CA2824940A1 - An emission spectrometer and method of operation - Google Patents
An emission spectrometer and method of operation Download PDFInfo
- Publication number
- CA2824940A1 CA2824940A1 CA2824940A CA2824940A CA2824940A1 CA 2824940 A1 CA2824940 A1 CA 2824940A1 CA 2824940 A CA2824940 A CA 2824940A CA 2824940 A CA2824940 A CA 2824940A CA 2824940 A1 CA2824940 A1 CA 2824940A1
- Authority
- CA
- Canada
- Prior art keywords
- sample
- detector
- radiation
- spectral characteristics
- drift
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161436328P | 2011-01-26 | 2011-01-26 | |
US61/436,328 | 2011-01-26 | ||
PCT/AU2012/000016 WO2012100284A1 (en) | 2011-01-26 | 2012-01-11 | An emission spectrometer and method of operation |
Publications (1)
Publication Number | Publication Date |
---|---|
CA2824940A1 true CA2824940A1 (en) | 2012-08-02 |
Family
ID=46580110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA2824940A Abandoned CA2824940A1 (en) | 2011-01-26 | 2012-01-11 | An emission spectrometer and method of operation |
Country Status (7)
Country | Link |
---|---|
CN (1) | CN103518121A (es) |
AU (1) | AU2012211024A1 (es) |
BR (1) | BR112013018523A2 (es) |
CA (1) | CA2824940A1 (es) |
CL (1) | CL2013002117A1 (es) |
PE (1) | PE20141402A1 (es) |
WO (1) | WO2012100284A1 (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014202618A2 (en) * | 2013-06-17 | 2014-12-24 | University Of Neuchâtel | Method for determining the configuration of a structure |
CN107037012B (zh) * | 2017-04-05 | 2019-10-25 | 华中科技大学 | 用于激光诱导击穿光谱采集的阶梯光谱仪动态校正方法 |
CN115839943B (zh) * | 2023-02-13 | 2023-07-11 | 合肥金星智控科技股份有限公司 | 激光诱导光谱***、光谱校准方法及电子设备 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6621574B1 (en) * | 2000-05-25 | 2003-09-16 | Inphotonics, Inc. | Dual function safety and calibration accessory for raman and other spectroscopic sampling |
US7321424B2 (en) * | 2004-08-05 | 2008-01-22 | Acton Research Corp. | Self-referencing instrument and method thereof for measuring electromagnetic properties |
US7502105B2 (en) * | 2004-09-15 | 2009-03-10 | General Electric Company | Apparatus and method for producing a calibrated Raman spectrum |
US7994479B2 (en) * | 2006-11-30 | 2011-08-09 | The Science And Technology Facilities Council | Infrared spectrometer |
CN101689222B (zh) * | 2007-05-07 | 2012-12-26 | 真实仪器公司 | 用于故障检验和过程监测的辐射光学监测***的校准 |
CN101354287B (zh) * | 2007-07-24 | 2010-12-22 | 杭州远方光电信息有限公司 | 一种光谱仪及其校正方法 |
-
2012
- 2012-01-11 BR BR112013018523A patent/BR112013018523A2/pt not_active IP Right Cessation
- 2012-01-11 AU AU2012211024A patent/AU2012211024A1/en not_active Abandoned
- 2012-01-11 WO PCT/AU2012/000016 patent/WO2012100284A1/en active Application Filing
- 2012-01-11 CA CA2824940A patent/CA2824940A1/en not_active Abandoned
- 2012-01-11 CN CN201280006560.7A patent/CN103518121A/zh active Pending
- 2012-01-11 PE PE2013001595A patent/PE20141402A1/es not_active Application Discontinuation
-
2013
- 2013-07-24 CL CL2013002117A patent/CL2013002117A1/es unknown
Also Published As
Publication number | Publication date |
---|---|
CL2013002117A1 (es) | 2013-12-13 |
CN103518121A (zh) | 2014-01-15 |
PE20141402A1 (es) | 2014-10-29 |
BR112013018523A2 (pt) | 2017-08-01 |
AU2012211024A1 (en) | 2013-08-01 |
WO2012100284A1 (en) | 2012-08-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7970101B2 (en) | X-ray analyzer and X-ray analysis method | |
US7507966B2 (en) | Optical-path-difference compensation mechanism for acquiring wave form signal of time-domain pulsed spectroscopy apparatus | |
US8102530B2 (en) | Colour measuring unit | |
JP2011047898A (ja) | X線分析装置及びx線分析方法 | |
JP2005207982A (ja) | 分光器及びそれを用いた測定装置 | |
US9012833B2 (en) | Terahertz wave measuring apparatus and measurement method | |
US9983060B1 (en) | Calibration of a spectral analysis module | |
CA2966701C (en) | Compact apparatus for laser induced breakdown spectroscopy and method therefor | |
CN104406955A (zh) | 一种基于拉曼光谱的物质检测方法 | |
EP3557228B1 (en) | Gas analyzer | |
CN109856078B (zh) | 光学气体检测*** | |
CA2824940A1 (en) | An emission spectrometer and method of operation | |
JP2015052531A (ja) | 分光器の波長校正方法 | |
JP4634413B2 (ja) | 測定装置 | |
US20070171420A1 (en) | Pulsed ellipsometer device | |
Gornushkin et al. | Determination of the maximum temperature at the center of an optically thick laser-induced plasma using self-reversed spectral lines | |
JP2008256440A (ja) | 分析装置 | |
JP2000055809A (ja) | 顕微ラマン分光装置及び顕微ラマン分光測定方法 | |
JP2005033104A (ja) | 2ステージレーザ用波長検出装置及びその校正装置 | |
JP2005172568A (ja) | 光学装置及びそれを有する測定装置 | |
JP2005121513A (ja) | 反射分光スペクトル観測のための光学配置 | |
JP2009222727A (ja) | 分光器 | |
JP4632373B2 (ja) | 時系列変換パルス分光計測装置 | |
KR20230103173A (ko) | 다양한 깊이의 콘크리트 구조물 분석을 위한 핸드피스 모듈 및 상기 핸드피스 모듈을 포함하는 장치 | |
JP2022128325A (ja) | 検査装置および検査方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FZDE | Dead |
Effective date: 20170111 |