BE845847A - Dispositif d'analyse de faute - Google Patents
Dispositif d'analyse de fauteInfo
- Publication number
- BE845847A BE845847A BE170348A BE170348A BE845847A BE 845847 A BE845847 A BE 845847A BE 170348 A BE170348 A BE 170348A BE 170348 A BE170348 A BE 170348A BE 845847 A BE845847 A BE 845847A
- Authority
- BE
- Belgium
- Prior art keywords
- analysis device
- fault analysis
- fault
- analysis
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/610,581 US4012625A (en) | 1975-09-05 | 1975-09-05 | Non-logic printed wiring board test system |
Publications (1)
Publication Number | Publication Date |
---|---|
BE845847A true BE845847A (fr) | 1976-12-31 |
Family
ID=24445606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE170348A BE845847A (fr) | 1975-09-05 | 1976-09-03 | Dispositif d'analyse de faute |
Country Status (7)
Country | Link |
---|---|
US (1) | US4012625A (fr) |
JP (1) | JPS5245058A (fr) |
BE (1) | BE845847A (fr) |
CA (1) | CA1065062A (fr) |
DE (1) | DE2639323A1 (fr) |
FR (1) | FR2323297A1 (fr) |
GB (1) | GB1523060A (fr) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4125763A (en) * | 1977-07-15 | 1978-11-14 | Fluke Trendar Corporation | Automatic tester for microprocessor board |
US4168796A (en) * | 1978-04-13 | 1979-09-25 | Ncr Corporation | Tester with driver/sensor circuit having programmable termination devices |
US4174805A (en) * | 1978-04-13 | 1979-11-20 | Ncr Corporation | Method and apparatus for transmitting data to a predefined destination bus |
USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
US4192451A (en) * | 1978-05-30 | 1980-03-11 | Tektronix, Inc. | Digital diagnostic system employing signature analysis |
US4242751A (en) * | 1978-08-28 | 1980-12-30 | Genrad, Inc. | Automatic fault-probing method and apparatus for checking electrical circuits and the like |
US4404627A (en) * | 1979-05-11 | 1983-09-13 | Rca Corporation | Interrupt signal generating means for data processor |
US4417336A (en) * | 1981-06-18 | 1983-11-22 | The Bendix Corporation | Method of testing with computers |
DE3234413A1 (de) * | 1982-09-16 | 1984-03-22 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur automatischen fehlersuche im innern von vlsi-schaltungen mit einer elektronensonde und vorrichtung zur durchfuehrung eines solchen verfahrens |
US4538269A (en) * | 1983-04-18 | 1985-08-27 | International Telephone And Telegraph Corporation | Programmable coding and decoding arrangement |
GB8432305D0 (en) * | 1984-12-20 | 1985-01-30 | Int Computers Ltd | Crystal oscillator overdrive |
US4713815A (en) * | 1986-03-12 | 1987-12-15 | International Business Machines Corp. | Automatic fault location system for electronic devices |
EP0296884A3 (fr) * | 1987-06-24 | 1991-01-16 | Schlumberger Technologies, Inc. | Procédé pour tester in-circuit un dispositif électronique |
US5047708A (en) * | 1988-12-23 | 1991-09-10 | Kondner Jr Robert L | Apparatus for testing circuit boards |
US5032789A (en) * | 1989-06-19 | 1991-07-16 | Hewlett-Packard Company | Modular/concurrent board tester |
US5045782A (en) * | 1990-01-23 | 1991-09-03 | Hewlett-Packard Company | Negative feedback high current driver for in-circuit tester |
US5091693A (en) * | 1990-07-13 | 1992-02-25 | Schlumberger Technologies, Inc. | Dual-sided test head having floating contact surfaces |
FR2675921B1 (fr) * | 1991-04-24 | 1993-08-20 | Hewlett Packard Co | Procede et dispositif de test d'une carte d'un systeme informatique. |
US5414712A (en) * | 1991-07-23 | 1995-05-09 | Progressive Computing, Inc. | Method for transmitting data using a communication interface box |
US5455938A (en) * | 1994-09-14 | 1995-10-03 | Ahmed; Sultan | Network based machine instruction generator for design verification |
US5748497A (en) * | 1994-10-31 | 1998-05-05 | Texas Instruments Incorporated | System and method for improving fault coverage of an electric circuit |
US5663967A (en) * | 1995-10-19 | 1997-09-02 | Lsi Logic Corporation | Defect isolation using scan-path testing and electron beam probing in multi-level high density asics |
JP4350802B2 (ja) * | 1996-11-13 | 2009-10-21 | ブリティッシュ・テレコミュニケーションズ・パブリック・リミテッド・カンパニー | 遠隔通信網用の欠陥管理システム |
US6473707B1 (en) * | 1998-08-21 | 2002-10-29 | National Instruments Corporation | Test executive system and method including automatic result collection |
US6266787B1 (en) * | 1998-10-09 | 2001-07-24 | Agilent Technologies, Inc. | Method and apparatus for selecting stimulus locations during limited access circuit test |
US20020152046A1 (en) * | 2001-04-13 | 2002-10-17 | Velichko Sergey A. | Concurrent control of semiconductor parametric testing |
US7162386B2 (en) * | 2002-04-25 | 2007-01-09 | Micron Technology, Inc. | Dynamically adaptable semiconductor parametric testing |
US7010451B2 (en) * | 2003-04-17 | 2006-03-07 | Micron Technology, Inc. | Dynamic creation and modification of wafer test maps during wafer testing |
US8626460B2 (en) * | 2006-03-31 | 2014-01-07 | Teseda Corporation | Secure test-for-yield chip diagnostics management system and method |
US20090105983A1 (en) * | 2007-10-23 | 2009-04-23 | Texas Instruments Incorporated | Test definer, a method of automatically determining and representing functional tests for a pcb having analog components and a test system |
US9659136B2 (en) | 2010-09-27 | 2017-05-23 | Teseda Corporation | Suspect logical region synthesis from device design and test information |
US9939488B2 (en) | 2011-08-31 | 2018-04-10 | Teseda Corporation | Field triage of EOS failures in semiconductor devices |
US8907697B2 (en) | 2011-08-31 | 2014-12-09 | Teseda Corporation | Electrical characterization for a semiconductor device pin |
US12007423B2 (en) * | 2021-09-02 | 2024-06-11 | Qmax Test Equipments Pvt, Ltd | Portable nodal impedance analyser |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1237325A (en) * | 1968-10-17 | 1971-06-30 | Bowater Flexpipe Ltd | Improved helically wound tubing |
DE2013070A1 (de) * | 1970-03-19 | 1971-09-30 | Licentia Gmbh | Verfahren und Vorrichtung zur Prüfung von unbestuckten gedruckten Schaltungs platten |
US3631229A (en) * | 1970-09-30 | 1971-12-28 | Ibm | Monolithic memory array tester |
BE790243A (fr) * | 1971-11-08 | 1973-02-15 | Burroughs Corp | Procede et appareil de verification de sous-systemes de circuits binaires |
US3764995A (en) * | 1971-12-21 | 1973-10-09 | Prd Electronics Inc | Programmable test systems |
US3777129A (en) * | 1972-05-22 | 1973-12-04 | Gte Automatic Electric Lab Inc | Fault detection and localization in digital systems |
US3851249A (en) * | 1973-06-04 | 1974-11-26 | Electroglass Inc | Microcircuit test device with multi-axes probe control and probe stop means |
DE2443716A1 (de) * | 1974-09-12 | 1976-03-25 | Siemens Ag | Einrichtung zum orten von kurzschluessen auf bestueckten und unbestueckten gedruckten schaltungen |
US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
US4001818A (en) * | 1975-10-22 | 1977-01-04 | Storage Technology Corporation | Digital circuit failure detector |
-
1975
- 1975-09-05 US US05/610,581 patent/US4012625A/en not_active Expired - Lifetime
-
1976
- 1976-08-11 CA CA258,918A patent/CA1065062A/fr not_active Expired
- 1976-09-01 DE DE19762639323 patent/DE2639323A1/de not_active Withdrawn
- 1976-09-02 GB GB36370/76A patent/GB1523060A/en not_active Expired
- 1976-09-03 FR FR7626705A patent/FR2323297A1/fr not_active Withdrawn
- 1976-09-03 BE BE170348A patent/BE845847A/fr unknown
- 1976-09-06 JP JP51106611A patent/JPS5245058A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
GB1523060A (en) | 1978-08-31 |
US4012625A (en) | 1977-03-15 |
CA1065062A (fr) | 1979-10-23 |
JPS5245058A (en) | 1977-04-08 |
FR2323297A1 (fr) | 1977-04-01 |
DE2639323A1 (de) | 1977-03-10 |
AU1682876A (en) | 1978-02-16 |
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