AU5442000A - Method for testing circuits - Google Patents

Method for testing circuits

Info

Publication number
AU5442000A
AU5442000A AU54420/00A AU5442000A AU5442000A AU 5442000 A AU5442000 A AU 5442000A AU 54420/00 A AU54420/00 A AU 54420/00A AU 5442000 A AU5442000 A AU 5442000A AU 5442000 A AU5442000 A AU 5442000A
Authority
AU
Australia
Prior art keywords
testing circuits
testing
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU54420/00A
Inventor
Abhijit Chatterjee
Pramodchandran N. Variyam
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Georgia Tech Research Corp
Original Assignee
Georgia Tech Research Institute
Georgia Tech Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Georgia Tech Research Institute, Georgia Tech Research Corp filed Critical Georgia Tech Research Institute
Publication of AU5442000A publication Critical patent/AU5442000A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G01R31/3163—Functional testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Tests Of Electronic Circuits (AREA)
AU54420/00A 1999-05-19 2000-05-19 Method for testing circuits Abandoned AU5442000A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13480099P 1999-05-19 1999-05-19
US60134800 1999-05-19
PCT/US2000/013862 WO2000070358A1 (en) 1999-05-19 2000-05-19 Method for testing circuits

Publications (1)

Publication Number Publication Date
AU5442000A true AU5442000A (en) 2000-12-05

Family

ID=22465073

Family Applications (1)

Application Number Title Priority Date Filing Date
AU54420/00A Abandoned AU5442000A (en) 1999-05-19 2000-05-19 Method for testing circuits

Country Status (3)

Country Link
EP (1) EP1212626A4 (en)
AU (1) AU5442000A (en)
WO (1) WO2000070358A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104198922A (en) * 2014-08-15 2014-12-10 电子科技大学 Frequency selection method in early fault diagnosis of analog circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237770B (en) * 2014-08-15 2016-11-23 电子科技大学 A kind of analog-circuit fault diagnosis method

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4044244A (en) * 1976-08-06 1977-08-23 International Business Machines Corporation Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
US4647846A (en) * 1980-10-10 1987-03-03 Malkin Dov B Method and means for testing multi-nodal circuits
US4907230A (en) * 1988-02-29 1990-03-06 Rik Heller Apparatus and method for testing printed circuit boards and their components
US4935877A (en) * 1988-05-20 1990-06-19 Koza John R Non-linear genetic algorithms for solving problems
US5327437A (en) * 1991-11-25 1994-07-05 Hewlett-Packard Company Method for testing electronic assemblies in the presence of noise
US5506852A (en) * 1994-03-17 1996-04-09 Nec Usa, Inc. Testing VLSI circuits for defects
US5805795A (en) * 1996-01-05 1998-09-08 Sun Microsystems, Inc. Method and computer program product for generating a computer program product test that includes an optimized set of computer program product test cases, and method for selecting same
US5819208A (en) * 1996-10-29 1998-10-06 Northern Telecom Limited Quantifying circuit performance
CA2206738A1 (en) * 1997-06-02 1998-12-02 Naim Ben Hamida Fault modeling and simulation for mixed-signal circuits and systems

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104198922A (en) * 2014-08-15 2014-12-10 电子科技大学 Frequency selection method in early fault diagnosis of analog circuit
CN104198922B (en) * 2014-08-15 2017-02-01 电子科技大学 Frequency selection method in early fault diagnosis of analog circuit

Also Published As

Publication number Publication date
EP1212626A1 (en) 2002-06-12
WO2000070358A1 (en) 2000-11-23
EP1212626A4 (en) 2006-05-24

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase