AU2001242020A1 - Imaging system - Google Patents

Imaging system

Info

Publication number
AU2001242020A1
AU2001242020A1 AU2001242020A AU4202001A AU2001242020A1 AU 2001242020 A1 AU2001242020 A1 AU 2001242020A1 AU 2001242020 A AU2001242020 A AU 2001242020A AU 4202001 A AU4202001 A AU 4202001A AU 2001242020 A1 AU2001242020 A1 AU 2001242020A1
Authority
AU
Australia
Prior art keywords
imaging system
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001242020A
Inventor
Kuo-Ching Liu
Shawn Reven
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Acuity CiMatrix Inc
Original Assignee
Robotic Vision Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robotic Vision Systems Inc filed Critical Robotic Vision Systems Inc
Publication of AU2001242020A1 publication Critical patent/AU2001242020A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6447—Fluorescence; Phosphorescence by visual observation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
AU2001242020A 2000-03-10 2001-03-07 Imaging system Abandoned AU2001242020A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09522540 2000-03-10
US09/522,540 US6407810B1 (en) 2000-03-10 2000-03-10 Imaging system
PCT/US2001/007331 WO2001069206A1 (en) 2000-03-10 2001-03-07 Imaging system

Publications (1)

Publication Number Publication Date
AU2001242020A1 true AU2001242020A1 (en) 2001-09-24

Family

ID=24081256

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001242020A Abandoned AU2001242020A1 (en) 2000-03-10 2001-03-07 Imaging system

Country Status (6)

Country Link
US (1) US6407810B1 (en)
EP (1) EP1266203A1 (en)
KR (1) KR100876471B1 (en)
AU (1) AU2001242020A1 (en)
CA (1) CA2402632A1 (en)
WO (1) WO2001069206A1 (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7088860B2 (en) * 2001-03-28 2006-08-08 Canon Kabushiki Kaisha Dynamically reconfigurable signal processing circuit, pattern recognition apparatus, and image processing apparatus
JP4188111B2 (en) * 2003-03-13 2008-11-26 日立オムロンターミナルソリューションズ株式会社 Paper sheet authenticity discrimination device
US9536124B1 (en) 2003-10-24 2017-01-03 Cognex Corporation Integrated illumination assembly for symbology reader
US9070031B2 (en) 2003-10-24 2015-06-30 Cognex Technology And Investment Llc Integrated illumination assembly for symbology reader
US7874487B2 (en) 2005-10-24 2011-01-25 Cognex Technology And Investment Corporation Integrated illumination assembly for symbology reader
US7823783B2 (en) 2003-10-24 2010-11-02 Cognex Technology And Investment Corporation Light pipe illumination system and method
US7823789B2 (en) 2004-12-21 2010-11-02 Cognex Technology And Investment Corporation Low profile illumination for direct part mark readers
US7604174B2 (en) 2003-10-24 2009-10-20 Cognex Technology And Investment Corporation Method and apparatus for providing omnidirectional lighting in a scanning device
US7617984B2 (en) 2004-12-16 2009-11-17 Cognex Technology And Investment Corporation Hand held symbology reader illumination diffuser
US9292724B1 (en) 2004-12-16 2016-03-22 Cognex Corporation Hand held symbology reader illumination diffuser with aimer optics
US7310147B2 (en) 2005-01-27 2007-12-18 Genetix Limited Robotic apparatus for picking of cells and other applications with integrated spectroscopic capability
US20060166305A1 (en) * 2005-01-27 2006-07-27 Genetix Limited Animal cell confluence detection method and apparatus
WO2008124397A1 (en) 2007-04-03 2008-10-16 David Fishbaine Inspection system and method
WO2009097193A1 (en) * 2008-01-28 2009-08-06 Innovative Imaging, Inc. Table gauge
US20100226114A1 (en) * 2009-03-03 2010-09-09 David Fishbaine Illumination and imaging system
JP2014503843A (en) * 2010-12-06 2014-02-13 エーエスエムエル ネザーランズ ビー．ブイ． Article inspection method and inspection apparatus, EUV lithography reticle, lithographic apparatus, and device manufacturing method
CN102488564B (en) * 2011-12-15 2013-12-18 杭州电子科技大学 Dental plaque detector capable of imaging by aid of fluorescent area arrays
DE102019204843A1 (en) * 2018-04-06 2019-10-10 Virtek Vision International Ulc Detecting fluorescence from foreign material
US11345014B2 (en) 2019-02-15 2022-05-31 Virtek Vision International Inc Method of detecting proper orientation of material applique
TWI794686B (en) 2019-11-26 2023-03-01 美商美國寶石學院公司 Fluorescence imaging of gemstone on transparent stage

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61290311A (en) * 1985-06-19 1986-12-20 Hitachi Ltd Apparatus and method for inspecting soldered zone
US5131755A (en) * 1988-02-19 1992-07-21 Chadwick Curt H Automatic high speed optical inspection system
US5278012A (en) * 1989-03-29 1994-01-11 Hitachi, Ltd. Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate
WO1996039619A1 (en) * 1995-06-06 1996-12-12 Kla Instruments Corporation Optical inspection of a specimen using multi-channel responses from the specimen
US6014209A (en) * 1997-06-23 2000-01-11 Beltronics, Inc. Method of optically inspecting multi-layered electronic parts and the like with fluorescent scattering top layer discrimination and apparatus therefor
US6091488A (en) * 1999-03-22 2000-07-18 Beltronics, Inc. Method of and apparatus for automatic high-speed optical inspection of semi-conductor structures and the like through fluorescent photoresist inspection

Also Published As

Publication number Publication date
EP1266203A1 (en) 2002-12-18
KR20030015207A (en) 2003-02-20
US6407810B1 (en) 2002-06-18
CA2402632A1 (en) 2001-09-20
KR100876471B1 (en) 2008-12-31
WO2001069206A1 (en) 2001-09-20

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