CA1330360C - Testeur de circuits - Google Patents

Testeur de circuits

Info

Publication number
CA1330360C
CA1330360C CA 573410 CA573410A CA1330360C CA 1330360 C CA1330360 C CA 1330360C CA 573410 CA573410 CA 573410 CA 573410 A CA573410 A CA 573410A CA 1330360 C CA1330360 C CA 1330360C
Authority
CA
Canada
Prior art keywords
electro
optical
accordance
circuit
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA 573410
Other languages
English (en)
Inventor
Paul Meyrueix
Gerard Tremblay
Jean Paul Verhnes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIAGNOSYS Ltd
Original Assignee
Schlumberger SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR8710870A external-priority patent/FR2621699B1/fr
Priority claimed from FR888808230A external-priority patent/FR2633055B2/fr
Application filed by Schlumberger SA filed Critical Schlumberger SA
Application granted granted Critical
Publication of CA1330360C publication Critical patent/CA1330360C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
CA 573410 1987-07-31 1988-07-29 Testeur de circuits Expired - Fee Related CA1330360C (fr)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
FR87/10870 1987-07-31
FR8710870A FR2621699B1 (fr) 1987-07-31 1987-07-31 Perfectionnements aux testeurs de circuits
FR88/08230 1988-06-20
FR888808230A FR2633055B2 (fr) 1987-07-31 1988-06-20 Perfectionnements aux testeurs de circuits
EP88401901.9 1988-07-22
EP88401901A EP0306359B1 (fr) 1987-07-31 1988-07-22 Dispositif pour un test d'un circuit

Publications (1)

Publication Number Publication Date
CA1330360C true CA1330360C (fr) 1994-06-21

Family

ID=27231790

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 573410 Expired - Fee Related CA1330360C (fr) 1987-07-31 1988-07-29 Testeur de circuits

Country Status (2)

Country Link
JP (1) JP2843572B2 (fr)
CA (1) CA1330360C (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113939103A (zh) * 2021-09-07 2022-01-14 德中（天津）技术发展股份有限公司 组装阶段进行通断测试和制造阻焊图案的电路板制造方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2859020B1 (fr) * 2003-08-22 2005-11-04 Centre Nat Rech Scient Dispositif et procede de detection et de mesure non invasives des proprietes d'un milieu

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2582579B2 (ja) * 1987-07-13 1997-02-19 浜松ホトニクス株式会社 電圧検出装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113939103A (zh) * 2021-09-07 2022-01-14 德中（天津）技术发展股份有限公司 组装阶段进行通断测试和制造阻焊图案的电路板制造方法

Also Published As

Publication number Publication date
JP2843572B2 (ja) 1999-01-06
JPH01119778A (ja) 1989-05-11

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