AU6014594A - Method and apparatus for imaging surfaces - Google Patents

Method and apparatus for imaging surfaces

Info

Publication number
AU6014594A
AU6014594A AU60145/94A AU6014594A AU6014594A AU 6014594 A AU6014594 A AU 6014594A AU 60145/94 A AU60145/94 A AU 60145/94A AU 6014594 A AU6014594 A AU 6014594A AU 6014594 A AU6014594 A AU 6014594A
Authority
AU
Australia
Prior art keywords
imaging surfaces
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU60145/94A
Inventor
Jack A Dean
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Golden Aluminum Co
Original Assignee
Golden Aluminum Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Golden Aluminum Co filed Critical Golden Aluminum Co
Publication of AU6014594A publication Critical patent/AU6014594A/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8822Dark field detection
    • G01N2021/8825Separate detection of dark field and bright field
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918Metal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/10Scanning
    • G01N2201/102Video camera

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU60145/94A 1993-02-02 1993-12-13 Method and apparatus for imaging surfaces Abandoned AU6014594A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US1231093A 1993-02-02 1993-02-02
US012310 1993-02-02
PCT/US1993/012141 WO1994018643A1 (en) 1993-02-02 1993-12-13 Method and apparatus for imaging surfaces

Publications (1)

Publication Number Publication Date
AU6014594A true AU6014594A (en) 1994-08-29

Family

ID=21754366

Family Applications (1)

Application Number Title Priority Date Filing Date
AU60145/94A Abandoned AU6014594A (en) 1993-02-02 1993-12-13 Method and apparatus for imaging surfaces

Country Status (2)

Country Link
AU (1) AU6014594A (en)
WO (1) WO1994018643A1 (en)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5917588A (en) * 1996-11-04 1999-06-29 Kla-Tencor Corporation Automated specimen inspection system for and method of distinguishing features or anomalies under either bright field or dark field illumination
EP0898163B1 (en) * 1997-08-22 2000-11-08 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Method and apparatus for automatic inspection of moving surfaces
US6294327B1 (en) 1997-09-08 2001-09-25 Affymetrix, Inc. Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering
US6327374B1 (en) 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
DE19946520B4 (en) * 1999-09-28 2010-09-16 Parsytec Ag Apparatus and method for surface inspection of a continuously tapered strip material
GB2384852A (en) * 2001-09-03 2003-08-06 Millennium Venture Holdings Lt Workpiece inspection apparatus
US7137182B2 (en) 2002-11-22 2006-11-21 The Boeing Company Parallel configuration composite material fabricator
US7236625B2 (en) * 2003-07-28 2007-06-26 The Boeing Company Systems and method for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure
US7289656B2 (en) 2003-12-02 2007-10-30 The Boeing Company Systems and methods for determining inconsistency characteristics of a composite structure
US8934702B2 (en) 2003-12-02 2015-01-13 The Boeing Company System and method for determining cumulative tow gap width
US7039485B2 (en) 2004-03-12 2006-05-02 The Boeing Company Systems and methods enabling automated return to and/or repair of defects with a material placement machine
US7193696B2 (en) 2004-04-12 2007-03-20 United Technologies Corporation Systems and methods for using light to indicate defect locations on a composite structure
US7424902B2 (en) 2004-11-24 2008-09-16 The Boeing Company In-process vision detection of flaw and FOD characteristics
US7889907B2 (en) 2005-01-12 2011-02-15 The Boeing Company Apparatus and methods for inspecting tape lamination
DE102006009593B4 (en) * 2005-10-01 2008-12-18 Vistec Semiconductor Systems Gmbh Device for taking multiple images of disc-shaped objects
US7372556B2 (en) 2005-10-31 2008-05-13 The Boeing Company Apparatus and methods for inspecting a composite structure for inconsistencies
US7435947B2 (en) 2005-10-31 2008-10-14 The Boeing Company Apparatus and methods for integrating encoding functions in material placement machines
DE102007007828B4 (en) * 2007-02-16 2011-02-24 Bst International Gmbh Method and device for illuminating a printed image on a material web
EP2144052A1 (en) * 2008-07-11 2010-01-13 Dr. Schenk GmbH Industriemesstechnik Method and device for detecting and classifying defects
JP6113355B2 (en) 2013-07-22 2017-04-12 ツェットエス−ハンドリング ゲゼルシャフト ミット ベシュレンクテル ハフツングZS−Handling GmbH Equipment for inspecting workpiece surfaces and strip materials
MY165130A (en) * 2015-03-31 2018-02-28 Nisshin Steel Co Ltd Surface defect inspecting device and method for hot-dip coated steel sheets
DE102016100437B4 (en) 2016-01-12 2018-08-02 Stephan Krebs Device for image control
CN106168580A (en) * 2016-07-18 2016-11-30 广东华冠新型材料有限公司 Band hole real-time detection apparatus
KR102632169B1 (en) * 2018-11-12 2024-02-02 삼성디스플레이 주식회사 Apparatus and method for inspecting glass substrate
DE102019107174B4 (en) * 2019-03-20 2020-12-24 Thyssenkrupp Rasselstein Gmbh Method and apparatus for inspecting the surface of a moving belt
CN113447485A (en) * 2020-03-26 2021-09-28 捷普电子(新加坡)公司 Optical detection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922337B1 (en) * 1988-04-26 1994-05-03 Picker Int Inc Time delay and integration of images using a frame transfer ccd sensor
US5030008A (en) * 1988-10-11 1991-07-09 Kla Instruments, Corporation Method and apparatus for the automated analysis of three-dimensional objects

Also Published As

Publication number Publication date
WO1994018643A1 (en) 1994-08-18

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