AU3401099A - Method and apparatus for identification of probable defects in a workpiece - Google Patents

Method and apparatus for identification of probable defects in a workpiece

Info

Publication number
AU3401099A
AU3401099A AU34010/99A AU3401099A AU3401099A AU 3401099 A AU3401099 A AU 3401099A AU 34010/99 A AU34010/99 A AU 34010/99A AU 3401099 A AU3401099 A AU 3401099A AU 3401099 A AU3401099 A AU 3401099A
Authority
AU
Australia
Prior art keywords
workpiece
identification
probable defects
probable
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU34010/99A
Inventor
Carl Flatman
Michael Mcguire
Steve C. Woods
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CAE Electronics Ltd
Original Assignee
CAE Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CAE Electronics Ltd filed Critical CAE Electronics Ltd
Publication of AU3401099A publication Critical patent/AU3401099A/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
AU34010/99A 1998-04-17 1999-04-16 Method and apparatus for identification of probable defects in a workpiece Abandoned AU3401099A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US6172698A 1998-04-17 1998-04-17
US09061726 1998-04-17
PCT/CA1999/000309 WO1999054717A2 (en) 1998-04-17 1999-04-16 Method and apparatus for identification of probable defects in a workpiece

Publications (1)

Publication Number Publication Date
AU3401099A true AU3401099A (en) 1999-11-08

Family

ID=22037723

Family Applications (1)

Application Number Title Priority Date Filing Date
AU34010/99A Abandoned AU3401099A (en) 1998-04-17 1999-04-16 Method and apparatus for identification of probable defects in a workpiece

Country Status (2)

Country Link
AU (1) AU3401099A (en)
WO (1) WO1999054717A2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6272437B1 (en) 1998-04-17 2001-08-07 Cae Inc. Method and apparatus for improved inspection and classification of attributes of a workpiece
ITMO20030156A1 (en) * 2003-05-26 2004-11-27 Paolo Benedetti METHOD FOR THE IDENTIFICATION OF FOREIGN BODIES WITHIN A FLOW OF MATERIAL, PARTICULARLY SUBSTANTIALLY HOMOGENEOUS MATERIAL OF A WOODY TYPE, AND RELATED EQUIPMENT.
US7065176B2 (en) * 2003-05-28 2006-06-20 General Electric Company Method and system to inspect a component
DE102005033533A1 (en) * 2005-07-14 2007-01-18 Carl Zeiss Industrielle Messtechnik Gmbh Method and device for examining a test object by means of invasive radiation
US8369481B2 (en) 2009-06-08 2013-02-05 Ishida Co., Ltd. X-ray inspection device
SE537956C2 (en) * 2011-10-13 2015-12-01 Stora Enso Oyj Building component, window frame and laminate with low density process
US11114324B2 (en) * 2019-04-10 2021-09-07 KLA Corp. Defect candidate generation for inspection
CN117705816B (en) * 2024-02-06 2024-04-26 西南交通大学 Unmanned aerial vehicle-based steel rail surface defect detection method, system, equipment and medium

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1462861A (en) * 1973-02-24 1977-01-26 Emi Ltd Radiography
CA1268547A (en) * 1986-03-31 1990-05-01 Ahmed Mostafa El-Sherbini Thresholding algorithm selection apparatus
CA1301371C (en) * 1988-08-23 1992-05-19 Jan Erik Aune Log scanner
US5319547A (en) * 1990-08-10 1994-06-07 Vivid Technologies, Inc. Device and method for inspection of baggage and other objects
US5309486A (en) * 1992-11-12 1994-05-03 Westinghouse Electric Corp. Non-contact flaw detection for cylindrical nuclear fuel pellets

Also Published As

Publication number Publication date
WO1999054717A2 (en) 1999-10-28
WO1999054717A3 (en) 2000-08-24

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase