AU2539299A - Apparatus for the investigation of surface chemistry - Google Patents
Apparatus for the investigation of surface chemistryInfo
- Publication number
- AU2539299A AU2539299A AU25392/99A AU2539299A AU2539299A AU 2539299 A AU2539299 A AU 2539299A AU 25392/99 A AU25392/99 A AU 25392/99A AU 2539299 A AU2539299 A AU 2539299A AU 2539299 A AU2539299 A AU 2539299A
- Authority
- AU
- Australia
- Prior art keywords
- investigation
- surface chemistry
- chemistry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/0006—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
- H05H1/0012—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature using electromagnetic or particle radiation, e.g. interferometry
- H05H1/005—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature using electromagnetic or particle radiation, e.g. interferometry by using X-rays or alpha rays
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Analytical Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Toxicology (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9803932.4A GB9803932D0 (en) | 1998-02-26 | 1998-02-26 | Apparatus for the investigation of surface chemistry |
GB9803932 | 1998-02-26 | ||
PCT/GB1999/000517 WO1999044399A1 (en) | 1998-02-26 | 1999-02-18 | Apparatus for the investigation of surface chemistry |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2539299A true AU2539299A (en) | 1999-09-15 |
Family
ID=10827547
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU25392/99A Abandoned AU2539299A (en) | 1998-02-26 | 1999-02-18 | Apparatus for the investigation of surface chemistry |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1059018A1 (en) |
JP (1) | JP2002509614A (en) |
AU (1) | AU2539299A (en) |
GB (1) | GB9803932D0 (en) |
WO (1) | WO1999044399A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2384303A (en) * | 2001-09-24 | 2003-07-23 | Pure Wafer Ltd | Detection of metals in semiconductor wafers |
US7186981B2 (en) * | 2003-07-29 | 2007-03-06 | Thermal Wave Imaging, Inc. | Method and apparatus for thermographic imaging using flash pulse truncation |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4445762A1 (en) * | 1994-12-21 | 1996-06-27 | Adolf Slaby Inst Forschungsges | Method and device for determining absolute plasma parameters |
US5989349A (en) * | 1997-06-24 | 1999-11-23 | Applied Materials, Inc. | Diagnostic pedestal assembly for a semiconductor wafer processing system |
-
1998
- 1998-02-26 GB GBGB9803932.4A patent/GB9803932D0/en not_active Ceased
-
1999
- 1999-02-18 AU AU25392/99A patent/AU2539299A/en not_active Abandoned
- 1999-02-18 JP JP54326999A patent/JP2002509614A/en active Pending
- 1999-02-18 EP EP99905096A patent/EP1059018A1/en not_active Withdrawn
- 1999-02-18 WO PCT/GB1999/000517 patent/WO1999044399A1/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
WO1999044399A1 (en) | 1999-09-02 |
GB9803932D0 (en) | 1998-04-22 |
JP2002509614A (en) | 2002-03-26 |
EP1059018A1 (en) | 2000-12-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |