AU4793597A - Electronic parts device - Google Patents

Electronic parts device

Info

Publication number
AU4793597A
AU4793597A AU47935/97A AU4793597A AU4793597A AU 4793597 A AU4793597 A AU 4793597A AU 47935/97 A AU47935/97 A AU 47935/97A AU 4793597 A AU4793597 A AU 4793597A AU 4793597 A AU4793597 A AU 4793597A
Authority
AU
Australia
Prior art keywords
electronic parts
parts device
electronic
parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU47935/97A
Inventor
Teiichi Inada
Kazuyoshi Kojima
Akira Nagai
Akishi Nakaso
Yasushi Shimada
Kenzo Takemura
Yoshiyuki Tsuru
Itsuo Watanabe
Osamu Watanabe
Kazunori Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Publication of AU4793597A publication Critical patent/AU4793597A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/12—Mountings, e.g. non-detachable insulating substrates
    • H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • H01L23/145—Organic substrates, e.g. plastic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5383—Multilayer substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001—Core members of the layer connector
    • H01L2224/29099—Material
    • H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
    • H01L2224/29199—Material of the matrix
    • H01L2224/2929—Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001—Core members of the layer connector
    • H01L2224/29099—Material
    • H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
    • H01L2224/29298—Fillers
    • H01L2224/29299—Base material
    • H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321—Disposition
    • H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73201—Location after the connecting process on the same surface
    • H01L2224/73203—Bump and layer connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73201—Location after the connecting process on the same surface
    • H01L2224/73203—Bump and layer connectors
    • H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838—Bonding techniques
    • H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • H01L2224/83851—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01046—Palladium [Pd]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01078—Platinum [Pt]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01079—Gold [Au]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01087—Francium [Fr]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06—Polymers
    • H01L2924/078—Adhesive characteristics other than chemical
    • H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
    • H01L2924/07811—Extrinsic, i.e. with electrical conductive fillers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301—Thyristor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301—Thyristor
    • H01L2924/13034—Silicon Controlled Rectifier [SCR]
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01—Dielectrics
    • H05K2201/0104—Properties and characteristics in general
    • H05K2201/0133—Elastomeric or compliant polymer
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/06—Thermal details
    • H05K2201/068—Thermal details wherein the coefficient of thermal expansion is important
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621—Components characterised by their electrical contacts
    • H05K2201/10674—Flip chip
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/46—Manufacturing multilayer circuits
    • H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
    • H05K3/4626—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/46—Manufacturing multilayer circuits
    • H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4652—Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/46—Manufacturing multilayer circuits
    • H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4652—Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern
    • H05K3/4655—Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern by using a laminate characterized by the insulating layer

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Wire Bonding (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
AU47935/97A 1996-11-01 1997-11-04 Electronic parts device Abandoned AU4793597A (en)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
JP8-292050 1996-11-01
JP29205096 1996-11-01
JP8-320116 1996-11-29
JP32011696 1996-11-29
JP9-298938 1997-10-30
JP29893897 1997-10-30
PCT/JP1997/004003 WO1998020542A1 (en) 1996-11-01 1997-11-04 Electronic parts device

Publications (1)

Publication Number Publication Date
AU4793597A true AU4793597A (en) 1998-05-29

Family

ID=27337707

Family Applications (1)

Application Number Title Priority Date Filing Date
AU47935/97A Abandoned AU4793597A (en) 1996-11-01 1997-11-04 Electronic parts device

Country Status (9)

Country Link
US (1) US6184577B1 (en)
EP (2) EP0957513A4 (en)
JP (1) JP3073532B2 (en)
KR (1) KR100338264B1 (en)
CN (2) CN1110079C (en)
AU (1) AU4793597A (en)
HK (1) HK1022781A1 (en)
TW (1) TW383435B (en)
WO (1) WO1998020542A1 (en)

Families Citing this family (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1288731C (en) * 1996-10-08 2006-12-06 日立化成工业株式会社 Semiconductor device, adhesive and adhesive film
US6562217B1 (en) * 1997-04-17 2003-05-13 Sekisui Chemical Co., Ltd. Method and device for manufacturing conductive particles
JPH11289103A (en) * 1998-02-05 1999-10-19 Canon Inc Semiconductor device and solar cell module and their overhauling methods
JP3374778B2 (en) * 1999-02-25 2003-02-10 株式会社村田製作所 Chip type electronic components
KR100543428B1 (en) * 1999-06-18 2006-01-20 히다치 가세고교 가부시끼가이샤 Adhesive, adhesive member, circuit substrate for semiconductor mounting having adhesive member, and semiconductor device containing the same
JP2001093938A (en) * 1999-09-20 2001-04-06 Nec Kansai Ltd Semiconductor device and its manufacturing method
JP3441412B2 (en) * 1999-10-29 2003-09-02 シャープ株式会社 Resin-sealed semiconductor device and liquid crystal display module using the same
SE523150C2 (en) 2000-01-14 2004-03-30 Ericsson Telefon Ab L M Circuit board and method for manufacturing circuit board with thin copper layer
JP3541777B2 (en) * 2000-03-15 2004-07-14 ソニーケミカル株式会社 Anisotropic conductive connection material
WO2001082367A1 (en) * 2000-04-20 2001-11-01 Hitachi, Ltd. Integrated circuit and method of manufacture thereof
US6423905B1 (en) * 2000-05-01 2002-07-23 International Business Machines Corporation Printed wiring board with improved plated through hole fatigue life
JP3292723B2 (en) * 2000-05-26 2002-06-17 アルス電子株式会社 Semiconductor package and manufacturing method thereof
GB2365816B (en) * 2000-08-09 2002-11-13 Murata Manufacturing Co Method of bonding conductive adhesive and electrode,and bonded structure
JP4174174B2 (en) * 2000-09-19 2008-10-29 株式会社ルネサステクノロジ Semiconductor device, manufacturing method thereof, and semiconductor device mounting structure
JP3851767B2 (en) * 2000-10-16 2006-11-29 ソニーケミカル＆インフォメーションデバイス株式会社 Adhesive film and method for producing adhesive film
JP3905325B2 (en) * 2001-04-23 2007-04-18 富士通株式会社 Multilayer printed wiring board
US7385286B2 (en) * 2001-06-05 2008-06-10 Matsushita Electric Industrial Co., Ltd. Semiconductor module
MXPA02005829A (en) * 2001-06-13 2004-12-13 Denso Corp Method for manufacturing printed wiring board with embedded electric device.
JP3840921B2 (en) 2001-06-13 2006-11-01 株式会社デンソー Printed circuit board and manufacturing method thereof
JP2003007962A (en) * 2001-06-19 2003-01-10 Toshiba Corp Multilayer semiconductor module
JP2003023250A (en) * 2001-07-06 2003-01-24 Denso Corp Multilayered substrate and its manufacturing method
KR20030056819A (en) * 2001-12-28 2003-07-04 삼성전기주식회사 Method for laminating film-type insulating material
JPWO2003085793A1 (en) * 2002-04-11 2005-08-18 Nok株式会社 Sealing structure
US7294928B2 (en) * 2002-09-06 2007-11-13 Tessera, Inc. Components, methods and assemblies for stacked packages
JP5000071B2 (en) * 2003-02-26 2012-08-15 新光電気工業株式会社 Semiconductor device substrate and semiconductor device
TWI234867B (en) * 2003-06-03 2005-06-21 Gigno Technology Co Ltd Flip-chip attach structure and method
CN100543953C (en) 2003-10-06 2009-09-23 日本电气株式会社 Electronic device and manufacture method thereof
JP2005259848A (en) * 2004-03-10 2005-09-22 Toshiba Corp Semiconductor device and its manufacturing method
JP4360240B2 (en) * 2004-03-22 2009-11-11 日立化成工業株式会社 Semiconductor device and multilayer substrate for semiconductor device
CN102290425B (en) * 2004-08-20 2014-04-02 Kamiyacho知识产权控股公司 Method of fabricating semiconductor device having three-dimensional stacked structure
CN100373421C (en) * 2004-09-17 2008-03-05 奇菱科技股份有限公司 Method for producing plane display structure element with protective layer
CN101084083B (en) * 2004-12-20 2010-07-07 千住金属工业株式会社 Solder precoating method and work for electronic device
JP4305430B2 (en) * 2005-08-24 2009-07-29 ソニー株式会社 Component mounting method and component mounting body
JP2007149870A (en) * 2005-11-25 2007-06-14 Denso Corp Circuit board and manufacturing method therefor
KR101070916B1 (en) * 2006-02-24 2011-10-06 삼성테크윈 주식회사 Board scrip and manufacturing method for semiconductor package using the same
JP4294722B2 (en) * 2006-04-27 2009-07-15 パナソニック株式会社 Connection structure and manufacturing method thereof
TW201217482A (en) * 2006-11-10 2012-05-01 Hitachi Chemical Co Ltd Adhesive film, and connection structure and connecting method for circuit member
KR101183317B1 (en) * 2007-10-18 2012-09-14 히다치 가세고교 가부시끼가이샤 Adhesive composition, circuit connecting material using the adhesive composition, method for connecting circuit member, and circuit connecting body
JP2010034197A (en) * 2008-07-28 2010-02-12 Fujitsu Ltd Buildup board
JP5585447B2 (en) * 2008-07-31 2014-09-10 日本電気株式会社 Semiconductor device and manufacturing method thereof
PL2408277T3 (en) * 2010-07-16 2016-08-31 Schurter Ag Fuse element
US8575755B1 (en) 2010-10-19 2013-11-05 Maxim Integrated Products, Inc. Semiconductor device having mode of operation defined by inner bump assembly connection
CN102064149A (en) * 2010-10-21 2011-05-18 日月光半导体制造股份有限公司 Semiconductor device with through guide hole, packaging structure thereof and manufacturing method of packaging structure
US8338294B2 (en) * 2011-03-31 2012-12-25 Soitec Methods of forming bonded semiconductor structures including two or more processed semiconductor structures carried by a common substrate, and semiconductor structures formed by such methods
US20120248621A1 (en) * 2011-03-31 2012-10-04 S.O.I.Tec Silicon On Insulator Technologies Methods of forming bonded semiconductor structures, and semiconductor structures formed by such methods
KR101397691B1 (en) * 2011-04-01 2014-05-22 제일모직주식회사 Composite sheet and substrate for display device usign the same
US8736056B2 (en) * 2012-07-31 2014-05-27 Taiwan Semiconductor Manufacturing Company, Ltd. Device for reducing contact resistance of a metal
JP6295206B2 (en) * 2012-12-11 2018-03-14 三井金属鉱業株式会社 Multilayer printed wiring board and manufacturing method thereof
JP6161380B2 (en) * 2013-04-17 2017-07-12 ルネサスエレクトロニクス株式会社 Manufacturing method of semiconductor device
CN104952839B (en) * 2014-03-28 2018-05-04 恒劲科技股份有限公司 Packaging system and preparation method thereof
US20170287838A1 (en) 2016-04-02 2017-10-05 Intel Corporation Electrical interconnect bridge
CN106099621A (en) * 2016-05-30 2016-11-09 铜陵东晟生态农业科技有限公司 The connection pre-treating method of terminal and wire harness
KR102009746B1 (en) 2018-01-09 2019-10-21 주식회사 신성이엔티 Manufacturing method of the winding coil for the transformer
KR102080865B1 (en) * 2018-02-12 2020-02-24 세메스 주식회사 Die bonding method
US10645808B2 (en) * 2018-02-22 2020-05-05 Apple Inc. Devices with radio-frequency printed circuits
US10381322B1 (en) 2018-04-23 2019-08-13 Sandisk Technologies Llc Three-dimensional memory device containing self-aligned interlocking bonded structure and method of making the same
CN109651987A (en) * 2018-12-17 2019-04-19 深圳市华星光电技术有限公司 A kind of anisotropy conductiving glue sticks agent and its conductive film
US10790241B2 (en) 2019-02-28 2020-09-29 Advanced Semiconductor Engineering, Inc. Wiring structure and method for manufacturing the same
US10879260B2 (en) 2019-02-28 2020-12-29 Sandisk Technologies Llc Bonded assembly of a support die and plural memory dies containing laterally shifted vertical interconnections and methods for making the same

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04332404A (en) * 1991-05-07 1992-11-19 Nec Corp Anisotropic conductive material and connection of integrated circuit element using it
US5282312A (en) * 1991-12-31 1994-02-01 Tessera, Inc. Multi-layer circuit construction methods with customization features
JPH0653684A (en) * 1992-07-29 1994-02-25 Hitachi Ltd Thin film multilayer wiring board and module using the same
US5350621A (en) * 1992-11-30 1994-09-27 Allied-Signal Inc. System of electronic laminates with improved registration properties
JP3320932B2 (en) 1993-12-13 2002-09-03 松下電器産業株式会社 Chip package mount, circuit board on which chip package is mounted, and method of forming circuit board
JP3210520B2 (en) * 1994-03-18 2001-09-17 富士通株式会社 Thin film multilayer substrate
US5571608A (en) * 1994-07-15 1996-11-05 Dell Usa, L.P. Apparatus and method of making laminate an embedded conductive layer
JPH08124965A (en) 1994-10-27 1996-05-17 Oki Electric Ind Co Ltd Method of connecting semiconductor chip to multilayer wiring board
JP3409957B2 (en) * 1996-03-06 2003-05-26 松下電器産業株式会社 Semiconductor unit and method of forming the same
US5789278A (en) * 1996-07-30 1998-08-04 Micron Technology, Inc. Method for fabricating chip modules
EP0831528A3 (en) * 1996-09-10 1999-12-22 Hitachi Chemical Company, Ltd. Multilayer wiring board for mounting semiconductor device and method of producing the same
US6121289A (en) * 1998-10-09 2000-09-19 Theramax, Inc. Method for enhanced brain delivery of nicotinic antagonist

Also Published As

Publication number Publication date
CN1110079C (en) 2003-05-28
US6184577B1 (en) 2001-02-06
EP0957513A4 (en) 2001-04-25
KR20000052888A (en) 2000-08-25
EP2194572A1 (en) 2010-06-09
KR100338264B1 (en) 2002-05-27
WO1998020542A1 (en) 1998-05-14
TW383435B (en) 2000-03-01
EP0957513A1 (en) 1999-11-17
HK1022781A1 (en) 2000-11-03
JP3073532B2 (en) 2000-08-07
CN1212657C (en) 2005-07-27
CN1441473A (en) 2003-09-10
CN1235699A (en) 1999-11-17

Similar Documents

Publication Publication Date Title
AU4793597A (en) Electronic parts device
AU8180594A (en) Electronic drawing device
AU1559095A (en) Mounting device
EP0896805A3 (en) Mounting device
AU3348897A (en) Electronic locking device
GB9624715D0 (en) Electronic device manufacture
AU4750897A (en) Mounting device
EP0896807A3 (en) Mounting device
EP0896806A3 (en) Mounting device
GB9606083D0 (en) Electronic device manufacture
AU4575597A (en) Manure-collection device
GB9617885D0 (en) Electronic device manufacture
GB9613065D0 (en) Electronic device manufacture
AU1802297A (en) Device
EP0817272A3 (en) Integrated circuit
AU3140997A (en) Photoelectrochemical-electrochromic device
AU1656397A (en) Finger-protective device
GB9610878D0 (en) Electronic device manufacture
EP1154465A2 (en) Device for encapsulating electronic components
AU1613897A (en) Electronic device enclosure
AU1221597A (en) Circuit selection device
AU2378697A (en) Product-transporting device
AU1902195A (en) Mounting device
AU8752298A (en) Vasoregulation device
AU3859297A (en) Positioning device