CH510369A - Process for the production of ions, source of ions for carrying out the process and application of the process - Google Patents

Process for the production of ions, source of ions for carrying out the process and application of the process

Info

Publication number
CH510369A
CH510369A CH738869A CH738869A CH510369A CH 510369 A CH510369 A CH 510369A CH 738869 A CH738869 A CH 738869A CH 738869 A CH738869 A CH 738869A CH 510369 A CH510369 A CH 510369A
Authority
CH
Switzerland
Prior art keywords
ions
carrying
production
source
application
Prior art date
Application number
CH738869A
Other languages
French (fr)
Inventor
Eloy Jean-Francois
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Publication of CH510369A publication Critical patent/CH510369A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
CH738869A 1968-05-15 1969-05-14 Process for the production of ions, source of ions for carrying out the process and application of the process CH510369A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR151943 1968-05-15

Publications (1)

Publication Number Publication Date
CH510369A true CH510369A (en) 1971-07-15

Family

ID=8650281

Family Applications (1)

Application Number Title Priority Date Filing Date
CH738869A CH510369A (en) 1968-05-15 1969-05-14 Process for the production of ions, source of ions for carrying out the process and application of the process

Country Status (8)

Country Link
US (1) US3644731A (en)
BE (1) BE732190A (en)
CH (1) CH510369A (en)
DE (1) DE1922871B2 (en)
ES (1) ES367221A1 (en)
FR (1) FR1580234A (en)
GB (1) GB1268813A (en)
LU (1) LU58541A1 (en)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748475A (en) * 1972-02-17 1973-07-24 T Roberts Neutron generator axially assisted by laser
US3944826A (en) * 1973-07-19 1976-03-16 Applied Research Laboratories Limited Methods and apparatus for analyzing mixtures
DE2540505A1 (en) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg FLIGHT TIME MASS SPECTROMETERS FOR IONS WITH DIFFERENT ENERGIES
DE2739829C2 (en) * 1977-09-03 1986-04-10 Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München Arrangement for analyzing a sample layer by bombarding it with electromagnetic radiation
DE2740183A1 (en) * 1977-09-07 1979-03-08 Leybold Heraeus Gmbh & Co Kg DEVICE FOR FOCUSING ELECTROMAGNETIC RADIATION ON A SAMPLE
JPS57205953A (en) * 1981-06-12 1982-12-17 Jeol Ltd Ion source
DE3201264A1 (en) * 1982-01-16 1983-07-28 Leybold-Heraeus GmbH, 5000 Köln LASER MICRO PROBE
US4740692A (en) * 1985-06-13 1988-04-26 Mitsubishi Denki Kabushiki Kaisha Laser mass spectroscopic analyzer and method
GB8703012D0 (en) * 1987-02-10 1987-03-18 Vg Instr Group Secondary ion mass spectrometer
JP2564404B2 (en) * 1989-09-20 1996-12-18 株式会社日立製作所 Mass spectrometry
US5204530A (en) * 1991-12-27 1993-04-20 Philippe Chastagner Noise reduction in negative-ion quadrupole mass spectrometry
DE19637480C2 (en) * 1996-09-13 2001-02-08 Thorald Bergmann Device for mass spectrometric analysis of surfaces
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
GB2400976B (en) * 2000-09-06 2005-02-09 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
US20090202692A1 (en) * 2008-02-11 2009-08-13 Sang Hoon Chun Seasoning dispenser
JP5801144B2 (en) * 2011-08-30 2015-10-28 株式会社東芝 Ion source
CN110828281B (en) * 2019-11-15 2020-10-09 中国科学院大连化学物理研究所 Ion enrichment ion migration tube

Also Published As

Publication number Publication date
LU58541A1 (en) 1969-07-29
BE732190A (en) 1969-10-01
US3644731A (en) 1972-02-22
DE1922871A1 (en) 1969-11-20
FR1580234A (en) 1969-09-05
ES367221A1 (en) 1971-05-01
DE1922871B2 (en) 1972-02-17
GB1268813A (en) 1972-03-29

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Legal Events

Date Code Title Description
PL Patent ceased