CN100464152C - 基于直线相位的光栅自校正方法 - Google Patents
基于直线相位的光栅自校正方法 Download PDFInfo
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- CN100464152C CN100464152C CNB2007100235859A CN200710023585A CN100464152C CN 100464152 C CN100464152 C CN 100464152C CN B2007100235859 A CNB2007100235859 A CN B2007100235859A CN 200710023585 A CN200710023585 A CN 200710023585A CN 100464152 C CN100464152 C CN 100464152C
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生成光栅波形 | 直线拟合误差平均值 | 直线拟合方差平均值 |
梯形波光强100 | 0.0142735 | 0.000103435 |
余弦波光强100 | 0.0119914 | 0.000218207 |
三角波光强100 | 0.0072835 | 2.07023e-005 |
梯形波光强80 | 0.00547147 | 1.38708e-005 |
三角波光强80 | 0.0416861 | 0.00143287 |
余弦波光强80 | 0.0135341 | 0.000121239 |
梯形波光强60 | 0.00961065 | 5.01802e-005 |
三角波光强60 | 0.0285122 | 0.000765628 |
余弦波光强60 | 0.011759 | 8.28686e-005 |
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CNB2007100235859A CN100464152C (zh) | 2007-06-08 | 2007-06-08 | 基于直线相位的光栅自校正方法 |
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CNB2007100235859A CN100464152C (zh) | 2007-06-08 | 2007-06-08 | 基于直线相位的光栅自校正方法 |
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CN101067548A CN101067548A (zh) | 2007-11-07 |
CN100464152C true CN100464152C (zh) | 2009-02-25 |
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Families Citing this family (12)
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CN101975558B (zh) * | 2010-09-03 | 2012-04-11 | 东南大学 | 基于彩色光栅投影的快速三维测量方法 |
CN102261896A (zh) * | 2011-04-19 | 2011-11-30 | 长春东瑞科技发展有限公司 | 一种基于相位测量的物体三维形貌测量方法及*** |
CN102288131A (zh) * | 2011-05-12 | 2011-12-21 | 上海大学 | 物体360°轮廓误差的自适应条纹测量装置和方法 |
CN102564349A (zh) * | 2012-01-19 | 2012-07-11 | 周波 | 一种用于光学三维轮廓测量的正弦光栅的设计 |
CN102940492A (zh) * | 2012-11-12 | 2013-02-27 | 黑龙江省科学院自动化研究所 | 嵌入式三维双目扫描***及方法 |
CN103753585A (zh) * | 2014-01-10 | 2014-04-30 | 南通大学 | 一种基于视觉图像分析的机械手及抓紧力智能调节方法 |
CN105678296B (zh) * | 2015-12-30 | 2019-12-06 | 小米科技有限责任公司 | 确定字符倾斜角度的方法及装置 |
CN106289058B (zh) * | 2016-08-18 | 2019-04-23 | 广东工业大学 | 一种光栅尺定位分配精度补偿的方法 |
JP6924163B2 (ja) * | 2018-03-27 | 2021-08-25 | 株式会社日立製作所 | 撮像装置、撮像モジュールおよび撮像方法 |
CN110375671B (zh) * | 2019-02-19 | 2021-04-02 | 西安理工大学 | 一种相位误差的自校正方法 |
CN110895134B (zh) * | 2019-12-01 | 2021-06-29 | 南京理工大学 | 基于相移轮廓术在日光灯下进行高速三维形状测量的方法 |
CN112414304B (zh) * | 2020-11-18 | 2022-06-21 | 天津科技大学 | 基于激光光栅投射的焊后焊缝表面三维测量方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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WO1999028704A1 (en) * | 1997-12-02 | 1999-06-10 | Universita' Degli Studi Di Brescia | Process for the measurement of three dimensional (3d) profiles by means of structured light projection |
CN1786658A (zh) * | 2005-12-29 | 2006-06-14 | 清华紫光股份有限公司 | 一种采用双波长结构光测量物体轮廓的方法及装置 |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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WO1999028704A1 (en) * | 1997-12-02 | 1999-06-10 | Universita' Degli Studi Di Brescia | Process for the measurement of three dimensional (3d) profiles by means of structured light projection |
CN1786658A (zh) * | 2005-12-29 | 2006-06-14 | 清华紫光股份有限公司 | 一种采用双波长结构光测量物体轮廓的方法及装置 |
Non-Patent Citations (4)
Title |
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High Resolution Measurement of Phase-ShiftAmplitude and numeric Object Phase Calculation. Georg Wiora.Proceedings of SPIE,Vol.4117 . 2000 * |
一种光学三维测量中的相位计算及补偿方法. 姜涛,习俊通,张鸿梁,***.机械工程学报,第41卷第3期. 2005 * |
光栅投影三微形貌测量技术的研究. 吴双卿.西安交通大学研究生学位论文. 2005 * |
提高光栅投影测量精度的相移精确测量法. 潘伟,赵毅.上海交通大学学报,第37卷第7期. 2003 * |
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