AU2001273766A1 - Device and method for cleaning articles used in the production of semiconductor components - Google Patents

Device and method for cleaning articles used in the production of semiconductor components

Info

Publication number
AU2001273766A1
AU2001273766A1 AU2001273766A AU7376601A AU2001273766A1 AU 2001273766 A1 AU2001273766 A1 AU 2001273766A1 AU 2001273766 A AU2001273766 A AU 2001273766A AU 7376601 A AU7376601 A AU 7376601A AU 2001273766 A1 AU2001273766 A1 AU 2001273766A1
Authority
AU
Australia
Prior art keywords
production
semiconductor components
articles used
cleaning articles
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001273766A
Inventor
Jakob Blattner
Federici Rudy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Brooks PRI Automation Switzerland GmbH
Original Assignee
Tec Sem AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tec Sem AG filed Critical Tec Sem AG
Publication of AU2001273766A1 publication Critical patent/AU2001273766A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82Auxiliary processes, e.g. cleaning or inspecting
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70733Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • G03F7/70741Handling masks outside exposure position, e.g. reticle libraries

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Library & Information Science (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
AU2001273766A 2000-06-27 2001-06-26 Device and method for cleaning articles used in the production of semiconductor components Abandoned AU2001273766A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH12702000 2000-06-27
CH1270/00 2000-06-27
PCT/CH2001/000402 WO2002001292A1 (en) 2000-06-27 2001-06-26 Device and method for cleaning articles used in the production of semiconductor components

Publications (1)

Publication Number Publication Date
AU2001273766A1 true AU2001273766A1 (en) 2002-01-08

Family

ID=4565148

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001273766A Abandoned AU2001273766A1 (en) 2000-06-27 2001-06-26 Device and method for cleaning articles used in the production of semiconductor components

Country Status (6)

Country Link
US (1) US7047984B2 (en)
EP (1) EP1297384B1 (en)
KR (1) KR100814179B1 (en)
AU (1) AU2001273766A1 (en)
DE (1) DE50111378D1 (en)
WO (1) WO2002001292A1 (en)

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US6007318A (en) 1996-12-20 1999-12-28 Z Corporation Method and apparatus for prototyping a three-dimensional object
US7037382B2 (en) * 1996-12-20 2006-05-02 Z Corporation Three-dimensional printer
EP1509342B2 (en) * 2002-05-31 2009-10-28 TRT Oil-Off GmbH Dry cleaning system for workpieces
CH695872A5 (en) 2002-07-29 2006-09-29 Brooks Pri Automation Switzerl Reticle handling device.
CH696188A5 (en) * 2002-07-29 2007-02-15 Brooks Pri Automation Switzerl Detection and cleaning device in a handling apparatus for photomasks.
JP4062437B2 (en) * 2003-01-21 2008-03-19 シャープ株式会社 Substrate cleaning apparatus and substrate processing facility
JP2005034782A (en) * 2003-07-17 2005-02-10 Sony Corp Washing device and washing method
TWI258642B (en) * 2004-01-30 2006-07-21 Powerchip Semiconductor Corp Tool and process for removing particles from reticle
US7396418B2 (en) * 2004-04-29 2008-07-08 Powerchip Semiconductor Corp. Process for removing particles from reticle
JP2006007012A (en) * 2004-06-22 2006-01-12 Koganei Corp Charge removal/dedusting apparatus
US20080155852A1 (en) * 2006-12-29 2008-07-03 Olgado Donald J K Multiple substrate vapor drying systems and methods
EP2281921A1 (en) * 2009-07-30 2011-02-09 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Apparatus and method for atomic layer deposition.
TW201136674A (en) * 2010-04-21 2011-11-01 Hon Hai Prec Ind Co Ltd Dust elimination device
DE102011052325A1 (en) * 2011-08-01 2013-02-07 Roth & Rau Ag Cleaning module and cleaning method for substrates and / or substrate carrier
CA2987358A1 (en) 2011-09-21 2013-03-28 Bayer Healthcare Llc Continuous multi-fluid pump device, drive and actuating system, and method
JP5919786B2 (en) * 2011-12-12 2016-05-18 株式会社リコー Dry cleaning housing and dry cleaning device
TW201334880A (en) * 2012-02-29 2013-09-01 Hon Hai Prec Ind Co Ltd LED light bar cleansing system and apparatus with the cleansing system thereof
TW201436891A (en) * 2013-03-25 2014-10-01 Hon Hai Prec Ind Co Ltd Air plasma cleaner device
EP3242649A4 (en) 2015-01-09 2019-01-09 Bayer Healthcare LLC Multiple fluid delivery system with multi-use disposable set and features thereof
TWI674168B (en) * 2015-07-27 2019-10-11 美商應用材料股份有限公司 Lift pin actuator,substrate support assembly, and method for utilizing substrate support assembly
FR3039437B1 (en) * 2015-07-30 2021-12-24 Michelin & Cie PROCESS FOR DRY CLEANING OF ADDITIVE MANUFACTURING TRAYS
KR102120704B1 (en) * 2018-09-28 2020-06-10 무진전자 주식회사 Chemical fume removing apparatus using air curtain
JP7261000B2 (en) * 2018-12-03 2023-04-19 キヤノン株式会社 CONTAINER, PROCESSING APPARATUS, CONTENT REMOVAL METHOD, AND PRODUCT MANUFACTURING METHOD
US11520246B1 (en) * 2021-08-30 2022-12-06 Taiwan Semiconductor Manufacturing Company, Ltd. Highly efficient automatic particle cleaner method for EUV systems

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE875921C (en) * 1950-06-23 1953-05-07 Karl Echterbecker Nasal filters
JPH0750271B2 (en) * 1986-01-27 1995-05-31 富士通株式会社 LCD display rubbing method
JPH01241821A (en) * 1988-03-24 1989-09-26 Toshiba Corp Aligner
DE3820931C2 (en) * 1988-06-21 1994-05-26 Peter Kist Process for electrostatic surface discharge and dedusting of workpieces and device for carrying out the process
DE4237767A1 (en) 1992-11-09 1994-05-11 Siemens Ag Cleaning of particulate-contaminated surfaces e.g. of masks or wafers for semiconductor device mfr. - exploits pressure gradient set up over length of workpiece by flow of gas through ducts along its opposite faces
AU7682594A (en) * 1993-09-08 1995-03-27 Uvtech Systems, Inc. Surface processing
US5584938A (en) * 1993-12-10 1996-12-17 Texas Instruments Incorporated Electrostatic particle removal and characterization
JP3234091B2 (en) * 1994-03-10 2001-12-04 株式会社日立製作所 Surface treatment equipment
US5979475A (en) * 1994-04-28 1999-11-09 Hitachi, Ltd. Specimen holding method and fluid treatment method of specimen surface and systems therefor
US5967156A (en) * 1994-11-07 1999-10-19 Krytek Corporation Processing a surface
US6395102B1 (en) * 1997-08-25 2002-05-28 Texas Instruments Incorporated Method and apparatus for in-situ reticle cleaning at photolithography tool
KR100300030B1 (en) * 1997-12-30 2001-10-19 김영환 Reticle cleaning apparatus
US5916374A (en) * 1998-02-09 1999-06-29 International Business Machines Corporation Optimized in-line mask cleaning system
US6305097B1 (en) * 2000-06-29 2001-10-23 Texas Instruments Incorporated Apparatus for in-situ reticle cleaning at photolithography tool
US6543078B1 (en) * 2000-07-24 2003-04-08 Eastman Kodak Company Apparatus and method for cleaning object having generally irregular surface features
US6656017B2 (en) * 2001-04-24 2003-12-02 David P. Jackson Method and apparatus for creating an open cell micro-environment for treating a substrate with an impingement spray

Also Published As

Publication number Publication date
KR100814179B1 (en) 2008-03-14
WO2002001292A1 (en) 2002-01-03
KR20030019462A (en) 2003-03-06
US20030159712A1 (en) 2003-08-28
EP1297384B1 (en) 2006-11-02
US7047984B2 (en) 2006-05-23
EP1297384A1 (en) 2003-04-02
DE50111378D1 (en) 2006-12-14

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