AU2003208560A1 - Esd-robust power switch and method of using same - Google Patents

Esd-robust power switch and method of using same

Info

Publication number
AU2003208560A1
AU2003208560A1 AU2003208560A AU2003208560A AU2003208560A1 AU 2003208560 A1 AU2003208560 A1 AU 2003208560A1 AU 2003208560 A AU2003208560 A AU 2003208560A AU 2003208560 A AU2003208560 A AU 2003208560A AU 2003208560 A1 AU2003208560 A1 AU 2003208560A1
Authority
AU
Australia
Prior art keywords
esd
same
power switch
robust power
robust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003208560A
Inventor
Jan Dikken
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of AU2003208560A1 publication Critical patent/AU2003208560A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/417Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
    • H01L29/41725Source or drain electrodes for field effect devices
    • H01L29/41758Source or drain electrodes for field effect devices for lateral devices with structured layout for source or drain region, i.e. the source or drain region having cellular, interdigitated or ring structure or being curved or angular
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0266Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Semiconductor Integrated Circuits (AREA)
AU2003208560A 2002-04-29 2003-03-20 Esd-robust power switch and method of using same Abandoned AU2003208560A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP02076695 2002-04-29
EP02076695.2 2002-04-29
PCT/IB2003/001091 WO2003094242A1 (en) 2002-04-29 2003-03-20 Esd-robust power switch and method of using same

Publications (1)

Publication Number Publication Date
AU2003208560A1 true AU2003208560A1 (en) 2003-11-17

Family

ID=29286175

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003208560A Abandoned AU2003208560A1 (en) 2002-04-29 2003-03-20 Esd-robust power switch and method of using same

Country Status (2)

Country Link
AU (1) AU2003208560A1 (en)
WO (1) WO2003094242A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6984853B2 (en) * 2004-02-26 2006-01-10 Agilent Technologies, Inc Integrated circuit with enhancement mode pseudomorphic high electron mobility transistors having on-chip electrostatic discharge protection
EP2400552A1 (en) * 2010-06-24 2011-12-28 Dialog Semiconductor GmbH Mos transistor structure with easy access to all nodes
TW201209997A (en) * 2010-08-16 2012-03-01 Fortune Semiconductor Corp Layout of power MOSFET
EP2937906A1 (en) 2014-04-24 2015-10-28 Nxp B.V. Semiconductor ESD device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3355817B2 (en) * 1994-10-20 2002-12-09 株式会社デンソー Semiconductor device
US6002156A (en) * 1997-09-16 1999-12-14 Winbond Electronics Corp. Distributed MOSFET structure with enclosed gate for improved transistor size/layout area ratio and uniform ESD triggering
US5955763A (en) * 1997-09-16 1999-09-21 Winbond Electronics Corp. Low noise, high current-drive MOSFET structure for uniform serpentine-shaped poly-gate turn-on during an ESD event
US6274896B1 (en) * 2000-01-14 2001-08-14 Lexmark International, Inc. Drive transistor with fold gate

Also Published As

Publication number Publication date
WO2003094242A1 (en) 2003-11-13

Similar Documents

Publication Publication Date Title
AU2003299635A1 (en) Series/shunt switch and method of operation
AU2003290986A1 (en) Power converter circuitry and method
AU2003232149A1 (en) A switch arrangement and method of making same
AU2001275105A1 (en) Power mosfet and method of making the same
AU2003275311A1 (en) Solid micro-perforators and methods of use
HK1095434A1 (en) Power switch structure and method
AU2003231201A1 (en) Improved power tong assembly and method
AU2003215121A1 (en) Dvd and method of using same
AU2003262770A1 (en) Tri-gate devices and methods of fabrication
EP1253595A3 (en) Power down voltage control method and apparatus
AU2003277597A1 (en) Cleaning composition and method of cleaning therewith
AU2003282558A1 (en) Nanopellets and method of making nanopellets
AU2003268369A1 (en) Performance monitor and method therefor
AU2001269878A1 (en) Power mosfet and method of making the same
AU2003262013A1 (en) Drive circuit and drive method
AU2002256424A1 (en) Improved power conversion apparatus and methods
AU2003276905A1 (en) A conductive composition and method of using the same
AU2003297924A1 (en) Electrode assembly and method of using the same
AU2003245487A1 (en) Cosmetic appliance and method of use
AU2003210760A1 (en) Energy converting c/c-composite and method of making the same
AU2003208548A1 (en) Esd-robust power switch and method of using same
AU2002246950A1 (en) Hydrocapsules and method of preparation
AU2003256956A1 (en) Optical switch arrangement and method
AU2003287802A1 (en) Palpometer and methods of use thereof
AU2003206090A1 (en) Receiver and method of operation thereof

Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase