CA2487790C - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

Info

Publication number: CA2487790C
Authority: CA; Canada
Prior art keywords: ions; mass filter; mass; orthogonally; filter
Prior art date: 2003-11-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

CA2487790A

Other languages

English (en)

French (fr)

Other versions

CA2487790A1 (en

Inventor

Jeffery Mark Brown

Daniel James Kenny

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Micromass UK Ltd

Original Assignee

Micromass UK Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2003-11-17

Filing date

2004-11-16

Publication date

2013-09-10

2004-11-16 Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd

2005-05-17 Publication of CA2487790A1 publication Critical patent/CA2487790A1/en

2013-09-10 Application granted granted Critical

2013-09-10 Publication of CA2487790C publication Critical patent/CA2487790C/en

Status Expired - Fee Related legal-status Critical Current

2024-11-16 Anticipated expiration legal-status Critical

Links

150000002500 ions Chemical class 0.000 claims abstract description 542
230000001133 acceleration Effects 0.000 claims abstract description 147
230000005684 electric field Effects 0.000 claims description 33
238000001914 filtration Methods 0.000 claims description 10
230000002238 attenuated effect Effects 0.000 claims description 8
230000000979 retarding effect Effects 0.000 claims description 7
238000005040 ion trap Methods 0.000 claims description 5
238000000034 method Methods 0.000 claims description 5
238000011144 upstream manufacturing Methods 0.000 claims description 5
238000003795 desorption Methods 0.000 claims description 4
238000000688 desorption electrospray ionisation Methods 0.000 claims description 4
238000010265 fast atom bombardment Methods 0.000 claims description 4
238000004992 fast atom bombardment mass spectroscopy Methods 0.000 claims description 4
238000009616 inductively coupled plasma Methods 0.000 claims description 4
238000001698 laser desorption ionisation Methods 0.000 claims description 4
238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 claims description 4
102100022704 Amyloid-beta precursor protein Human genes 0.000 claims description 2
208000035699 Distal ileal obstruction syndrome Diseases 0.000 claims description 2
238000004252 FT/ICR mass spectrometry Methods 0.000 claims description 2
101000823051 Homo sapiens Amyloid-beta precursor protein Proteins 0.000 claims description 2
XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
DZHSAHHDTRWUTF-SIQRNXPUSA-N amyloid-beta polypeptide 42 Chemical compound C([C@@H](C(=O)N[C@@H](C)C(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H](CC(O)=O)C(=O)N[C@H](C(=O)NCC(=O)N[C@@H](CO)C(=O)N[C@@H](CC(N)=O)C(=O)N[C@@H](CCCCN)C(=O)NCC(=O)N[C@@H](C)C(=O)N[C@H](C(=O)N[C@@H]([C@@H](C)CC)C(=O)NCC(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](CCSC)C(=O)N[C@@H](C(C)C)C(=O)NCC(=O)NCC(=O)N[C@@H](C(C)C)C(=O)N[C@@H](C(C)C)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](C)C(O)=O)[C@@H](C)CC)C(C)C)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@@H](NC(=O)[C@H](CC(C)C)NC(=O)[C@H](CCCCN)NC(=O)[C@H](CCC(N)=O)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@@H](NC(=O)[C@H](CCC(O)=O)NC(=O)[C@H](CC=1C=CC(O)=CC=1)NC(=O)CNC(=O)[C@H](CO)NC(=O)[C@H](CC(O)=O)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@H](CCCNC(N)=N)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@H](CCC(O)=O)NC(=O)[C@H](C)NC(=O)[C@@H](N)CC(O)=O)C(C)C)C(C)C)C1=CC=CC=C1 DZHSAHHDTRWUTF-SIQRNXPUSA-N 0.000 claims description 2
238000000065 atmospheric pressure chemical ionisation Methods 0.000 claims description 2
238000000451 chemical ionisation Methods 0.000 claims description 2
229910052710 silicon Inorganic materials 0.000 claims description 2
239000010703 silicon Substances 0.000 claims description 2
238000010884 ion-beam technique Methods 0.000 description 16
238000004088 simulation Methods 0.000 description 15
238000009826 distribution Methods 0.000 description 8
230000000694 effects Effects 0.000 description 8
230000005540 biological transmission Effects 0.000 description 7
238000010586 diagram Methods 0.000 description 7
239000012634 fragment Substances 0.000 description 4
230000007423 decrease Effects 0.000 description 3
239000002243 precursor Substances 0.000 description 3
238000013467 fragmentation Methods 0.000 description 2
238000006062 fragmentation reaction Methods 0.000 description 2
230000002411 adverse Effects 0.000 description 1
238000004458 analytical method Methods 0.000 description 1
230000015572 biosynthetic process Effects 0.000 description 1
238000001360 collision-induced dissociation Methods 0.000 description 1
230000001419 dependent effect Effects 0.000 description 1
238000010494 dissociation reaction Methods 0.000 description 1
230000005593 dissociations Effects 0.000 description 1
238000005468 ion implantation Methods 0.000 description 1
230000003278 mimic effect Effects 0.000 description 1
238000005381 potential energy Methods 0.000 description 1
239000007787 solid Substances 0.000 description 1

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping

Landscapes

Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

CA2487790A 2003-11-17 2004-11-16 Mass spectrometer Expired - Fee Related CA2487790C (en)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
GBGB0326717.6A GB0326717D0 (en)	2003-11-17	2003-11-17	Mass spectrometer
GB0326717.6		2003-11-17

Publications (2)

Publication Number	Publication Date
CA2487790A1 CA2487790A1 (en)	2005-05-17
CA2487790C true CA2487790C (en)	2013-09-10

Family

ID=29726671

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
CA2487790A Expired - Fee Related CA2487790C (en)	2003-11-17	2004-11-16	Mass spectrometer

Country Status (4)

Country	Link
JP (1)	JP5036017B2 (de)
CA (1)	CA2487790C (de)
DE (2)	DE202004017772U1 (de)
GB (3)	GB0326717D0 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE102018116305B4 (de) *	2018-07-05	2023-05-25	Analytik Jena Gmbh	Dynamischer Ionenfilter zur Reduzierung hochabundanter Ionen

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH0562643A (ja) *	1991-09-04	1993-03-12	Nippon Steel Corp	静電シヤツターを有する飛行時間型質量分析装置と分析方法
US5654543A (en) *	1995-11-02	1997-08-05	Hewlett-Packard Company	Mass spectrometer and related method
GB9604057D0 (en) *	1996-02-27	1996-05-01	Univ Birmingham	Mass selector
GB9612091D0 (en) *	1996-06-10	1996-08-14	Hd Technologies Limited	Improvements in or relating to time-of-flight mass spectrometers
AUPO481097A0 (en) *	1997-01-28	1997-02-20	Gbc Scientific Equipment Pty Ltd	Gate for eliminating charged particles in time of flight spectrometers
WO1999001889A1 (en) *	1997-07-02	1999-01-14	Merck & Co., Inc.	Novel mass spectrometer
JP2000285848A (ja) *	1999-03-30	2000-10-13	Jeol Ltd	飛行時間型質量分析装置
JP2000348666A (ja) *	1999-06-03	2000-12-15	Jeol Ltd	垂直加速型飛行時間型質量分析装置
JP2001215216A (ja) *	2000-02-01	2001-08-10	Hitachi Ltd	顕微レーザ質量分析計
JP2002245964A (ja) *	2001-02-22	2002-08-30	Jeol Ltd	飛行時間型質量分析装置

2003
- 2003-11-17 GB GBGB0326717.6A patent/GB0326717D0/en not_active Ceased
2004
- 2004-11-16 GB GB0523064A patent/GB2419032B/en not_active Expired - Fee Related
- 2004-11-16 GB GB0425270A patent/GB2408144B/en not_active Expired - Fee Related
- 2004-11-16 DE DE202004017772U patent/DE202004017772U1/de not_active Expired - Lifetime
- 2004-11-16 JP JP2004331809A patent/JP5036017B2/ja not_active Expired - Fee Related
- 2004-11-16 CA CA2487790A patent/CA2487790C/en not_active Expired - Fee Related
- 2004-11-16 DE DE102004055279A patent/DE102004055279B4/de not_active Expired - Fee Related

Also Published As

Publication number	Publication date
GB2419032A (en)	2006-04-12
DE102004055279B4 (de)	2010-12-02
DE202004017772U1 (de)	2005-04-07
DE102004055279A1 (de)	2005-07-07
GB2419032B (en)	2006-07-26
GB0523064D0 (en)	2005-12-21
JP2005190994A (ja)	2005-07-14
JP5036017B2 (ja)	2012-09-26
GB0425270D0 (en)	2004-12-15
GB0326717D0 (en)	2003-12-17
GB2408144A (en)	2005-05-18
CA2487790A1 (en)	2005-05-17
GB2408144B (en)	2006-04-26

Legal Events

Date	Code	Title	Description
2009-11-04	EEER	Examination request
2021-10-12	MKLA	Lapsed	Effective date: 20210831
2022-10-06	MKLA	Lapsed	Effective date: 20191118

Publication	Publication Date	Title
US20080111071A1 (en)	2008-05-15	Mass Spectrometer
US6770870B2 (en)	2004-08-03	Tandem time-of-flight mass spectrometer with delayed extraction and method for use
JP6287419B2 (ja)	2018-03-07	飛行時間型質量分析装置
US6107625A (en)	2000-08-22	Coaxial multiple reflection time-of-flight mass spectrometer
JP6152113B2 (ja)	2017-06-21	加速器デバイスを備える質量分析計及び質量分析方法
US7087897B2 (en)	2006-08-08	Mass spectrometer
US7372021B2 (en)	2008-05-13	Time-of-flight mass spectrometer combining fields non-linear in time and space
US20130068944A1 (en)	2013-03-21	Control Of Ions
US9721779B2 (en)	2017-08-01	Orthogonal acceleration coaxial cylinder time of flight mass analyser
Piyadasa et al.	1999	A high resolving power multiple reflection matrix‐assisted laser desorption/ionization time‐of‐flight mass spectrometer
US5744797A (en)	1998-04-28	Split-field interface
CA2487790C (en)	2013-09-10	Mass spectrometer
GB2612416A (en)	2023-05-03	Time-of-flight mass spectrometer with multiple reflection
GB2505275A (en)	2014-02-26	Orthogonal acceleration coaxial cylinder time of flight mass analyser
US5942758A (en)	1999-08-24	Shielded lens
CA2460469C (en)	2012-10-02	Mass spectrometer
JP2002532845A (ja)	2002-10-02	衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計
JP2002245964A (ja)	2002-08-30	飛行時間型質量分析装置
JP6084815B2 (ja)	2017-02-22	タンデム飛行時間型質量分析計
WO2003103008A1 (en)	2003-12-11	Time of flight mass specrometer combining fields non-linear in time and space
JP2005190994A5 (de)	2011-04-28