CN100428415C - 基于氮化硅镂空掩模的纳米电极制备方法 - Google Patents
基于氮化硅镂空掩模的纳米电极制备方法 Download PDFInfo
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- CN100428415C CN100428415C CNB2005100852943A CN200510085294A CN100428415C CN 100428415 C CN100428415 C CN 100428415C CN B2005100852943 A CNB2005100852943 A CN B2005100852943A CN 200510085294 A CN200510085294 A CN 200510085294A CN 100428415 C CN100428415 C CN 100428415C
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- silicon nitride
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- 229910052581 Si3N4 Inorganic materials 0.000 title claims abstract description 54
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 title claims abstract description 54
- 238000002360 preparation method Methods 0.000 title abstract description 6
- 239000000758 substrate Substances 0.000 claims abstract description 39
- 238000000034 method Methods 0.000 claims abstract description 28
- 238000001259 photo etching Methods 0.000 claims abstract description 12
- 238000005530 etching Methods 0.000 claims abstract description 11
- 229910052751 metal Inorganic materials 0.000 claims abstract description 11
- 239000002184 metal Substances 0.000 claims abstract description 11
- 238000001704 evaporation Methods 0.000 claims abstract description 8
- 238000004528 spin coating Methods 0.000 claims abstract description 8
- 238000004544 sputter deposition Methods 0.000 claims abstract description 8
- 230000007797 corrosion Effects 0.000 claims abstract description 6
- 238000005260 corrosion Methods 0.000 claims abstract description 6
- 238000000151 deposition Methods 0.000 claims abstract description 6
- 238000001039 wet etching Methods 0.000 claims description 8
- 230000008020 evaporation Effects 0.000 claims description 7
- 239000003795 chemical substances by application Substances 0.000 claims description 6
- 230000003628 erosive effect Effects 0.000 claims description 6
- 238000002164 ion-beam lithography Methods 0.000 claims description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 6
- 230000008021 deposition Effects 0.000 claims description 5
- 238000001312 dry etching Methods 0.000 claims description 5
- 238000005229 chemical vapour deposition Methods 0.000 claims description 3
- 238000004821 distillation Methods 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 239000002245 particle Substances 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims description 2
- 229910052731 fluorine Inorganic materials 0.000 claims description 2
- 239000011737 fluorine Substances 0.000 claims description 2
- 239000003112 inhibitor Substances 0.000 abstract 1
- 238000010884 ion-beam technique Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
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Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CNB2005100852943A CN100428415C (zh) | 2005-07-22 | 2005-07-22 | 基于氮化硅镂空掩模的纳米电极制备方法 |
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CNB2005100852943A CN100428415C (zh) | 2005-07-22 | 2005-07-22 | 基于氮化硅镂空掩模的纳米电极制备方法 |
Publications (2)
Publication Number | Publication Date |
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CN1901141A CN1901141A (zh) | 2007-01-24 |
CN100428415C true CN100428415C (zh) | 2008-10-22 |
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CNB2005100852943A Expired - Fee Related CN100428415C (zh) | 2005-07-22 | 2005-07-22 | 基于氮化硅镂空掩模的纳米电极制备方法 |
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CN (1) | CN100428415C (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110923623A (zh) * | 2019-12-06 | 2020-03-27 | 苏州逸峰新材料科技有限公司 | 一种磁场吸附辅助掩模蒸镀微纳结构的制备方法 |
CN112563124A (zh) * | 2020-12-10 | 2021-03-26 | 西安电子科技大学 | 一种大面积超薄镂空硬掩模的制备方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01238176A (ja) * | 1988-03-18 | 1989-09-22 | Nec Corp | 化合物半導体電界効果トランジスタおよびその製造方法 |
US5308442A (en) * | 1993-01-25 | 1994-05-03 | Hewlett-Packard Company | Anisotropically etched ink fill slots in silicon |
-
2005
- 2005-07-22 CN CNB2005100852943A patent/CN100428415C/zh not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01238176A (ja) * | 1988-03-18 | 1989-09-22 | Nec Corp | 化合物半導体電界効果トランジスタおよびその製造方法 |
US5308442A (en) * | 1993-01-25 | 1994-05-03 | Hewlett-Packard Company | Anisotropically etched ink fill slots in silicon |
Non-Patent Citations (1)
Title |
---|
Sub-um wide channels with surface potential compensated byfocused Si ion beam implantation. Toshimasa Fujisawa,Tadashi Saku, Yoshiro Hirayama, SeigoTarucha.Appl. Phys. Lett.,Vol.63 No.1. 1993 * |
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CN1901141A (zh) | 2007-01-24 |
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Effective date of registration: 20130419 Address after: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee after: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) Corp. Patentee after: Institute of Microelectronics of the Chinese Academy of Sciences Address before: 100029 Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee before: Institute of Microelectronics of the Chinese Academy of Sciences |
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