CH542501A - Verfahren zur Herstellung von Kondensatoren in einer elektronische Halbleiteranordnung - Google Patents
Verfahren zur Herstellung von Kondensatoren in einer elektronische HalbleiteranordnungInfo
- Publication number
- CH542501A CH542501A CH755172A CH755172A CH542501A CH 542501 A CH542501 A CH 542501A CH 755172 A CH755172 A CH 755172A CH 755172 A CH755172 A CH 755172A CH 542501 A CH542501 A CH 542501A
- Authority
- CH
- Switzerland
- Prior art keywords
- capacitors
- production
- semiconductor device
- electronic semiconductor
- electronic
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/0223—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate
- H01L21/02244—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of a metallic layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
- H01L21/3165—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation
- H01L21/31683—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation of metallic layers, e.g. Al deposited on the body, e.g. formation of multi-layer insulating structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
- H01L21/02175—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal
- H01L21/02178—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal the material containing aluminium, e.g. Al2O3
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/02258—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by anodic treatment, e.g. anodic oxidation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02356—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment to change the morphology of the insulating layer, e.g. transformation of an amorphous layer into a crystalline layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S204/00—Chemistry: electrical and wave energy
- Y10S204/03—Auxiliary internally generated electrical energy
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Bipolar Integrated Circuits (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7118642A FR2138339B1 (de) | 1971-05-24 | 1971-05-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
CH542501A true CH542501A (de) | 1973-09-30 |
Family
ID=9077495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH755172A CH542501A (de) | 1971-05-24 | 1972-05-23 | Verfahren zur Herstellung von Kondensatoren in einer elektronische Halbleiteranordnung |
Country Status (11)
Country | Link |
---|---|
US (1) | US3839164A (de) |
JP (1) | JPS515279B1 (de) |
AU (1) | AU4256772A (de) |
BE (1) | BE783832A (de) |
CA (1) | CA959791A (de) |
CH (1) | CH542501A (de) |
FR (1) | FR2138339B1 (de) |
GB (1) | GB1387018A (de) |
IT (1) | IT958931B (de) |
NL (1) | NL7206878A (de) |
SE (1) | SE369984B (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3214991A1 (de) * | 1982-04-22 | 1983-11-03 | Siemens AG, 1000 Berlin und 8000 München | Halbleiterbaustein mit diskretem kondensator |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5010168A (de) * | 1973-05-24 | 1975-02-01 | ||
FR2509516A1 (fr) * | 1981-07-08 | 1983-01-14 | Labo Electronique Physique | Procede destine a accroitre la tension de claquage d'un condensateur integre et condensateur ainsi realise |
DE3137708A1 (de) * | 1981-09-22 | 1983-04-07 | Siemens AG, 1000 Berlin und 8000 München | Integratorschaltung mit einem differenzverstaerker |
FR2526225B1 (fr) * | 1982-04-30 | 1985-11-08 | Radiotechnique Compelec | Procede de realisation d'un condensateur integre, et dispositif ainsi obtenu |
US6271131B1 (en) | 1998-08-26 | 2001-08-07 | Micron Technology, Inc. | Methods for forming rhodium-containing layers such as platinum-rhodium barrier layers |
US6239028B1 (en) * | 1998-09-03 | 2001-05-29 | Micron Technology, Inc. | Methods for forming iridium-containing films on substrates |
US6284655B1 (en) | 1998-09-03 | 2001-09-04 | Micron Technology, Inc. | Method for producing low carbon/oxygen conductive layers |
US6323081B1 (en) | 1998-09-03 | 2001-11-27 | Micron Technology, Inc. | Diffusion barrier layers and methods of forming same |
US6329286B1 (en) | 1999-04-27 | 2001-12-11 | Micron Technology, Inc. | Methods for forming conformal iridium layers on substrates |
US6660631B1 (en) * | 2000-08-31 | 2003-12-09 | Micron Technology, Inc. | Devices containing platinum-iridium films and methods of preparing such films and devices |
KR100849854B1 (ko) * | 2007-02-23 | 2008-08-01 | 삼성전자주식회사 | 반도체 소자 및 그 제조 방법 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2640806A (en) * | 1949-06-27 | 1953-06-02 | Kaiser Aluminium Chem Corp | Process for polishing aluminum |
US2853445A (en) * | 1956-04-06 | 1958-09-23 | Aerovox Corp | Process of etching aluminum foil for electrolytic capacitor |
US3389060A (en) * | 1964-06-15 | 1968-06-18 | Gen Motors Corp | Method of indium coating metallic articles |
US3423821A (en) * | 1965-03-18 | 1969-01-28 | Hitachi Ltd | Method of producing thin film integrated circuits |
US3466719A (en) * | 1967-01-11 | 1969-09-16 | Texas Instruments Inc | Method of fabricating thin film capacitors |
-
1971
- 1971-05-24 FR FR7118642A patent/FR2138339B1/fr not_active Expired
-
1972
- 1972-05-20 IT IT68609/72A patent/IT958931B/it active
- 1972-05-20 NL NL7206878A patent/NL7206878A/xx unknown
- 1972-05-22 GB GB2389072A patent/GB1387018A/en not_active Expired
- 1972-05-22 US US00255799A patent/US3839164A/en not_active Expired - Lifetime
- 1972-05-23 AU AU42567/72A patent/AU4256772A/en not_active Expired
- 1972-05-23 CA CA142,707A patent/CA959791A/en not_active Expired
- 1972-05-23 CH CH755172A patent/CH542501A/de not_active IP Right Cessation
- 1972-05-23 SE SE06696/72A patent/SE369984B/xx unknown
- 1972-05-23 BE BE783832A patent/BE783832A/nl unknown
- 1972-05-24 JP JP47051592A patent/JPS515279B1/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3214991A1 (de) * | 1982-04-22 | 1983-11-03 | Siemens AG, 1000 Berlin und 8000 München | Halbleiterbaustein mit diskretem kondensator |
Also Published As
Publication number | Publication date |
---|---|
DE2225163A1 (de) | 1972-12-07 |
JPS515279B1 (de) | 1976-02-18 |
AU4256772A (en) | 1973-11-29 |
FR2138339A1 (de) | 1973-01-05 |
FR2138339B1 (de) | 1974-08-19 |
NL7206878A (de) | 1972-11-28 |
GB1387018A (en) | 1975-03-12 |
CA959791A (en) | 1974-12-24 |
SE369984B (de) | 1974-09-23 |
BE783832A (nl) | 1972-11-23 |
DE2225163B2 (de) | 1976-11-25 |
US3839164A (en) | 1974-10-01 |
IT958931B (it) | 1973-10-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |