AU666726B2 - Simultaneous double inspection - Google Patents

Simultaneous double inspection Download PDF

Info

Publication number
AU666726B2
AU666726B2 AU39822/93A AU3982293A AU666726B2 AU 666726 B2 AU666726 B2 AU 666726B2 AU 39822/93 A AU39822/93 A AU 39822/93A AU 3982293 A AU3982293 A AU 3982293A AU 666726 B2 AU666726 B2 AU 666726B2
Authority
AU
Australia
Prior art keywords
image
electromagnetic radiation
deviations
type
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU39822/93A
Other versions
AU3982293A (en
Inventor
Lucien Johannes Nelen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HEUFT-QUALIPLUS BV
Original Assignee
Heuft Qualiplus BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heuft Qualiplus BV filed Critical Heuft Qualiplus BV
Publication of AU3982293A publication Critical patent/AU3982293A/en
Application granted granted Critical
Publication of AU666726B2 publication Critical patent/AU666726B2/en
Anticipated expiration legal-status Critical
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

INM
j -1- 66& 72 6 jo
AUSTRALIA
PATENTS ACT 1990 COMPLETE SPECIFICATION FOR A STANDARD PATENT
ORIGINAL
C'
CC C C C CC C CC CC~ E C
C.
I. CC #6 C
C
CCC
C C CC C C C C
C-
CCCI
C
Name of Applicant: Actual Inventor: HEUFT-QUALIPLUS B.V.
Lucien Johannes Nelen Address for Service: SHELSTON WATERS 55 Clarence Street SYDNEY NSW 2000 C C C. C C C
CC
Invention Title: "SIMULTANEOUS DOUBLE INSPECTION" IDetails of Original Application No. 49735/90 dated 13th February 1990 The following statement is a full description of this invention, including the best method of performing it known to us:- ?s including..
Sla SIMULTANEOUS DOUBLE INSPECTION The invention relates to a method for inspecting an object or a series of successively supplied objects for deviations such as form errors, dirt, cracks and so on, comprising the following steps of: 1) providing at least one illuminating station for emitting electromagnetic radiation of a chosen type, 2) providing at least one associated sensing station which is arranged for sensing the electromagnetic radiation emitted by the illuminating station, 10 3) providing an object for inspection, and 4) arranging in alignment the or each illuminating station, the or each associated sensing station and the object, such that the or each sensing station can form an image of the object illuminated by the associated illuminat- 15 ing station.
Such a method is known. In a known method an object for inspection, for example a glass jar, is transported by means of a conveyor device to a illuminating station and an associated sensing station. The illuminating station can, for example, be arranged to generate a flash at the moment the arrival of the object for inspection is determined. The sensing station, in particular a video camera, senses the image of the object for inspection and feeds that to a central processing unit for instance, which can be coupled with pushing means for pushing out a rejected object. The object subjected in this marine- to a first inspection is subsequently carried to a second inspection station with (a second illuminating station and a second sensing station, which inspection station differs from the first in order to be able ii to determine a second type of deviation. Fig. 1 shows a conveyor device 1 for transporting *ij I K__ m i[~a 1 i f L1L~-W4 I, I_.
~II
2/4 -2glass jars 2. A lamp 3 generates a flash at the moment the jar 2 has arrived at the place of inspection. A video camera 4 senses the image of the jar 2 and if necessary transmits to central control means (not drawn) a rejection signal which can serve for controlling push-out means placed downstream of the conveyor device. Light passes through the jar 2 in this manner. This method of illumination is known as bright field illumination.
This method is very suitable for sensing, for example, dirt.
The jar 2 is subsequently further transported in the direction of arrow 5 to the T :position indicated by Located there is a second inspection station, consisting of a second lamp 6 which generates a flash at the moment the jar 2' has arrived. Because a 10 round, opaque disc 7 is located above the lamp 6 in the middle, light does not pass directly through the jar 2' as described above, but illuminating takes place according to the dark field principle. Under normal conditions a video camera 8 does not therefore sense light but can only ascertain the presence of particular errors of form or cracks, namely deviations which result in transmitting by the jar 2' of light in the direction of the :15 video camera 8.
According to this known art, use has therefore to be made for determining two different types of deviation of two separate inspection stations, each consisting of an illuminating station and a sensing station.
The drawback of the above described known inspection method is that these two separate inspections take up a lot of space and require extra control means.
It is an object of the invention to overcome or substantially ameliorate at least one of these deficiencies of the prior art.
B--
3/4 -3- IC C 0 4 1 According to the invention there is provided an apparatus for inspecting glass containers for deviations, said apparatus including: a conveyor device for carrying the containers; illuminating means having a light-emitting surface below the conveyor device, the light-emitting surface having a central portion covered by a filter for allowing passage of electromagnetic radiation of a first type only and an edge zone surrounding the filter for emitting electromagnetic radiation of a second type; and a sensing station for forming a first image of the containers from the radiation passing through the filter, said first image being formed by bright-field illumination, and said sensing station forming a second image of the containers from the radiation emitted from the edge zone, said second image being formed by dark-field illumination whereby said first and second images allow detection of deviations in said container.
A preferred embodiment di -plays the feature that the one sensing station is arranged for simultaneous, separate sensing of all types of electromagnetic radiation.
For example, for inspecting glass containers the dark field detection method can be markedly improved by illuminating the bottom of the container not only from the outside, as will be discussed hereafter with reference to Fig. 2, but also thfrough the "black" disc. To, this end the device then displays the feature that the illuminating station is arranged for emitting through-passing, indirect electromagnetic radiation antd comprises for this purpose: a source for electromagnetic radiation which is placed for through-passing illumination of an object for inspection, and
I
:1U 4/4 -4dark field means comprising, from the electromagnetic radiation source, a diff-user, a first pattern of strips opaque to the electromagnetic radiation, for example concentric rings, and a second pattern of strips opaque to the electromagnetic radiation, which two patterns are placed at a distance above E 4 t
I
It 4e*t It
I.
I
C V C I V CCC C CC CC C Cli C C C If.
CI C C C
C
C C Cli 0 C C
CCCO
C C C C CC I* C CI I~ C. CI 0. vs C C -It
I
0 another such that the lines of the one pattern cover the free spaces between the lines of the other pattern.
As a result of this configuration, for instance glass splinters and the like are now not only illuminated from the outside, i.e. from the annular diffuse light-source around the black disc, but also, as it were, through the disc, though not directly but exclusively indirectly, so that when an object is fault-free no electromagnetic radiation reaches the sensing station, and this only occurs in the case of a deviation.
The method and device according to the invention provide the option of performing at least two inspections at one inspection position.
S"The invention will now be elucidated with reference to 15 the annexed drawing. In the drawing: fig. 1 shows a schematic side view of the inspection device according to the state of the art already discussed above; fig. 2 shows a schematic side view of an inspection 20 device according to the invention in a first embodiment; fig. 3 shows an inspection device according to the invention in a second embodiment; fig. 4 shows an inspection device according to the invention in a third embodiient; fig. 5 shows the transmission characteristics of spectral-selective filters for use in the invention; :fig. 6 shows a highly schematic detail of a fourth "embodiment; fig. 7 shows a schematic side view of a fifth embodiment; fig. 8 shows the image of a perfect fluorescent lamp; fig. 9 shows the image of a fluorescent lamp with a deviation in the glass; fig. 10 shows the detail X according to fig. 7; fig. 11 is a view corresponding with fig. 10 of a preferred embodiment of the diffusor with grating; and fig. 12 shows a cross section through an alternative .j h 6- 1 *4 a. a.
a a a.
a a .i a *i a *4 a a illuminating station.
For the description of fig. 1, reference is made to the above.
Fig. 2 shows the jar 2 which is carried by the conveyor device 1 to above a lamp 9 which is covered in the middle by a filter 10 which allows through all radiation of a wavelength above 600 nm and cuts out all radiation of a smaller wavelength.
The red light allowed through by the filter 10 passes through the jar 2. The radiation allowed through passes through a semi-transparent mirror 11 and enters the video camera 4 via a filter 12. The filter 12 is of the same type as the filter 10 and thus allows through red light. The camera 4 therefore senses an image similar to the camera 4 according to fig. 1.
The semi-transparent mirror 11 transmits via a mirror 13 another portion of the light to the video camera 8 via a filter 14. The filter 14 is of the type that allows through only radiation of a wavelength smaller than 600 nm. As a result hereof no image of the jar 2 formed by light passing through will be sensed by the camera 8. For this camera 8 the filter 10 therefore functions as the black disc 7 according to fig. 1.
However, the light-emitting upper surface 15 of the lamp 9 is covered by the f lter 10 only in its central portion. The edge zone 16 can emit light in the same way as the lamp 6 with the black disc 7 as in fig. 1. This light-emitting edge 16 therefore acts to form dark field illumination for, the jar 2. Since the radiation emitted via the edge 16 also contains wavelengths which can be allowed through by the filter 14 the camera 8 is hereby capable of sensing a dark field image of the jar 2.
t ill be apparent from the above that two inspections for different deviations can now be carried out simultaneously at one inspection location.
Fig. 3 shows a conveyor belt 17 which supplies an open aluminium holder 18 for inspection. A first lamp 19 emits a
S,I
a. t a- 1igh bund of t cal, 5 the the a ve3 wher withc 10 cylii an ii will tran.
the 15 mirrc light a bli or 1 20 symbc ally cannc radia via t a tc atc
C
0 i~ C rrra cc~ t t CL a ir respc videc in t) diffe i! j r gi 1
I'A
chara missi filte paren 35 is es tion use c NowI I
S.
S.
S S *5 5.55 S. S light via the filter 10 to a lens system 20, 21. The outgoing bundle is parallel. Situated in the middle on the exit side of the system 20, 21 is a black disc 7, whereby a cylindrical, parallel bundle 22 is directed intu the holder 18 via the semi-transparent mirror 11. This bundle is reflected by the upwardly convex bottom of the holder 18 and directed at a very small angle onto the cylindrical wall of the holder 18 where it is again reflected. A perfectly cylindrical holder without errors of form will emit the light reflected by the cylindrical wall such that this travels beyond the range of an imaging lens 23. Only in the case of, for example, a dent will red light be allowed through by the lens 23 to the semitransparent mirror 11 where the red light corresponding with the dent reaches the video camera 4 via a semi-transparent 15 mirror 24 via the red filter 12.
Extending around the imaging lens 23 is an annular light source 25. This comprises an annular flash light 26 and a blue diffusor 27. This matt glass diffusor gives off more or less diffuse light to the interior of the can 18, as symbolically indicated with arrows 28. The can 18 is internally illuminated in diffuse blue. The blue image of the can cannot pass through the red filter 12, and only the blue radiation reflected by the mirror 24 can reach the camera 8 via the mirror 13 and the blue filter 14.
fig. 4 shows a variant wherein the light source corresponds with that according to fig. 3, but where only one video camera 29 is used. If required, the colour information in the video signal can serve for discriminating between different deviations.
Fig. 5 shows in an unbroken line the transmission characteristic 30 of the red filters 10, 12 while the transmission characteristic 31 of the diffusor 27 and the blue filter 14 is indicated with a broken line. It will be apparent that in particular the transmission characteristic 30 is especially sharp so that there need be no fear of information cross-talk between both inspection systems. If required use could optionally also be made of illuminating means which of th S 5C r S emit width line this c 5 a sod: that sider
S
5* *5 5e S 9 f9#
SC
cent there desigi direc radia 32 an 15 trans furth nate more filt examp 25 polar refle videc tivel r r S li 30
'I
have glass cies, peril to f: pass for *tJ
C-,
JL-J:
o i 6 t 9
S
*9 99r *5' 9 a 9 9 9 9 9 9*9 9 9 9* .9 9 91 9 emit electromagnetic radiation with a very limited band width, for example sources with a line spectrum wherein one line or a limited wave length field is allowed through. In this context a combination of for instance a mercury lamp and a sodium lamp may be envisaged. It will be otherwise apparent that all sorts of other types of sources can also be considered.
Fig. 6 shows a detail of a variant wherein use is made of three video cameras 4, 33, 8.
The incident light or other electromagnetic radiation designated with 35 coming from the object fEr inspection is directed onto a so-called dichroic mirror 36. This allows radiation of the one wavelength field through to the camera 32 and reflects another portion in the direction of semi- 15 transparent mirror 24. Reference is made to fig. 3 for the further optical route.
Fig. 7 shows a disposition for inspecting a fluorescent lamp 37 or at least the pre-manufactured glass housing thereof.
20 Use is mae of two flash lights 38, 39, which illuminate diffusor plates 40 and 41 respectively. As can be seen more clearly in fig. 10, these diffusor plates display a red filter formed as a grating 42 of parallel strips 43, for example of the same ,aterial as the filter 10 or 12. Via a 25 polarization filter 44 acting against sensing of direct reflections and via respective mirrors 45, 46 and 47, 48 a video camera 53 senses the tube 37 in two directions, respectively illuminated by the lamps 38 and 39.
There are various types of deviations or faults which k.>3 0 have to be sensed in the tube, such as air bubbles in the glass, stripes, enclosures, small stones, material deficiencies. For a good inspection it is required that the entire periphery of the tube be inspected. The disposition according to fig. 7 is arranged to this end.
Attention is drawn to the fact that the tube 37 can pass through the inspection station in an axial direction, for example at a determined speed, whereby all deficiencies tion az the lan a a #9 *9 9 .9 9 9 r a SA a *9*9 99 from wh glass faults the gra 15 6Iutall, detecte overlap 51' is 20 inspect the ent along i basis traced 5 tion of thereof
I
i! tl i it i j:i i:i i directi nal dir tion ac front sl of insr place oi strips use can these i, During through be sensi J 35 along the entire length can be detected.
The inspection according to fig. 7 takes place on a basis of light refraction. Non-transparent particles are traced by determining a transmission-difference. A disposition of the same type as according to fig. 2 or an equivalent thereof can also be employed as sensing station.
Fig. 8 shows a video image consisting of tt(o inspection areas which correspond respectively with the lamp 39 and the lamp 38.
Fig. 9 shows as example a disturbance of the image from which is apparent that this is a case of a fault in the glass seen by the camera 53. This senses non-transparent faults in any position, in contrast to the situation wherein the grating-pattern consists of non-transparent strips, and 15 imall, non-transparent faults which fall onto a strip are not detected.
SThe overlap areas 49, 50 are composed of lines which overlap each other after diffraction. The remaining area 51, 51' is the inspection area. It will be apparent that this inspection area must be large enough to sense deviations over the entire periphery of the tube 37 at the two angles.
With regard to fig. 9 it is further noted the line direction of the video image corresponds with the longitudi- Snal direction of the grating strips 43.
Attention is drawn to the fact that with the inspection according to fig. 7 the camera 53 is focused on the front surface of the diffusor plates 40, 41. With the methods of inspection discussed heretofore, focusing always takes place on the object 2, 18.
In order to ensure that the grey value of the grating strips 43 corresponds with the areas situated therebetween use can Be made of the variant drawn in fig. 11, wherein these intermediate areas are provided with grey filters 54.
SDuring sensing 'of a diffusor plate according to fig. 11 through a red filter a homogeneous red surface will therefore be sensed.
Fig. 10shows the breadth 55 rCnd the mutual distance 1 2i
I!
4 Ui /1
-I
I *1 -u 56 of the grating strips 43. These quantities influence the size of the inspection area on the tube and the dimensions of the minimal detectable deviation. Broadly speaking: The smaller the breadth and the mutual distance, the greater the overlap area will be, and smaller deviations can be better detected.
The greater the breadth and the mutual distance the smaller the overlap area will be, and smaller deviations will be less well detected.
The more the breadth and the mutual distance deviate from one another, the less well glass deviations will always be detected.
As a result of the invention the detection of nontransparent faults has become independent of the grating pattern.
Fig. 11 finally shows a disposition for dark field illuminating. This arrangement comprises a glass plate 57 which comprises on its upper surface first pattern 58 of strips, for example concentric rings, opaque to the electro- 20 magnetic radiation, and comprises on its underside a second pattern 60 of strips 61 opaque to the electromagnetic radiation, which patterns are placed a'Qje one anotner at a distance the size of the thickness of he glass plate 57 such that the strips of the one pattern 58, 60 cover the free 25 spaces between the strips of the other pattern 60, 58. Under the plate 57 is situated a diffusor 62 under which is placed SI the radiation source (not drawn). This transmits electromag- 0* netic radiation indicated with arrows 63. This electromagnetic radiation is wholly screened off in the direction of the sensing station 4, 8 (see fig. 2) by the opaque patterns i 58, 60. Only by obliquely through-falling radiation can deviations and faults be illuminated and result in image forming in the sensing station 4, 8. It will be apparent that, for glass bottles for instance, patterns of concentric rings are most suitable. For use in a disposition for checking fluorescent tubes, as explained with reference to fig. 7-' 7 i11, patterns of straight strips can be applied.
i 1

Claims (4)

1. An apparatus for inspecting glass containers for deviations, said apparatus including: a conveyor device for carrying the containers; illuminating means having a light-emitting surface below the conveyor device, the light-emitting surface having a central portion covered by a filter for allowing passage of electromagnetic radiation of a first type only and an edge zone surrounding the filter for emitting electromagnetic radiation of a second type; and a sensing station for forming a first image of the containers from the radiation 10 passing through the filter, said first image being formed by bright-field illumination, and t said sensing station forming a second image of the containers from the radiation emitted from the edge zone, said second image being formed by dark-field illumination whereby C 9 said first and second images allow detection of deviations in said container.
2. The apparatus of claim 1, whelrein the sensing station comprises two video c o 15 cameras, the light from the light-emitting surface and having passed the container is split by a semi-transparent mirror into two portions, one portion being transmitted through a F C tl filter transparent only for electromagnetic raliation of the first type to one of the video cameras for forming said first image and the other portion being transmitted through a filter transparent only for electromagnetic radiation of the second type to the other of the video cameras for forming said second image. 1
3. The apparatus of claims 1 or 2, wherein the spectral compositions of the two types of electromagnetic radiation differ mutually. ,I -W ~~xL It 1 1
12- 4. The apparatus of claims 1 or 2, wherein the polarisation directions of the electromagnetic radiation of the at least two types differ mutually. An apparatus for inspecting glass containers for deviations substantially as hereindescribed with reference to Figures 2, 5 and 6. Dated this 21st Day of December, 1995 HEUFT-QUALIPLUS B.V. Attorney: JOHN B. REDFERN Fellow Institute of Patent Attorneys of Australia of SHELSTON WATERS C CCC CC I I S4- 1'1 I: ABSTRACT Method and apparatus for inspecting an object or series of successive objects for deviations such as errors of form, dirt, cracks and other flaws, comprising the following steps of: providing only one illuminating station and/or only one sensing station, which illuminating station transmits electromagnetic radiation of at least two types and which sensing station can sense electromagnetic radiation of these at least two types, wherein the image formed from radiation of the one type can give information about deviations of the first type and the image formed from radiation of the second type can give information about deviations of the second type and so on, such that two or more types of deviation can be determined simultaneously; 15 and performing the abovementioned step such that the travel directions of the electromagnetic radiation of said at least two types differ. .0 00 *t c 0 C 00 E-1 t
AU39822/93A 1989-02-14 1993-05-26 Simultaneous double inspection Expired AU666726B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NL8900356 1989-02-14
NL8900356 1989-02-14
NL8901380 1989-05-31

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
AU49735/90A Division AU4973590A (en) 1989-02-14 1990-02-13 Simultaneous double inspection

Publications (2)

Publication Number Publication Date
AU3982293A AU3982293A (en) 1993-08-19
AU666726B2 true AU666726B2 (en) 1996-02-22

Family

ID=19854127

Family Applications (1)

Application Number Title Priority Date Filing Date
AU39822/93A Expired AU666726B2 (en) 1989-02-14 1993-05-26 Simultaneous double inspection

Country Status (1)

Country Link
AU (1) AU666726B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3413027A1 (en) * 1984-04-06 1985-10-17 Mecapec S.A., Schmerikon Method and device for monitoring the surface of a moving material layer
US4650326A (en) * 1983-06-21 1987-03-17 Mitsubishi Denki Kabushiki Kaisha Apparatus for inspecting bottles
US5020908A (en) * 1985-11-15 1991-06-04 Peter Hermann Apparatus for the optical detection of flaws, in particular cracks in transparent objects

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4650326A (en) * 1983-06-21 1987-03-17 Mitsubishi Denki Kabushiki Kaisha Apparatus for inspecting bottles
DE3413027A1 (en) * 1984-04-06 1985-10-17 Mecapec S.A., Schmerikon Method and device for monitoring the surface of a moving material layer
US5020908A (en) * 1985-11-15 1991-06-04 Peter Hermann Apparatus for the optical detection of flaws, in particular cracks in transparent objects

Also Published As

Publication number Publication date
AU3982293A (en) 1993-08-19

Similar Documents

Publication Publication Date Title
US5134278A (en) Device for simultaneously inspecting an object for defects and debris
CN1114100C (en) Method and apparatus for optical inspection of transparent containers using infrared and polarized visible light
ES2734901T3 (en) Apparatus and methods for inspecting a composite structure to detect defects
JPS6145956A (en) Method for selectively inspecting refractive defect in transparent product
US20100051834A1 (en) Bright field and dark field channels, used for automotive glass inspection systems
JP2002529698A (en) Glass inspection equipment
CA2098260C (en) Inspection of transparent containers with opposing reflection means
JP3607744B2 (en) Translucent container inspection device and inspection method
GB2212911A (en) Bottle bottom inspection apparatus
JPH07209210A (en) Method and device for optically inspecting transparent region of container
WO1998058241A1 (en) Device for checking sheet packaging
US6424414B1 (en) Method and apparatus for detecting refractive defects in transparent containers
US6532064B1 (en) Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object
JPS61159139A (en) Inspection device
JP3216876B2 (en) Sheet packaging inspection device
JP4743552B2 (en) Foreign matter inspection method, foreign matter inspection device, and illumination device for foreign matter inspection
JP4284646B2 (en) Foreign matter inspection device and illumination device for foreign matter inspection
AU666726B2 (en) Simultaneous double inspection
JP4707511B2 (en) Foreign matter inspection device in liquid filled in light transmissive container
JPH01141342A (en) Bottle bottom inspection instrument
JP2002131239A (en) Apparatus and method for inspection of foreign body
JP2005233695A (en) Flaw inspection device for transparent panel
JPH03122556A (en) Method and apparatus of checking translucent sheet-like material
JP2004317426A (en) Apparatus for inspecting bottom of container for foreign substances
JPH06129539A (en) Inspection of o-ring