AU2001246581A1 - Sensor arrangement and method in digital x-ray imaging - Google Patents

Sensor arrangement and method in digital x-ray imaging

Info

Publication number
AU2001246581A1
AU2001246581A1 AU2001246581A AU4658101A AU2001246581A1 AU 2001246581 A1 AU2001246581 A1 AU 2001246581A1 AU 2001246581 A AU2001246581 A AU 2001246581A AU 4658101 A AU4658101 A AU 4658101A AU 2001246581 A1 AU2001246581 A1 AU 2001246581A1
Authority
AU
Australia
Prior art keywords
digital
ray imaging
sensor arrangement
sensor
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001246581A
Inventor
Pekka Strommer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Planmed Oy
Original Assignee
Planmed Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Planmed Oy filed Critical Planmed Oy
Publication of AU2001246581A1 publication Critical patent/AU2001246581A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/768—Addressed sensors, e.g. MOS or CMOS sensors for time delay and integration [TDI]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/79—Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
AU2001246581A 2000-03-14 2001-03-14 Sensor arrangement and method in digital x-ray imaging Abandoned AU2001246581A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI20000592A FI111759B (en) 2000-03-14 2000-03-14 Arrangement with sensor and procedure for digital x-ray imaging
FI20000592 2000-03-14
PCT/FI2001/000246 WO2001069284A1 (en) 2000-03-14 2001-03-14 Sensor arrangement and method in digital x-ray imaging

Publications (1)

Publication Number Publication Date
AU2001246581A1 true AU2001246581A1 (en) 2001-09-24

Family

ID=8557927

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001246581A Abandoned AU2001246581A1 (en) 2000-03-14 2001-03-14 Sensor arrangement and method in digital x-ray imaging

Country Status (6)

Country Link
US (1) US6847040B2 (en)
EP (1) EP1266241A1 (en)
JP (1) JP4989005B2 (en)
AU (1) AU2001246581A1 (en)
FI (1) FI111759B (en)
WO (1) WO2001069284A1 (en)

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US20060033826A1 (en) * 2004-08-12 2006-02-16 Xinqiao Liu Imaging array having variable pixel size
FR2877733B1 (en) * 2004-11-05 2007-01-12 Commissariat Energie Atomique CIRCUIT FOR DETECTING PARTICLES WITH ELEMENTARY CIRCUITS CONSTITUTING SUB-PIXELS
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US7573040B2 (en) * 2007-03-23 2009-08-11 General Electric Company Energy discriminating detector different materials direct conversion layers
US7512210B2 (en) * 2007-03-27 2009-03-31 General Electric Company Hybrid energy discriminating charge integrating CT detector
DE102007022519A1 (en) * 2007-05-14 2008-11-20 Siemens Ag Method for determination of individual quantum absorption events with radiation converter, involves transforming analog-to-digital electrical signals continuously with given number of bits
CN101569530B (en) * 2008-04-30 2013-03-27 Ge医疗***环球技术有限公司 X-ray detector and x-ray ct equipment
US8054937B2 (en) * 2008-08-11 2011-11-08 Rapiscan Systems, Inc. Systems and methods for using an intensity-modulated X-ray source
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US8098795B2 (en) * 2008-09-29 2012-01-17 Friedrich-Alexander-Universität Erlangen-Nürnberg Device and method for time-delayed integration on an X-ray detector composed of a plurality of detector modules
DE102009014763B4 (en) * 2009-03-25 2018-09-20 Siemens Healthcare Gmbh Method and data processing system for determining the calcium content in coronary vessels
FI122647B (en) 2009-06-09 2012-05-15 Planmeca Oy Digital x-ray sensor arrangement and digital x-ray imaging method
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US9679401B2 (en) * 2010-03-30 2017-06-13 Hewlett Packard Enterprise Development Lp Generalized scatter plots
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FR2971621B1 (en) * 2011-02-10 2013-02-08 E2V Semiconductors LINEAR IMAGE SENSOR WITH TWO LINES AND SHARED PIXELS
US9310495B2 (en) * 2011-05-04 2016-04-12 Oy Ajat Ltd. Photon/energy identifying X-ray and gamma ray imaging device (“PID”) with a two dimensional array of pixels and system therefrom
US9224573B2 (en) 2011-06-09 2015-12-29 Rapiscan Systems, Inc. System and method for X-ray source weight reduction
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DE102011081548A1 (en) * 2011-08-25 2013-02-28 Siemens Aktiengesellschaft Method for obtaining X-ray image of patient for e.g. cardiology application, involves determining absorption depth of incident X-ray quantum in X-ray converter based on drift length of charge carriers generated in X-ray detector
CN103035547B (en) * 2011-09-29 2015-04-01 中芯国际集成电路制造(北京)有限公司 Device and method for detecting mark and semiconductor device processing system
US9274065B2 (en) 2012-02-08 2016-03-01 Rapiscan Systems, Inc. High-speed security inspection system
US8729485B2 (en) 2012-02-17 2014-05-20 Luxen Technologies, Inc. Parallel mode readout integrated circuit for X-ray image sensor
US9128195B2 (en) 2012-03-28 2015-09-08 Luxen Technologies, Inc. Increasing dynamic range for x-ray image sensor
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US10375300B2 (en) 2014-04-28 2019-08-06 Lynx System Developers, Inc. Methods for processing event timing data
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Also Published As

Publication number Publication date
JP4989005B2 (en) 2012-08-01
FI20000592A (en) 2001-09-15
FI111759B (en) 2003-09-15
JP2003527610A (en) 2003-09-16
US6847040B2 (en) 2005-01-25
FI20000592A0 (en) 2000-03-14
EP1266241A1 (en) 2002-12-18
WO2001069284A1 (en) 2001-09-20
US20030035510A1 (en) 2003-02-20

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