CN100489523C

CN100489523C - Composite detection system of sealed electromagnetic relay residue micro-particle

Info

Publication number: CN100489523C
Application number: CNB200510010203XA
Authority: CN
Inventors: 翟国富; 王世成; 张辉; 高宏亮; 余琼; 王淑娟
Original assignee: Harbin Institute of Technology
Current assignee: Harbin Institute of Technology
Priority date: 2005-07-20
Filing date: 2005-07-20
Publication date: 2009-05-20
Anticipated expiration: 2025-07-20
Also published as: CN1719251A

Abstract

The present invention relates to a method for detecting excess material particles in the sealed electromagnetic relay and its detection system. Said invention provides all the electric components formed into said detection system and their connection mode. Said invention utilizes the tested dynamic parameters to effectively detect out the excess material particles existed between sealed electromagnetic relay armature iron and electrode face, and utilizes the dynamic parameter sequence to judge size of excess material and its hazard extent to said relay function.

Description

The complex detection system of sealed electromagnetic relay excess micro-particle

Technical field：

Present invention relates particularly to the detection method of fifth wheel inside relay.

Background technology：

Relay is widely used in industry spot, particularly aerospace relay and is widely used in the national defences such as military affairs, Aeronautics and Astronautics.Relay plays vital effect in terms of control, navigation and monitoring, thus it is guaranteed that relay function is normal, not breaking down is to ensure that the key of Mission Success and personnel and equipment safety.Hermetically sealed electromagnetic relay is in manufacture, seal process, the particles such as some dusts, plastics bits, scolding tin are easy to be encapsulated in relay and be attached on relay internals to form excess micro-particle, and these excess micro-particles are a principal elements for causing relay failure.Because the design basis of China's relay at this stage is theoretical weak, manufacturing technology level is not high, the generation that excess micro-particle is eliminated from root can not also be realized, therefore, it can only detect whether contain excess micro-particle in relay by certain method, then reject the relay containing excess micro-particle.Fifth wheel detection technique for studying hermetically sealed electromagnetic relay, particularly the fifth wheel detection technique and precautionary measures of research aerospace relay are to ensureing that whole Defensive Avionics System, especially satellite, guided missile, the reliability of manned space flight airship have important theory significance and practical value.

At present, it is conventional both at home and abroad to be used to detect whether the method containing fifth wheel is PIND methods (i.e. Grain crushing method) and Matrah method to relay, relay is detected using Matrah method, the static parameters such as contact resistance, insulaion resistance i.e. in vibration by monitoring sealed relay contact, directly detect the presence of excess micro-particle from function harm of the excess micro-particle to relay.Extension and supplement of the Matrah method as PIND methods, although the various metals for sealed relay contact disabler of sening as an envoy to can be detected effectively, nonmetallic fifth wheel particle, but Matrah method can only detect the static parameters such as the contact resistance and insulaion resistance of hermetically sealed electromagnetic relay contact, the failure of these parameters whether there is fifth wheel particle between can only reflecting contact, and it is helpless and can not reflect that excess micro-particle has much to the degree that relay function causes harm for the excess micro-particle (be generally ferromagnetism excess micro-particle) being present between the armature of relay and pole-face, thus the potential significance of Matrah method test parameter is little, and it is less efficient.

The content of the invention：

It is low the invention aims to solve existing Matrah method detection efficiency, the problem of excess micro-particle being present between hermetically sealed electromagnetic relay armature and pole-face can not be determined and the extent of injury that excess micro-particle is caused to relay can not be further analyzed, so that there is provided a kind of complex detection system of sealed electromagnetic relay excess micro-particle.The present invention includes being used for the shaking platform 2 of fixed tested hermetically sealed electromagnetic relay, it also includes processor 3, drive control circuit 4, data acquisition storage circuit 5, circuit 6 occurs for synchronous triggering signal, relay coil current measurement circuit 7, relay contact parameter measurement circuit 8, the signal input part of the multi-way control signals output end connection drive control circuit 4 of processor 3, the measurement data output end of the multichannel measurement data input pin connection data acquisition storage circuit 5 of processor 3, the measured relay control signal input of circuit 6 occurs for the single channel control signal output connection synchronous triggering signal of drive control circuit 4, the measured relay control signal input of the measured relay control signal output connection relay coil current measurement circuit 7 of circuit 6 occurs for synchronous triggering signal, circuit 6 occurs for the multi-way control signals output end connection synchronous triggering signal of drive control circuit 4, the control signal input of relay coil current measurement circuit 7 and relay contact parameter measurement circuit 8, the external trigger signal input part of the trigger signal output end connection data acquisition storage circuit 5 of circuit 6 occurs for synchronous triggering signal, the coil current measurement data input of the multichannel measurement data output end connection data acquisition storage circuit 5 of relay coil current measurement circuit 7, the contact parameter measurement data input of the multichannel measurement data output end connection data acquisition storage circuit 5 of relay contact parameter measurement circuit 8.

Operation principle：The shaking platform 2 for being used for fixed tested hermetically sealed electromagnetic relay of the present invention is that tested hermetically sealed electromagnetic relay 1 provides vibration environment, only under vibration, being encapsulated in the excess micro-particle in tested hermetically sealed electromagnetic relay 1 and being attached on the tested internals of hermetically sealed electromagnetic relay 1 just can be moved between transfer contact or be moved between armature and pole-face, then detect that the static parameter of tested hermetically sealed electromagnetic relay 1 can be used for judging whether there is excess micro-particle between contact, detect that its dynamic parameter can be used for judging whether there is excess micro-particle between armature and pole-face and evaluate it to the influence degree for the function of being tested hermetically sealed electromagnetic relay 1.The present invention is on the basis of Matrah method detection hermetically sealed electromagnetic relay static parameter, to extend composite method formed by the detection to hermetically sealed electromagnetic relay dynamic parameter.The detection of electromagnetic relay dynamic parameter such as super-path time, actuation time etc. relies primarily on synchronous detection relay coil current signal and contact voltage signal, is obtained by signal analysis；And static parameter refers mainly to the contact resistance and insulaion resistance between transfer contact, by detecting electric signal conversion acquisition.The relay contact parameter measurement circuit 8 of the present invention is the contact voltage waveform for measuring the contact resistance, insulaion resistance and actuating of relay process of the transfer contact of tested hermetically sealed electromagnetic relay 1；When to obtain the static parameter of tested hermetically sealed electromagnetic relay 1, processor 3, which provides the control signal of drive control circuit 4, to be made the contact resistance or insulation resistance data between the transfer contact of the tested hermetically sealed electromagnetic relay 1 of the measurement of relay contact parameter measurement circuit 8 and measurement data is stored in data acquisition storage circuit 5, and processor 3 can read static parameter measurement data from data acquisition storage circuit 5 when needed；When to obtain the dynamic parameter of tested hermetically sealed electromagnetic relay 1, processor 3, which starts synchronous triggering signal by drive control circuit 4 and occurs circuit 6, to work and produces synchronous triggering signal, under the external trigger signal, the coil measurement signal of the synchronous acquisition relay coil current measurement circuit 7 of data acquisition storage circuit 5 and the contact-voltage measuring data of relay contact parameter measurement circuit 8, processor 3 measurement data of read coil electric current and contact voltage and are compared and analyzed the dynamic parameter of tested hermetically sealed electromagnetic relay 1 from data acquisition storage circuit 5 again.

Invention effect：The present invention can detect hermetically sealed electromagnetic relay static parameter, the dynamic parameter of hermetically sealed electromagnetic relay can be detected again, using testing the excess micro-particle that dynamic parameter can effectively detect to be present between hermetically sealed electromagnetic relay armature and pole-face, and judge according to the change of dynamic parameter sequence the extent of injury that the size and the excess micro-particle of excess micro-particle are caused to hermetically sealed electromagnetic relay function.During using the shake table and its drive system of PIND instrument as the shaking platform 2 that hermetically sealed electromagnetic relay is tested for fixing, the present invention obtains experimental result as shown in Figure 7 and Figure 8：A curves in Fig. 7 are the coil current dynamic waveform figures for the tested hermetically sealed electromagnetic relay 1 that the present invention is collected, and b curves are the contact voltage dynamic waveforms of the transfer contact for the tested hermetically sealed electromagnetic relay 1 that the present invention is collected；As shown in figure 8, the sequence of hermetically sealed electromagnetic relay armature closing time, i.e., according to Fig. 7 analyze come tested hermetically sealed electromagnetic relay 1 dynamic parameter.By the way that Fig. 9 and Fig. 7 is carried out to when analyzing the data in Fig. 8, the test error of all static parameters of the invention can be shown within 5%, the test error of dynamic parameter is within 1%.As shown in figure 8, the cycle tests of analysis contact resistance can find there is a larger undulating value (508.34m Ω), now hermetically sealed electromagnetic relay closure contact is sandwiched between a metal excess micro-particle；The cycle tests of analysis insulaion resistance can be found, there is also the large change of insulaion resistance (88.67M Ω), a larger metal excess micro-particle is now accompanied between hermetically sealed electromagnetic relay break contact；The cycle tests of dynamic parameter armature adhesive is analyzed, it can be found that armature closing time is there is also a larger undulating value (6.64ms), now the armature and pole-face of relay are in the presence of a less excess micro-particle of diameter；From above-mentioned test data analyzer, the present invention is for being present between hermetically sealed electromagnetic relay contact, the various excess micro-particles between armature and pole-face relatively effective can detect and can also judge the size of excess micro-particle, and it improves the detection efficiency of excess micro-particle.The present invention carrys out the reliability index of Comprehensive Assessment electromagnetic relay also using the coil current waveform obtained in test process.The present invention is the PIND methods and the great supplement of Ma Te daraf(reciprocals of farad) to excess micro-particle in detection electromagnetic relay, if used cooperatively using the present invention with PIND detection methods, has complementary advantages, can greatly improve the detectability to sealed electromagnetic relay excess micro-particle.

Brief description of the drawings：

Fig. 1 is the overall structure diagram of the present invention, Fig. 2 is the structural representation of embodiment two, Fig. 3 is the structural representation of embodiment three, Fig. 4 is the structural representation of embodiment four, Fig. 5 is the structural representation of embodiment five, Fig. 6 is the circuit structure diagram of embodiment six, Fig. 7 is the dynamic waveform figure for the tested hermetically sealed electromagnetic relay 1 that the present invention is collected, Fig. 8 be the invention detects that tested hermetically sealed electromagnetic relay 1 static parameter and according to Fig. 7 analyze come tested hermetically sealed electromagnetic relay 1 dynamic parameter, Fig. 9 is the waveform of coil current in theory during relay adhesive action and contact voltage.

Embodiment：

Embodiment one：Illustrate present embodiment with reference to Fig. 1,Present embodiment is by being tested hermetically sealed electromagnetic relay 1,Shaking platform 2 for fixed tested hermetically sealed electromagnetic relay,Processor 3,Drive control circuit 4,Data acquisition storage circuit 5,Circuit 6 occurs for synchronous triggering signal,Relay coil current measurement circuit 7,Relay contact parameter measurement circuit 8 is constituted,The signal input part of the multi-way control signals output end connection drive control circuit 4 of processor 3,The measurement data output end of the multichannel measurement data input pin connection data acquisition storage circuit 5 of processor 3,The measured relay control signal input of circuit 6 occurs for the single channel control signal output connection synchronous triggering signal of drive control circuit 4,The measured relay control signal input of the measured relay control signal output connection relay coil current measurement circuit 7 of circuit 6 occurs for synchronous triggering signal,Circuit 6 occurs for the multi-way control signals output end connection synchronous triggering signal of drive control circuit 4,The control signal input of relay coil current measurement circuit 7 and relay contact parameter measurement circuit 8,The external trigger signal input part of the trigger signal output end connection data acquisition storage circuit 5 of circuit 6 occurs for synchronous triggering signal,The coil current measurement data input of the multichannel measurement data output end connection data acquisition storage circuit 5 of relay coil current measurement circuit 7,The contact parameter measurement data input of the multichannel measurement data output end connection data acquisition storage circuit 5 of relay contact parameter measurement circuit 8,Tested hermetically sealed electromagnetic relay 1 is fixed on the shaking platform 2 for fixed tested hermetically sealed electromagnetic relay,The coil current signal output end of the tested hermetically sealed electromagnetic relay 1 of measurement data input connection of relay coil current measurement circuit 7,The signal output part of the transfer contact of the tested hermetically sealed electromagnetic relay 1 of measurement data input connection of relay contact parameter measurement circuit 8.

It is used for the shaking platform 2 of fixed tested hermetically sealed electromagnetic relay in present embodiment using the shake table and its drive system of PIND instrument.The present invention can constantly detect the static parameter and dynamic parameter with split-phase relay in actually detected experiment using the vibration environment of PIND instrument, obtain the time series of static parameter and dynamic parameter.

Embodiment two：Illustrate present embodiment with reference to Fig. 1 and Fig. 2, the difference of present embodiment and embodiment one is：Drive control circuit 4 is by isa bus 4-1, D/A modular converters 4-2, multi-way switching values output circuit 4-3, power amplification circuit 4-4 and multiple isolated drive circuit 4-5 compositions, signal input part of the multi-way control signals output end of processor 3 by isa bus 4-1 respectively with D/A modular converters 4-2 and multi-way switching values output circuit 4-3 is connected, a D/A modular converters 4-2 signal output part connection power amplification circuit 4-4 signal input part, power amplification circuit 4-4 another signal input part ground connection, the measured relay control signal input of circuit 6 occurs for power amplification circuit 4-4 signal output part connection synchronous triggering signal, multi-way switching values output circuit 4-3 each signal output part connects isolated drive circuit 4-5 input respectively.Other compositions and annexation are identical with embodiment one.

The processor 3 of present embodiment uses CPU to realize that it possesses eight ISA extension grooves and four pci expansion slots for PIII866 industrial computer, there is standard external input and output configuration；Drive control circuit 4 is that the DA cards based on ISA extension groove are realized, the fixture is for 1 DA passage and power amplification circuit and 32 way switch amount output circuits.D/A modular converters 4-2 output voltages are 0~5V in present embodiment, are 0~30V by the power amplification circuit 4-4 voltages exported, power amplification circuit 4-4 signal output part (VR) is positive polarity output terminal；Multi-way switching values change-over circuit 4-4 can export 32 way switch amount signals, that is M=32,32 way switch amount signals export 32 tunnel control signals (IO1~IO32) respectively through isolated drive circuit 4-5, and this 32 tunnel control signal (IO1~IO32) can be used for driving synchronous triggering signal to occur each control component work in circuit 6, relay coil current measurement circuit 7 and relay contact parameter measurement circuit 8.

Embodiment three：Illustrate present embodiment with reference to Fig. 1 and Fig. 3, the difference of present embodiment and embodiment one is：Data acquisition storage circuit 5 is by pci bus 5-1, clock control circuit 5-2, PCI protocol conversion interface circuits 5-3, local bus 5-4 and at least two groups A/D conversions and storage circuit 5-5 compositions, the multichannel measurement data input pin of processor 3 is connected by pci bus 5-1 with PCI protocol conversion interface circuits 5-3 data output end, clock control circuit 5-2 control signal output connection PCI protocol conversion interface circuits 5-3 control signal input, the trigger signal output end of circuit 6 occurs for clock control circuit 5-2 external trigger signal input part connection synchronous triggering signal, every group of A/D conversion and storage circuit 5-5 are by RAM memory modules 5-5-1, A/D modular converters 5-5-2 and level conversion and amplifying circuit 5-5-3 compositions, level conversion and amplifying circuit 5-5-3 output end connection A/D modular converters 5-5-2 data input pin in every group of A/D conversion and storage circuit 5-5, A/D modular converters 5-5-2 data output end connection RAM memory modules 5-5-1 data input pin in every group of A/D conversion and storage circuit 5-5, every group of A/D conversion and storage circuit 5-5 RAM memory modules 5-5-1 data output end are all connected by local bus 5-4 with PCI protocol conversion interface circuits 5-3 data input pin, clock control circuit 5-2 each clock signal output terminal connects one group of A/D conversion and storage circuit 5-5 RAM memory module 5-5-1 and A/D modular converters 5-5-2 clock signal terminal respectively.PCI protocol conversions interface circuit 5-3 master chip model PCI9030 in present embodiment, clock control circuit 5-2 master chip model EPM7128STC100, A/D modular converters 5-5-2 master chip model ADS802 in RAM memory modules 5-5-1 master chip model IS61C64 in every group of A/D conversion and storage circuit 5-5, every group of A/D conversion and storage circuit 5-5.Other compositions and annexation are identical with embodiment one.

The data acquisition storage circuit 5 of present embodiment is that the CPU used based on processor 3 is realized for the pci expansion slot of PIII866 industrial computer, it is the Key Circuit of the accurate dynamic parameter for obtaining tested hermetically sealed electromagnetic relay 1, and it is made up of multi-channel synchronous high-speed data acquistion system；At least one group A/D conversion and storage circuit 5-5 are used for the coil current signal for gathering tested hermetically sealed electromagnetic relay 1 in data acquisition storage circuit 5, and at least one group A/D conversion and storage circuit 5-5 are used for the transfer contact parameter for gathering tested hermetically sealed electromagnetic relay 1；The trigger signal of synchronous triggering signal generation circuit 6 controls the measurement data of multigroup A/D conversions and storage circuit 5-5 synchronous acquisition relay coils current measurement circuit 7 and relay contact parameter measurement circuit 8 after clock control circuit 5-2.The number of the clock control circuit 5-2 of data acquisition circuit 5 clock signal output terminal is equal to A/D conversions and storage circuit 5-5 group number, and A/D conversions and storage circuit 5-5 coil number and transfer contact group number sum of the group number equal to tested hermetically sealed electromagnetic relay 1 for organizing coil number and transfer contact group number that number depends on tested hermetically sealed electromagnetic relay 1, i.e. A/D conversions and storage circuit 5-5.

Embodiment four：Illustrate present embodiment with reference to Fig. 1, Fig. 3 and Fig. 4, the difference of present embodiment and embodiment one is：Relay coil current measurement circuit 7 is made up of at least one set of relay coil sampling conversion amplifying circuit 7-1；Relay contact parameter measurement circuit 8 is made up of at least one set of relay contacts resistance/insulaion resistance/contact-voltage measuring circuit 8-1, the multi-way control signals output end connection of drive control circuit 4 is per group relay coil sampling conversion amplifying circuit 7-1 and the control signal input per group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1, the measured relay control signal output connection of circuit 6 occurs for synchronous triggering signal per group relay coil sampling conversion amplifying circuit 7-1 measured relay control signal input, each group relay coil sampling conversion amplifying circuit 7-1 measurement data output end connects the level conversion and amplifying circuit 5-5-3 data input pin of one group of A/D conversion and storage circuit 5-5 in data acquisition storage circuit 5 respectively, each group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 measurement data output end also connects one group of A/D conversions in data acquisition storage circuit 5 and storage circuit 5-5 level conversion and amplifying circuit 5-5-3 data input pin respectively.Other compositions and annexation are identical with embodiment one.

As shown in figure 4, tested hermetically sealed electromagnetic relay 1 is made up of at least one coil 1-1 and at least one set transfer contact 1-2, the static state and dynamic parameter of the sealed relay containing multiple coils and multigroup transfer contact, such as aerospace relay can be measured using the present invention；A coil 1-1 be to that should have group relay coil sampling conversion amplifying circuit 7-1 to be used for the coil current signal for measuring this coil in tested hermetically sealed electromagnetic relay 1, and this described group relay coil sampling conversion amplifying circuit 7-1 to should there is one group of A/D conversion and storage circuit 5-5 to be used for gather and store this group relay coil sampling conversion amplifying circuit 7-1 measure described in this coil current signal；One group of transfer contact 1-2 measures that should have a group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 to be used for the contact parameter of this group of transfer contact in tested hermetically sealed electromagnetic relay 1, and this described group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 this group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 described in should having one group of A/D conversion and storage circuit 5-5 to be used for gather and store is measured described in this group of transfer contact contact parameter.It can be seen from the explanation of embodiment three, A/D conversions and storage circuit 5-5 group number in data acquisition storage circuit 5, this three is mutually equal with transfer contact group number sum with the coil number of tested hermetically sealed electromagnetic relay 1 for the repeat circuit coil of relay coil current measurement circuit 7 sampling conversion amplifying circuit 7-1 and the repeat circuit contact resistance of relay contact parameter measurement circuit 8/insulaion resistance/contact-voltage measuring circuit 8-1 group number sum, so A/D conversions and storage circuit 5-5 in the present invention can be adjusted according to the model of tested hermetically sealed electromagnetic relay 1, relay coil sampling conversion amplifying circuit 7-1 and relay contacts resistance/insulaion resistance/contact-voltage measuring circuit 8-1 group number.Relay coil sampling conversion amplifying circuit 7-1 principle is to obtain relay coil current signal using sample resistance, recycles operational amplifier that coil current sampled signal is amplified into the voltage range that data acquisition storage circuit 5 can be recognized correctly.Provided according to American army mark specification, in the coil current sampling of tested hermetically sealed electromagnetic relay 1, sample resistance is small as far as possible, in order to avoid change the time constant of tested hermetically sealed electromagnetic relay 1, the measuring accuracy of the dynamic parameter of the tested hermetically sealed electromagnetic relay 1 of influence, the resistance of general sample resistance is less than the 1/20 of the coil resistance of tested hermetically sealed electromagnetic relay 1.

Embodiment five：Illustrate present embodiment with reference to Fig. 1, Fig. 3, Fig. 4 and Fig. 5, the difference of present embodiment and embodiment four is：Every group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 in relay contact parameter measurement circuit 8 is by signal gating circuit 8-1-1,Relay contacts resistance test circuit 8-1-2,Relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 compositions,The multi-way control signals output end connection signal gating circuit 8-1-1 of drive circuit 4,Relay contacts resistance test circuit 8-1-2,Relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 control signal input,Relay contacts resistance test circuit 8-1-2,Relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 measurement data output end connect signal gating circuit 8-1-1 three measurement data inputs respectively,One group of A/D conversion and storage circuit 5-5 level conversion and amplifying circuit 5-5-3 data input pin in signal gating circuit 8-1-1 measurement data output end connection data acquisition storage circuit 5,Relay contacts resistance test circuit 8-1-2 normally-closed contact measurement signal input connects relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 normally-closed contact measurement signal input,Relay contacts resistance test circuit 8-1-2 normally opened contact measurement signal input connects relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 normally opened contact measurement signal input,Relay contacts resistance test circuit 8-1-2 measurement signal output end connects relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 measurement signal output end.Other compositions and annexation are identical with embodiment four.

As shown in Figure 5, each group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 repeat circuit contact resistance test circuits 8-1-2, relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 normally-closed contact measurement signal input is used for measuring the normally-closed contact of the transfer contact of the tested hermetically sealed electromagnetic relay 1 of connection corresponding with this group of relay contacts resistance/insulaion resistance/contact-voltage measuring circuit 8-1, each group relay contact resistance/insulated electro/contact-voltage measuring circuit 8-1 repeat circuit contact resistance test circuits 8-1-2, relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 normally opened contact measurement signal input is used for measuring the normally opened contact of the transfer contact of the tested hermetically sealed electromagnetic relay 1 of connection corresponding with this group of relay contacts resistance/insulaion resistance/contact-voltage measuring circuit 8-1, each group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1 repeat circuit contact resistance test circuits 8-1-2, relay insulation resistance test circuit 8-1-3 and relay contact-voltage Acquisition Circuit 8-1-4 measurement signal output end are used for measuring the common port of the transfer contact of the tested hermetically sealed electromagnetic relay 1 of connection corresponding with this group of relay contacts resistance/insulaion resistance/contact-voltage measuring circuit 8-1.Relay contacts resistance test circuit 8-1-2 principle is to make tested contact by certain electric current, and by testing the contact drop of contact, equivalent contact resistance value is gone out by Conversion Calculation.Provided according to American army mark associated test standards, the load of contact resistance or contact drop test is 6V (maximum)/10mA, and 28V/100mA can be selected after medium current experiment.Relay insulation resistance test circuit 8-1-3 principle is by applying higher test voltage to being tested clearance for insulation, by the leakage current of certain electric circuit inspection clearance for insulation, the test value of insulaion resistance being gone out by certain Conversion Calculation.Provided according to American army mark associated test standards, 60V relay is respectively less than for coil rating voltage and contact nominal load, the test voltage of insulaion resistance is DC100 ± 10%.The coil rating voltage and contact nominal load of the test object of pilot system of the present invention are respectively less than 60V, therefore are DC100 ± 10% according to army's mark selection test and excitation voltage.Relay contact-voltage Acquisition Circuit 8-1-4 function is mainly by gathering the contact voltage waveform in electromagnetic relay action process, to analyze contacts status.Load when contact voltage waveform acquisition is provided in army's mark is identical with the load that contact resistance is tested.

As shown in Figure 4 and Figure 5, using present embodiment when testing static parameter, processor 3 issues the control instruction of drive control circuit 4 so that relay contacts resistance test circuit 8-1-2 and relay insulation resistance test circuit 8-1-3 signal are linked into data acquisition storage circuit 5 by signal gating circuit 8-1-1, analog signal is changed into data signal by data acquisition storage circuit 5, data signal in data acquisition storage circuit 5 is read in handled again by processor 3, and analysis is calculated；When processor 3 changes the order of the tested state of hermetically sealed electromagnetic relay 1 to drive control circuit 4, the path that using synchronous triggering signal the coil formation of circuit 6, relay coil current measurement circuit 7 and tested hermetically sealed electromagnetic relay 1 occurs for the single channel control signal output (VR) of drive control circuit 4 gives the signal that tested hermetically sealed electromagnetic relay 1 changes state, then the static parameter of tested hermetically sealed electromagnetic relay 1 in another state just can be tested, test data is preserved.Present embodiment is before test dynamic parameter, processor 3 is according to the model of tested hermetically sealed electromagnetic relay 1, drive control circuit 4 is controlled to switch the sampling multiplication factor in relay coil current sampling conversion amplifying circuit 7-1, make relay coil current sampling translation circuit 7-1 output signal in the range of linearity of data acquisition storage circuit 5, relay contact-voltage Acquisition Circuit 8-1-4 signal is linked into data acquisition storage circuit 5 by command signal gating circuit 8-1-1 simultaneously, so as to obtain original Contrast's data；When testing adhesive dynamic parameter, the single channel control signal output of the control drive control of processor 3 circuit 4 gives the tested pumping signal of hermetically sealed electromagnetic relay 1, synchronous triggering signal occurs circuit 6 and gives the synchronous triggering signal of data acquisition storage circuit 5 according to pumping signal, then the synchronous acquisition relay coil current sampling of data acquisition circuit 5 converts amplifying circuit 7-1 and relay contact-voltage Acquisition Circuit 8-1-4 signal, after sampling is finished, processor 3 reads in original Contrast's data before the test dynamic parameter stored in data acquisition storage circuit 5, its signal for converting amplifying circuit 7-1 and relay contact-voltage Acquisition Circuit 8-1-4 with now relay coil current sampling is set to compare, analyze the dynamic parameter of attracting process, and obtained data and initial data upload will be analyzed or preserved；When testing release dynamics parameter, the single channel control signal output of the control drive control of processor 3 circuit 4 gives the tested power-off signal of hermetically sealed electromagnetic relay 1, circuit 6 occurs for synchronous triggering signal according to the signal of drive control circuit 4 to the synchronous triggering signal of data acquisition storage circuit 5 and log-on data store circuit 5, then the synchronous acquisition relay coil current sampling of data acquisition circuit 5 converts amplifying circuit 7-1 and relay contact-voltage Acquisition Circuit 8-1-4 signal, after sampling is finished, processor 3 reads in original Contrast's data before the test dynamic parameter stored in data acquisition storage circuit 5, it is set to be compared with the signal of now relay coil current sampling translation circuit 7 and relay contact-voltage Acquisition Circuit 8-1-4, and analyze the dynamic parameter of release process, obtained data will be analyzed and initial data is uploaded or preserved.

Embodiment six：Illustrate present embodiment with reference to Fig. 1, Fig. 2, Fig. 3, Fig. 5 and Fig. 6, the difference of present embodiment and embodiment four is：Data acquisition storage circuit 5 includes two groups of A/D conversions and storage circuit 5-5, circuit 6 occurs for synchronous triggering signal by relay U1, first resistor R1, second resistance R2, switch triode T1 and the first dc source+VA compositions, the positive ends of first dc source+VA output end connection relay U1 magnet exciting coil, first isolated drive circuit 4-5 control signal output in the negative polarity end connection drive control circuit 4 of relay U1 magnet exciting coil, power amplification circuit 4-4 signal output part in relay U1 stationary contact connection drive control circuit 4, relay U1 movable contact connection first resistor R1 one end, first resistor R1 other end connecting valve triode T1 base stage, switch triode T1 colelctor electrode connection second resistance R2 one end and the clock control circuit 5-2 of data store circuit 5 external trigger signal input part, the second resistance R2 other end connects the first dc source+VA output end, switch triode T1 grounded emitter；Relay coil current measurement circuit 7 is made up of group relay coil sampling conversion amplifying circuit 7-1,Amplifying circuit 7-1 is by the first double break electromagnetic relay U2 for relay coil sampling conversion,Second double break electromagnetic relay U3,3rd double break electromagnetic relay U4,3rd resistor R3,4th resistance R4,5th resistance R5,6th resistance R6,7th resistance R7,8th resistance R8,Second dc source-VB,3rd dc source+VC and the first operational amplifier Q1 compositions,The positive ends of first double break electromagnetic relay U2 coil connect the first dc source+VA output end,Second isolated drive circuit 4-5 control signal output in the negative polarity end connection drive control circuit 4 of first double break electromagnetic relay U2 coil,Relay U1 movable contact connects the common port of the first double break electromagnetic relay U2 first group of transfer contact,The normally-closed contact of first double break electromagnetic relay U2 first group of transfer contact connects the normally opened contact of the first double break electromagnetic relay U2 second group of transfer contact,The normally opened contact of first double break electromagnetic relay U2 first group of transfer contact connects the normally-closed contact of the first double break electromagnetic relay U2 second group of transfer contact,The common port of first double break electromagnetic relay U2 second group of transfer contact connects the first operational amplifier Q1 3 pin and 3rd resistor R3 one end,The 3rd resistor R3 other end connects the first operational amplifier Q1 2 pin and is grounded,First operational amplifier Q1 4 pin connect the second dc source-VB output end,First operational amplifier Q1 7 pin connect the 3rd dc source+VC output end,First operational amplifier Q1 5 pin ground connection,First operational amplifier Q1 1 pin connects the 4th resistance R4,5th resistance R5,7th resistance R7 and the 6th resistance R6 one end,The 4th resistance R4 other end connects the normally-closed contact of the second double break electromagnetic relay U3 first group of transfer contact,The 5th resistance R5 other end connects the normally opened contact of the second double break electromagnetic relay U3 first group of transfer contact,The 7th resistance R7 other end connects the normally opened contact of the second double break electromagnetic relay U3 second group of transfer contact,The 6th resistance R6 other end connects the normally-closed contact of the second double break electromagnetic relay U3 second group of transfer contact,The positive ends of second double break electromagnetic relay U3 coil connect the first dc source+VA output end,3rd isolated drive circuit 4-5 control signal output in the negative polarity end connection drive control circuit 4 of second double break electromagnetic relay U3 coil,The common port of second double break electromagnetic relay U3 first group of transfer contact connects the normally opened contact of the 3rd double break electromagnetic relay U4 first group of transfer contact,The common port of second double break electromagnetic relay U3 second group of transfer contact connects the normally-closed contact of the 3rd double break electromagnetic relay U4 first group of transfer contact,The common port of 3rd double break electromagnetic relay U4 first group of transfer contact connects the first operational amplifier Q1 8 pin,The positive ends of 3rd double break electromagnetic relay U4 coil connect the first dc source+VA output end,4th isolated drive circuit 4-5 control signal output in the negative pole end connection drive control circuit 4 of 3rd double break electromagnetic relay U4 coil,First operational amplifier Q1 6 pin pass through first group of A/D conversions in the 8th resistance R8 connection data acquisitions storage circuit 5 and storage circuit 5-5 data input pin；Relay contact parameter measurement circuit 8 is made up of a group relay contact resistance/insulaion resistance/contact-voltage measuring circuit 8-1,Relay contacts resistance test circuit 8-1-2 is by the 4th double break electromagnetic relay U5,5th double break electromagnetic relay U6,6th double break electromagnetic relay U7,Second operational amplifier Q2,9th resistance R9,Tenth resistance R10 and the 11st resistance R11 compositions,The positive ends of 4th double break electromagnetic relay U5 coil connect the first dc source+VA output end,5th isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 4th double break electromagnetic relay U5 coil control signal output,The normally-closed contact of 4th double break electromagnetic relay U5 first group of transfer contact and second group of transfer contact is all grounded,The common port of 4th double break electromagnetic relay U5 first group of transfer contact connects the second operational amplifier Q2 3 pin,The common port of 4th double break electromagnetic relay U5 second group of transfer contact connects the second operational amplifier Q2 2 pin,The normally opened contact of 4th double break electromagnetic relay U5 second group of transfer contact connects the common port of the 5th double break electromagnetic relay U6 first group of transfer contact,The positive ends of 5th double break electromagnetic relay U6 coil connect the first dc source+VA output end,6th isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 5th double break electromagnetic relay U6 coil control signal output,Second operational amplifier Q2 7 pin connect the 3rd dc source+VC output end,Second operational amplifier Q2 4 pin connect the second dc source-VB output end,Second operational amplifier Q2 1 pin connects the 9th resistance R9 and the tenth resistance R10 one end,The 9th resistance R9 other end connects the normally-closed contact of the 6th double break electromagnetic relay U7 first group of transfer contact,The tenth resistance R10 other end connects the normally opened contact of the 6th double break electromagnetic relay U7 first group of transfer contact,The positive ends of 6th double break electromagnetic relay U7 coil connect the first dc source+VA output end,7th isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 6th double break electromagnetic relay U7 coil control signal output,Second operational amplifier Q2 8 pin connect the common port of the 6th double break electromagnetic relay U7 first group of transfer contact,Second operational amplifier Q2 6 pin connect the 11st resistance R11 one end,Second operational amplifier Q2 5 pin ground connection；Relay insulation resistance test circuit 8-1-3 is by the 7th double break electromagnetic relay U8,8th double break electromagnetic relay U9,3rd operational amplifier Q3,12nd resistance R12,13rd resistance R13,14th resistance R14,15th resistance R15,16th resistance R16,4th dc source+VD and voltage-regulator diode D1 compositions,The positive ends of 7th double break electromagnetic relay U8 coil connect the first dc source+VA output end,8th isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 7th double break electromagnetic relay U8 coil control signal output,The output end that the common port of 7th double break electromagnetic relay U8 first group of transfer contact passes through the dc source+VD of the 12nd resistance R12 connections the 4th,The positive ends of 8th double break electromagnetic relay U9 coil connect the first dc source+VA output end,9th isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 8th double break electromagnetic relay U9 coil control signal output,The common port connection voltage-regulator diode D1 of 8th double break electromagnetic relay U9 first group of transfer contact negative polarity end and the 13rd resistance R13 one end,The 13rd resistance R13 other end connects the 14th resistance R14 one end and the 3rd operational amplifier Q3 3 pin,Voltage-regulator diode D1 positive ends,The 14th resistance R14 other end,3rd operational amplifier Q3 2 pin and the 3rd operational amplifier Q3 5 pin are all grounded,8 pin that 3rd operational amplifier Q3 1 pin passes through the operational amplifier Q3 of the 16th resistance R16 connections the 3rd,3rd operational amplifier Q3 6 pin connect the 15th resistance R15 one end,3rd operational amplifier Q3 7 pin connect the 3rd dc source+VC output end,3rd operational amplifier Q3 4 pin connect the second dc source-VB output end；Relay contact-voltage Acquisition Circuit 8-1-4 is by the 9th double break electromagnetic relay U10, 17th resistance R17, 18th resistance R18, 19th resistance R19, 20th resistance R20, 21st resistance R21, 22nd resistance R22, 5th dc source+VE and the 6th dc source+VF compositions, the positive ends of 9th double break electromagnetic relay U10 coil connect the first dc source+VA output end, tenth isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 9th double break electromagnetic relay U10 coil control signal output, the normally-closed contact of 9th double break electromagnetic relay U10 first group of transfer contact connects the 6th dc source+VF output end, the output end that the normally opened contact of 9th double break electromagnetic relay U10 first group of transfer contact passes through the dc source+VE of the 17th resistance R17 connections the 5th, the normally-closed contact of 9th double break electromagnetic relay U10 second group of transfer contact connects the 19th resistance R19 and the 21st resistance R21 one end, the common port of 9th double break electromagnetic relay U10 second group of transfer contact connects the 18th resistance R18 one end, the normally opened contact of 9th double break electromagnetic relay U10 second group of transfer contact connects the 20th resistance R20 and the 22nd resistance R22 one end, 21st resistance R21 and the 22nd resistance R22 other end ground connection；Signal gating circuit 8-1-1 is by the tenth double break electromagnetic relay U11,11st double break electromagnetic relay U12 and the 23rd resistance R23 compositions,The positive ends of tenth double break electromagnetic relay U11 coil connect the first dc source+VA output end,11st isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the tenth double break electromagnetic relay U11 coil control signal output,The normally-closed contact connection relay contacts resistance test circuit 8-1-2 of tenth double break electromagnetic relay U11 first group of transfer contact the 11st resistance R11 other end,The common port of tenth double break electromagnetic relay U11 first group of transfer contact connects the normally-closed contact of the 11st double break electromagnetic relay U12 first group of transfer contact,The normally opened contact connection relay contact-voltage Acquisition Circuit 8-1-4 of tenth double break electromagnetic relay U11 first group of transfer contact the 19th resistance R19 and the 20th resistance the R20 other end,The normally-closed contact connection relay insulation resistance test circuit 8-1-3 of tenth double break electromagnetic relay U11 second group of transfer contact the 15th resistance R15 other end,The common port of tenth double break electromagnetic relay U11 second group of transfer contact connects the normally opened contact of the 11st double break electromagnetic relay U12 first group of transfer contact,The positive ends of 11st double break electromagnetic relay U12 coil connect the first dc source+VA output end,12nd isolated drive circuit 4-5 of the negative polarity end connection drive control circuit 4 of the 11st double break electromagnetic relay U12 coil control signal output,Second group A/D conversion and storage circuit 5-5 data input pin of the common port of 11st double break electromagnetic relay U12 first group of transfer contact by the 23rd resistance R23 connection data acquisitions storage circuit 5.Other compositions and annexation are identical with embodiment four.

When the static state and dynamic parameter of tested hermetically sealed electromagnetic relay 1 are measured using present embodiment, in relay coil sampling conversion amplifying circuit 7-1 the normally-closed contact of the first double break electromagnetic relay U2 first group of transfer contact as the coil 1-1 for the tested hermetically sealed electromagnetic relay 1 surveyed electrode input end, the normally opened contact of the first double break electromagnetic relay U2 first group of transfer contact as the coil 1-1 of tested hermetically sealed electromagnetic relay 1 negative input；The normally opened contact of 4th double break electromagnetic relay U5 first group of transfer contact in relay contacts resistance test circuit 8-1-2, the normally opened contact of 7th double break electromagnetic relay U8 first group of transfer contact in relay insulation resistance test circuit 8-1-3, in relay contact-voltage Acquisition Circuit 8-1-4 the common port of the 9th double break electromagnetic relay U10 first group of transfer contact as the transfer contact 1-2 of tested hermetically sealed electromagnetic relay 1 common port measurement input；In relay contacts resistance test circuit 8-1-2 in the normally-closed contact of the 5th double break electromagnetic relay U6 first group of transfer contact, relay insulation resistance test circuit 8-1-3 in the normally opened contact of the 8th double break electromagnetic relay U9 first group of transfer contact, relay contact-voltage Acquisition Circuit 8-1-4 the 18th resistance R18 the other end as the transfer contact 1-2 of tested hermetically sealed electromagnetic relay 1 normally-closed contact measurement input；The normally opened contact of 5th double break electromagnetic relay U6 first group of transfer contact in relay contacts resistance test circuit 8-1-2, the normally-closed contact of 8th double break electromagnetic relay U9 first group of transfer contact in relay insulation resistance test circuit 8-1-3, in relay contact-voltage Acquisition Circuit 8-1-4 the common port of the 9th double break electromagnetic relay U10 second group of transfer contact as the transfer contact 1-2 of tested hermetically sealed electromagnetic relay 1 normally opened contact measurement input.

Occur the repeat circuit U1 of circuit 6 in synchronous triggering signal and use mercury-wetted relay, it may ensure that relay does not produce rebound during upper electricity closure, it can ensure that the dynamic parameter of tested hermetically sealed electromagnetic relay 1 is unaffected in test, so as to improve measuring accuracy；When first isolated drive circuit 4-5 of drive control circuit 4 exports low level, it is electric on relay U1 coil, contact adhesive, switch triode T1 is turned on, switch triode T1 colelctor electrode produces the clock control circuit 5-2 of trailing edge feeding data acquisition storage circuit 5 external trigger signal input part, otherwise, when first isolated drive circuit 4-5 of drive control circuit 4 exports high level, relay U1 coil blackout, contact disconnects, switch triode T1 ends, switch triode T1 colelctor electrode produces the clock control circuit 5-2 of rising edge feeding data acquisition storage circuit 5 external trigger signal input part, circuit 6, which occurs, for synchronous triggering signal to be transformed into Transistor-Transistor Logic level by 5V~28V level signal；When changing the first double break electromagnetic relay U2 adhesive or off-state by drive control circuit 4, the excitation polarity of tested hermetically sealed electromagnetic relay 1 also changes therewith, if tested hermetically sealed electromagnetic relay 1 is magnetic latching relay, then the change of the first double break electromagnetic relay U2 states will can make the armature of tested hermetically sealed electromagnetic relay 1 return to initial position；Second double break electromagnetic relay U3 and the 3rd double break electromagnetic relay U4 adhesive or off-state in relay coil sampling conversion amplifying circuit 7-1 are changed by drive control circuit 4, the first operational amplifier Q1 can be made to obtain four kinds of different multiplication factors.The 4th double break electromagnetic relay U5 is the switch of switching control contact resistance test in relay contacts resistance test circuit 8-1-2,5th double break electromagnetic relay U6 is for selecting test normally opened contact contact resistance or normally-closed contact contact resistance, when testing normally opened contact resistance, need to make electricity on tested hermetically sealed electromagnetic relay 1, the 6th double break electromagnetic relay U7 is the multiplication factor for changing contact resistance test.The 7th double break electromagnetic relay U8 is in megger test loading test voltage+VD in relay insulation resistance test circuit 8-1-3,8th double break electromagnetic relay U9 is for selecting test normally opened contact insulaion resistance or testing normally-closed contact insulaion resistance,, it is necessary to make electricity on tested hermetically sealed electromagnetic relay 1 when testing normally closed insulaion resistance.The 9th double break electromagnetic relay U10 is for switching different load criterias in relay contact-voltage Acquisition Circuit 8-1-4.The tenth double break electromagnetic relay U11 and the 11st double break electromagnetic relay U12 is used for selecting contact parametric testing module output in signal gating circuit 8-1-1；When the 11st isolated drive circuit 4-5 of drive control circuit 4 control signal output and drive control circuit 4 the 12nd isolated drive circuit 4-5 control signal output all be high level when, selective relay contact resistance test circuit 8-1-2 output is entered in data acquisition storage circuit 5；When the 11st isolated drive circuit 4-5 of drive control circuit 4 control signal output is low level, and the 12nd isolated drive circuit 4-5 of drive control circuit 4 control signal output be high level when, selective relay contact voltage Acquisition Circuit 8-1-4 output is entered in data acquisition storage circuit 5；When the 11st isolated drive circuit 4-5 of drive control circuit 4 control signal output is high level, when the 12nd isolated drive circuit 4-5 of drive control circuit 4 control signal output is low level, selective relay insulation resistance test circuit 8-1-3 output is entered in data acquisition storage circuit 5.The model AD620 that the first operational amplifier Q1, the second operational amplifier Q2 and the 3rd operational amplifier Q3 are used in present embodiment.

Claims

1,The complex detection system of sealed electromagnetic relay excess micro-particle,It includes being used for the shaking platform (2) of fixed tested hermetically sealed electromagnetic relay,It is characterized in that it also includes processor (3),Drive control circuit (4),Data acquisition storage circuit (5),Circuit (6) occurs for synchronous triggering signal,Relay coil current measurement circuit (7),Relay contact parameter measurement circuit (8),The signal input part of the multi-way control signals output end connection drive control circuit (4) of processor (3),The measurement data output end of the multichannel measurement data input pin connection data acquisition storage circuit (5) of processor (3),The measured relay control signal input of circuit (6) occurs for the single channel control signal output connection synchronous triggering signal of drive control circuit (4),The measured relay control signal input of the measured relay control signal output connection relay coil current measurement circuit (7) of circuit (6) occurs for synchronous triggering signal,Circuit (6) occurs for the multi-way control signals output end connection synchronous triggering signal of drive control circuit (4),The control signal input of relay coil current measurement circuit (7) and relay contact parameter measurement circuit (8),The external trigger signal input part of the trigger signal output end connection data acquisition storage circuit (5) of circuit (6) occurs for synchronous triggering signal,The coil current measurement data input of the multichannel measurement data output end connection data acquisition storage circuit (5) of relay coil current measurement circuit (7),The contact parameter measurement data input of the multichannel measurement data output end connection data acquisition storage circuit (5) of relay contact parameter measurement circuit (8).

2, the complex detection system of sealed electromagnetic relay excess micro-particle according to claim 1, it is characterized in that drive control circuit (4) is by isa bus (4-1), D/A modular converters (4-2), multi-way switching values output circuit (4-3), power amplification circuit (4-4) and multiple isolated drive circuits (4-5) composition, signal input part of the multi-way control signals output end of processor (3) by isa bus (4-1) respectively with D/A modular converters (4-2) and multi-way switching values output circuit (4-3) is connected, one signal input part of the signal output part connection power amplification circuit (4-4) of D/A modular converters (4-2), another signal input part ground connection of power amplification circuit (4-4), the measured relay control signal input of circuit (6) occurs for the signal output part connection synchronous triggering signal of power amplification circuit (4-4), each signal output part of multi-way switching values output circuit (4-3) connects the input of an isolated drive circuit (4-5) respectively.

3,The complex detection system of sealed electromagnetic relay excess micro-particle according to claim 1,It is characterized in that data acquisition storage circuit (5) is by pci bus (5-1),Clock control circuit (5-2),PCI protocol conversions interface circuit (5-3),Local bus (5-4) and at least two groups A/D conversions and storage circuit (5-5) composition,The multichannel measurement data input pin of processor (3) is connected by pci bus (5-1) with the data output end of PCI protocol conversions interface circuit (5-3),The control signal input of the control signal output connection PCI protocol conversions interface circuit (5-3) of clock control circuit (5-2),The trigger signal output end of circuit (6) occurs for the external trigger signal input part connection synchronous triggering signal of clock control circuit (5-2),Every group of A/D conversion and storage circuit (5-5) are by RAM memory modules (5-5-1),A/D modular converters (5-5-2) and level conversion and amplifying circuit (5-5-3) composition,The data input pin of level conversion and the output end of amplifying circuit (5-5-3) connection A/D modular converters (5-5-2) in every group of A/D conversion and storage circuit (5-5),The data input pin of the data output end connection RAM memory modules (5-5-1) of A/D modular converters (5-5-2) in every group of A/D conversion and storage circuit (5-5),The data output end of the RAM memory modules (5-5-1) of every group of A/D conversion and storage circuit (5-5) is all connected by local bus (5-4) with the data input pin of PCI protocol conversions interface circuit (5-3),Each clock signal output terminal of clock control circuit (5-2) connects the RAM memory modules (5-5-1) and the clock signal terminal of A/D modular converters (5-5-2) of one group of A/D conversion and storage circuit (5-5) respectively.

4th, the complex detection system of the sealed electromagnetic relay excess micro-particle according to claim 1 or 3, it is characterised in that relay coil current measurement circuit (7) is made up of at least one set of relay coil sampling conversion amplifying circuit (7-1)；Relay contact parameter measurement circuit (8) is made up of at least one set of relay contacts resistance/insulaion resistance/contact-voltage measuring circuit (8-1), the multi-way control signals output end connection of drive control circuit (4) converts amplifying circuit (7-1) and the control signal input per group relay contact resistance/insulaion resistance/contact-voltage measuring circuit (8-1) per the sampling of group relay coil, measured relay control signal input of the measured relay control signal output connection of circuit (6) per group relay coil sampling conversion amplifying circuit (7-1) occurs for synchronous triggering signal, the measurement data output end of each group relay coil sampling conversion amplifying circuit (7-1) connects the level conversion and the data input pin of amplifying circuit (5-5-3) of one group of A/D conversion and storage circuit (5-5) in data acquisition storage circuit (5) respectively, the measurement data output end of each group relay contact resistance/insulaion resistance/contact-voltage measuring circuit (8-1) also connects one group of A/D conversions in data acquisition storage circuit (5) and the level conversion and the data input pin of amplifying circuit (5-5-3) of storage circuit (5-5) respectively.

5,The complex detection system of sealed electromagnetic relay excess micro-particle according to claim 4,It is characterized in that every group relay contact resistance/insulaion resistance/contact-voltage measuring circuit (8-1) in relay contact parameter measurement circuit (8) is by signal gating circuit (8-1-1),Relay contacts resistance test circuit (8-1-2),Relay insulation resistance test circuit (8-1-3) and relay contact-voltage Acquisition Circuit (8-1-4) composition,The multi-way control signals output end connection signal gating circuit (8-1-1) of drive circuit (4),Relay contacts resistance test circuit (8-1-2),The control signal input of relay insulation resistance test circuit (8-1-3) and relay contact-voltage Acquisition Circuit (8-1-4),Relay contacts resistance test circuit (8-1-2),The measurement data output end of relay insulation resistance test circuit (8-1-3) and relay contact-voltage Acquisition Circuit (8-1-4) connects three measurement data inputs of signal gating circuit (8-1-1) respectively,The level conversion and the data input pin of amplifying circuit (5-5-3) of one group of A/D conversion and storage circuit (5-5) in the measurement data output end connection data acquisition storage circuit (5) of signal gating circuit (8-1-1),The normally-closed contact measurement signal input connection relay insulation resistance test circuit (8-1-3) and the normally-closed contact measurement signal input of relay contact-voltage Acquisition Circuit (8-1-4) of relay contacts resistance test circuit (8-1-2),The normally opened contact measurement signal input connection relay insulation resistance test circuit (8-1-3) and the normally opened contact measurement signal input of relay contact-voltage Acquisition Circuit (8-1-4) of relay contacts resistance test circuit (8-1-2),The measurement signal output end connection relay insulation resistance test circuit (8-1-3) and the measurement signal output end of relay contact-voltage Acquisition Circuit (8-1-4) of relay contacts resistance test circuit (8-1-2).

6, the complex detection system of sealed electromagnetic relay excess micro-particle according to claim 4, it is characterized in that data acquisition storage circuit (5) includes two groups of A/D conversions and storage circuit (5-5), circuit (6) occurs for synchronous triggering signal by relay (U1), first resistor (R1), second resistance (R2), switch triode (TI) and the first dc source (+VA) composition, the positive ends of the magnet exciting coil of the output end connection relay (U1) of first dc source (+VA), the control signal output of first isolated drive circuit (4-5) in the negative polarity end connection drive control circuit (4) of the magnet exciting coil of relay (U1), the signal output part of power amplification circuit (4-4) in the stationary contact connection drive control circuit (4) of relay (U1), one end of the movable contact connection first resistor (R1) of relay (U1), the base stage of the other end connecting valve triode (T1) of first resistor (R1), one end of the colelctor electrode connection second resistance (R2) of switch triode (T1) and the external trigger signal input part of the clock control circuit (5-2) of data store circuit (5), the other end of second resistance (R2) connects the output end of the first dc source (+VA), the grounded emitter of switch triode (T1)；Relay coil current measurement circuit (7) is made up of group relay coil sampling conversion amplifying circuit (7-1),Relay coil sampling conversion amplifying circuit (7-1) is by the first double break electromagnetic relay (U2),Second double break electromagnetic relay (U3),3rd double break electromagnetic relay (U4),3rd resistor (R3),4th resistance (R4),5th resistance (R5),6th resistance (R6),7th resistance (R7),8th resistance (R8),Second dc source (- VB),3rd dc source (+VC) and the first operational amplifier (Q1) composition,The positive ends of the coil of first double break electromagnetic relay (U2) connect the output end of the first dc source (+VA),The control signal output of second isolated drive circuit (4-5) in the negative polarity end connection drive control circuit (4) of the coil of first double break electromagnetic relay (U2),The movable contact of relay (U1) connects the common port of first group of transfer contact of the first double break electromagnetic relay (U2),The normally-closed contact of first group of transfer contact of the first double break electromagnetic relay (U2) connects the normally opened contact of second group of transfer contact of the first double break electromagnetic relay (U2),The normally opened contact of first group of transfer contact of the first double break electromagnetic relay (U2) connects the normally-closed contact of second group of transfer contact of the first double break electromagnetic relay (U2),The common port of second group of transfer contact of the first double break electromagnetic relay (U2) connects 3 pin of the first operational amplifier (Q1) and one end of 3rd resistor (R3),The other end of 3rd resistor (R3) connects 2 pin of the first operational amplifier (Q1) and is grounded,4 pin of the first operational amplifier (Q1) connect the output end of the second dc source (- VB),7 pin of the first operational amplifier (Q1) connect the output end of the 3rd dc source (+VC),The 5 pin ground connection of first operational amplifier (Q1),1 pin of the first operational amplifier (Q1) connects the 4th resistance (R4),5th resistance (R5),One end of 7th resistance (R7) and the 6th resistance (R6),The other end of 4th resistance (R4) connects the normally-closed contact of first group of transfer contact of the second double break electromagnetic relay (U3),The other end of 5th resistance (R5) connects the normally opened contact of first group of transfer contact of the second double break electromagnetic relay (U3),The other end of 7th resistance (R7) connects the normally opened contact of second group of transfer contact of the second double break electromagnetic relay (U3),The other end of 6th resistance (R6) connects the normally-closed contact of second group of transfer contact of the second double break electromagnetic relay (U3),The positive ends of the coil of second double break electromagnetic relay (U3) connect the output end of the first dc source (+VA),The control signal output of 3rd isolated drive circuit (4-5) in the negative polarity end connection drive control circuit (4) of the coil of second double break electromagnetic relay (U3),The common port of first group of transfer contact of the second double break electromagnetic relay (U3) connects the normally opened contact of first group of transfer contact of the 3rd double break electromagnetic relay (U4),The common port of second group of transfer contact of the second double break electromagnetic relay (U3) connects the normally-closed contact of first group of transfer contact of the 3rd double break electromagnetic relay (U4),The common port of first group of transfer contact of the 3rd double break electromagnetic relay (U4) connects 8 pin of the first operational amplifier (Q1),The positive ends of the coil of 3rd double break electromagnetic relay (U4) connect the output end of the first dc source (+VA),The control signal output of 4th isolated drive circuit (4-5) in the negative pole end connection drive control circuit (4) of the coil of 3rd double break electromagnetic relay (U4),6 pin of the first operational amplifier (Q1) connect first group of A/D conversions in data acquisition storage circuit (5) and the data input pin of storage circuit (5-5) by the 8th resistance (R8)；Relay contact parameter measurement circuit (8) is made up of a group relay contact resistance/insulaion resistance/contact-voltage measuring circuit (8-1),Relay contacts resistance test circuit (8-1-2) is by the 4th double break electromagnetic relay (U5),5th double break electromagnetic relay (U6),6th double break electromagnetic relay (U7),Second operational amplifier (Q2),9th resistance (R9),Tenth resistance (R10) and the 11st resistance (R11) composition,The positive ends of the coil of 4th double break electromagnetic relay (U5) connect the output end of the first dc source (+VA),The control signal output of 5th isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 4th double break electromagnetic relay (U5),The normally-closed contact of first group of transfer contact and the second group of transfer contact of 4th double break electromagnetic relay (U5) is all grounded,The common port of first group of transfer contact of the 4th double break electromagnetic relay (U5) connects 3 pin of the second operational amplifier (Q2),The common port of second group of transfer contact of the 4th double break electromagnetic relay (U5) connects 2 pin of the second operational amplifier (Q2),The normally opened contact of second group of transfer contact of the 4th double break electromagnetic relay (U5) connects the common port of first group of transfer contact of the 5th double break electromagnetic relay (U6),The positive ends of the coil of 5th double break electromagnetic relay (U6) connect the output end of the first dc source (+VA),The control signal output of 6th isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 5th double break electromagnetic relay (U6),7 pin of the second operational amplifier (Q2) connect the output end of the 3rd dc source (+VC),4 pin of the second operational amplifier (Q2) connect the output end of the second dc source (- VB),1 pin of the second operational amplifier (Q2) connects one end of the 9th resistance (R9) and the tenth resistance (R1),The other end of 9th resistance (R9) connects the normally-closed contact of first group of transfer contact of the 6th double break electromagnetic relay (U7),The other end of tenth resistance (R10) connects the normally opened contact of first group of transfer contact of the 6th double break electromagnetic relay (U7),The positive ends of the coil of 6th double break electromagnetic relay (U7) connect the output end of the first dc source (+VA),The control signal output of 7th isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 6th double break electromagnetic relay (U7),8 pin of the second operational amplifier (Q2) connect the common port of first group of transfer contact of the 6th double break electromagnetic relay (U7),6 pin of the second operational amplifier (Q2) connect one end of the 11st resistance (R11),The 5 pin ground connection of second operational amplifier (Q2)；Relay insulation resistance test circuit (8-1-3) is by the 7th double break electromagnetic relay (U8),8th double break electromagnetic relay (U9),3rd operational amplifier (Q3),12nd resistance (R12),13rd resistance (R13),14th resistance (R14),15th resistance (R15),16th resistance (R16),4th dc source (+VD) and voltage-regulator diode (D1) composition,The positive ends of the coil of 7th double break electromagnetic relay (U8) connect the output end of the first dc source (+VA),The control signal output of 8th isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 7th double break electromagnetic relay (U8),The common port of first group of transfer contact of the 7th double break electromagnetic relay (U8) connects the output end of the 4th dc source (+VD) by the 12nd resistance (R12),The positive ends of the coil of 8th double break electromagnetic relay (U9) connect the output end of the first dc source (+VA),The control signal output of 9th isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 8th double break electromagnetic relay (U9),The negative polarity end and one end of the 13rd resistance (R13) of the common port connection voltage-regulator diode (D1) of first group of transfer contact of the 8th double break electromagnetic relay (U9),The other end of 13rd resistance (R13) connects one end of the 14th resistance (R14) and 3 pin of the 3rd operational amplifier (Q3),The positive ends of voltage-regulator diode (D1),The other end of 14th resistance (R14),2 pin of the 3rd operational amplifier (Q3) and 5 pin of the 3rd operational amplifier (Q3) are all grounded,1 pin of the 3rd operational amplifier (Q3) connects 8 pin of the 3rd operational amplifier (Q3) by the 16th resistance (R16),6 pin of the 3rd operational amplifier (Q3) connect one end of the 15th resistance (R15),7 pin of the 3rd operational amplifier (Q3) connect the output end of the 3rd dc source (+VC),4 pin of the 3rd operational amplifier (Q3) connect the output end of the second dc source (- VB)；Relay contact-voltage Acquisition Circuit (8-1-4) is by the 9th double break electromagnetic relay (U10),17th resistance (R17),18th resistance (R18),19th resistance (R19),20th resistance (R20),21st resistance (R21),22nd resistance (R22),5th dc source (+VE) and the 6th dc source (+VF) composition,The positive ends of the coil of 9th double break electromagnetic relay (U10) connect the output end of the first dc source (+VA),The control signal output of tenth isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 9th double break electromagnetic relay (U10),The normally-closed contact of first group of transfer contact of the 9th double break electromagnetic relay (U10) connects the output end of the 6th dc source (+VF),The normally opened contact of first group of transfer contact of the 9th double break electromagnetic relay (U10) connects the output end of the 5th dc source (+VE) by the 17th resistance (R17),The normally-closed contact of second group of transfer contact of the 9th double break electromagnetic relay (U10) connects one end of the 19th resistance (R19) and the 21st resistance (R21),The common port of second group of transfer contact of the 9th double break electromagnetic relay (U10) connects one end of the 18th resistance (R18),The normally opened contact of second group of transfer contact of the 9th double break electromagnetic relay (U10) connects one end of the 20th resistance (R20) and the 22nd resistance (R22),The other end ground connection of 21st resistance (R21) and the 22nd resistance (R22)；Signal gating circuit (8-1-1) is by the tenth double break electromagnetic relay (U11),11st double break electromagnetic relay (U12) and the 23rd resistance (R23) composition,The positive ends of the coil of tenth double break electromagnetic relay (U11) connect the output end of the first dc source (+VA),The control signal output of 11st isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the tenth double break electromagnetic relay (U11),The other end of 11st resistance (R11) of the normally-closed contact connection relay contacts resistance test circuit (8-1-2) of first group of transfer contact of the tenth double break electromagnetic relay (U11),The common port of first group of transfer contact of the tenth double break electromagnetic relay (U11) connects the normally-closed contact of first group of transfer contact of the 11st double break electromagnetic relay (U12),The 19th resistance (R19) and the other end of the 20th resistance (R20) of the normally opened contact connection relay contact-voltage Acquisition Circuit (8-1-4) of first group of transfer contact of the tenth double break electromagnetic relay (U11),The other end of 15th resistance (R15) of the normally-closed contact connection relay insulation resistance test circuit (8-1-3) of second group of transfer contact of the tenth double break electromagnetic relay (U11),The common port of second group of transfer contact of the tenth double break electromagnetic relay (U11) connects the normally opened contact of first group of transfer contact of the 11st double break electromagnetic relay (U12),The positive ends of the coil of 11st double break electromagnetic relay (U12) connect the output end of the first dc source (+VA),The control signal output of 12nd isolated drive circuit (4-5) of the negative polarity end connection drive control circuit (4) of the coil of the 11st double break electromagnetic relay (U12),The common port of first group of transfer contact of the 11st double break electromagnetic relay (U12) connects second group of A/D conversions and the data input pin of storage circuit (5-5) of data acquisition storage circuit (5) by the 23rd resistance (R23).

7th, the complex detection system of the sealed electromagnetic relay excess micro-particle according to claim 1,2 or 3, it is characterised in that the shaking platform (2) for fixed tested hermetically sealed electromagnetic relay uses the shake table and its drive system of PIND instrument；Processor (3) uses CPU for PIII866 industrial computer；The master chip model PCI9030 of PCI protocol conversions interface circuit (5-3) in data acquisition storage circuit (5), the master chip model EPM7128STC100 of clock control circuit (5-2), the master chip model IS61C64 of RAM memory modules (5-5-1), the master chip model ADS802 of A/D modular converters (5-5-2) in every group of A/D conversion and storage circuit (5-5) in every group of A/D conversion and storage circuit (5-5).

8th, the complex detection system of sealed electromagnetic relay excess micro-particle according to claim 6, it is characterised in that the model AD620 that the first operational amplifier (Q1), the second operational amplifier (Q2) and the 3rd operational amplifier (Q3) are used；Synchronous triggering signal occurs circuit (6) repeat circuit (U1) and uses mercury-wetted relay.