AU5537094A - Method of manufacturing utilizing master test result feedback to slave test stations - Google Patents

Method of manufacturing utilizing master test result feedback to slave test stations

Info

Publication number
AU5537094A
AU5537094A AU55370/94A AU5537094A AU5537094A AU 5537094 A AU5537094 A AU 5537094A AU 55370/94 A AU55370/94 A AU 55370/94A AU 5537094 A AU5537094 A AU 5537094A AU 5537094 A AU5537094 A AU 5537094A
Authority
AU
Australia
Prior art keywords
result feedback
slave
test result
stations
utilizing master
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU55370/94A
Inventor
James Marvin Harris
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gardiner Communications Corp
Original Assignee
Gardiner Communications Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gardiner Communications Corp filed Critical Gardiner Communications Corp
Publication of AU5537094A publication Critical patent/AU5537094A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
AU55370/94A 1993-02-11 1993-10-12 Method of manufacturing utilizing master test result feedback to slave test stations Abandoned AU5537094A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US1659893A 1993-02-11 1993-02-11
US016598 1993-02-11
PCT/US1993/009676 WO1994018637A1 (en) 1993-02-11 1993-10-12 Method of manufacturing utilizing master test result feedback to slave test stations

Publications (1)

Publication Number Publication Date
AU5537094A true AU5537094A (en) 1994-08-29

Family

ID=21777969

Family Applications (1)

Application Number Title Priority Date Filing Date
AU55370/94A Abandoned AU5537094A (en) 1993-02-11 1993-10-12 Method of manufacturing utilizing master test result feedback to slave test stations

Country Status (2)

Country Link
AU (1) AU5537094A (en)
WO (1) WO1994018637A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2180572T3 (en) * 1993-04-02 2003-02-16 Echelon Corp COMMUNICATIONS ANALYZER THROUGH ELECTRICAL POWER LINES.
DE10328719B4 (en) 2003-06-25 2007-02-01 Infineon Technologies Ag Method for testing electronic components

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4866644A (en) * 1986-08-29 1989-09-12 Shenk John S Optical instrument calibration system
US4864842A (en) * 1988-07-29 1989-09-12 Troxler Electronic Laboratories, Inc. Method and system for transferring calibration data between calibrated measurement instruments
US5243546A (en) * 1991-01-10 1993-09-07 Ashland Oil, Inc. Spectroscopic instrument calibration

Also Published As

Publication number Publication date
WO1994018637A1 (en) 1994-08-18

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