CA2824940A1 - An emission spectrometer and method of operation - Google Patents

An emission spectrometer and method of operation Download PDF

Info

Publication number
CA2824940A1
CA2824940A1 CA2824940A CA2824940A CA2824940A1 CA 2824940 A1 CA2824940 A1 CA 2824940A1 CA 2824940 A CA2824940 A CA 2824940A CA 2824940 A CA2824940 A CA 2824940A CA 2824940 A1 CA2824940 A1 CA 2824940A1
Authority
CA
Canada
Prior art keywords
sample
detector
radiation
spectral characteristics
drift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA2824940A
Other languages
English (en)
French (fr)
Inventor
Paolo Moreschini
Joanna COHEN
Gale PAULSEN
Geoffrey Alan CARTER
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Technological Resources Pty Ltd
Original Assignee
Technological Resources Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=46580110&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=CA2824940(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Technological Resources Pty Ltd filed Critical Technological Resources Pty Ltd
Publication of CA2824940A1 publication Critical patent/CA2824940A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • G01N21/276Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CA2824940A 2011-01-26 2012-01-11 An emission spectrometer and method of operation Abandoned CA2824940A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161436328P 2011-01-26 2011-01-26
US61/436,328 2011-01-26
PCT/AU2012/000016 WO2012100284A1 (en) 2011-01-26 2012-01-11 An emission spectrometer and method of operation

Publications (1)

Publication Number Publication Date
CA2824940A1 true CA2824940A1 (en) 2012-08-02

Family

ID=46580110

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2824940A Abandoned CA2824940A1 (en) 2011-01-26 2012-01-11 An emission spectrometer and method of operation

Country Status (7)

Country Link
CN (1) CN103518121A (es)
AU (1) AU2012211024A1 (es)
BR (1) BR112013018523A2 (es)
CA (1) CA2824940A1 (es)
CL (1) CL2013002117A1 (es)
PE (1) PE20141402A1 (es)
WO (1) WO2012100284A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014202618A2 (en) * 2013-06-17 2014-12-24 University Of Neuchâtel Method for determining the configuration of a structure
CN107037012B (zh) * 2017-04-05 2019-10-25 华中科技大学 用于激光诱导击穿光谱采集的阶梯光谱仪动态校正方法
CN115839943B (zh) * 2023-02-13 2023-07-11 合肥金星智控科技股份有限公司 激光诱导光谱***、光谱校准方法及电子设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6621574B1 (en) * 2000-05-25 2003-09-16 Inphotonics, Inc. Dual function safety and calibration accessory for raman and other spectroscopic sampling
US7321424B2 (en) * 2004-08-05 2008-01-22 Acton Research Corp. Self-referencing instrument and method thereof for measuring electromagnetic properties
US7502105B2 (en) * 2004-09-15 2009-03-10 General Electric Company Apparatus and method for producing a calibrated Raman spectrum
US7994479B2 (en) * 2006-11-30 2011-08-09 The Science And Technology Facilities Council Infrared spectrometer
CN101689222B (zh) * 2007-05-07 2012-12-26 真实仪器公司 用于故障检验和过程监测的辐射光学监测***的校准
CN101354287B (zh) * 2007-07-24 2010-12-22 杭州远方光电信息有限公司 一种光谱仪及其校正方法

Also Published As

Publication number Publication date
CL2013002117A1 (es) 2013-12-13
CN103518121A (zh) 2014-01-15
PE20141402A1 (es) 2014-10-29
BR112013018523A2 (pt) 2017-08-01
AU2012211024A1 (en) 2013-08-01
WO2012100284A1 (en) 2012-08-02

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Date Code Title Description
FZDE Dead

Effective date: 20170111