AU2001283944A1 - Gas inlet mechanism for cvd-method and device - Google Patents

Gas inlet mechanism for cvd-method and device

Info

Publication number
AU2001283944A1
AU2001283944A1 AU2001283944A AU8394401A AU2001283944A1 AU 2001283944 A1 AU2001283944 A1 AU 2001283944A1 AU 2001283944 A AU2001283944 A AU 2001283944A AU 8394401 A AU8394401 A AU 8394401A AU 2001283944 A1 AU2001283944 A1 AU 2001283944A1
Authority
AU
Australia
Prior art keywords
cvd
gas inlet
inlet mechanism
gas
inlet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001283944A
Inventor
Martin Dauelsberg
Johannes Kappeler
Gerd Strauch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aixtron SE
Original Assignee
Aixtron SE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE10064941A external-priority patent/DE10064941A1/en
Application filed by Aixtron SE filed Critical Aixtron SE
Publication of AU2001283944A1 publication Critical patent/AU2001283944A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45574Nozzles for more than one gas
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45502Flow conditions in reaction chamber
    • C23C16/45508Radial flow
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45568Porous nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45576Coaxial inlets for each gas
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
AU2001283944A 2000-09-22 2001-07-14 Gas inlet mechanism for cvd-method and device Abandoned AU2001283944A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE10061671 2000-09-22
DE10061671 2000-09-22
DE10064941 2000-12-23
DE10064941A DE10064941A1 (en) 2000-09-22 2000-12-23 Gas inlet element
PCT/EP2001/008139 WO2002024985A1 (en) 2000-09-22 2001-07-14 Gas inlet mechanism for cvd-method and device

Publications (1)

Publication Number Publication Date
AU2001283944A1 true AU2001283944A1 (en) 2002-04-02

Family

ID=26007933

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001283944A Abandoned AU2001283944A1 (en) 2000-09-22 2001-07-14 Gas inlet mechanism for cvd-method and device

Country Status (5)

Country Link
US (1) US7294207B2 (en)
EP (1) EP1322801B1 (en)
AU (1) AU2001283944A1 (en)
TW (1) TW555900B (en)
WO (1) WO2002024985A1 (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10043601A1 (en) * 2000-09-01 2002-03-14 Aixtron Ag Device and method for depositing, in particular, crystalline layers on, in particular, crystalline substrates
AU2001283944A1 (en) * 2000-09-22 2002-04-02 Aixtron Ag Gas inlet mechanism for cvd-method and device
DE102004009130A1 (en) * 2004-02-25 2005-09-15 Aixtron Ag Inlet system for a MOCVD reactor
US7510624B2 (en) * 2004-12-17 2009-03-31 Applied Materials, Inc. Self-cooling gas delivery apparatus under high vacuum for high density plasma applications
US7722719B2 (en) * 2005-03-07 2010-05-25 Applied Materials, Inc. Gas baffle and distributor for semiconductor processing chamber
DE102005011384A1 (en) * 2005-03-11 2006-09-14 Centrotherm Elektrische Anlagen Gmbh & Co. Kg Gas-tight connection element with bayonet lock
DE102005045582B3 (en) * 2005-09-23 2007-03-29 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Apparatus and method for continuous vapor deposition under atmospheric pressure and their use
DE102005056320A1 (en) * 2005-11-25 2007-06-06 Aixtron Ag CVD reactor with a gas inlet member
US20070234956A1 (en) * 2006-04-05 2007-10-11 Dalton Jeremie J Method and apparatus for providing uniform gas delivery to a reactor
US7740706B2 (en) * 2006-11-28 2010-06-22 Applied Materials, Inc. Gas baffle and distributor for semiconductor processing chamber
US20080124944A1 (en) * 2006-11-28 2008-05-29 Applied Materials, Inc. Gas baffle and distributor for semiconductor processing chamber
US7758698B2 (en) * 2006-11-28 2010-07-20 Applied Materials, Inc. Dual top gas feed through distributor for high density plasma chamber
US20080121177A1 (en) * 2006-11-28 2008-05-29 Applied Materials, Inc. Dual top gas feed through distributor for high density plasma chamber
WO2009049020A2 (en) * 2007-10-11 2009-04-16 Valence Process Equipment, Inc. Chemical vapor deposition reactor
DE112008002689T5 (en) * 2007-11-20 2010-12-23 S.O.I.Tec Silicon On Insulator Technologies Transfer of high temperature wafers
JP5409413B2 (en) * 2010-01-26 2014-02-05 日本パイオニクス株式会社 III-nitride semiconductor vapor phase growth system
US8927302B2 (en) * 2010-12-20 2015-01-06 Samsung Electronics Co., Ltd. Chemical vapor deposition apparatus and method for manufacturing light-emitting devices using same
TWI473903B (en) 2013-02-23 2015-02-21 Hermes Epitek Corp Gas Injector and Cover Plate Assembly for Semiconductor Equipment
FR3010092B1 (en) * 2013-09-02 2017-05-26 Commissariat Energie Atomique METHOD AND DEVICE FOR TREATING THE FREE SURFACE OF A MATERIAL
US10407771B2 (en) * 2014-10-06 2019-09-10 Applied Materials, Inc. Atomic layer deposition chamber with thermal lid
US10403515B2 (en) * 2015-09-24 2019-09-03 Applied Materials, Inc. Loadlock integrated bevel etcher system
CN114164412B (en) * 2020-09-10 2024-03-08 鑫天虹(厦门)科技有限公司 Spray head structure of semiconductor atomic layer deposition device
CN112342529B (en) * 2020-09-24 2022-12-06 杭州盾源聚芯半导体科技有限公司 Injection pipe with connector
CN114105679B (en) * 2021-11-25 2023-05-16 西安鑫垚陶瓷复合材料有限公司 Chemical vapor infiltration diversion equipment and method for preparing ceramic composite pipe fitting by using same

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1056430A (en) * 1962-11-13 1967-01-25 Texas Instruments Inc Epitaxial process and apparatus for semiconductors
GB1282866A (en) * 1968-08-16 1972-07-26 Pilkington Brothers Ltd Improvements in or relating to the production of glass having desired surface characteristics
US3757733A (en) * 1971-10-27 1973-09-11 Texas Instruments Inc Radial flow reactor
USRE30244E (en) * 1976-01-22 1980-04-01 Bell Telephone Laboratories, Incorporated Radial flow reactor including glow discharge limitting shield
US4033287A (en) * 1976-01-22 1977-07-05 Bell Telephone Laboratories, Incorporated Radial flow reactor including glow discharge limiting shield
US4207137A (en) * 1979-04-13 1980-06-10 Bell Telephone Laboratories, Incorporated Method of controlling a plasma etching process by monitoring the impedance changes of the RF power
JPS6055478B2 (en) * 1982-10-19 1985-12-05 松下電器産業株式会社 Vapor phase growth method
US4590042A (en) * 1984-12-24 1986-05-20 Tegal Corporation Plasma reactor having slotted manifold
US4793975A (en) * 1985-05-20 1988-12-27 Tegal Corporation Plasma Reactor with removable insert
US4612077A (en) * 1985-07-29 1986-09-16 The Perkin-Elmer Corporation Electrode for plasma etching system
US4778559A (en) * 1986-10-15 1988-10-18 Advantage Production Technology Semiconductor substrate heater and reactor process and apparatus
FR2628984B1 (en) * 1988-03-22 1990-12-28 Labo Electronique Physique PLANETARY EPITAXY REACTOR
FR2628985B1 (en) * 1988-03-22 1990-12-28 Labo Electronique Physique EPITAXY REACTOR WITH WALL PROTECTION
US4993358A (en) * 1989-07-28 1991-02-19 Watkins-Johnson Company Chemical vapor deposition reactor and method of operation
DE4011933C2 (en) * 1990-04-12 1996-11-21 Balzers Hochvakuum Process for the reactive surface treatment of a workpiece and treatment chamber therefor
US5212116A (en) * 1990-06-18 1993-05-18 At&T Bell Laboratories Method for forming planarized films by preferential etching of the center of a wafer
US5275976A (en) * 1990-12-27 1994-01-04 Texas Instruments Incorporated Process chamber purge module for semiconductor processing equipment
US6039812A (en) * 1996-10-21 2000-03-21 Abb Research Ltd. Device for epitaxially growing objects and method for such a growth
US5954881A (en) * 1997-01-28 1999-09-21 Northrop Grumman Corporation Ceiling arrangement for an epitaxial growth reactor
JP3702068B2 (en) * 1997-04-09 2005-10-05 東京エレクトロン株式会社 Substrate processing equipment
WO1998045501A1 (en) * 1997-04-10 1998-10-15 Koninklijke Philips Electronics N.V. Method of manufacturing a semiconductor device and a device for applying such a method
US6537418B1 (en) * 1997-09-19 2003-03-25 Siemens Aktiengesellschaft Spatially uniform gas supply and pump configuration for large wafer diameters
US6056824A (en) * 1998-01-16 2000-05-02 Silicon Valley Group Thermal Systems Free floating shield and semiconductor processing system
US6352592B1 (en) * 1998-01-16 2002-03-05 Silicon Valley Group, Thermal Systems Llc Free floating shield and semiconductor processing system
US5849088A (en) * 1998-01-16 1998-12-15 Watkins-Johnson Company Free floating shield
US6015595A (en) * 1998-05-28 2000-01-18 Felts; John T. Multiple source deposition plasma apparatus
US6246030B1 (en) * 1998-07-22 2001-06-12 Tokyo Electron Limited Heat processing method and apparatus
DE19841777C1 (en) * 1998-09-12 2000-01-05 Fraunhofer Ges Forschung Apparatus for plasma-technological precipitation of polycrystalline diamond on substrates with large plane areas
TW455912B (en) * 1999-01-22 2001-09-21 Sony Corp Method and apparatus for film deposition
KR100328820B1 (en) * 1999-02-25 2002-03-14 박종섭 Gas injection apparatus of chemical vapor deposition device
US6592771B1 (en) * 1999-04-08 2003-07-15 Sony Corporation Vapor-phase processing method and apparatus therefor
ATE539179T1 (en) * 1999-05-21 2012-01-15 Aviza Tech Inc DEVICE FOR PROTECTIVE GAS SHIELDING
WO2001057289A1 (en) * 2000-02-04 2001-08-09 Aixtron Ag Device and method for depositing one or more layers onto a substrate
US6325855B1 (en) * 2000-08-09 2001-12-04 Itt Manufacturing Enterprises, Inc. Gas collector for epitaxial reactors
DE10043601A1 (en) * 2000-09-01 2002-03-14 Aixtron Ag Device and method for depositing, in particular, crystalline layers on, in particular, crystalline substrates
AU2001283944A1 (en) * 2000-09-22 2002-04-02 Aixtron Ag Gas inlet mechanism for cvd-method and device
DE10064944A1 (en) * 2000-09-22 2002-04-11 Aixtron Ag Process for depositing crystalline layers in particular, gas inlet element and device for carrying out the process
JP3864696B2 (en) * 2000-11-10 2007-01-10 株式会社デンソー Method and apparatus for producing silicon carbide single crystal
JP3959952B2 (en) * 2000-11-10 2007-08-15 株式会社デンソー Method and apparatus for producing silicon carbide single crystal
DE10133914A1 (en) * 2001-07-12 2003-01-23 Aixtron Ag Apparatus to deposit crystalline layers on semiconductor wafers comprises rotating wafer holders mounted on rotating mounting forming floor of process chamber whose roof contains central gas inlet
US6890386B2 (en) * 2001-07-13 2005-05-10 Aviza Technology, Inc. Modular injector and exhaust assembly
JP2003100717A (en) * 2001-09-21 2003-04-04 Tokyo Electron Ltd Plasma treatment apparatus
DE10153463A1 (en) * 2001-10-30 2003-05-15 Aixtron Ag Method and device for depositing, in particular, crystalline layers on, in particular, crystalline substrates
DE10247921A1 (en) * 2002-10-10 2004-04-22 Aixtron Ag Hydride vapor phase epitaxy reactor, to produce pseudo-substrates for electronic components, deposits layers of crystalline substrates from a gas phase with increased growth rates
JP3866655B2 (en) * 2002-12-26 2007-01-10 励起 渡辺 Processing apparatus and processing method

Also Published As

Publication number Publication date
EP1322801B1 (en) 2010-01-06
US7294207B2 (en) 2007-11-13
WO2002024985A1 (en) 2002-03-28
TW555900B (en) 2003-10-01
US20030177977A1 (en) 2003-09-25
EP1322801A1 (en) 2003-07-02

Similar Documents

Publication Publication Date Title
AU2001283944A1 (en) Gas inlet mechanism for cvd-method and device
AU2002216967A1 (en) Breathing mask and gas discharging device
AU2002214877A1 (en) Gas separation device
AU2001239828A1 (en) Gas recovery device
AU2001283307A1 (en) Hydrocarbon gas processing
AU2001261205A1 (en) Copolymers for photoresists and processes therefor
AU2001294417A1 (en) Operating device
AU2001233093A1 (en) Gas sensor
AU5525700A (en) Device for gas burners
AU5276301A (en) Gas flow neutralizing device and method
AU2002349746A1 (en) An exhaust gas filter device
AU2001274578A1 (en) Gas supply device and treating device
AU2001259027A1 (en) Gas sampling apparatus
AU2849201A (en) Device for the passage of air
AUPQ094399A0 (en) Gas flow measurement device
EP1164279A4 (en) Exhaust gas recirculating valve device
AU2001258025A1 (en) Safety cut-out device for gas pipelines
AU2002215837A1 (en) Supply component for gases and liquids
AU2001276790A1 (en) Complex air-purifying process and device
AU2002210303A1 (en) Exhaust gas treating device
AU2001226639A1 (en) Gas analyser
AU2001270700A1 (en) Exhaust volume and exhaust device comprising same
AU2002222208A1 (en) Flow limiting apparatus
GB0109036D0 (en) Microwave-acoustic gas analyzer
AU3710501A (en) Method and device for conditioning gas mixtures