CN100511244C

CN100511244C - Method for analyzing component mounting board

Info

Publication number: CN100511244C
Application number: CNB2006800047919A
Authority: CN
Inventors: 垣野学; 冈崎亨; 岩濑铁平; 高田和宪; 藤原宏章; 黑石友明
Original assignee: 松下电器产业株式会社
Current assignee: Godo Kaisha IP Bridge 1
Priority date: 2005-03-10
Filing date: 2006-01-20
Publication date: 2009-07-08
Anticipated expiration: 2026-01-20
Also published as: JP2006252113A; CN101120346A

Abstract

A method for analyzing a component mounting board comprising a step (A) for forming a multilayer substrate shell model of a multilayer wiring board, a step (B) for forming a multilayer component shell model divided by element division lines based on the bonding position of a component to the surface of the multilayer wiring board, step (C) for redividing the mounting position of the component in the multilayer substrate shell model, and step (D) for forming an analysis model by bonding the neutral plane of the substrate and the neutral plane of the component through a beam element or a solid element, i.e. a bonding element equivalent to mounting conditions of the component, wherein precision of analysis is enhanced while reducing computation cost by performing calculation while imparting boundary conditions to the analysis model.

Description

Method for analyzing component mounting board

Technical field

The present invention relates in the structure of the electronic circuit of various electronic equipments, to install on the employed multi-layer wire substrate analytical approach of the physical characteristics of the component mounting board under the state of parts.

Background technology

With the small-sized purpose that turns to of electronic equipment,, in the structure of electronic circuit, adopt multi-layer wire substrate recently in order to realize the high-density installation of electronic component.The wiring figure of each of multi-layer wire substrate layer can be by input circuit data in the Design CAD (Computer-Aided Design, computer-aided design (CAD)) of area of computer aided multi-layer wire substrate, thereby are met the multilayer wiring figure of electrical property.

But, because the material of each layer of multi-layer wire substrate and the width of wiring figure is different, in other words, because the position and the quantity of the difference of the residual copper rate of the Copper Foil of wiring figure part, the difference that is assembled in the rigidity of inner electronic component, via hole and be installed in installation method of lip-deep parts and these parts or the like, the mechanical property of the component mounting board of having finished will change.Specifically, because the abnormal situation of work might take place in the external force of effect and temperature variation and produce the warpage overstep the extreme limit on component mounting board on the multi-layer wire substrate.

Therefore, as seen multi-layer wire substrate of past (patent documentation 1), the data that according to the outer shape of substrate are figure, thickness are to each layer generation 3 dimension models, the 3 dimension models of each layer are synthesized and the solid model of generation substrate integral body, applying to this solid model under the situation of external force and temperature variation, whether the change of shape of judging solid model is the interior distortion of allowed band, when change of shape is the distortion that has surpassed allowed band, feed back to the design phase of utilizing described CAD, the multi-layer wire substrate of mechanical property is satisfied in design again.

In addition, described [solid model] consideration method itself is the theory of establishing and adopting in the stress analysis field of the various industrial parts of solid, has a detailed description in (non-patent literature 1) etc.

Patent documentation 1: the spy opens 2004-13437 communiques

A non-patent literature 1:[finite element method handbook I basis piece of writing] this rich outstanding, (strain) training wind shop first edition the 5th on the 25th printing February in 1989 distribution of Eagle Tianjin Lang Gong of a specified duration

But, in order to expect high-precision analysis result, must increase the number of cutting apart in the plane of each layer, thereby number of elements is very huge and increased and assess the cost.When being not only multi-layer wire substrate, and want to analyze under the situation of the mechanical property of the component mounting board that parts have been installed on the surface of multi-layer wire substrate, unit number is very huge and increased more and assess the cost.

Under the situation that the very narrow and slim multi-layer wire substrate of allowed band to the length and width size ratio of the profile of multi-layer wire substrate uses, present situation is to assess the cost to compare with cost to look to precision that corresponding raising is arranged.

The object of the invention is to provide a kind of method for analyzing component mounting board that assesses the cost and improve analysis precision of can realizing reducing.

Summary of the invention

The described method for analyzing component mounting board of a first aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Generate the operation (A) of every layer single-layer model, the regeneration that has carried out in each layer cutting apart being used each layer thickness information separately stacked Shell model of substrate that the single-layer model of each above-mentioned each layer is stacked with the unit cut-off rule according to each layer profile of above-mentioned multi-layer wire substrate and the wiring figure of each layer;

According to the bonding station on above-mentioned parts and above-mentioned multi-layer wire substrate surface, generate the operation (B) of the stacked Shell model of having cut apart with the unit cut-off rule of parts;

The unit cut-off rule that uses when generating the stacked Shell model of parts, the operation (C) that the installation site of the above-mentioned parts of the stacked Shell model of aforesaid substrate is cut apart again;

With being beam element or solid element, the substrate neutral surface that will calculate from the above-mentioned stacked Shell model of having cut apart again of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model;

And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model.

Fig. 6 represents the figure corresponding with the technical scheme of this first aspect.

The described method for analyzing component mounting board of a second aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Generate the operation (A-2) of every layer single-layer model, the regeneration that has carried out in each layer cutting apart being used each layer thickness information separately stacked Shell model of substrate that the single-layer model of each above-mentioned each layer is stacked with the unit cut-off rule according to the wiring figure of the profile of above-mentioned multi-layer wire substrate and each layer and the position of parts being carried out the terminal pad of mounted on surface;

With being beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model;

Figure 16 represents the figure of the technical scheme correspondence of this second aspect, and parts are not cut apart with substrate again, and this point is different with first aspect.

The described method for analyzing component mounting board of a third aspect of the present invention is characterized in that:

In the technical scheme of first aspect or second aspect, be beam element or solid element with joint unit with substrate neutral surface and parts neutral surface in conjunction with and form in the operation (D) of analytical model, with between stacked Shell model of aforesaid substrate and the stacked Shell model of above-mentioned parts except with above-mentioned joint unit being the node of the resene grafting material area the node of beam element or solid element combination, combine with the joint unit of physical strength, come the computational analysis model with the resin-bonded material equivalence of above-mentioned resene grafting material area.

The described method for analyzing component mounting board of a fourth aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Generate the operation (A) of every layer single-layer model, the regeneration that has carried out in each layer cutting apart being used each layer thickness information separately stacked Shell model of substrate that the single-layer model of each above-mentioned each layer is stacked with the unit cut-off rule according to the profile of above-mentioned multi-layer wire substrate and the wiring figure of each layer;

Write down according to the profile of above-mentioned parts and inner structure and the bonding station by above-mentioned parts and above-mentioned multi-layer wire substrate surface above-mentioned from corresponding each parts and to engage cut-off rule, to have carried out the operation (B-2) of reading the stacked Shell model of above-mentioned parts the parts database of the stacked Shell model of parts cut apart the unit;

The operation of the installation site of the above-mentioned parts of the stacked Shell model of aforesaid substrate being cut apart again with the unit cut-off rule of the stacked Shell model of parts (C);

With being beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts and combining from the above-mentioned parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model;

Figure 17 represents the figure of the technical scheme correspondence of this fourth aspect.

The described method for analyzing component mounting board of a fifth aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Write down according to the profile of above-mentioned parts and inner structure and by engaging cut-off rule with the bonding station on above-mentioned multi-layer wire substrate surface above-mentioned, having carried out the operation (B-2) of reading the stacked Shell model of above-mentioned parts the parts database of the stacked Shell model of parts cut apart the unit from corresponding each parts;

Figure 18 is the figure of the technical scheme correspondence of expression the 5th aspect.

The described method for analyzing component mounting board of a sixth aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Will be from according to the profile of parts and inner structure and by engage the parts neutral surface that the stacked Shell model of parts that cut-off rule cut apart with the unit cut-off rule calculates, the operation (B-3) of from the parts database that writes down corresponding to parts, reading with the bonding station on above-mentioned multi-layer wire substrate surface above-mentioned;

Figure 19 represents the figure of the technical scheme correspondence of the 6th aspect.

The described method for analyzing component mounting board of a seventh aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

With being that beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate and above-mentioned parts neutral surface combine and form the operation (D) of analytical model with the joint unit of the mounting condition equivalence of above-mentioned parts;

Figure 20 represents the figure of the technical scheme correspondence of the 7th aspect.

The described method for analyzing component mounting board of a eighth aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

When the position of unit cut-off rule engages with the stacked Shell model of the inconsistent above-mentioned parts of the stacked Shell model of substrate on will the installation site on above-mentioned parts and the surface of the stacked Shell model of substrate, for combining near the intersection point of unit cut-off rule with the intersection point of the unit cut-off rule of a model among stacked Shell model of substrate and the stacked Shell model of parts and another model, according to above-mentioned another model generate the operation (F) that engages intermediate file near the distance and the rigidity between them of the intersection point of unit cut-off rule;

With being beam element or solid element and above-mentioned joint intermediate file, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D-2) of analytical model;

Figure 21 represents the figure of the technical scheme correspondence of this eight aspect, it or not the stacked Shell model of position generation substrate according to the terminal pad that parts is carried out mounted on surface, but by using the joint intermediate file that generates, do not need for example the stacked Shell model of substrate to be carried out and cutting apart again that the stacked Shell model of parts is consistent, this point is different with the technical scheme of second aspect.

The described method for analyzing component mounting board of a ninth aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Figure 23 represents the figure of the technical scheme correspondence of the 9th aspect, it or not the stacked Shell model of position generation substrate according to the terminal pad that parts is carried out mounted on surface, but by using the joint intermediate file that generates, do not need for example the stacked Shell model of substrate to be carried out and cutting apart again that the stacked Shell model of parts is consistent, this point is different with the technical scheme of the 5th aspect.

The described method for analyzing component mounting board of a tenth aspect of the present invention is characterized in that, when analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, has:

Figure 24 represents the figure of the technical scheme correspondence of the tenth aspect, it or not the stacked Shell model of position generation substrate according to the terminal pad that parts is carried out mounted on surface, but by using the joint intermediate file that generates, do not need for example the stacked Shell model of substrate to be carried out and cutting apart again that the stacked Shell model of parts is consistent, this point is different with the technical scheme of the 7th aspect.

If according to method for analyzing component mounting board of the present invention, then do not carry out the following step: the single-layer model that promptly generates every layer according to the composition of the profile of the uneven multi-layer wire substrate of material in the layer and each layer, and generate stacked Shell model according to these, to calculate distortion in this stacked Shell model of boundary condition substitution again, and carry out the following step: promptly using the joint unit with the mounting condition equivalence of parts is beam element or solid element, neutral surface combination with the neutral surface and the stacked Shell model of substrate of the stacked Shell model of parts, generate the analytical model of such combination, and provide boundary condition to this analytical model, calculate distortion, thereby be subjected to what kind of influence there from being installed in its surperficial parts for multi-layer wire substrate, and be installed in what kind of influence the lip-deep parts of multi-layer wire substrate are subjected to there from multi-layer wire substrate problem, compare with calculated amount according to the analytical approach in past, although calculated amount is less, also can access good analysis result.

Description of drawings

Fig. 1 is the process flow diagram of the stress analysis of the multi-layer wire substrate based on the tabular body analytical approach of the present invention.

Fig. 2 is the exploded view of the multi-layer wire substrate of same example.

Fig. 3 is that the material category in the single-layer model of same example is distributed the key diagram of operation.

Fig. 4 is the key diagram of stacked Shell model that the single-layer model of same example is stacked.

Fig. 5 is the key diagram of the neutral surface that calculates of the stacked Shell model according to same example.

Fig. 6 is the figure of the technical scheme correspondence of a first aspect of the present invention.

Fig. 7 is the key diagram that the layer of the stacked Shell model of parts is cut apart.

Fig. 8 is the key diagram that the unit of the stacked Shell model of parts is cut apart.

Fig. 9 is the key diagram of cutting apart again of the stacked Shell model of substrate.

Figure 10 is the key diagram of parts neutral surface and the combination of substrate neutral surface.

Figure 11 is with the key diagram of parts neutral surface among Figure 10 and the combination of substrate neutral surface and and the key diagram of other embodiment during with the resene grafting material.

Figure 12 is the process flow diagram that material category is distributed other example of operation.

Figure 13 is the key diagram of Figure 12.

Figure 14 be the unit of single-layer model cut apart before with cut apart again after the different key diagram of cell size.

Figure 15 is the process flow diagram that carries out the processing of Figure 14.

Figure 16 is the figure of the technical scheme correspondence of a second aspect of the present invention.

Figure 17 is the figure of the technical scheme correspondence of a fourth aspect of the present invention.

Figure 18 is the figure of the technical scheme correspondence of a fifth aspect of the present invention.

Figure 19 is the figure of the technical scheme correspondence of a sixth aspect of the present invention.

Figure 20 is the figure of the technical scheme correspondence of a seventh aspect of the present invention.

Figure 21 is the figure of the technical scheme correspondence of a eighth aspect of the present invention.

Figure 22 is the key diagram of the joint intermediate file of Figure 21.

Figure 23 is the figure of the technical scheme correspondence of a ninth aspect of the present invention.

Figure 24 is the figure of the technical scheme correspondence of a tenth aspect of the present invention.

Figure 25 is with the key diagram of beam element with the situation of substrate

neutral surface

14 and 26 combinations of parts neutral surface.

Figure 26 is with the key diagram of solid element with the situation of substrate

neutral surface

14 and 26 combinations of parts neutral surface.

Figure 27 is with the specify figure of solid element with the situation of substrate

neutral surface

14 and 26 combinations of parts neutral surface.

Figure 28 is that the node with the substrate-side of solid element 31 is the process chart that benchmark is cut apart the stacked Shell model 11 of substrate again.

Embodiment

Each example that following basis is concrete illustrates method for analyzing component mounting board of the present invention.

(example 1)

Fig. 1 represents the process flow diagram according to the stress analysis of method for analyzing component mounting board.

When handling beginning, the data 2 of the outer shape 1 of the multi-layer wire substrate that preparation acceptance is analyzed and the wiring figure of each layer are as the 1st file M1, in the multi-layer wire substrate except wiring figure and via hole etc., also dispose under the situation of parts in the inside of multi-layer wire substrate, prepare parts kind 3 and shape 4 and position 5a as the 2nd file M2.About the parts on the surface that is installed in multi-layer wire substrate, the mounted on surface component number of preparing each parts is described installation method and shape and structure according to 5b as the 2nd file M2.In the shape of mounted on surface component number, when being integrated circuit, then comprise the data of the configuration of assembly profile and external connection terminals according to 5b.In structure, when being integrated circuit, data of the material of record component and its inner chip position etc. then.About the data of parts to the installation site on multi-layer wire substrate surface, can come together to describe according to 5b to each parts and mounted on surface component number, which perhaps, handle from for using multi-layer wire substrate and which installation site on the surface of this multi-layer wire substrate is installed the Design CAD data of the area of computer aided multi-layer wire substrate which parts manages, reading.In this example,, be to describe as the data of from cad data, reading and handling about the installation site of parts and the data of this parts title.

The 1st file M1 is separated into the 1st layer～n layer with multi-layer wire substrate specifically as shown in Figure 2, the 1st layer, the 3rd layer, the 5th layer ..., the n layer is wiring layer, the 2nd layer, the 4th layer ..., (n-1) layer be insulation course.

At first, the analysis with the state of uneasy component on the multi-layer wire substrate surface illustrates as basic status.

In the step S101 of the robot calculator 6 of this basic status, carry out the unit dividing processing according to the 1st file M1.The unit dividing processing be with the 1st layer, the 3rd layer, the 5th layer ... each wiring layer carry out the unit and be divided into a plurality of unit.The object lesson of the 1st wiring layer is shown in Fig. 3 (a).In the figure, the copper clad patterns 8 of formation target shape on base material 7.At this moment, among the step S101 shown in Fig. 3 (b), cut apart carrying out the unit in the plane of the 1st wiring layer, be divided into the unit of identical size.

In step S102, partition data about each unit of having carried out among the step S101 cutting apart the unit, then according to data of unit material kind etc., image pattern 3 (c) is such, the unit of Copper Foil more than 50% is called [all covering with Copper Foil] and the unit of less than 50% is called the threshold value of [not having Copper Foil that base material is only arranged] according to predefined, implement the unit judges of each unit.Fig. 3 (d) represents the kind allocation result of this material.

The 3rd wiring layer that mixes for base material and Copper Foil, the 5th wiring layer ... remaining wiring layer, also identical with the 1st wiring layer, under same condition, carry out the distribution of material category.For the picture the 2nd layer, the 4th layer ... unit material kind in the such plane of insulation course of (n-1) layer is under certain situation, also according to having or not the via hole that connects to descend wiring layer and last wiring layer etc., similarly implements the unit judges of each unit.

In addition, at this moment, for all layers of the 1st layer～n layer, the shape of unit is identical with size, and is divided into the coordinate position unanimity of intersection point GX of each unit cut-off rule 24 of unit in the plane with each wiring layer.

Like this after every layer material category is distributed the knot beam and stored in the 3rd file as partition data 9 and unit material data 10, in step S103, carry out analytical model and generate and handle.Specifically, give and each layer thickness data and lamination order for 2 dimension data of each layer that processing generated before the step S102 according to the 1st file M1, arrive shown in Fig. 4 (b) as Fig. 4 (a), generate the stacked Shell model 11 of substrate of 3 dimensions, and in step S104, store among the 4th file M4 as the stacked Shell model 11 of substrate.

In multi-layer wire substrate except wiring figure and via hole etc., also dispose under the situation of parts, parts kind and shape and position according to the 2nd file M2 are enclosed on the relevant position of the stacked Shell model that generates among the step S103, and as stacked Shell model data 11.

In the 4th file M4, pre-deposit boundary condition 12 that expression is the purpose condition with the analysis and according to the material property 13 of each material of the multi-layer wire substrate of the 1st file.

Comprise about beam condition and loading condition in the essential boundary condition 12 when adopting finite element method.Expression install and support material for testing multi-layer wire substrate state be about beam condition.The expansion of mechanical load that the somewhere that is included in this multi-layer wire substrate in the loading condition produces owing to the power that mechanically applies and the material for testing that causes owing to temperature variation, shrink the temperature load that the power that produced is brought.

Above-mentioned material rerum natura 13 is eigenvalues of various materials of the multi-layer wire substrate of component analysis object, mainly deposits longitudinal modulus of elasticity, Poisson ratio, linear expansion coefficient, thermal conductivity, specific heat, density, radiance, the coefficient of overall heat transmission of every kind of material etc. in.

In step S105,, calculate the 2D model of the reference field of the stacked Shell model of 3 dimensions according to the material property 13 of stacked Shell model 11 of the substrate of the 4th file M4 and the 4th file M4.Specifically, shown in Fig. 5 (a), calculate the imaginary substrate neutral surface 14 that is present in the stacked Shell model 11 of 3 dimension substrates.The position of setting this substrate neutral surface 14 is that the distance from the upper surface of the stacked Shell model 11 of substrate is d1, is the position of d2 from the distance of the lower surface of the stacked Shell model 11 of substrate.

And in this step S105, calculating offers above-mentioned boundary condition 12 distortion of the substrate neutral surface 14 under the situation of substrate neutral surface 14, if the neutral surface that will be out of shape is set at the 14A shown in Fig. 5 (b), then to one side and the another side of this substrate neutral surface 14A that has been out of shape, additional above-mentioned apart from d1, d2 according to thickness of slab obtained the distortion 11A of multi-layer wire substrate.

In addition, in this step S105, when carrying out stress analysis, be that to adopt distortion 11A and above-mentioned thickness information be that the rerum natura of the thickness of slab of each layer and longitudinal modulus of elasticity, Poisson ratio, linear expansion coefficient is calculated the stress of each layer of the 1st layer～n layer.

And, in this step S105, in order to implement heat conduction analysis together, temperature conditions is offered the upper surface and the lower surface of above-mentioned stacked housing, and to adopt above-mentioned thickness information be the rerum natura of the thickness of slab of each layer and thermal conductivity, specific heat, density, thereby calculate each layer temperature of the 1st layer～n layer, and calculate the temperature of the stacked Shell model 11 of substrate.

In step S106, the result of the distortion 11A of step S105 is deposited among the 5th file M5 as the stress 16 of warpage (displacement) 15 and each layer.The temperature of the stacked Shell model 11 of substrate also deposits among the 5th file M5.

In step S107, read in the 5th file M5 of step S106, whether discriminatory analysis result's distortion, temperature satisfy condition, under situation about not satisfying condition, change the part of parameter of the cad data 17 of the 6th file M6 write the data relevant with making analytic target, change the 1st file M1 and the 2nd file M2 according to this, and repeat above-mentioned analysis.If satisfy condition, then export to CAM (Computer-Aided Manufacturing) data 18 of computer-aided manufacturing.

Like this, in step S105, because be to be transformed to neutral surface from the stacked Shell model 11 of 3 dimensions, make boundary condition 12 effects and substrate neutral surface 14, calculate distortion, the temperature of 2 dimensions, and additional thickness information, obtain the profile of multi-layer wire substrate,, can analyze by such computing operation, so the analyses that made boundary condition act on 3 dimension solid models like that with the past and calculated 3 dimension distortion are compared, and can obtain the roughly the same analysis result of precision with short computing time.

Be the basic status that parts are not installed on the surface of multi-layer wire substrate above,, handle according to the first claim corresponding diagram shown in Figure 6 when installing under the situation of parts on the surface at multi-layer wire substrate.

In the operation (A) of the 1st claim corresponding diagram, though it is identical generating the stacked Shell model 11 of substrate and write among the 4th file M4 in the step S103 of robot calculator 6, but the operation that makes boundary condition 12 act on substrate neutral surface 14 and carry out computing by the stacked Shell model of 3 dimensions among the step S105 of robot calculator 6, under situation at the mounted on surface parts of multi-layer wire substrate, be replaced into operation (the B)～operation (D) of the 1st claim corresponding diagram, according to the lip-deep parts that are installed in multi-layer wire substrate, read in data 5b from above-mentioned the 2nd file M2 again, carry out following processing according to these data again by configuration determined and the bonding station multi-layer wire substrate surface of the electric connection terminal of installation method and each parts.

Generation is installed in the stacked Shell model 19 of parts of the parts on multi-layer wire substrate surface.

The stacked Shell model 11 of substrate is cut apart again.

Stacked Shell model 11 of substrate and the stacked Shell model 19 of parts are carried out combination.

Specifically describe each operation according to Fig. 7～Figure 11.

The generation of the stacked Shell model 19 of-parts-

This operation (B) is undertaken by step S103.As the parts that are installed in the multi-layer wire substrate surface, retrieve the mounted on surface component number of the 2nd file M2 according to 5b with the parts title of from cad data, reading, these parts of Que Dinging are shown in Fig. 7 (a) thus, at QFP (Quad Flat Package: four limits lead-in wire flat package) under the situation of integrated circuit, the identical part of structure of direction in the face (X-Y plane) is envisioned for one deck, and direction (Z direction) the last every kind of different structure (material) that leaves multi-layer wire substrate is defined as layer.Here shown in Fig. 7 (b), the layer of the IC chip 20 of dress is as the 2nd layer in will comprising, and then its downside is as the 1st layer, and upside is as the 3rd layer.On the 1st layer, as shown in Figure 8, be provided as the external connection terminals 21 at the junction surface that the terminal pad with the surface of multi-layer wire substrate welds around.The 1st layer and the 3rd layer only is made of encapsulating material, and different is, the 2nd layer is made of with the IC chip 20 different with the mechanical property of encapsulating material encapsulating material.

At first, shown in Fig. 8 (b), direction is carried out mesh segmentation to the 2nd layer shown in Fig. 8 (a) in face.The cut-off rule 22 of the position of said external splicing ear 21 that here will be by the 1st layer carries out mesh segmentation as benchmark.Then, shown in Fig. 8 (c), as benchmark,, the distribution of material category is carried out in each zone of having cut apart with the limit 20a of IC chip 20 again with 23 pairs of the 2nd layer of mesh segmentation of carrying out shown in Fig. 8 (d) of line bonus secant.Even the unit material kind as the 1st layer and the 3rd layer in the plane is under certain situation, also to use the cut-off rule identical with Fig. 8 (d) to carry out mesh segmentation, each zone is carried out the distribution of material category.

The 1st layer～the 3rd layer single-layer model for such parts that generated, give the thickness data and the lamination order of each layer, shown in Figure 10 (a), generate the stacked Shell model 19 of 3 dimension parts, in step S104, store among the 4th file M4 as the stacked Shell model 19 of parts.

The cutting apart again of the stacked Shell model 11 of-substrate-

This operation (C) is undertaken by step S103.

Cut apart again about the stacked Shell model 11 of substrate, suppose shown in Fig. 9 (a), to be divided into baseplate material 7 and copper wiring 8 by unit cut-off rule 24 according to the stacked Shell model 11 of substrate that the independent structure of multi-layer wire substrate is cut apart and the present moment writes among the 4th file M4.

Shown in Fig. 9 (b), on the installation site of the parts that read in from cad data, the grid of the unit cut-

off rule

22,23 of stacked Shell model 19 1 sides of above-mentioned parts is overlapped, upgrade the content of the stacked Shell model 11 of substrate of the 4th file M4, become shown in Fig. 9 (c) content shown in Fig. 9 (d) that the holostrome that utilizes 251～2511 pairs of stacked Shell models 11 of substrate of new unit cut-off rule consistent with the grid of the unit cut-

off rule

22,23 of parts side cuts apart again.

The combination of stacked Shell model 11 of-substrate and the stacked Shell model 19 of parts-

This operation (D) is undertaken by step S105.

Figure 10 (a) is illustrated in the state of the stacked Shell model 19 of stacked parts on the installation site of the stacked Shell model 11 of substrate, the parts of Figure 10 (b) expression parts installation site and the enlarged drawing of multi-layer wire substrate.Calculating respectively about the parts neutral surface 26 (with reference to Figure 10 (c)) of the substrate neutral surface 14 (with reference to Fig. 5 (b)) of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts, when calculating substrate neutral surface 14, read and the material property value of each unit of having divided with unit cut-off rule 24 of each layer of the stacked Shell model 11 of substitution substrate from the material property 13 of the 4th file M4, thereby calculate.And when calculating parts neutral surface 26, then read and the material property value of each unit of having divided with unit cut-

off rule

22,23 of each layer of the stacked Shell model 19 of substitution parts, thereby carry out the calculating of neutral surface from the material property 13 of the 4th file M4.

To multi-layer wire substrate parts being installed is under the situation of QFP integrated circuit, shown in Figure 10 (b), because each external connection terminals 21 of welding part on the terminal pad 27 of multi-layer wire substrate, so shown in Figure 10 (c), above-mentioned combination be by as and the tin columniform beam element 28 of combining unit that connects equivalence be combined into one, generate analytical model 29.

In detail, here because the grid of the unit cut-off rule of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts is in full accord, therefore combine by the grid node of beam element 28 respectively the position of the terminal pad 27 of the parts installation site of the grid node of the position of each external connection terminals 21 of parts neutral surface 26 and substrate neutral surface 14.

In addition, the shape of beam element 28 is set corresponding to terminal and its shape of parts, even the situation that identical tin connects, but be not with terminal from assembly but under with the situation of drawing, also use quadrangular as beam element 28.

In addition in the above description, for example enumerate the non-conductive film who between parts and multi-layer wire substrate, does not fill as the resene grafting material, non-conductive paste, the situation of any in the filler resin, explanation is the situation that only connects parts neutral surface 26 and substrate neutral surface 14 with columniform beam element 28 shown in Figure 11 (a), but this is as MCM (Multi Chip Module, multi-chip module), BGA (BallGrid Array, ball grid array), CSP (Chip Size Package, wafer-level package) etc. the resene grafting material between parts and multi-layer wire substrate is for example filled under the situation of above-mentioned filler resin, not only to connect parts neutral surface 26 and substrate neutral surface 14 with columniform beam element 28, but shown in Figure 11 (b), the grid node that will be surrounded with columniform a plurality of above-mentioned beam elements 28 on parts neutral surface 26 and the grid node utilization of substrate neutral surface 14 combine as the beam element 30 with for example quadrangular of the joint unit of resene grafting material equivalence, each beam element 30 for quadrangular, read the also material property value of substitution filler resin from the material property 13 of the 4th file M4, thereby the generation analytical model is carried out operation (E).

Like this, for process operation (B), (C), (D) analytical model of the multi-layer wire substrate that has parts that generates, again in the operation (E) of step S105 (the claim corresponding diagram of Fig. 6), make boundary condition 12 act on analytical model 29, find the solution the computing operation of the profile of multi-layer wire substrate by calculating 2 distortion of tieing up and temperature and additional thickness information, can analyze, with compare in the analysis of distortion that makes boundary condition act on the solid models of 3 dimensions and to calculate 3 dimensions as before, can obtain the roughly the same analysis result of precision enough short computing times.

In addition, not only can carry out parts are carried out the analysis of the multi-layer wire substrate under the state of mounted on surface, also can analyze because the distortion of multi-layer wire substrate and in fact act on the distortion of parts.

In addition, in the above description as shown in figure 25, be to utilize for example as the beam element 28 of joint unit analytical model 29 to illustrate with parts neutral surface 26 combinations of the substrate neutral surface 14 of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts, but under the situation of salient point of utilizing solder ball etc. with multi-layer wire substrate and parts combination, do not adopt beam element 28 as joint unit, but adopting the analytical model 29 of utilizing solid element 31 combinations as shown in figure 26, this can access the higher analysis result of precision.

(example 2)

Judge in the operation at the unit material shown in Fig. 3 of above-mentioned example (c), it is 1 unit for base material 7 and copper clad patterns 8 mixing, ratio according to base material 7 and copper clad patterns 8, judge the physics value of [all being base material 7] or [all being copper clad patterns 8] and material, handle simply, but in this (example 2), be the physics value of judging and handle material according to the wiring width of the copper clad patterns 8 of each unit respectively, only different on this point.

Figure 12 and Figure 13 represent (example 2).

Figure 12 is illustrated in the single-layer model shown in Figure 13 (a), judges the processing procedure of the material of each the unit A in the single-layer model face by automatic processing.

In step S1～S11 of Figure 12, shown in Figure 13 (b), each unit A of scanning on the x direction of principal axis, and the axial residual copper rate of y of calculating copper clad patterns 8.In step S12～S17, shown in Figure 13 (c), each unit A of scanning on the y direction of principal axis, and the axial residual copper rate of x of calculating copper clad patterns 8.

In detail, in step S1,, and set default value j=0 for the 1st layer of the single-layer model that determine to begin to calculate which layer among the n layer.

In step S2, the default value j=0 of step S1 is added 1, illustrate the 1st layer is calculated.

In step S3, in the data 2 of the wiring figure of each layer, shown in Figure 13 (a), be divided into etc. the unit A of cutting apart for the 1st layer specified wiring figure of the j=1 that adds 1 by above-mentioned steps S2.

In step S4,, set default value i=0 for the unit A that determines to begin to calculate.

In step S5, the default value i=0 of step S4 is added 1, illustrate that the unit A to No. 1, element number calculates.

In step S6,, set default value k=0 for the x axial scanning position in the unit that has been illustrated by step S5 is described.

In step S7, the default value k=0 of step S6 is added 1, the wiring width in each position of x direction of principal axis among the unit A of No. 1, computing unit numbering is described.

In step S8, the axial position of x of the unit A that No. 1, the computing unit numbering is the axial length Ry1 of y of the copper clad patterns 8 at k=1 place.

In step S9, check the axial position of whole x of the unit A whether calculated No. 1, element number.Here because k=1, so return step S7, and carry out the process of step S7, S8 repeatedly, when the axial position of whole x of the unit A that has calculated No. 1, element number, in step S9, skip this process, and carry out step S10.

If the length of side of establishing unit A is for " 1 ", then because be the mean value of length Ry1～RyN in the rate that exists of the residual copper of y direction of principal axis, so this value is set at the axial average residual copper of y rate, in step S10, the mean value Vfy of the axial length of y of the Copper Foil 8 of each position that calculating is tried to achieve in step S8 so far.

Vfy＝(Ry1+Ry2+…+RyN)/N

In step S11, calculate the axial equivalent physics value Ey of y.

Ey＝EB(1—Vfy)+ECU·Vfy

In addition, EB is the physics value of base material 7, and ECU is the physics value of copper clad patterns 8.

In step S12,, set default value k=0 for the axial scanning position of y is described.

In step S13, the default value k=0 of step S12 is added 1, axial each the locational wiring width of y among the unit A of No. 1, computing unit numbering is described.

In step S14, shown in Figure 13 (c), the axial position of y of the unit A that No. 1, the computing unit numbering is the axial length Rx1 of x of the copper clad patterns 8 at k=1 place.

In step S15, check the axial position of whole y of the unit A whether calculate No. 1, element number.Because k=1 here, so return step S13, and the process of step S13, step S14 repeatedly when calculating is over the axial position of whole y of unit A of No. 1, element number, is skipped this process in step S15, and steps performed S16.

In step S16, calculate the mean value Vfx of the axial length of x of the copper clad patterns 8 of each position that current position tries to achieve in step S14.

Vfx＝(Rx1+Rx2+…+RxN)/N

In step S17, calculate the axial equivalent physics value Ex of x.

Ex＝EB(1—Vfx)+ECU·Vfx

In step S18,, in the 4th file M4 shown in Figure 1, write the material property value of corresponding wiring width corresponding to unit A by No. 1, the element number of the 1st floor of step S2 and step S5 explanation.

In step S19, whether check that the whole unit A for the 1st layer that illustrates among the step S5 have implemented step S18.Because i=1 here, step S5 returned, and add 1, make i=2, arrive process till the step S18 repeatedly, when calculating is over the unit A of No. 2, element number for the unit A of No. 2, the element number of the 1st floor, in step S17, skip this process, and steps performed S20.

In step S20, whether check for all stacked layer 1～m and implemented step S18.Because j=1 here, step S2 returned, and add 1, make j=2, arrive the process till the step S18 repeatedly, when tying beam for the calculating of m layer for the 2nd layer～m layer, in step S20, skip this process, the acquisition process of the material property value of the corresponding wiring width of knot beam.

Like this, because the wiring width according to each unit decides the material property value, so distortion of calculating substrate neutral surface 14 according to this material property value 13, and the face and the additional thickness of slab of another face of substrate neutral surface 14 obtained the profile of multi-layer wire substrate, thereby can realize more high-precision analysis.

(example 3)

In above-mentioned each example, what illustrate is the shape and the big or small identical situation of the unit cut apart, the unit in the whole single-layer model face, but for not deforming in the face or little scope taking place, the shape of the unit of cutting apart by the unit that makes in the single-layer model face is different with other scope with size, thereby can reduce the model scale.

That is, the zone that mixes for base material 7 and copper clad patterns 8, with the size of unit A cut apart than only by a kind of material in base material 7 or the copper clad patterns 8 occupy regional little.

Specifically, for each unit of having cut apart roughly in advance, read residual copper rate from the data 2 of each layer wiring figure of the 1st file M1, residual copper rate is occupied regarding as below 20% by base material 7, the above-mentioned unit of having cut apart is not roughly cut apart again thinlyyer.Residual copper rate occupies regarding as more than 80% by copper clad patterns 8, the above-mentioned unit of having cut apart roughly do not cut apart again thinlyyer., then regard base material 7 and copper clad patterns 8 as and mix and exist below 20% and for residual copper rate, thinner cutting apart again carried out in the inside of the above-mentioned unit of having cut apart roughly in the situation more than 80%.

For the tiny unit after cutting apart again, above-mentioned repeatedly processing more than 20% and in the situation below 80%, is carried out the thinner processing of cutting apart again to the inside, unit after cutting apart again for residual copper rate repeatedly.Single-layer model before Figure 14 (a) expression is cut apart, the single-layer model after Figure 14 (b) expression is cut apart again, the size of grid hole is represented the difference of cell size.

The treatment scheme of this situation of expression among Figure 15.

In step S1, equally spaced cut apart single-layer model with the MIN number of cutting apart.Here shown in (a), establishing initial partitioning is 4 * 4.

In step S2, axial 4 cell S 11 of x, S12, S13, S14 as shown in (b), are concentrated and select the row unit.

In step S3, for all cell S 11～S14 that extracted out by step S2, according to the wiring figure of substrate CAD, specifically according to the data 2 of each layer wiring figure of the 1st file M1 shown in (c), calculate residual copper rate like that, in this example, the residual copper rate of among cell S 11～S13 any is 25%, and the residual copper rate of unit 14 is 50%.

In step S4, whether the residual copper rate of checking the whole unit that calculated by step S3 is below 20% or more than 80%.In this example, in step S4, be judged as " NO ", then steps performed S5.In step S5, shown in (d), be divided into 2 again at direction of principal axis, and steps performed S6.In step S4, be judged as other situation of " YES ", skips steps S5 then, and steps performed S6.

In step S6,, check the process of whether having carried out between step S2 and step S6 for all row unit of the single-layer model shown in (a), if for all single-layer models, carry out the process between step S2 and step S6, finished necessary cutting apart again, then followed steps performed S7.

In step S7, axial 4 cell S 11 of y, S21, S31, S41 shown in (e), are concentrated and select column unit.

In step S8,, shown in (f), calculate residual copper rate like that according to the data 2 of each layer wiring figure of the 1st file M1 for all cell S 11～S41 that extracted out by step S7.In this example, the residual copper rate of cell S 11, S21, S31, S41 is 20%, 15%, 10%, 20%.

In step S9, whether the residual copper rate of checking the whole unit that calculated by step S8 is below 20% or more than 80%.In this example, in step S9, be judged as " YES " skips steps S10 then, and steps performed S11.When the residual copper rate of the whole unit that calculated by step S8 is not below 20% or 80% when above, in step S9, be judged as " NO ", then steps performed S10.Under the situation of steps performed S10, as shown in the hypothesis line, on the y direction of principal axis, cutting apart again like that in (g).

In step S11,, check the process of whether having carried out between step S2 and step S6 for all column units of the single-layer model shown in (a), if for all single-layer models, carry out the process between step S7 and step S11, finished necessary cutting apart again, then followed steps performed S12.

In step S12, attach unit symbol for the unit that has carried out in order to last flow process cutting apart again, and operate as the unit.

In step S13, check at least one step of whether having carried out among step S5 and the step S10, under the situation of having carried out a step, return step S2, and handle repeatedly.

Carry out the processing of this Figure 15 for the single-layer model of each layer, generate the stacked Shell model 11 of substrate.

Like this, the zone that configuration for wiring figure is very complicated, want to calculate more accurately warpage (displacement), cut apart with thin grid, and zone is in addition cut apart with thick grid, in other words, for can not the generating plane internal strain or little scope takes place, the shape of the unit of cutting apart by the unit that makes in the single-layer model face is different with other scopes with size, by the corresponding suitable unit number of the configuration of such utilization and wiring figure, computing time with short, can access high-precision analysis result.

In addition, as about beam condition of the mesh segmentation among Figure 15, must be that the segmented shape of layer direction is fully different and cut apart in rectangular coordinate system.Therefore, under the situation of the stacked Shell model of making multi-layer wire substrate, when stacked each single-layer model, for in the different unit of the segmented shape of layer direction, be holostrome to be cut apart again according to the size of the unit of minimum, perhaps in advance in the step S2 and step S7 of Figure 15, the capable unit of selecting on the x direction of principal axis is not only the cell S 11～S14 of individual layer, but as the S11～S14 and the S11～S41 of holostrome, for these all unit, as the step S4 of back and the inspection object of the residual copper rate among the S8, in all layers, reflect cutting apart among the step S12 simultaneously.

In above-mentioned each example, be that for example to enumerate tabular body be that the situation of the plate that has an even surface illustrates, even but the plate with curvature can implement too.

In the method for analyzing component mounting board of each above-mentioned example, be as shown in Figure 6, grid with the unit cut-off rule of the stacked Shell model of parts in operation (C) is cut apart the stacked Shell model of substrate again, but utilize structure as shown in figure 16, can not adopt the segmentation process again (C) of the stacked Shell model of substrate.

Specifically, formation comprises: according to the wiring figure of the profile of above-mentioned multi-layer wire substrate and each layer and with parts carry out the terminal pad 27 of mounted on surface the position (equal by above-mentioned parts and multi-layer wire substrate surface bonding station engage the cut-off rule position) generate with the unit cut-off rule with every layer single-layer model having carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate with the single-layer model of each above-mentioned each layer stacked be above-mentioned multi-layer wire substrate shape the operation (A-2) of the stacked Shell model of substrate; According to the bonding station of the above-mentioned parts on the surface of above-mentioned parts and above-mentioned multi-layer wire substrate, generate the operation (B) of the stacked Shell model of having cut apart with the unit cut-off rule of parts; With being beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model 29; And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model 29.Operation (B) also can in operation (A-2) front.

In the method for analyzing component mounting board of above-mentioned each example, when on multi-layer wire substrate, installing, be each data from the 2nd file M2 read zero parts, generate the stacked Shell model of parts, write again among the 4th file M4, but these are as the data of each parts among the 2nd file M2, write down according to profile and inner structure and by above-mentioned the engage cut-off rule of above-mentioned parts corresponding to each parts by preparing with the bonding station on multi-layer wire substrate surface, carry out the parts database of the stacked Shell model of parts cut apart the unit, thereby can reduce the working load of robot calculator 6 more.

Specifically, as Figure 17 or implementation as shown in Figure 18.

Method for analyzing component mounting board shown in Figure 17 is the variation of Fig. 6, in this case, have: according to the wiring figure of each layer profile of above-mentioned multi-layer wire substrate and each layer generate with the unit cut-off rule with every layer single-layer model having carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate with the single-layer model of each above-mentioned each layer stacked be the operation (A) of the stacked Shell model of substrate of above-mentioned multi-layer wire substrate shape; Write down according to the profile of above-mentioned parts and inner structure and the bonding station by above-mentioned parts and multi-layer wire substrate surface above-mentioned from corresponding each parts and to engage cut-off rule, to have carried out the operation (B-2) of reading the stacked Shell model of above-mentioned parts the database of the stacked Shell model of parts cut apart the unit; The operation of the installation site of the above-mentioned parts of the stacked Shell model of aforesaid substrate being cut apart again with the unit cut-off rule of the stacked Shell model of parts (C); Combine with the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts with from the above-mentioned parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model; And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model.

Method for analyzing component mounting board shown in Figure 180 is the variation of Figure 16, in this case, have: position (=bonding station by above-mentioned parts and multi-layer wire substrate surface the engage cut-off rule) generation of carrying out the terminal pad of mounted on surface according to the wiring figure of the profile of above-mentioned multi-layer wire substrate and each layer and with parts with the unit cut-off rule with every layer the single-layer model that has carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate is with the operation (A-2) of the stacked stacked Shell model of substrate for above-mentioned multi-layer wire substrate shape of the single-layer model of each above-mentioned each layer; Write down according to the profile of above-mentioned parts and inner structure and the bonding station by above-mentioned parts and multi-layer wire substrate surface above-mentioned from corresponding each parts and to engage cut-off rule, to have carried out the operation (B-2) of reading the stacked Shell model of above-mentioned parts the database of the stacked Shell model of parts cut apart the unit; Combine with the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts with from the above-mentioned parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model; And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model.

In the method for analyzing component mounting board of above-mentioned each example, be when on multi-layer wire substrate, installing, each parts neutral surface 26 that calculates, but these are as the data of each parts among the 2nd file M2, write down the parts database of parts neutral surface 26 by preparation corresponding to each parts, thereby can reduce the working load of robot calculator 6 more.

Specifically, as Figure 19 or implementation as shown in Figure 20.

Method for analyzing component mounting board shown in Figure 19 is the variation of Fig. 6, in this case, it is characterized in that having: according to the wiring figure of each layer profile of above-mentioned multi-layer wire substrate and each layer generate with the unit cut-off rule with every layer single-layer model having carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate with the single-layer model of each above-mentioned each layer stacked be the operation (A) of the stacked Shell model of substrate of above-mentioned multi-layer wire substrate shape; Will be from engage the parts neutral surface that the stacked Shell model of parts that cut-off rule cut apart with the unit cut-off rule calculates, the operation (B-3) of from the parts database that writes down corresponding to parts, reading according to the profile of parts and inner structure and the bonding station by above-mentioned parts and multi-layer wire substrate surface above-mentioned; The operation of the installation site of the above-mentioned parts of the stacked Shell model of aforesaid substrate being cut apart again with the unit cut-off rule of the stacked Shell model of parts (C); Combine with the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts with from the above-mentioned parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model; And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model.Operation (B-2) also can be in the front of operation (A-2).

Method for analyzing component mounting board shown in Figure 20 is the variation of Figure 16, in this case, have: position (bonding station by above-mentioned parts and multi-layer wire substrate surface the engage cut-off rule) generation of carrying out the terminal pad of mounted on surface according to the wiring figure of the profile of above-mentioned multi-layer wire substrate and each layer and with parts with the unit cut-off rule with every layer the single-layer model that has carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate with the single-layer model of each above-mentioned each layer stacked for above-mentioned multi-layer wire substrate shape the operation (A-2) of the stacked Shell model of substrate; Will be from engage the parts neutral surface that the stacked Shell model of parts that cut-off rule cut apart with the unit cut-off rule calculates, the operation (B-3) of from the parts database that writes down corresponding to parts, reading according to the profile of parts and inner structure and the bonding station by above-mentioned parts and multi-layer wire substrate surface above-mentioned; Combine with the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of above-mentioned parts with from the above-mentioned parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model; And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model.Operation (B-3) also can be in the front of operation (A-2).

Figure 16, Figure 17, Figure 18, Figure 19, operation (D) shown in Figure 20, as shown in figure 25, be to be set at the analytical model 29 of the parts neutral surface 26 of the substrate neutral surface 14 of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts being carried out combination by as the beam element 28 of joint unit, under the situation that the salient point that utilizes solder ball etc. at picture engages multi-layer wire substrate and parts, can use joint unit is not beam element 28 but the analytical model 29 of solid element 31 combinations by as shown in figure 26.

In Figure 16, Figure 18 of above-mentioned explanation, Figure 20, in order to remove the segmentation process again of the stacked Shell model of substrate, be [generate with the unit cut-off rule according to the position of parts being carried out the terminal pad of mounted on surface (bonding station by above-mentioned parts and multi-layer wire substrate surface combine cut-off rule) and cut apart every layer single-layer model in each layer], but, also can remove the segmentation process again of the stacked Shell model of substrate by as Figure 21 and structure shown in Figure 22.

As shown in figure 21, it is characterized in that having: according to the wiring figure of the profile of above-mentioned multi-layer wire substrate and each layer generate with the unit cut-off rule with every layer single-layer model having carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate with the single-layer model of each above-mentioned each layer stacked be the operation (A) of the stacked Shell model of substrate of above-mentioned multi-layer wire substrate shape; According to the bonding station on the surface of the multi-layer wire substrate of above-mentioned parts and above-mentioned parts, generate the operation (B) of the stacked Shell model of having cut apart with the unit cut-off rule of parts; When the position of unit cut-off rule engages with the stacked Shell model of the inconsistent above-mentioned parts of the stacked Shell model of substrate on will the installation site on above-mentioned parts and the surface of the stacked Shell model of substrate, for combining near the intersection point of unit cut-off rule with the intersection point of the unit cut-off rule of (for example parts) model among stacked Shell model of substrate and the stacked Shell model of parts and another (for example substrate) model, according to above-mentioned another (for example substrate) model generate the operation (F) that engages intermediate file near the distance and the rigidity between them of the intersection point of unit cut-off rule; With combining and form the operation (D-2) of analytical model with the joint unit of the mounting condition equivalence of above-mentioned parts and above-mentioned joint intermediate file, the substrate neutral surface that will calculate from the stacked Shell model of substrate with from the parts neutral surface that the stacked Shell model of parts calculates; And the operation (E) that provides boundary condition to calculate distortion to above-mentioned analytical model.Operation (B) also can be in operation (A) front.

Specifically, shown in Figure 22 (a), for stacked Shell model 11 of substrate and the stacked Shell model 19 of parts wanted by operation (D-2) combination, because the grid that the unit of the grid of the unit cut-off rule of the parts installation site of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts is cut apart is inconsistent, so in operation (F), shown in Figure 22 (b), if the front end of the beam element 28 that is connected with the position P2 of the external connection terminals 21 of the stacked Shell model 19 of parts is P1, the length of beam element 28 is 11, the rigidity of beam element 28 is k1, when installing on the parts installation site of the stacked Shell model 11 of substrate under the situation of the stacked Shell model 19 of parts, if the position of the stacked Shell model 11 of aforesaid substrate of the front end P1 of beam element 28 contact is P1a, and the intersection point of establishing the grid of the unit cut-off rule on the stacked Shell model 11 of substrate is P3, P4, and the distance of establishing position P1a and intersection point P3 is 12, rigidity between position P1a and the intersection point P3 is k2, the distance of position P1a and intersection point P4 is 13, rigidity between position P1a and the intersection point P4 is k3, consider distance 11,12,13 and rigidity k1, k2, k3 engages intermediate file thereby generate.

In operation (D-2), by using joint unit and the above-mentioned intermediate file that engages with the mounting condition equivalence of above-mentioned parts, substrate neutral surface that will be calculated by the stacked Shell model 11 of substrate and the parts that calculated by the stacked Shell model 19 of parts combine.By like this, because will be assigned to node P1, P3, P4 in the power that binding site P1a produces, so can form the state of the state equivalence consistent with the grid of the unit cut-off rule of the grid of the unit cut-off rule of the parts installation site of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts, even do not carry out above-mentionedly cutting apart again, can access the analytical model of target yet.In operation (E), provide boundary condition to calculate distortion to the above-mentioned analytical model that generates by operation (D-2).In addition, the operation of Figure 21 (B) also can be in the front of operation (A).

In addition, as shown in figure 25, operation (D-2) analytical model 29 that to be the beam element 28 that is used as joint unit carry out combination with the parts neutral surface 26 of the substrate neutral surface 14 of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts, but under situation about multi-layer wire substrate and parts being engaged with the salient point of solder ball etc., being to use joint unit is not beam element 28 but as shown in figure 26 by the situation of the analytical model 29 of solid element 31 combinations, engages intermediate file and analyzes even so can use yet.

Adopt above-mentioned joint intermediate file also identical under the situation of Figure 18, Figure 20 with Figure 21.

The situation of Figure 18 as shown in figure 23, in operation (A), according to each layer profile of multi-layer wire substrate and the wiring figure of each layer, generate with the unit cut-off rule every layer the single-layer model that has carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate is the stacked Shell model of substrate of above-mentioned multi-layer wire substrate shape with the single-layer model of each above-mentioned each layer is stacked.In operation (B-2), write down according to the profile of above-mentioned parts and inner structure and the bonding station by above-mentioned parts and multi-layer wire substrate surface above-mentioned from corresponding each parts and to engage cut-off rule, to have carried out reading the stacked Shell model of above-mentioned parts the database of the stacked Shell model of parts cut apart the unit.In operation (F), when the position of unit cut-off rule engages with the stacked Shell model of the inconsistent above-mentioned parts of the stacked Shell model of substrate on will the installation site on above-mentioned parts and the surface of the stacked Shell model of substrate, for with the combining near the intersection point of unit cut-off rule of the intersection point of the unit cut-off rule of a model among stacked Shell model of substrate and the stacked Shell model of parts and another model, according to engaging intermediate file with generating near the distance of the intersection point of unit cut-off rule and the rigidity between them of above-mentioned another model.In operation (D-2), with with the joint unit and the above-mentioned intermediate file that engages of the mounting condition equivalence of above-mentioned parts, substrate neutral surface that will calculate from the stacked Shell model of substrate and the parts neutral surface combination that calculates from the stacked Shell model of parts, and form analytical model.In operation (E), provide boundary condition to calculate distortion to above-mentioned analytical model.In addition, the operation of Figure 23 (B-2) also can be in the front of operation (A).

The situation of Figure 20 as shown in figure 24, in operation (A), according to each layer profile of multi-layer wire substrate and the wiring figure of each layer, generate with the unit cut-off rule every layer the single-layer model that has carried out in each layer cutting apart, each layer thickness information separately that regeneration uses above-mentioned multi-layer wire substrate is the stacked Shell model of substrate of above-mentioned multi-layer wire substrate shape with the single-layer model of each above-mentioned each layer is stacked.In operation (B-3), to from the parts database that writes down corresponding to parts, read from engage the parts neutral surface that the stacked Shell model of parts that cut-off rule cut apart with the unit cut-off rule calculates according to the profile of parts and inner structure and the bonding station by above-mentioned parts and multi-layer wire substrate surface above-mentioned.In operation (F), when the position of unit cut-off rule engages with the stacked Shell model of the inconsistent above-mentioned parts of the stacked Shell model of substrate on will the installation site on above-mentioned parts and the surface of the stacked Shell model of substrate, for with the combining near the intersection point of unit cut-off rule of the intersection point of the unit cut-off rule of a model among stacked Shell model of substrate and the stacked Shell model of parts and another model, according to engaging intermediate file with generating near the distance of the intersection point of unit cut-off rule and the rigidity between them of above-mentioned another model.In operation (D-2), with with the joint unit and the above-mentioned intermediate file that engages of the mounting condition equivalence of above-mentioned parts, substrate neutral surface that will calculate from the stacked Shell model of substrate and the parts neutral surface combination that calculates from the stacked Shell model of parts, and form analytical model.In operation (E), provide boundary condition to calculate distortion to above-mentioned analytical model.In addition, the operation of Figure 24 (B-3) also can be in the front of operation (A).

In addition, as shown in figure 25, operation (D-2) analytical model 29 that to be the beam element 28 that is used as joint unit carry out combination with the parts neutral surface 26 of the substrate neutral surface 14 of the stacked Shell model 11 of substrate and the stacked Shell model 19 of parts, but under situation about multi-layer wire substrate and parts being engaged with the salient point of solder ball etc., being to use joint unit is not beam element 28 but as shown in figure 26 by the situation of the analytical model 29 of solid element 31 combinations, engages intermediate file and analyzes even so can use yet.Though in Figure 26 the expression according to a salient point in conjunction with the place, utilize the position of solid element 31 combinations to have salient point quantity.

In addition, the component mounting board routine analyzer that moves in robot calculator 6 for the method for analyzing component mounting board of carrying out above-mentioned each example can write in the storage medium and circulate.In addition, also can give terminal, it is installed in the robot calculator move through dispensings such as the Internet wirings.

In above-mentioned each example, when with combining unit during, use concrete example in conjunction with intermediate file shown in Figure 27 (a), Figure 27 (b), Figure 27 (c) as solid element 31.In addition, adopt above-mentioned joint intermediate file on calculating, to make contact junction surface separately expression on drawing that node is consistent and engage here.And 3 dimension shapes of the solid element 31 of the salient point of solder ball etc. be the center section shown in as shown in figure 26 cylindrical or this Figure 27 expand cylindrical, the node of the node of the parts side of solid element 31 and the substrate-side of solid element 31 is concentric circles and arranges.

The inconsistent state of node of the substrate-side node of the parts side gusset of Figure 27 (a) presentation-entity unit 31 but solid element 31 consistent and the substrate neutral surface 14 of the stacked Shell model 11 of substrate with the node of the parts neutral surface 26 of the stacked Shell model 19 of parts.At this moment, use above-mentioned joint intermediate file, the node of the substrate-side of solid element 31 is combined with the node equivalence of the substrate neutral surface 14 of the stacked Shell model 11 of substrate.

The inconsistent state of node of the parts side gusset of the substrate-side node of Figure 27 (b) presentation-entity unit 31 but solid element 31 consistent and the parts neutral surface 26 of the stacked Shell model 19 of parts with the node of the substrate neutral surface 14 of the stacked Shell model 19 of substrate.At this moment, use above-mentioned joint intermediate file, the node of the parts side of solid element 31 is combined with the node equivalence of the substrate neutral surface 26 of the stacked Shell model 19 of parts.

Figure 27 (c) is that the node of parts neutral surface 26 of the parts side gusset of solid element 31 and the stacked Shell model 19 of parts is inconsistent, and the also inconsistent state of node of the substrate neutral surface 14 of the substrate-side node of solid element 31 and the stacked Shell model 11 of substrate, at this moment, use above-mentioned joint intermediate file, the node of the substrate-side of solid element 31 is combined with the node equivalence of the substrate neutral surface 14 of the stacked Shell model 11 of substrate, and use above-mentioned joint intermediate file, the node of the parts side of solid element 31 is combined with the node equivalence of the substrate neutral surface 26 of the stacked Shell model 19 of parts.

In addition, when the node of the substrate neutral surface 14 of the substrate-side node of solid element 31 and the stacked Shell model 11 of substrate takes place under the inconsistent situation, by with the substrate-side node of solid element 31 as benchmark, the stacked Shell model 11 of substrate is cut apart again, can not used above-mentioned joint intermediate file and carry out combination.Specifically, at first shown in Figure 28 (a), uppermost n layer for multi-layer wire substrate, determine each node 32 consistent with the substrate-side node of solid element 31, and will not that the zone of each node 32 is shown in Figure 28 (b), according to the profile of above-mentioned multi-layer wire substrate and the wiring figure of each layer, with cutting apart again in 33 pairs of each layers of unit cut-off rule, the remaining zone of not cutting apart in Figure 28 (a) and Figure 28 (b) around each node 32 is cut apart by cut-off rule 34 again, and generated single-layer model.For n-1 layer ..., the 2nd layer, the 1st layer, also similarly cut apart again, each layer thickness information separately of the above-mentioned multi-layer wire substrate of generation employing will have been finished and cut apart the stacked Shell model of substrate that above-mentioned every layer later single-layer model is laminated into the shape of above-mentioned multi-layer wire substrate again, be used to complete the substrate neutral surface 14 of the stacked Shell model 11 of this substrate of cutting apart again again in analysis.

In addition, node at the parts neutral surface 26 of the parts side gusset of solid element 31 and the stacked Shell model 19 of parts takes place under the inconsistent situation, with the parts side gusset of solid element 31 as benchmark, identical with Figure 28, to stacked Shell model 19 decisions of parts each node 32 consistent with the parts side gusset of solid element 31, and according to above-mentioned parts with the unit cut-off rule to not being that the zone of each node 32 is cut apart again, the remaining zone of not cutting apart around each node 32 is cut apart again, generate single-layer model, the stacked shape that becomes above-mentioned parts of each single-layer model of single-layer model will be generated, generate the parts Shell model, in analysis, be used to complete the parts neutral surface 26 of the stacked Shell models 19 of these parts of cutting apart again again, thereby can not used above-mentioned joint intermediate file and carry out combination.

Industrial practicality

If according to the present invention, then for the plate body of multi-layer wire substrate, semiconductor integrated circuit etc. should Power is analyzed, by less calculation procedure, can access analysis result at short notice, especially for design The change correction of the cad data in the operation, the change correction of the CAM data in the production process are very effective.

Claims

1. method for analyzing component mounting board is characterized in that:

When analyzing the physical characteristics of the component mounting board that parts have been installed on the multi-layer wire substrate surface, have:

Generate the operation (A) of every layer single-layer model, the regeneration that has carried out in each layer cutting apart being used each layer thickness information separately stacked Shell model of substrate that the single-layer model of each described each layer is stacked with the unit cut-off rule according to each layer profile of described multi-layer wire substrate and the wiring figure of each layer;

According to the bonding station on described parts and described multi-layer wire substrate surface, generate the operation (B) of the stacked Shell model of having cut apart with the unit cut-off rule of parts;

The unit cut-off rule that uses when generating the stacked Shell model of parts, the operation (C) that the installation site of the described parts of the stacked Shell model of described substrate is cut apart again;

With being beam element or solid element, the substrate neutral surface that will calculate from the described stacked Shell model of having cut apart again of substrate with the joint unit of the mounting condition equivalence of described parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model;

And the operation (E) that provides boundary condition to calculate distortion to described analytical model.

2. a method for analyzing component mounting board is characterized in that,

Generate the operation (A-2) of every layer single-layer model, the regeneration that has carried out in each layer cutting apart being used each layer thickness information separately stacked Shell model of substrate that the single-layer model of each described each layer is stacked with the unit cut-off rule according to the wiring figure of the profile of described multi-layer wire substrate and each layer and the position of parts being carried out the terminal pad of mounted on surface;

With being beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of described parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model;

3. the method for analyzing component mounting board described in claim 1 or 2 is characterized in that:

Be beam element or solid element with joint unit with substrate neutral surface and parts neutral surface in conjunction with and form in the operation (D) of analytical model,

With between stacked Shell model of described substrate and the stacked Shell model of described parts except with described joint unit being the node of the resene grafting material area the node of beam element or solid element combination, combine with the joint unit of physical strength, come the computational analysis model with the resin-bonded material equivalence of described resene grafting material area.

4. method for analyzing component mounting board is characterized in that:

Generate the operation (A) of every layer single-layer model, the regeneration that has carried out in each layer cutting apart being used each layer thickness information separately stacked Shell model of substrate that the single-layer model of each described each layer is stacked with the unit cut-off rule according to the profile of described multi-layer wire substrate and the wiring figure of each layer;

Write down according to the profile of described parts and inner structure and the bonding station by described parts and described multi-layer wire substrate surface described from corresponding each parts and to engage cut-off rule, to have carried out the operation (B-2) of reading the stacked Shell model of described parts the parts database of the stacked Shell model of parts cut apart the unit;

The operation of the installation site of the described parts of the stacked Shell model of described substrate being cut apart again with the unit cut-off rule of the stacked Shell model of parts (C);

With being beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of described parts and combining from the described parts neutral surface that the stacked Shell model of parts calculates and form the operation (D) of analytical model;

5. method for analyzing component mounting board is characterized in that:

Write down according to the profile of described parts and inner structure and by engaging cut-off rule with the bonding station on described multi-layer wire substrate surface described, having carried out the operation (B-2) of reading the stacked Shell model of described parts the parts database of the stacked Shell model of parts cut apart the unit from corresponding each parts;

6. method for analyzing component mounting board is characterized in that:

Will be from according to the profile of parts and inner structure and by engage the parts neutral surface that the stacked Shell model of parts that cut-off rule cut apart with the unit cut-off rule calculates, the operation (B-3) of from the parts database that writes down corresponding to parts, reading with the bonding station on described multi-layer wire substrate surface described;

7. method for analyzing component mounting board is characterized in that:

With being that beam element or solid element, the substrate neutral surface that will calculate from the stacked Shell model of substrate and described parts neutral surface combine and form the operation (D) of analytical model with the joint unit of the mounting condition equivalence of described parts;

8. method for analyzing component mounting board is characterized in that:

When the position of unit cut-off rule engages with the stacked Shell model of the inconsistent described parts of the stacked Shell model of substrate on will the installation site on described parts and the surface of the stacked Shell model of substrate, for combining near the intersection point of unit cut-off rule with the intersection point of the unit cut-off rule of a model among stacked Shell model of substrate and the stacked Shell model of parts and another model, according to described another model generate the operation (F) that engages intermediate file near the distance and the rigidity between them of the intersection point of unit cut-off rule;

With being beam element or solid element and described joint intermediate file, the substrate neutral surface that will calculate from the stacked Shell model of substrate with the joint unit of the mounting condition equivalence of described parts and combining from the parts neutral surface that the stacked Shell model of parts calculates and form the operation (D-2) of analytical model;

9. method for analyzing component mounting board is characterized in that:

10. a method for analyzing component mounting board is characterized in that