CN100485631C

CN100485631C - Motherboard function test board

Info

Publication number: CN100485631C
Application number: CNB2004100264650A
Authority: CN
Inventors: 潘文俊; 张溯舜
Original assignee: Hongfujin Precision Industry Shenzhen Co Ltd; Hon Hai Precision Industry Co Ltd
Current assignee: Hongfujin Precision Industry Shenzhen Co Ltd; Hon Hai Precision Industry Co Ltd
Priority date: 2004-03-08
Filing date: 2004-03-08
Publication date: 2009-05-06
Anticipated expiration: 2024-03-08
Also published as: CN1667581A

Abstract

The invention relates to a motherboard function test board, which can be used to test motherboard function on-line automatically and completely, wherein the invention comprises a VGA and AGP change circuit which can activate initial test through a trigger signal and realize the automatic switch between AGP and VGA through a signal automatic switch circuit; an Audio test circuit, which controls a CPLD Out0 and a CPLD Out2 signal and form test circuit with tested motherboard sound source to realize the test completely about the motherboard sound source circuit; a battery test circuit, which screens out the non-conforming article with lower electric quantity than the standard through the comparison between the tested motherboard battery and a battery standard; a Front Panel test circuit,which realizes the automatic control and test to shell type, hard disk display and power display of the tested motherboard, wherein the test result can be displayed in the video screen straightly.

Description

Motherboard functional test plate

[technical field]

The invention relates to a kind of motherboard device for testing functions, be meant a kind of motherboard functional test plate that can carry out full test especially the multiple function of tested motherboard.

[technical background]

Motherboard is after assembly is finished, need to determine whether it is good product through comprehensive functional test, and host board testing mainly is at the various mistakes on this motherboard, for example, the situations such as part of open circuit, short circuit and non-correct contact are detected, promptly in conjunction with rub-out signal data that tester table produced, and motherboard to be measured is by wiring data that computer-aided design (CAD) produced, make maintenance person rapidly by the poor prognostic cause place of finding out the circuit-under-test plate on the screen, thereby save the time of imperfect repair product.

Existing motherboard functional test machine is that a motherboard to be tested is plugged on the test board; be connected in the slot and chip pin of connector to be tested in the mode of artificial plug by some winding displacements that are connected on the test machine then; test signal is guided; but; usually have a lot of components and parts on the motherboard to be tested; the winding displacement that plugs this type of slot that is connected to assembly and chip pin one by one need expend a large amount of artificial and times; and the workman is in the long-time operation process, occurs easily because of situations such as fatigue or maloperation jam a finger.

Back industry has been improved above work pattern, this improved procedure is to utilize a probe stationary plate that the test signal of motherboard components and parts to be measured is connect to draw by some probes to receive on the card extender, this card extender is to be electrically connected on the measurement jig, it can be to the CPU on the motherboard to be tested (central processing unit), hard disk and PCI (Peripheral Component Interface, peripheral interface) primary clustering such as slot and interface carry out the generality test, and about audio-frequency test, the test of assemblies such as power supply then can't be taken into account, and the bad quality yield that can have influence on whole motherboard equally of quality of assemblies such as audio frequency and power supply, can use to the user and bring certain puzzlement, for example, if the power source voltage value is lower than standard voltage value, can influence the setting of CMOS value on the mainboard, thus fault such as cause that the preset password value can't be preserved.

[summary of the invention]

The object of the present invention is to provide a kind of motherboard functional test plate that can realize the automatic switchover between AGP and VGA test.

A kind of motherboard functional test plate comprises a VGA﹠amp; The AGP change-over circuit, described VGA﹠amp; The AGP change-over circuit comprises a signal automatic switch-over circuit, described test board also comprises a test signal modular converter, described test signal modular converter becomes the control signal that test macro is convenient to handle with the conversion of signals of motherboard to be tested, described test signal modular converter comprises a test signal output port and a control chip, one device signal is applied to the state of the control signal of the described conversion that is used to monitor described control chip output on the described control chip, described VGA ﹠amp; The AGP change-over circuit passes through an activation trigger signal initial testing, and activates described signal automatic switch-over circuit by the control signal of described conversion, the automatic switchover of realization system between AGP and VGA test.

With respect to prior art, the present invention has adopted a signal conversion module that the conversion of signals of motherboard to be tested is become the control signal that test macro is convenient to handle, described control signal activates described signal automatic switch-over circuit, the automatic switchover of realization system between AGP and VGA test.Described motherboard functional test plate is easy to operate, the testing efficiency height.

[description of drawings]

The present invention is further illustrated in conjunction with the embodiments with reference to the accompanying drawings.

Fig. 1 is the test synoptic diagram of motherboard functional test plate of the present invention.

Fig. 2 is the structural representation of motherboard functional test plate of the present invention.

Fig. 3 (A) is the test signal modular converter of motherboard functional test plate of the present invention.

Fig. 3 (B) is another embodiment of the test signal modular converter of motherboard functional test plate of the present invention.

Fig. 4 is the VGA﹠amp of motherboard functional test plate of the present invention; AGP change-over circuit figure.

Fig. 5 is the Front Panel test philosophy figure of motherboard functional test plate of the present invention.

Fig. 6 is the Audio test circuit figure of motherboard functional test plate of the present invention.

Fig. 7 is the battery test circuit figure of motherboard functional test plate of the present invention.

[embodiment]

Please refer to Fig. 1, this motherboard functional test plate 10 carries out the test of various functions by 12 pairs one motherboards 14 to be tested of a probe stationary plate.In test, at first motherboard 14 to be tested is placed on this probe stationary plate 12, by the probe on this probe stationary plate 12 (figure indicate) with the signal converting on the motherboard 14 to be tested to this motherboard functional test plate 10, the another side of this motherboard functional test plate 10 is connected with some measurement jigs 16, this measurement jig 16 is some instrument that show test modes and result, display screen etc., can analyze and processing such as demonstration the signal that be come by these motherboard functional test plate 10 switchings.

Please, comprise a VGA ﹠amp on this motherboard functional test plate 10 jointly with reference to Fig. 2; AGP change-over circuit 20, an Audio test circuit 30, a battery test circuit 40, a Serial Port test loop 50, a Front Panel test circuit 60, a test signal modular converter 70, a PCI, IDE1, SATA, Floppy, a USB converting interface 80 and a network interface card test loop 90.Wherein, this Serial Port test loop 50, PCI, IDE1, SATA, Floppy, USB converting interface 80 and network interface card test loop 90 are that the performances such as main plug receptacle of motherboard are tested.This IDE2 interface 72 is the signal output of being responsible for being transferred on this motherboard functional test plate 10 from motherboard to be tested, and is converted to I/O control signal 724 by this CPLD CPLD is converted to the I/O control signal, outputs to this VGA﹠amp; AGP change-over circuit 20, this Audio test circuit 30, this battery test circuit 40 and this Front Panel test loop 60 are as the system testing signal.

Please refer to Fig. 3 (A), the function of this test signal modular converter 70 is that the motherboard signal to be tested that will be come by switching on this motherboard functional test plate is converted into the convenient I/O control signal of handling of test macro.This test signal modular converter 70 comprises a control chip 725, one input end of this control chip 725 is connected on this IDE2 interface 70, reception is from the test signal of this motherboard to be tested, this control chip 725 is converted to the I/O control signal that the test test macro is convenient to compatibility and processing with this test signal by CPLD, simultaneously, another input end of this control chip 725 receives a device signal 722, this device signal 722 can be monitored the state of the signal of these control chip 725 outputs, the I/O control signal of guaranteeing these control chip 725 outputs is in correct state, thereby guarantees carrying out smoothly of whole testing process.Certainly, the function switching signal of this module also can be realized by alternate manner, in every case the module that test macro is easy to the compatible control signal of accepting can be and be converted to signal-under-test output and all this operation can be realized, shown in Fig. 3 (B), survey signal conversion module 70 ', this test signal modular converter 70 ' is by the control chip 725 ' of the printer interface 72 ' on this motherboard to be tested with signal output to be tested, simultaneously, another input end of this control chip 725 ' also connects a device signal 722 ', this device signal 722 ' is whether be used for monitoring accurate by the state of the signal of this control chip 725 ' output, thereby guarantees carrying out smoothly of whole testing process.Content hereinafter described of the present invention serves as the module that realizes the test signal translation function with Fig. 3 (A) test signal modular converter 70 only.

Please continue with reference to Fig. 4 this VGA ﹠amp; AGP change-over circuit 20 comprises that an AGP shows that test circuit 100, a signal automatic switch-over circuit 140, a control circuit 160 and a VGA show test circuit 180.One CPLD Out5 control signal 170 is applied on this control circuit 160, and one triggers AGP_RST (Reset resets) signal 120 is applied on this AGP demonstration test circuit 100.This circuit is the right of priority problem that is determined demonstration by this AGP_RST signal 120, and when being high level as if this AGP_RST signal 120, this AGP shows that test circuit 100 activates, and when being low level as if this AGP_RST signal 120, this VGA demonstration test circuit 180 is effective.It is high level that this circuit is connected back this AGP_RST signal 120 of acquiescence, promptly connects this AGP earlier and shows test circuit 100, if be integrated with video card on the motherboard to be measured, forbids that then this AGP shows test circuit 100, and this AGP_RST signal 120 changes low level into; If integrated graphics card not on the motherboard to be measured, the AGP slot of then carrying out earlier grafting AGP video card (figure does not show) is tested, finish after the test, this triggering AGP_RST signal 120 becomes low level, this AGP shows that test circuit 100 is under an embargo, simultaneously, this CPLD Out5 control signal 170 of changing via this test signal modular converter 72 is transported in this control circuit 160, activate this control circuit 160, and the detecting information that CPLD Out5 is entrained exports this signal automatic switch-over circuit 140 to, activate switching flow, finish by AGP and be shown to the switching that VGA shows, this VGA shows that test circuit 180 is effective, and system tests this VGA demonstration test circuit 180.

Please jointly with reference to Fig. 5, this Front Panel test circuit can be finished the test to Chassis ID (cabinet kind), HDD LED (hard disk demonstration) and Power LED (power supply demonstration).This circuit is to be connected respectively to a Chassis ID 610 by a FrontPanel equipment 600, on one a HDD LED 620 and the PowerLED 640, this Chassis ID610 is responsible for gathering the model of tested motherboard, export a control circuit 611 then to, this control circuit 611 is effectively write I/O control mouth 613 by a low level and is activated, this port input information of writing I/O control mouth 613 is from this test signal modular converter 72, its output terminal and one is read motherboard register 615 and is connected, in this cabinet model of reading the motherboard model parameter in the motherboard register 615 and matching, on display screen, demonstrate chassis types by reading pre-stored with this tested motherboard coupling; This HDD LED 620 is activated by an IDE1 HDD LED control signal 623 controls, after I/O control mouthful 621 signal feedings, one input value is effectively write by 72 pairs of these low levels of this test signal modular converter by system, be delivered to this IDE1 HDD LED control signal 623, this IDE1HDD LED control signal 623 receives this write I/O control mouthful 621 signals after, activating HDD LED signal 620 shows, then output in the control circuit 625 by HDD LED signal 620, after these control circuit 625 test comparison processing, be sent to a level circuit for detecting 627 again, this level circuit for detecting 627 is that low level is effective, when even test result is low level, it is normal to show that then this HDD LED 620 shows, when being high level as if test result, then shows this HDD LED 620 display abnormalities, there is fault, needs further to detect and get rid of this fault.This Power LED 640 writes motherboard register 641 by one to trigger the activation.When this step is carried out in detection, system provides this by this test signal test module 72 and writes motherboard register 641 Test input signals, after this input signal is sent to PowerLED 640, after 643 processing of control comparator circuit, comparative result is delivered in the level circuit for detecting 645, and this level circuit for detecting 645 also is that low level is effective.

Please refer to Fig. 6, the input end of this Audio test circuit comprises a CPLD Out0 signal 300, a CPLD Out2 signal 330 and one tested motherboard source of sound 320, and this CPLD Out0 signal 300 and this CPLD Out2 signal 330 all come from this test signal modular converter 72.When CPLD Out0 signal 300 is low level, it can constitute Line Out (input)/HP (Headphone earphone)-Line In (output) loop 340 with tested motherboard source of sound 320, and tested motherboard source of sound 320 is carried out the test of earpiece audio I/O quality aspect; When CPLD Out0 signal 300 was high level, it can constitute a MIC (Microphone loudspeaker)-Line In loop 350 with tested motherboard source of sound 320, and loudspeaker input quality is tested.No matter this CPLD Out0 signal 300 is low level or high level, as long as this CPLD Out2 signal 330 is when being in low level, system will this CPLDOut2 signal 330 of priority processing.When this CPLD Out2 signal 330 is low level, it will constitute a CD (Compact Disk CD) _ In-Speaker loop 360 with this tested motherboard audio frequency 320.When system begins to test, these CPLD Out2 signal 330 original states are high level, system at first is set to low level with this CPLD Out0 signal 300, make the tested motherboard source of sound 320 of itself and this constitute Line Out/HP-LineIn loop 340, system acquisition is tested required parameters then, outputs to a test loop 380 by this Line Out/HP-LineIn loop 340 and carries out functional test.Then, system changes to high level with the setting of this CPLD Out0 signal 300, make the tested motherboard source of sound 320 of itself and this constitute this MIC-LineIn loop 350, system also tests collection required parameters subsequently, outputs to this test loop 380 by this MIC-Line In loop 350 and carries out functional test.After CPLD Out0 signal 300 handled, system is low with the level of this CPLD Out2 signal 330 by high-transformation, shield this CPLDOut0 signal 300, thereby make the tested motherboard source of sound 320 of itself and this constitute this CD_In-Speaker loop 360, its output terminal also is connected to this test loop 380 and carries out functional test.

Please refer to Fig. 7, this battery test circuit is to establish standard value and compare according to tested motherboard battery and system are given, and filters out the defective products that magnitude of voltage is lower than standard value, reaches the purpose of test.This battery test circuit mainly comprises a battery standard duty control circuit 400, one tested motherboard battery 410, one CPLD Outputl (output) control signal 430, one control circuit 450, one standard value and actual value comparator circuit 470 and CPLD Input (input) circuit for detecting 490, during test, the output terminal of this tested motherboard battery 410 is connected in this control circuit 450, this CPLD Outputl control signal 430 comes from this test signal modular converter 72, its activation signal as this control circuit 450 is just effective at low level state, the value of this tested motherboard battery 410 that will gather after this control circuit 450 activates is delivered to this standard value and actual value comparator circuit 470, simultaneously, this standard value and actual value comparator circuit 470 also will be from these battery standard duty control circuit 400 acceptance criteria magnitudes of voltage, then standard value and actual value are delivered in this CPLD Input circuit for detecting 490 after relatively, if this fiducial value is a low level, the ecbatic of this CPLD Input circuit for detecting 490 will be shown as " Pass " (by), if this fiducial value is a high level, the ecbatic of this CPLD Input circuit for detecting 490 will be shown as " Fail " (not passing through).

Claims

1. a motherboard functional test plate comprises a VGA﹠amp; The AGP change-over circuit, described VGA﹠amp; The AGP change-over circuit comprises a signal automatic switch-over circuit, it is characterized in that: described test board also comprises a test signal modular converter, described test signal modular converter becomes the control signal that test macro is convenient to handle with the conversion of signals of motherboard to be tested, described test signal modular converter comprises a test signal output port and a control chip, one device signal is applied to the state of the control signal of the described conversion that is used to monitor described control chip output on the described control chip, described VGA﹠amp; The AGP change-over circuit passes through an activation trigger signal initial testing, and activates described signal automatic switch-over circuit by the control signal of described conversion, the automatic switchover of realization system between AGP and VGA test.

2. motherboard functional test plate as claimed in claim 1 is characterized in that: described VGA﹠amp; The AGP change-over circuit comprises that also an AGP shows that test circuit, a VGA show test circuit, reach a control circuit, described AGP shows that test circuit, described VGA show that test circuit and described control circuit all connect described signal automatic switch-over circuit, described trigger pip is applied to described AGP and shows on the test circuit, the control signal of described conversion is applied to described control circuit and controls described signal automatic switch-over circuit and be activated, and realizes the automatic conversion between AGP and VGA test.

3. motherboard functional test plate as claimed in claim 2, it is characterized in that: described trigger pip is with deciding described AGP to show that test circuit and described VGA show the right of priority problem of test circuit, if described trigger pip is a high level state, the described AGP of priority processing shows test circuit; If described trigger pip is a low level state, just the described VGA of priority processing shows test circuit.

4. motherboard functional test plate as claimed in claim 1, it is characterized in that: described test signal output port is used for exporting the test signal of motherboard to be tested, and exports it to described control chip.