CH373817A - Einrichtung zur Bestimmung des Leitfähifkeitstyps eines Halbleiterkörpers - Google Patents

Einrichtung zur Bestimmung des Leitfähifkeitstyps eines Halbleiterkörpers

Info

Publication number
CH373817A
CH373817A CH7232759A CH7232759A CH373817A CH 373817 A CH373817 A CH 373817A CH 7232759 A CH7232759 A CH 7232759A CH 7232759 A CH7232759 A CH 7232759A CH 373817 A CH373817 A CH 373817A
Authority
CH
Switzerland
Prior art keywords
determining
conductivity type
semiconductor body
semiconductor
conductivity
Prior art date
Application number
CH7232759A
Other languages
English (en)
Inventor
Wolfgang Dr Keller
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of CH373817A publication Critical patent/CH373817A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CH7232759A 1958-04-26 1959-04-21 Einrichtung zur Bestimmung des Leitfähifkeitstyps eines Halbleiterkörpers CH373817A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0058006 1958-04-26

Publications (1)

Publication Number Publication Date
CH373817A true CH373817A (de) 1963-12-15

Family

ID=7492239

Family Applications (1)

Application Number Title Priority Date Filing Date
CH7232759A CH373817A (de) 1958-04-26 1959-04-21 Einrichtung zur Bestimmung des Leitfähifkeitstyps eines Halbleiterkörpers

Country Status (2)

Country Link
CH (1) CH373817A (de)
DE (1) DE1072745B (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1268279B (de) * 1962-10-17 1968-05-16 Siemens Ag Verfahren zum Messen des spezifischen Widerstandes von Halbleitermaterial

Also Published As

Publication number Publication date
DE1072745B (de) 1960-01-07

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