AU2003223446A1 - Nanowire microscope probe tips - Google Patents

Nanowire microscope probe tips

Info

Publication number
AU2003223446A1
AU2003223446A1 AU2003223446A AU2003223446A AU2003223446A1 AU 2003223446 A1 AU2003223446 A1 AU 2003223446A1 AU 2003223446 A AU2003223446 A AU 2003223446A AU 2003223446 A AU2003223446 A AU 2003223446A AU 2003223446 A1 AU2003223446 A1 AU 2003223446A1
Authority
AU
Australia
Prior art keywords
nanowire
probe tips
microscope probe
microscope
tips
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003223446A
Other languages
English (en)
Inventor
Alan M. Cassell
Jie Han
Ramsey M. Stevens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Integrated Nanosystems Inc
Original Assignee
Integrated Nanosystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Nanosystems Inc filed Critical Integrated Nanosystems Inc
Publication of AU2003223446A1 publication Critical patent/AU2003223446A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/16—Probe manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G01Q70/12—Nanotube tips

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Micromachines (AREA)
AU2003223446A 2002-04-05 2003-04-02 Nanowire microscope probe tips Abandoned AU2003223446A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11782202A 2002-04-05 2002-04-05
US11/117,822 2002-04-05
PCT/US2003/010304 WO2003087709A1 (fr) 2002-04-05 2003-04-02 Pointes sondes de microscope a nanofils

Publications (1)

Publication Number Publication Date
AU2003223446A1 true AU2003223446A1 (en) 2003-10-27

Family

ID=29248210

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003223446A Abandoned AU2003223446A1 (en) 2002-04-05 2003-04-02 Nanowire microscope probe tips

Country Status (2)

Country Link
AU (1) AU2003223446A1 (fr)
WO (1) WO2003087709A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7494593B1 (en) 2004-06-28 2009-02-24 Hewlett-Packard Development Company, L.P. Method for forming a cantilever and tip
DE102005063127B3 (de) * 2005-12-30 2007-08-23 Universität Hamburg Mikro- und Nanospitzen sowie Verfahren zu deren Herstellung
US8484756B2 (en) 2011-01-19 2013-07-09 The United States of America, as represented by the Secretary of Commerce, The National Institute of Standards and Technology Tip-mounted nanowire light source instrumentation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69721986T2 (de) * 1997-08-27 2004-02-12 Imec Vzw Taststift-Konfiguration sowie Herstellungsverfahren und Verwendung von Taststiften
CN1251962C (zh) * 2000-07-18 2006-04-19 Lg电子株式会社 水平生长碳纳米管的方法和使用碳纳米管的场效应晶体管
US6755956B2 (en) * 2000-10-24 2004-06-29 Ut-Battelle, Llc Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires

Also Published As

Publication number Publication date
WO2003087709A1 (fr) 2003-10-23

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase