CN100349169C - Power management circuit for non-contact IC card reading apparatus - Google Patents
Power management circuit for non-contact IC card reading apparatus Download PDFInfo
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- CN100349169C CN100349169C CNB2005100087843A CN200510008784A CN100349169C CN 100349169 C CN100349169 C CN 100349169C CN B2005100087843 A CNB2005100087843 A CN B2005100087843A CN 200510008784 A CN200510008784 A CN 200510008784A CN 100349169 C CN100349169 C CN 100349169C
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Abstract
The present invention relates to a power supply managing circuit used for non-contact IC card reading equipment, which belongs to the technical field of IC cards. The power supply managing circuit of the present invention comprises an input power supply and a voltage managing unit, and has the structural characteristics that the power supply managing circuit also comprises a reference control unit and an isolating unit, wherein the reference control unit, the isolating unit and the voltage managing unit are orderly connected and are all supplied with power by an input power supply; a control signal is output from the reference control unit to the isolating unit so as to control reference voltage, which enables the reference control unit and the voltage managing unit to have no mutual influence, and reference voltage is output to the voltage managing unit which outputs and adjusts the reference voltage so as to output the voltage. Compared with the prior art, the present invention has the characteristics of convenient operation, accurate adjustment, high testing efficiency, low cost and fine real-time performance.
Description
Technical field
The present invention relates to the IC-card technical field, especially for continuously changing the electric power management circuit that output voltage control radio field intensity changes in the test/card-reading apparatus of contactless IC card.
Background technology
Contactless IC card produces radio-frequency field by coupling test/card-reading apparatus, to obtain the required energy of self work.Test/card-reading apparatus generally is made up of motherboard and radio frequency card read head for ID and antenna, and the signal of radio-frequency field is directly produced by the radio frequency card read head for ID, and its field intensity is directly related with input voltage.The consensus standard that all are relevant with contactless IC card has all clearly been stipulated the radio-frequency field field intensity of the suitable work of contactless IC card.Though different test/card-reading apparatus is all followed the protocol requirement of this respect, the radio-frequency field field intensity that different tests/card-reading apparatus produces still has certain difference.
In order to guarantee that contactless ic is stuck in the normal use under the various occasions, need test IC-card, fully comprising the test of different field intensity before dispatching from the factory.Tradition changes the method for radio-frequency field field intensity, is mostly the input voltage by manual adjustments radio frequency card read head for ID.This kind method can not adjust accurately that changing value, the real-time of field intensity are poor, testing efficiency is low, and the external power supply of Adjustable Output Voltage need be set, and has increased cost.Also have a kind of electric power management circuit of being made up of the voltage management unit in the prior art, it is made up of power management chip 6, resistance three R1, adjustable resistance R2, electric capacity one Ci and electric capacity two Co.The input end of power management chip 6 is connected with electric capacity one Ci with input power supply Vin respectively, the other end ground connection of electric capacity one Ci, the reference edge of power management chip 6 is connected with adjustable resistance R2 with resistance three R1 respectively, the other end ground connection of adjustable resistance R2, the output terminal of power management chip 6 is connected with the other end of resistance three R1 with electric capacity two Co respectively, the other end ground connection of electric capacity two Co, as shown in Figure 1.The power management chip 6 that with the model is LM3 17 is an example, output voltage V out=1.25 (1+R
2/ R
1)+I
AdjR2, I in the formula
AdjFor from the reference edge of power management chip 6 through the electric current of adjustable resistance R2 to ground.The shortcoming of this technology is, when expectation output voltage V out was higher value, the resistance of resistance three R1 and adjustable resistance R2 was very big, can make output voltage V out cause very big error like this.
Summary of the invention
In order to solve the shortcoming that exists in the above-mentioned prior art, the purpose of this invention is to provide a kind of electric power management circuit that is used for non-contact IC card reading apparatus.It controls the variation of field intensity by the output voltage values that continuously changes non-contact IC card reading apparatus, guarantees that contactless ic is stuck in various occasions and normally uses.Have characteristics easy to operate, that adjustment is accurate, testing efficiency is high, cost is low, real-time is good.
In order to reach above-mentioned goal of the invention, technical scheme of the present invention realizes as follows:
A kind of electric power management circuit that is used for non-contact IC card reading apparatus, it comprises input power supply and voltage management unit.Its design feature is that it also comprises benchmark control module and isolated location.Described benchmark control module, isolated location and voltage management unit link to each other successively and power by the input power supply.The benchmark control module is made up of potentiometer.The input power supply be connected with the high-end of potentiometer, the bottom ground connection of potentiometer, control signal by the change potentiometer the middle-end tap position control its output to the reference voltage of isolated location.Isolated location is made up of low-loss field effect transistor and resistance two.The drain electrode of field effect transistor is connected with the input power supply, and the grid of field effect transistor is connected with the middle-end of potentiometer in the benchmark control module, and the source electrode of field effect transistor is by resistance two ground connection.Isolated location make be independent of each other between benchmark control module and the voltage management unit and output reference voltage to the voltage management unit.The voltage management unit is made up of power management chip and resistance one.The input end of power management chip is connected with the input power supply, the reference edge of power management chip respectively with isolated location in the source electrode of field effect transistor be connected with resistance one, resistance one other end is connected the adjusted output voltage of output with the output terminal of power management chip.
In above-mentioned electric power management circuit, described potentiometer can be digital regulation resistance or simulation potentiometer.
In above-mentioned electric power management circuit, the model of described power management chip is LM1085 or LM317.
The present invention is owing to adopted above-mentioned connecting circuit, increase a low-loss field effect transistor, position by the tap of control signal change potentiometer middle-end just can obtain comparatively precise output voltage value, thereby realizes the test that contactless ic is stuck under the different radio frequency field intensity is used with normal.Compare the characteristics that the present invention has is easy to operate, adjust accurately, testing efficiency is high, cost is low, real-time is good with prior art.
The present invention will be further described below in conjunction with the drawings and specific embodiments.
Description of drawings
Fig. 1 is the circuit connection diagram of the electric power management circuit of prior art;
Fig. 2 is a fundamental diagram of the present invention;
Fig. 3 is a circuit connection diagram of the present invention;
Fig. 4 is an application principle synoptic diagram of the present invention.
Embodiment
Referring to Fig. 2 and Fig. 3, the present invention includes input power supply Vin and the benchmark control module 1 that links to each other successively, isolated location 2, voltage management unit 3.Benchmark control module 1 is made up of the potentiometer 4 that adopts digital regulation resistance or simulation potentiometer, input power supply Vin is connected with the high-end H of potentiometer 4, it outputs to the reference voltage of isolated location 2 position control of the bottom L ground connection of potentiometer 4, the control signal middle-end W tap by changing potentiometer 4.Isolated location 2 is made up of low-loss field effect transistor 5 and resistance 27.The drain electrode of field effect transistor 5 is connected with input power supply Vin, and the grid of field effect transistor 5 is connected with the middle-end W of potentiometer 4 in the benchmark control module 1, and the source electrode of field effect transistor 5 is by resistance 27 ground connection.Isolated location 2 make be independent of each other between benchmark control module 1 and the voltage management unit 3 and from the source electrode output reference voltage of field effect transistor 5 to voltage management unit 3.Voltage management unit 3 is made up of power management chip 6 and resistance 1.Model is that the input end of the power management chip 6 of LM1085 or LM317 is connected with input power supply Vin, the reference edge of power management chip 6 respectively with isolated location 2 in the source electrode of field effect transistor 5 be connected with resistance 1, the other end of resistance 1 is connected with the output terminal of power management chip 6, exports adjusted output voltage from output terminal.
Voltage of the present invention is adjusted computing method:
The value of the reference voltage V w of the middle-end W of potentiometer 4 output is by the intrinsic standoff ratio decision of input voltage vin and potentiometer 4, Vw=Vin*Rwl/R from benchmark control module 1.Rwl is the resistance of the middle-end W tap of potentiometer 4 to ground in the formula, and R is whole resistances of potentiometer 4.
When reference voltage V w is effective, field effect transistor 5 conductings, its source voltage deducts the cut-in voltage of field effect transistor 5 for reference voltage V w.This source voltage is sent to the reference edge of power management chip 6 in the voltage management unit 3 as reference voltage, and this reference voltage is Vadj=Vw-Vgs, and Vgs is the cut-in voltage of field effect transistor 5 in the formula.
The output voltage V out of power management chip 6 adds with reference to pressure reduction for the voltage of its reference edge in the Power Management Unit 3, be that output voltage is Vout=Vadj+Vreference, Vreference is with reference to pressure reduction in the formula, with reference to pressure reduction according to the difference of the power management chip 6 selected for use and different.
Final derivation can get, Vout=Vw-Vgs+Vreference.
The present invention can obtain output voltage V out value accurately by the accurate control to potentiometer 4.Electric power management circuit of the present invention is applied in the non-contact IC card reading apparatus, as shown in Figure 4.Adjusted output voltage V out among the present invention is exported to the radio frequency card read head for ID, and the control radio field intensity takes place to change continuously, can satisfy the field strength measurement requirement to contactless IC card.
Claims (3)
1, a kind of electric power management circuit that is used for non-contact IC card reading apparatus, it comprises input power supply (Vin) and voltage management unit (3), it is characterized in that, it also comprises benchmark control module (1) and isolated location (2), described benchmark control module (1), isolated location (2) links to each other successively with voltage management unit (3) and powers by input power supply (Vin), described benchmark control module (1) is made up of potentiometer (4), input power supply (Vin) is connected with high-end (H) of potentiometer (4), bottom (L) ground connection of potentiometer (4), it outputs to the reference voltage of isolated location (2) position control of middle-end (W) tap of control signal by changing potentiometer (4), described isolated location (2) is made up of low-loss field effect transistor (5) and resistance two (7), the drain electrode of field effect transistor (5) is connected with input power supply (Vin), the grid of field effect transistor (5) is connected with the middle-end (W) of potentiometer (4) in the benchmark control module (1), the source electrode of field effect transistor (5) is by resistance two (7) ground connection, isolated location (2) make be independent of each other between benchmark control module (1) and voltage management unit (3) and output reference voltage to voltage management unit (3), described voltage management unit (3) is made up of power management chip (6) and resistance one (8), the input end of power management chip (6) is connected with input power supply (Vin), the reference edge of power management chip (6) respectively with isolated location (2) in the source electrode of field effect transistor (5) be connected with resistance one (8), resistance one (8) other end is connected the adjusted output voltage of output with the output terminal of power management chip (6).
2, the electric power management circuit that is used for non-contact IC card reading apparatus according to claim 1 is characterized in that, described potentiometer (4) can be digital regulation resistance or simulation potentiometer.
3, the electric power management circuit that is used for non-contact IC card reading apparatus according to claim 1 and 2 is characterized in that, the model of described power management chip (6) is LM1085 or LM317.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100087843A CN100349169C (en) | 2005-03-01 | 2005-03-01 | Power management circuit for non-contact IC card reading apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100087843A CN100349169C (en) | 2005-03-01 | 2005-03-01 | Power management circuit for non-contact IC card reading apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1828627A CN1828627A (en) | 2006-09-06 |
| CN100349169C true CN100349169C (en) | 2007-11-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100087843A Active CN100349169C (en) | 2005-03-01 | 2005-03-01 | Power management circuit for non-contact IC card reading apparatus |
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| CN (1) | CN100349169C (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104569599B (en) * | 2015-01-09 | 2017-10-31 | 杭州电子科技大学 | A kind of electronic tag resistance on-line checking circuit |
| CN108227596A (en) * | 2018-03-10 | 2018-06-29 | 江苏物润船联网络股份有限公司 | Control and monitoring system for ships and power circuit |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2076667U (en) * | 1990-10-15 | 1991-05-08 | 大华仪表厂 | Recording instrument for blended data |
| CN2219489Y (en) * | 1994-12-31 | 1996-02-07 | 姚贞香 | IC card gas metering controller |
| US5666036A (en) * | 1995-05-31 | 1997-09-09 | Sgs-Thomson Microelectronics, Inc. | Circuit for driving the motor of a temperature blend door |
| US6091887A (en) * | 1995-12-04 | 2000-07-18 | Papst-Motoren Gmbh & Co. Kg | Method and apparatus for controlling a physical parameter |
| CN2783428Y (en) * | 2005-03-01 | 2006-05-24 | 北京清华同方微电子有限公司 | Power source management circuit for contactless IC card read apparatus |
-
2005
- 2005-03-01 CN CNB2005100087843A patent/CN100349169C/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2076667U (en) * | 1990-10-15 | 1991-05-08 | 大华仪表厂 | Recording instrument for blended data |
| CN2219489Y (en) * | 1994-12-31 | 1996-02-07 | 姚贞香 | IC card gas metering controller |
| US5666036A (en) * | 1995-05-31 | 1997-09-09 | Sgs-Thomson Microelectronics, Inc. | Circuit for driving the motor of a temperature blend door |
| US6091887A (en) * | 1995-12-04 | 2000-07-18 | Papst-Motoren Gmbh & Co. Kg | Method and apparatus for controlling a physical parameter |
| CN2783428Y (en) * | 2005-03-01 | 2006-05-24 | 北京清华同方微电子有限公司 | Power source management circuit for contactless IC card read apparatus |
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|---|---|
| CN1828627A (en) | 2006-09-06 |
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Address after: 100083 Beijing City, Haidian District Wudaokou Wangzhuang Road No. 1 Tongfang Technology Plaza D floor 18 West Patentee after: Beijing Tongfang Microelectronics Company Address before: 100083 A, block 2901, Tongfang science and Technology Plaza, Beijing Patentee before: Beijing Tongfang Microelectronics Company |