CN100356137C - Method and device for automatic on-line measurement of optical sheet warp - Google Patents
Method and device for automatic on-line measurement of optical sheet warp Download PDFInfo
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- CN100356137C CN100356137C CNB2004100869329A CN200410086932A CN100356137C CN 100356137 C CN100356137 C CN 100356137C CN B2004100869329 A CNB2004100869329 A CN B2004100869329A CN 200410086932 A CN200410086932 A CN 200410086932A CN 100356137 C CN100356137 C CN 100356137C
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- optical sheet
- measuring beam
- conveying belt
- measuring
- warpage
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Abstract
The present invention discloses a method and a device for the automatic on-line measurement of the warping of an optical sheet. The method uses a conveying belt to move the optical sheet, at least one measuring optical beam is arranged on the conveying belt, and the warping of the optical sheet is judged when the optical sheet shields the measuring optical beam. The present invention uses accurate optical measurement to realize the on-line automatic measurement of the warping of the optical sheet, can effectively improve the accuracy of the measurement and greatly enhances measuring speed.
Description
Technical field
The present invention relates to a kind of manufacturing process and product managing method of optical sheet, but and particularly relate to measuring method and the device that the optical sheet warp of robotization was measured and be easy to a kind of online in real time.
Background technology
Advantages such as LCD has that high image quality, volume are little, in light weight, low voltage drive, low consumpting power and applied range.Therefore be widely used in medium and small Portable TV, mobile phone, shoot with video-corder consumer electronics or computer products such as projector, mobile computer, desktop display and projection TV, and (cathode ray tube CRT) becomes the main flow of display to replace cathode-ray tube (CRT) gradually.
In LCD, Polarizer is one of main composition assembly of its liquid crystal panel.Polarizer can be made up of one or more optical sheet, except polarisation function originally, can more have other function of for example peep-proof, optical compensation etc. concurrently.Generally speaking, optical sheet may produce warpage because of preparation technology is bad.The optical sheet of warpage can't entirely fit in liquid crystal panel, and cause the not good problem of LCD quality when fitting with liquid crystal panel.
Therefore, known technology can just have been made when having finished at optical sheet, utilizes the method for manual measurement to measure the warpage of optical sheet, conforms with the optical sheet of product pipe standards to filter out warpage degree.Yet the manual measurement method that this kind is traditional is also inconvenient, and accuracy is very low, causes the not good problem of QC because of measuring error easily.Moreover the Measuring Time of manual measurement is very long, not only drags slower rays to learn the speed of production of thin plate, and very waste of manpower, causes the burden of manufacturing cost.
Summary of the invention
Purpose of the present invention is providing a kind of on-line automatic measurement optical sheet warp exactly, and the variation that utilizes light intensity is on-line measurement optical sheet warpage whether in real time, and is easy to be incorporated among the production procedure of robotization.
Another object of the present invention is at the device that a kind of on-line automatic measurement optical sheet warp is provided, can improve measurement accuracy, speed measuring speed, promote QC ability and production capacity, and save manpower to reduce manufacturing cost.
For achieving the above object, the invention provides a kind of method of on-line automatic measurement optical sheet warp, comprise: a plurality of measuring beams are set on a conveying belt, and the level height of described a plurality of measuring beams and inequality; Utilize this conveying belt to move an optical sheet; And when this optical sheet blocks described measuring beam, judge that this optical sheet is a warpage.
The level height of each measuring beam is that the direct of travel according to this conveying belt successively decreases in regular turn.
This method also comprises the level height according to each measuring beam, and the optical sheet that each measuring beam is judged to be warpage is made grade separation.
The present invention also provides a kind of device of on-line automatic measurement optical sheet warp, comprises: a conveying belt, carry an optical sheet; At least one light source is launched a plurality of measuring beams, and wherein said measuring beam is positioned at this conveying belt top, and the level height of described measuring beam and inequality; A plurality of detecting devices receive this measuring beam, and wherein when this optical sheet blocks one of described measuring beam, described detecting device judges that this optical sheet is a warpage.
This device also comprises one and picks equipment, picks in order to the optical sheet with this warpage and leaves this conveying belt.
This light source is a LASER Light Source or an ordinary light source.
This detecting device is Charged Coupled Device, photomultiplier or optical diode.
This device also comprises a pin hole, is disposed in the light path of this measuring beam to improve the accuracy of measuring.
That is to say that the method and apparatus of the on-line automatic measurement optical sheet warp that the present invention proposes is that a plurality of measuring beams are set on a conveying belt, and the level height of described a plurality of measuring beams and inequality; Utilize conveying belt mobile optical thin plate, when optical sheet blocks measuring beam, judge that optical sheet is a warpage.
According to a preferred embodiment of the present invention, measuring beam is produced by a light source, and is received by a detecting device.Light source is LASER Light Source or ordinary light source, and detecting device is Charged Coupled Device, photomultiplier or optical diode.In addition, this device also comprises a pin hole, is disposed in the light path of measuring beam, to improve the accuracy of measuring.
According to another preferred embodiment of the present invention, a plurality of level heights and measuring beam inequality also can be set, and the level height of each measuring beam is successively decreased in regular turn according to the direct of travel of conveying belt on conveying belt.So, can be according to the level height of each measuring beam, the optical sheet that each measuring beam is judged to be warpage is made grade separation, and utilizes the equipment that picks that the optical sheet of warpage is picked and leave conveying belt.
Moreover the device in this preferred embodiment also comprises a plurality of detecting devices, in order to receive described measuring beam.Described measuring beam can directly be launched by a plurality of light sources, or is cooperatively interacted by a plurality of spectroscopes and single light source and to form.
The present invention utilizes conveying belt that optical sheet is passed through between light source and the detecting device, and measure the intensity variation of light simultaneously, so the on-line automatic measurement of reaching optical sheet warp by accurate optical measurement can improve the accuracy of measurement effectively, and speed measuring speed significantly.Because the present invention can finish by photoelectric subassembly and computer controlled automatic, therefore be easy to combine with the automated production flow process, not only QC ability and production capacity can be promoted, and manpower can be saved to reduce manufacturing cost.
Description of drawings
For above and other objects of the present invention, feature, advantage and embodiment can be become apparent, right
Accompanying drawing is described in detail as follows:
Fig. 1 is the synoptic diagram of a preferred embodiment of the present invention; And
Fig. 2 is the synoptic diagram of another preferred embodiment of the present invention.
Wherein, description of reference numerals is as follows:
102: conveying belt; 104: measuring beam;
110: optical sheet; 114: light source;
124: detecting device; 134: pin hole;
204a, 204b, 204c: measuring beam;
214: light source;
214a, 214b, 214c: spectroscope;
224a, 224b, 224c: detecting device;
240: pick equipment.
Embodiment
Fig. 1 illustrates the synoptic diagram of a preferred embodiment of the present invention.As shown in Figure 1, optical sheet 110, for example Polarizer is to move on conveying belt 102.This preferred embodiment is that at least one measuring beam 104 is set on conveying belt 102, when the optical sheet 110 in moving blocks measuring beam 104, judges that optical sheet 110 is a warpage.Because conveying belt 102 can be incorporated among the known optical sheet manufacturing process easily, therefore utilize this preferred embodiment apparatus and method can the production online in real time whether measure optical sheet 110 be warpage.
In this preferred embodiment, measuring beam 104 is produced by light source 114, and is received by detecting device 124.Light source 114 can be LASER Light Source or ordinary light source, and for example He-Ne Lasers, diode laser, Halogen lamp LED or other wavelength that emits beam can produce intensity variation person because of blocking of optical sheet 110, all are applicable among the present invention.124 of detecting devices can be Charged Coupled Device (Charge CoupledDevice; CCD), photomultiplier (Photomultiplier Tube; PMT) or optical diode (Photodiode).Whether and the wavelength of light source 114 emitted lights that the applicable wavelengths of this detecting device 124 should be corresponding with it matches, can be because of caused the variation of its light intensity by the warpage partial occlusion of optical sheet 110 to observe measuring beam 104.
Accuracy when in addition, this preferred embodiment also provides several methods to improve optical measurement.For instance, this preferred embodiment promptly between light source 114 and the detecting device 124, is disposed at least one pin hole 134 in the optical path of measuring beam 104, utilizes the characteristic of pin hole 134 limitation optical paths to improve the accuracy of optical measurement.Moreover, when measuring the intensity variation of measuring beam 104, also can control the accuracy of optical measurement by the critical value (Threshold Value) of adjusting detecting device 124.
In brief, other technology that is used for improving the optical measurement accuracy in known skill all should spirit according to the invention and scope, know this operator when understanding easily and using it among the present invention, be not subject to the above-mentioned technological means that only can use preferred embodiment of the present invention to disclose.
Fig. 2 illustrates the synoptic diagram of another preferred embodiment of the present invention.As shown in Figure 2, this preferred embodiment is that a plurality of measuring beam 204a, 204b and 204c are set on conveying belt 102.The level height d of measuring beam 204a, 204b and 204c
1, d
2And d
3And inequality, and the level height d of measuring beam 204a, 204b and 204c
1, d
2And d
3Be that direct of travel according to conveying belt 102 successively decreases in regular turn.
So, can be according to the level height d of measuring beam 204a, 204b and 204c
1, d
2And d
3, the optical sheet that is judged to be warpage by different measuring light beam 204a, 204b or 204c is made the grade separation of warpage degree.The grade separation mode that also cooperates this warpage degree in this preferred embodiment, use one to pick equipment 240, for example mechanical arm or vacsorb equipment, the optical sheet that is judged as warpage picked leave conveying belt 102, and according to its warpage degree it is classified, so to realize that automatic online measures the optical sheet warpage degree and finish the purpose of grade separation.
Moreover this preferred embodiment is to utilize a plurality of detecting device 224a, 224b and 224c to receive measuring beam 204a, 204b and 204c.And on the other hand, with detecting device 224a, 224b and the corresponding light source of 224c, can be directly launch (i.e. the configuration of the corresponding detecting device of a light source), or cooperatively interact by a plurality of spectroscope 214a, 214b and 214c and single light source 214 and to form, as shown in Figure 2 by a plurality of light sources.Similarly, the method for above-mentioned raising optical measurement accuracy also can apply to repeat no more in this preferred embodiment herein.
The present invention utilizes conveying belt that optical sheet is passed through between light source and the detecting device, and measure the intensity variation of light simultaneously, so the on-line automatic measurement of reaching optical sheet warp by accurate optical measurement can improve the accuracy of measurement effectively, and speed measuring speed significantly.Because the present invention can finish by photoelectric subassembly and computer controlled automatic, therefore be easy to combine with the automated production flow process, not only QC ability and production capacity can be promoted, and manpower can be saved to reduce manufacturing cost.
Though the present invention discloses as above with a preferred embodiment; right its is not in order to limiting the present invention, anyly is familiar with this operator, without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion as the claim person of defining that look.
Claims (8)
1. the method for an on-line automatic measurement optical sheet warp is characterized in that, comprises:
A plurality of measuring beams are set on a conveying belt, and the level height of described a plurality of measuring beams and inequality;
Utilize this conveying belt to move an optical sheet; And
When this optical sheet blocks described measuring beam, judge that this optical sheet is a warpage.
2. the method for claim 1 is characterized in that, the level height of each measuring beam is that the direct of travel according to this conveying belt successively decreases in regular turn.
3. the method for claim 1 is characterized in that, this method also comprises the level height according to each measuring beam, and the optical sheet that each measuring beam is judged to be warpage is made grade separation.
4. the device of an on-line automatic measurement optical sheet warp is characterized in that, comprises:
One conveying belt is carried an optical sheet;
At least one light source is launched a plurality of measuring beams, and wherein said measuring beam is positioned at this conveying belt top, and the level height of described measuring beam and inequality;
A plurality of detecting devices, in order to receive described measuring beam, wherein when this optical sheet blocks one of described measuring beam, described detecting device judges that this optical sheet is a warpage.
5. device as claimed in claim 4 is characterized in that, this device also comprises one and picks equipment, picks in order to the optical sheet with this warpage and leaves this conveying belt.
6. device as claimed in claim 4 is characterized in that, this light source is a LASER Light Source or an ordinary light source.
7. device as claimed in claim 4 is characterized in that, described detecting device is Charged Coupled Device, photomultiplier or optical diode.
8. device as claimed in claim 4 is characterized in that this device also comprises a pin hole, is disposed in the light path of described measuring beam to improve the accuracy of measuring.
Priority Applications (1)
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CNB2004100869329A CN100356137C (en) | 2004-10-20 | 2004-10-20 | Method and device for automatic on-line measurement of optical sheet warp |
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CNB2004100869329A CN100356137C (en) | 2004-10-20 | 2004-10-20 | Method and device for automatic on-line measurement of optical sheet warp |
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CN1763473A CN1763473A (en) | 2006-04-26 |
CN100356137C true CN100356137C (en) | 2007-12-19 |
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CNB2004100869329A Expired - Fee Related CN100356137C (en) | 2004-10-20 | 2004-10-20 | Method and device for automatic on-line measurement of optical sheet warp |
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CN102519377A (en) * | 2011-11-04 | 2012-06-27 | 彩虹(合肥)液晶玻璃有限公司 | Device for on-line detection of glass pane warpage and method thereof |
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CN107957252A (en) * | 2017-12-18 | 2018-04-24 | 周大银 | Thin slice detection device |
CN108981600B (en) * | 2018-04-20 | 2020-07-24 | 盐城工学院 | Automatic adjusting device and method for online detection of warpage of PCB |
CN109260608B (en) * | 2018-08-31 | 2021-05-18 | 上海联影医疗科技股份有限公司 | Deformation detection system and method |
CN111439549B (en) * | 2020-04-04 | 2021-12-17 | 神龙汽车有限公司 | Detection method based on stamping line cleaning machine front plate overrun detection device |
CN113916157B (en) * | 2021-09-30 | 2022-06-14 | 广州思拓力测绘科技有限公司 | Annular electrode inclination angle measuring method and measuring device thereof |
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JPH0658744A (en) * | 1992-08-10 | 1994-03-04 | Sumitomo Metal Ind Ltd | Buckling detection method for steel plate |
JPH0821711A (en) * | 1994-07-06 | 1996-01-23 | Toyobo Co Ltd | Waviness detector for surface of sheet board |
US5701178A (en) * | 1994-07-05 | 1997-12-23 | Corning Incorporated | Non-damaging flatness and thickness gauge for glass |
JPH1048144A (en) * | 1996-07-31 | 1998-02-20 | Dainippon Printing Co Ltd | Glass substrate inspecting instrument |
CN1354362A (en) * | 2000-11-17 | 2002-06-19 | 巴斯勒公开股份有限公司 | Detection system of sheet glass for making display |
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2004
- 2004-10-20 CN CNB2004100869329A patent/CN100356137C/en not_active Expired - Fee Related
Patent Citations (9)
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US3877814A (en) * | 1973-02-07 | 1975-04-15 | Ppg Industries Inc | Method of and apparatus for detecting concave and convex portions in a specular surface |
US4284357A (en) * | 1978-12-27 | 1981-08-18 | Fuji Photo Film Co., Ltd. | Device for continuously inspecting a surface |
US4585343A (en) * | 1983-11-04 | 1986-04-29 | Libbey-Owens-Ford Company | Apparatus and method for inspecting glass |
JPH0658744A (en) * | 1992-08-10 | 1994-03-04 | Sumitomo Metal Ind Ltd | Buckling detection method for steel plate |
US5701178A (en) * | 1994-07-05 | 1997-12-23 | Corning Incorporated | Non-damaging flatness and thickness gauge for glass |
JPH0821711A (en) * | 1994-07-06 | 1996-01-23 | Toyobo Co Ltd | Waviness detector for surface of sheet board |
JPH1048144A (en) * | 1996-07-31 | 1998-02-20 | Dainippon Printing Co Ltd | Glass substrate inspecting instrument |
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