CN100433171C - Storage device testing method and testing device - Google Patents
Storage device testing method and testing device Download PDFInfo
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- CN100433171C CN100433171C CNB2006100834757A CN200610083475A CN100433171C CN 100433171 C CN100433171 C CN 100433171C CN B2006100834757 A CNB2006100834757 A CN B2006100834757A CN 200610083475 A CN200610083475 A CN 200610083475A CN 100433171 C CN100433171 C CN 100433171C
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Abstract
The present invention discloses a storage device testing method which comprises storage device drive which is onload and is provided with a single operating interface, and a testing flow path which is built taking the single operation of the storage device as a base, wherein the single operation of the storage device is carried out through single operation interface driven by the storage device. The present invention can flexibly take the test for the storage device by various testing modes according to the requirements and support the test that a plurality of storage devices in various types can be simultaneously tested. The tested software by the present invention can run on an operating system and can also run under the condition of no operating system. The delamination architecture has good transplantation performance, which is convenient for expanding testing functions.
Description
Technical field
The present invention relates to computing machine and Network storage technology, relate in particular to the method for a kind of storage system test and use the device of this method.
Background technology
Memory device is of paramount importance role in the storage system, and the height of storage device performance directly has influence on the performance of total system.Collision and the vibration of memory device in transportation or use might cause damage to memory device, therefore need carry out comprehensive reliability testing to memory device.
With the hard disk test is example, standard A PI (the Application Program Interface that existing hard disk test software provides by direct call operation system usually, application programming interfaces) interface comes hard disk is tested, finish read-write to hard disk by operating system by the hard drive of bottom, its structure as shown in Figure 1.
Those skilled in the art will know that, the api interface of operating system designs at application program, be used for using hard disk but not testing hard disk, consider and use the required flexibility of operation of hard disk usually far below testing hard disk, can only support more single test mode by calling the test that standard A PI interface carried out, the structure of testing process must carry out on the basis of api interface, is difficult to organize neatly and revise every test function; Simultaneously, through api interface and bottom layer driving is two-layer call after, test performance often can not reach the maximum performance of hard disk.
Because the different api interface differences that operating system provided, therefore existing testing software generally can not transplant between different operating system.The testing process of a maturation usually needs could change the operating system of being moved through significantly changing, and this change can relate to the framework of whole testing software in some cases, has increased the time and the cost of test greatly.
Existing testing software is at the design of desktop hard disk market, and most of testing software once can only test a hard disk, when hard disk quantity to be tested is big, shortens the test duration and just need use considerable hardware resource.
Summary of the invention
The present invention will solve is that existing memory device testing software test mode is single and be difficult to reach the problem of the maximum performance of memory device.
Test method for storage devices of the present invention may further comprise the steps:
Loading provides the memory device of single operation interface to drive;
Obtain the information of the memory device that will test, and, generate testing process as the basis with single operation to memory device according to described information;
Execution is based on the testing process constructed to the single operation of memory device, and wherein the single operation to memory device is undertaken by the single operation interface that memory device drives.
Preferably, described execution testing process comprises:
Drive the instruction that writes single operation by the single operation interface to memory device, drive by memory device and carry out described instruction;
Read the instruction executing state that memory device drives, when producing mistake, stop test.
Preferably, described execution testing process also comprises: after the memory device driving command is finished, writes the single operation instruction once more or finish test according to testing process.
Preferably, described method also comprises: when testing above 1 memory device simultaneously, adopt polling mode to test according to the instruction executing state of each tested memory device and the testing process of this memory device.
Preferably, described memory device driving receives and carries out single operational order in the mode of round-robin queue.
Preferably, described single operation comprises read operation or write operation;
Described memory device the interface that provides is provided comprises the single operation interface and be used for the state output interface of output order executing state, and different memory devices that the interface that provides is provided is identical.
Alternatively, described memory device the interface that provides is provided also comprises operating system interface, is used for realizing the visit of operating system to memory device.
Another kind of test method for storage devices provided by the invention may further comprise the steps:
Obtain the information of the memory device that will test, and, generate testing process as the basis with single operation to memory device according to described information;
Carry out testing process, directly drive memory device and carry out single operation in the flow process.
Preferably, described testing process is that unit makes up with the atomic operation, and each atomic operation comprises a single operation in the testing process, comprising the single operation to memory device.
Preferably, described driving memory device carries out single operation and writes the single operation instruction and carry out by driving to memory device;
Described execution testing process comprises:
Write the single operation instruction to the memory device driving;
The instruction executing state that the monitoring memory device drives stops test when making a mistake;
After the instruction that write storage device drives is finished, carry out other outer atomic operations of the single operation of memory device;
Stop test until end of test (EOT) or when making a mistake according to testing process circulation above-mentioned steps.
Preferably, described method also comprises: when testing above 1 memory device simultaneously, adopt polling mode to carry out the testing process of each memory device respectively.
The present invention also provides a kind of memory device proving installation, comprises test module, operational module, interactive module and driver module, wherein:
Driver module comprises the single operation instruction that receives and carry out memory device with visiting tested memory device; The tested memory device of described visit also comprises the information that obtains tested memory device, and transfers to interactive module by operational module, generates testing process according to this for interactive module;
Interactive module is used for generating testing process according to the information of tested memory device, and starts and stop test module execution testing process;
Test module is used for carrying out the testing process based on constructed to the single operation of memory device, and wherein the single operation to memory device is undertaken by send the single operation instruction to driver module.
Preferably, it is characterized in that: described driver module surpasses 1, and respectively with visiting different memory devices, the single operation instruction that each driver module received and carried out has identical form.
The present invention is by being split as single operation with the visit to memory device in the testing process, and directly drives memory device by test procedure and carry out single operation, improved the accuracy to the storage device performance test; Because single operation is the basic operation unit in the various test modes, be basis tested tissue flow process easily and flexibly simultaneously, be easy to conversion test mode and the new content measurement of expansion with the single operation; In addition, the present invention has reduced the coupling with operating system, has reduced the workload of platform transplantation;
Further, the present invention by each memory device of poll state and send single operation instruction to each memory device in view of the above, realized that a plurality of memory devices test simultaneously, and each memory device can have independently testing process.
Description of drawings
Fig. 1 is the structural representation of memory device testing software in the prior art;
Fig. 2 is the process flow diagram of memory device method of testing of the present invention;
Fig. 3 is the hierarchy synoptic diagram of the testing software of realization according to the present invention;
Fig. 4 is the structural representation of the embodiment of the invention one;
Fig. 5 is the status transition chart of memory device test process among the present invention;
Fig. 6 is the structural representation of the embodiment of the invention two;
Fig. 7 is the structural representation of memory device proving installation of the present invention.
Embodiment
Though drive software and api interface are provided in the operating system, can visit tested memory device for testing software, but can not reach the maximum performance of memory device usually, and make that the degree of coupling of testing software and operating system is too high, limit the platform transplantation of testing software.One skilled in the art will appreciate that and on big as far as possible degree, to bring into play its performance the direct control of hardware; But simultaneously, the testing software main body should reduce the degree of coupling with hardware equally, so that can be conveniently used for testing different types of memory device, adopt the mode of in carrying out testing process, directly calling driving to carry out storage device access among the present invention through simple change.
In order to take into account to the test of storage device performance and the decoupling zero of testing software main body and hardware, the interface that is provided is provided memory device should be common to polytype memory device as far as possible, has as far as possible little operating unit again so that satisfy the performance test requirement simultaneously.Consider that the test operation of memory device can decompose the read operation and the write operation of memory device, and any memory device driving all can provide read operation interface and write operation interface at least, the unit of operating as the driving memory device with the single operation that comprises read operation and/or write operation among the present invention.
Consider testing process again, can be divided into the test of read-write memory device, read the memory device test and write memory device test etc. the test of memory device; From measurement direction, can be divided into sequential testing, inverted order test, random test etc.; From the test duration, can be divided into test fixed time, test designated capabilities etc.Analyzing the flow process of these tests can find, each test all is made up of some shirtsleeve operations, and whole testing process can be regarded as the circulation of these simple operationss and carries out.
Owing to need call the single operation interface that memory device drives to be provided when carrying out testing process, testing process need make up based on the single operation to memory device, except that storage device access other operation in the testing process also can be split as single operation like this, each single operation is only finished a concrete operations step in the flow process, this concrete operations step can not or needn't be cut apart under testing process and hardware and the alap condition of the operating system degree of coupling again, is referred to as atomic operation among the present invention.
For example, testing process can be split as the atomic operation shown in the table one:
Table one
Need to prove that in the table one, RandomAddressOperate is used for keeping at a distance after being provided with random address, address overflow error taking place between the maximum address of largest random address and memory device with the read-write operation that prevents to carry out; CheckAddressOperate detects in increasing progressively or can being used as done state when successively decreasing read-write operation of order, and when the memory device current address exceeded the effective address scope, the declaration order operation was finished; When SafeStopPoint is used for needing to stop after carrying out atomic operation CheckAddressOperate or StopXXXOperate, the next one of atomic operation tabulation is operated one of pointed do not have the place that operation is performed; NOP cooperates with SafeStopPoint at atomic operation tabulation end, prevents the full state of instruction queue in the memory device driving.
As seen, also be a kind of atomic operation in the testing process to the single operation of memory device.Make up the dirigibility that testing process can greatly increase test by atomic operation, when carrying out atomic operation by reasonable realization simultaneously and the interface of operating system can reduce to the degree of coupling of testing software and operating system minimum.
The flow process of memory device method of testing of the present invention as shown in Figure 2.At step S210, load the memory device that the single operation interface is provided and drive.Among the present invention, memory device drives and provides read operation interface and write operation interface to upper layer software (applications), receives the memory device operational order by these two interfaces; Can also provide the state output interface in addition, keep supplying the executing state that layer software reads its instruction.
Because read operation and write operation and the read-write state output basic functions that is memory device, those skilled in the art do not need creative work can realize having the driving of above-mentioned interface, repeat no more among the present invention.
The present invention is recommended in the memory device driving and adopts round-robin queue to receive and carry out single operational order, and reason is the processing mode that a lot of memory devices itself are supported round-robin queue, can improve the efficient of software like this.Even memory device is not supported, realize also can reaching the purpose of raising operational efficiency in the mode of management cycle formation to the driving of memory device.
At step S220, obtain storing device information.Can before being tested, memory device obtain the routine information of memory device in advance, the for example kind of memory device, capacity, number or the like, also can read above-mentioned information by the interface that memory device provides is online, offer tester or upper layer software (applications), the testing process that decision will be carried out.
At step S230, generate testing process according to storing device information.After determining the test that to carry out, serve as that the basis generates testing process with single operation to memory device.
Generally include preprocessing process in the testing process, to the atomic operation of memory device with to processing of memory device operating result etc.Wherein, the preliminary work that preprocessing process is tested, for example the address realm of the distribution of buffer area, tested storage area presets or the like; Atomic operation to memory device can be an atomic operation, also can be a plurality of continuous atomic operations, and memory device is conducted interviews; Processing to the memory device operating result mainly comprises error-detecting, function timing etc., collects the foundation that generates test result.
When the single operation of memory device is made up testing process, in fact the processing procedure of preprocessing process and operating result is also because of need being complementary with the visit to memory device, and often is that unit makes up with the atomic operation.For example,, all capacity readwrite tests of hard disk be carried out, such operating list can be set up according to the atomic operation in the table one:
1 WriteOperate 0x10000 Buffer1
2 ReadOperate 0x10000 Buffer2
3 CompareOperate Buffer1 Buffer2
4 IncreaseAddressOperate?0x10000
5 CheckAddressOperate
6 WriteOperate 0x10000 Buffer3
7 ReadOperate 0x10000 Buffer4
8 CompareOperate Buffer3 Buffer4
9 IncreaseAddressOperate 0x10000
10?CheckAddressOperate
11?JumpOperate 1
12?NOP
13?SafeStopPoint
14 NOP
If carry out the random read-write test of certain hour, can set up such operating list:
21 WriteOperate 0x10000 Buffer1
22 ReadOperate 0x10000 Buffer2
23 CompareOperate Buffer1 Buffer2
24 RamdonAddressOperate 0x10000
25 WriteOperate 0x10000 Buffer3
26 ReadOperate 0x10000 Buffer4
27 CompareOperate Buffer3 Buffer4
28 RamdonAddressOperate 0x10000
29 StopWhenTimerReachOperate
30 JumpOperate 21
31 NOP
32 SafeStopPoint
33 NOP
Like this, test process use atomic operation is tabulated and is represented, just can organize various tests neatly.In case existing atomic operation tabulation can not be satisfied the needs of test, only need to add new atomic operation and just can set up new tabulation, and the framework of whole testing software is not had influence.
After generating testing process, step afterwards is the implementation to testing process, and pre-service, the instruction storage equipment that comprises test carries out single operation and operating result handled etc.Because the pre-service of test and operating result are handled the atom tabulation that obtains according to fractionation and be easy to those skilled in the art realize in conjunction with prior art, below mainly the process that relates to the memory device single operation is described.Instruction storage equipment carries out single operation and the single operation interface that is provided is provided realizes by being invoked at the memory device that loads among the step S210.
It is to be noted, in concrete implementation and the testing process operations put in order relevant, the implementation of describing among the step S240 to S290 is a kind of more excellent realization, may change the execution sequence of each step in the practical application according to putting in order of operating in the testing process.
At step S240, drive the instruction that writes single operation to memory device by the single operation interface.Instruction write finish after, memory device drives and promptly to begin to carry out the instruction that is write.
At step S250, the implementation that the monitoring memory device drives is if make a mistake in the implementation then stop test; Otherwise change step S260.Whether can drive the state output interface that provides by memory device to making a mistake in the implementation monitors.
At step S260, judge memory device drives whether the intact single operation that writes of executed instructs, if, execution in step S270; If not, change step S250, continue the execution process instruction that the monitoring memory device drives.
At step S270, handle the instruction execution result of memory device.
At step S280, judge whether execution result makes a mistake, if then stop test; Otherwise change step S290.
At step S290, judge whether to also have in the testing process operation to memory device, if, change step S240, continue to carry out single operation to memory device; Otherwise testing process finishes.
The flow process of step S240 to S290 for a memory device is tested.Support of the present invention is tested a plurality of memory devices simultaneously, when two or more memory devices are tested simultaneously, can carry out the testing process of each memory device respectively, write the single operation instruction to each memory device respectively, adopt polling mode to monitor the instruction executing state of all memory devices of testing simultaneously, respectively it is dispatched according to the testing process and the instruction executing state of each memory device.In other words, each memory device is carried out its testing process respectively, monitor its executing state and when certain state occurring, handle accordingly with polling mode.
The memory device of variety classes, manufacturer, model has different drivings, can make read operation interface, write operation interface and state output interface that each memory device drives and equipment output interface etc. have unified format among the present invention, need not change testing software like this, and the driving that only need load corresponding to tested memory device gets final product.In addition, management and display interface that testing software provides to the tester usually, the tester can inquire about the information of tested memory device by this interface, edit and issue testing process, starting and stop testing process carrying out, check flow performing state etc., because the realization at this interface is often relevant with the hardware and software system that testing software is moved, can make this interface realization and testing process carry out between these two parts equally by unified interface Data transmission and order, when changing operation platform, only need the interface is realized that part correspondingly change, with the platform-neutral of further increase testing software.
Like this, testing software among the present invention can have hierarchy as shown in Figure 3, comprise interbedded formation, operation layer and Drive Layer, interbedded formation is finished the interactive function with the tester, sends testing process and control command, obtains the information of tested memory device and the executing state of testing process etc. from operation layer to operation layer; Operation layer is carried out testing process according to the instruction of interbedded formation, to Drive Layer transmit operation instruction, from Drive Layer reading command executing state etc.; Drive Layer is finished the practical operation to tested memory device, the return state.All adopt unified interface to visit mutually between operation layer and interbedded formation, operation layer and the Drive Layer, to realize high as far as possible platform and hardware independence.
The present invention can combine realization with operating system, also can realize separately by separating system.Below illustrated respectively with two embodiment.
In embodiment one, binding operation system of testing software realizes that its structure as shown in Figure 4.Tested memory device is SATA (Serial Advanced Technology Attachment in the present embodiment, the serial ATA bus) hard disk, after loading the SATA driving, by SATA drive and operation layer between, interface between operation layer and the interbedded formation, the user can be learnt the information of institute's connection hard disk by interbedded formation.SATA drives to operation layer provides the reading and writing operation-interface to send the single operation instruction for it, provide the state output interface to obtain the instruction executing state, can provide the information output interface to obtain the information of SATA hard disk by operation layer for interbedded formation in addition for operation layer.
Because present embodiment binding operation system realizes, so SATA drives operating system interface also is provided, and calls for operating system, to realize the visit of operating system to hard disk.Operating system interface can be realized with reference to the driving of the memory device under the operating system in the prior art.
Interbedded formation is set up a passage that supplies the user to control test on operating system, how the user can test according to the decision of SATA hard disk information, generates testing process according to the single operation to hard disk, by interbedded formation testing process is transferred to operation layer and carries out.In addition, interbedded formation can also provide for the user start, stop, the management tool of control and measuring flow performing.Testing process can be made up of a series of atomic operation.
Operation layer is carried out the testing process that receives from interbedded formation, and direct instruction SATA drives the read-write single operation that carries out in the testing process.Operation layer is the main part of testing software, and the variation of testing process only can have influence on the atomic operation tabulation, and the memory device of test different types also only needs corresponding driving, and can not have influence on operation layer.
Operation layer adopts the mode of poll and state machine to come tested hard disk is dispatched, and its status change as shown in Figure 5.After initial work is finished, write the single operation instruction to the SATA driving; After instruction was filled in and finished, SATA drove and begins to carry out the operational order that writes; Operation layer reads the instruction executing state of SATA driving and carries out fault processing, stops test when making a mistake; After SATA drove the instruction that will write and is finished, operation layer was carried out the operation in other atoms tabulations, mainly comprises the processing of instruction execution result and the preliminary work that next time, instruction was carried out; If according to testing process also needs carry out operation to hard disk, then forward instruction to and fill in, proceed test; If all atomic operation executeds finish or result treatment in make a mistake, then stop the test.
Operation layer can be tested a plurality of hard disks simultaneously, carries out operation in its testing process respectively by the instruction executing state of each hard disk of poll, and all hard disks are carried out in turn successively.Be finished usually for some time at interval owing in test process, instruction is sent to hard disk to instruction, so adopt polling mode can support a plurality of hard disks to test simultaneously.
Except that interbedded formation realized on operating system, interbedded formation, operation layer and Drive Layer also can realize some support functions by the function that operating system provides, as Memory Allocation, mathematical computations, demonstration printing etc.When being transplanted to other operating systems, interbedded formation and these support function to make amendment.
Obviously, present embodiment is equally applicable to other memory devices, is loading a plurality of memory devices when driving, and is applicable to that also a plurality of different types of memory devices test simultaneously.
Testing software is embedded among the BIOS (Basic Input Output System, Basic Input or Output System (BIOS)) among the embodiment two, and separating system realizes that its structure as shown in Figure 6.
Embodiment two comprises with the difference of embodiment one: tested memory device is SATA hard disk and ATA (Advanced Technology Attachment) hard disk, so operation layer need load, and ATA drives and SATA drives; Interbedded formation is based upon on the user setup interface of BIOS, and the instrument of required test-types that carries out of configuration and parameter is provided to the user; Because separating system moves, the employed support function of interbedded formation, operation layer and driving needs to realize separately as Memory Allocation/release function, internal memory copy function, string operation function, demonstration output function and data-switching function etc. simultaneously.Embodiment two no longer repeats with the something in common of embodiment one.
Figure 7 shows that the structural representation of memory device proving installation of the present invention, interactive module 710 connects test module 720, and test module 720 connects more than one driver module, and each driver module connects more than one memory device; Be that test module 720 connects driver module 731 and 732 shown in the figure, driver module 731 connects memory device 741 and 742, and driver module 732 connects memory device 743 and 744.
Driver module is realized it is connected the visit of memory device, and the single operation instruction comprising receiving and carry out memory device can also comprise to operational module 720 output order executing states and storing device information etc.Driver module 731 is connected different memory devices usually with 732, realizes the visit to different storage device, and when the single operation instruction that each driver module received and carried out had identical form, the memory device proving installation had better hardware independence.
The present invention is split as atomic operation with testing process, can adopt various test mode that memory device is tested neatly as required; Test when supporting different types of memory device test, a plurality of and multiple memory device; The testing software that realizes according to the present invention may operate on the operating system, also may operate under the environment of no operating system, and its layer architecture has good transplantability, is convenient to the extend testing function.
Above-described embodiment of the present invention does not constitute the qualification to protection domain of the present invention.Any any modification of being done within the spirit and principles in the present invention, be equal to and replace and improvement etc., all should be included within the claim protection domain of the present invention.
Claims (13)
1. a test method for storage devices is characterized in that, may further comprise the steps:
Loading provides the memory device of single operation interface to drive;
Obtain the information of the memory device that will test, and, generate testing process as the basis with single operation to memory device according to described information;
Execution is based on the testing process constructed to the single operation of memory device, and wherein the single operation to memory device is undertaken by the single operation interface that memory device drives.
2. test method for storage devices according to claim 1 is characterized in that described execution testing process comprises:
Drive the instruction that writes single operation by the single operation interface to memory device, drive by memory device and carry out described instruction;
Read the instruction executing state that memory device drives, when producing mistake, stop test.
3. as test method for storage devices as described in the claim 2, it is characterized in that described execution testing process also comprises: after the memory device driving command is finished, writes the single operation instruction once more or finish test according to testing process.
4. as test method for storage devices as described in the claim 3, it is characterized in that, described method also comprises: when testing above 1 memory device simultaneously, adopt polling mode to test according to the instruction executing state of each tested memory device and the testing process of this memory device.
5. as test method for storage devices as described in the claim 2, it is characterized in that: the mode that described memory device drives with round-robin queue receives and carries out single operational order.
6. as test method for storage devices as described in any one of the claim 2 to 5, it is characterized in that: described single operation comprises read operation or write operation;
Described memory device the interface that provides is provided comprises the single operation interface and be used for the state output interface of output order executing state, and different memory devices that the interface that provides is provided is identical.
7. as test method for storage devices as described in the claim 6, it is characterized in that: described memory device the interface that provides is provided also comprises operating system interface, is used for realizing the visit of operating system to memory device.
8. a test method for storage devices is characterized in that, may further comprise the steps:
Obtain the information of the memory device that will test, and, generate testing process as the basis with single operation to memory device according to described information;
Carry out testing process, directly drive memory device and carry out single operation in the flow process.
9. as test method for storage devices as described in the claim 8, it is characterized in that: described testing process is that unit makes up with the atomic operation, and each atomic operation comprises a single operation in the testing process, comprising the single operation to memory device.
10. as test method for storage devices as described in the claim 9, it is characterized in that: described driving memory device carries out single operation and writes the single operation instruction and carry out by driving to memory device;
Described execution testing process comprises:
Write the single operation instruction to the memory device driving;
The instruction executing state that the monitoring memory device drives stops test when making a mistake;
After the instruction that write storage device drives is finished, carry out other outer atomic operations of the single operation of memory device;
Stop test until end of test (EOT) or when making a mistake according to testing process circulation above-mentioned steps.
11., it is characterized in that described method also comprises: when test surpasses 1 memory device simultaneously, adopt polling mode to carry out the testing process of each memory device respectively as test method for storage devices as described in the claim 10.
12. a memory device proving installation is characterized in that, comprises test module, operational module, interactive module and driver module, wherein:
Driver module comprises the single operation instruction that receives and carry out memory device with visiting tested memory device; The tested memory device of described visit also comprises the information that obtains tested memory device, and transfers to interactive module by operational module, generates testing process according to this for interactive module;
Interactive module is used for generating testing process according to the information of tested memory device, and starts and stop test module execution testing process;
Test module is used for carrying out the testing process based on constructed to the single operation of memory device, and wherein the single operation to memory device is undertaken by send the single operation instruction to driver module.
13. memory device proving installation as claimed in claim 12 is characterized in that: described driver module surpasses 1, and respectively with visiting different memory devices, the single operation instruction that each driver module received and carried out has identical form.
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| CN102016611B (en) * | 2009-04-17 | 2015-02-04 | 泰拉丁公司 | Storage device testing |
| US9001456B2 (en) * | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
| CN102393829B (en) * | 2011-10-31 | 2014-02-12 | 华南理工大学 | Disk I/O (Input/Output) test system oriented to embedded system |
| CN105338381A (en) * | 2015-10-29 | 2016-02-17 | 无锡天脉聚源传媒科技有限公司 | Instruction transmitting method and device |
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| US6327150B1 (en) * | 2000-02-10 | 2001-12-04 | Maxtor Corporation | Disk drive test rack with universal electrical connector |
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