AU2348499A - Deflection device - Google Patents

Deflection device

Info

Publication number
AU2348499A
AU2348499A AU23484/99A AU2348499A AU2348499A AU 2348499 A AU2348499 A AU 2348499A AU 23484/99 A AU23484/99 A AU 23484/99A AU 2348499 A AU2348499 A AU 2348499A AU 2348499 A AU2348499 A AU 2348499A
Authority
AU
Australia
Prior art keywords
deflection device
deflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU23484/99A
Inventor
James D. Kennedy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kinetic Probe LLC
Original Assignee
Kinetic Probe LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kinetic Probe LLC filed Critical Kinetic Probe LLC
Publication of AU2348499A publication Critical patent/AU2348499A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07392—Multiple probes manipulating each probe element or tip individually
AU23484/99A 1999-01-29 1999-01-29 Deflection device Abandoned AU2348499A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1999/001845 WO2000045182A1 (en) 1999-01-29 1999-01-29 Deflection device

Publications (1)

Publication Number Publication Date
AU2348499A true AU2348499A (en) 2000-08-18

Family

ID=22272066

Family Applications (1)

Application Number Title Priority Date Filing Date
AU23484/99A Abandoned AU2348499A (en) 1999-01-29 1999-01-29 Deflection device

Country Status (3)

Country Link
JP (1) JP2002535681A (en)
AU (1) AU2348499A (en)
WO (1) WO2000045182A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102456907B1 (en) * 2022-06-17 2022-10-20 주식회사 프로이천 Probe apparatus

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3622815A (en) * 1970-03-25 1971-11-23 Motorola Inc High reliability ceramic bender
JPH0658957A (en) * 1992-08-07 1994-03-04 Fujitsu Autom Ltd Probe head and probing method
US5475318A (en) * 1993-10-29 1995-12-12 Robert B. Marcus Microprobe
JP3838381B2 (en) * 1995-11-22 2006-10-25 株式会社アドバンテスト Probe card

Also Published As

Publication number Publication date
JP2002535681A (en) 2002-10-22
WO2000045182A1 (en) 2000-08-03

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase