AU2001239949A1 - Vertical counter balanced test head manipulator - Google Patents
Vertical counter balanced test head manipulatorInfo
- Publication number
- AU2001239949A1 AU2001239949A1 AU2001239949A AU3994901A AU2001239949A1 AU 2001239949 A1 AU2001239949 A1 AU 2001239949A1 AU 2001239949 A AU2001239949 A AU 2001239949A AU 3994901 A AU3994901 A AU 3994901A AU 2001239949 A1 AU2001239949 A1 AU 2001239949A1
- Authority
- AU
- Australia
- Prior art keywords
- test head
- vertical support
- main arm
- vertical counter
- counter balanced
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56016—Apparatus features
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Manipulator (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Transmission Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Vehicle Body Suspensions (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Supporting Of Heads In Record-Carrier Devices (AREA)
- Details Or Accessories Of Spraying Plant Or Apparatus (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counterblancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18619600P | 2000-03-01 | 2000-03-01 | |
US60/186,196 | 2000-03-01 | ||
PCT/US2001/006456 WO2001064389A2 (en) | 2000-03-01 | 2001-03-01 | Vertical counter balanced test head manipulator |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001239949A1 true AU2001239949A1 (en) | 2001-09-12 |
Family
ID=22684009
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001239949A Abandoned AU2001239949A1 (en) | 2000-03-01 | 2001-03-01 | Vertical counter balanced test head manipulator |
Country Status (11)
Country | Link |
---|---|
US (1) | US7554321B2 (en) |
EP (2) | EP1259829B1 (en) |
JP (1) | JP2003525433A (en) |
KR (1) | KR20020082862A (en) |
CN (1) | CN100495040C (en) |
AT (1) | ATE317128T1 (en) |
AU (1) | AU2001239949A1 (en) |
DE (2) | DE60117003T2 (en) |
MY (2) | MY144519A (en) |
TW (1) | TWI222911B (en) |
WO (1) | WO2001064389A2 (en) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MY147595A (en) * | 2000-09-22 | 2012-12-31 | Intest Corp | Apparatus and method for balancing and for providing a compliant range to a test head |
WO2004031782A1 (en) * | 2002-10-02 | 2004-04-15 | Intest Ip Corp. | Test head positioning apparatus |
US7235964B2 (en) * | 2003-03-31 | 2007-06-26 | Intest Corporation | Test head positioning system and method |
MY146692A (en) * | 2003-08-06 | 2012-09-14 | Intest Corp | Test head positioning system |
CN100429757C (en) * | 2004-03-25 | 2008-10-29 | 东京毅力科创株式会社 | Turning device for heavy object |
JP4793809B2 (en) * | 2004-09-02 | 2011-10-12 | 東京エレクトロン株式会社 | Heavy object turning mechanism |
US8607935B2 (en) | 2005-12-20 | 2013-12-17 | Intuitive Surgical Operations, Inc. | Guide systems for laminated spring assemblies |
TWI490513B (en) * | 2006-12-29 | 2015-07-01 | Intest Corp | Load positioning system for translating load along axis of translation and method of balancing load |
US8350584B2 (en) * | 2006-12-29 | 2013-01-08 | Intest Corporation | Test head positioning system and method |
CN101720269B (en) * | 2007-02-23 | 2014-04-16 | 英泰斯特股份有限公司 | Test head manipulator |
US7750657B2 (en) * | 2007-03-15 | 2010-07-06 | Applied Materials Inc. | Polishing head testing with movable pedestal |
JP5221118B2 (en) * | 2007-12-14 | 2013-06-26 | 東京エレクトロン株式会社 | Inspection device |
CN101846589B (en) * | 2009-03-24 | 2013-06-05 | 京元电子股份有限公司 | Turnover testing module and testing system thereof |
US8981807B2 (en) * | 2010-07-27 | 2015-03-17 | Intest Corporation | Positioner system and method of positioning |
WO2013009817A1 (en) | 2011-07-12 | 2013-01-17 | Intest Corporation | Method and apparatus for docking a test head with a peripheral |
US8935952B2 (en) * | 2012-06-27 | 2015-01-20 | International Business Machines Corporation | Dynamic rack cabinet stability testing |
CN102735387B (en) * | 2012-07-16 | 2014-08-06 | 台州市计量技术研究院 | Static torque precise testing device and torque testing method using same |
CN103629913B (en) * | 2012-08-16 | 2015-04-08 | 上海华虹宏力半导体制造有限公司 | Vertical gravity center adjusting devices of revolution type rotary drier |
JP5953215B2 (en) * | 2012-12-07 | 2016-07-20 | 三鷹光器株式会社 | Automatic balancing structure of medical balancing stand |
EP3461754B1 (en) | 2013-02-13 | 2020-04-29 | Lantech.Com LLC | Packaging material profiling for containment force-based wrapping |
CA3202736A1 (en) | 2014-01-14 | 2015-07-23 | Lantech.Com, Llc | Dynamic adjustment of wrap force parameter responsive to monitored wrap force and/or for film break reduction |
AU2015330915B2 (en) | 2014-10-07 | 2018-11-08 | Lantech.Com, Llc | Load stability-based wrapping |
EP3280646B1 (en) | 2015-04-10 | 2021-06-02 | Lantech.com, LLC | Stretch wrapping machine supporting top layer containment operations |
WO2017053608A1 (en) * | 2015-09-25 | 2017-03-30 | Lantech.Com, Llc | Stretch wrapping machine with automated determination of load stability by subjecting a load to a disturbance |
KR102221204B1 (en) * | 2016-10-10 | 2021-03-03 | 레이드-애쉬맨 매뉴팩추어링 인코포레이티드 | Manipulator |
TWI658271B (en) * | 2017-08-25 | 2019-05-01 | 鴻勁精密股份有限公司 | Electronic component crimping unit and test equipment for its application |
AU2018338049B2 (en) | 2017-09-22 | 2021-12-23 | Lantech.Com, Llc | Load wrapping apparatus wrap profiles with controlled wrap cycle interruptions |
CN110303487B (en) * | 2018-05-17 | 2023-06-20 | 青岛理工大学 | Manipulator device for carrying pipes |
CN109856554A (en) * | 2019-04-22 | 2019-06-07 | 星云智能装备(昆山)有限公司 | It is a kind of automatically to slotting mechanism and battery pack test device |
CN110251197A (en) * | 2019-07-05 | 2019-09-20 | 四川大学 | A kind of backbone drilling operation auxiliary device |
AU2020346736B2 (en) | 2019-09-09 | 2024-02-22 | Lantech.Com, Llc | Stretch wrapping machine with dispense rate control based on sensed rate of dispensed packaging material and predicted load geometry |
AU2020350496B2 (en) | 2019-09-19 | 2024-01-25 | Lantech.Com, Llc | Packaging material grading and/or factory profiles |
CN114325325B (en) * | 2021-12-29 | 2023-12-01 | 日月新半导体(昆山)有限公司 | Apparatus for testing integrated circuit products |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1639608A (en) * | 1926-03-24 | 1927-08-16 | Hofland Christian | Hitch for draft animals |
CH516806A (en) * | 1970-06-09 | 1971-12-15 | Bbc Brown Boveri & Cie | Electro-optical device for rotating the plane of polarization of a linearly polarized light wave |
US3994476A (en) * | 1975-03-20 | 1976-11-30 | Gennep Jan Van | Automatic braking arrangement for a windlass |
US4527942A (en) * | 1982-08-25 | 1985-07-09 | Intest Corporation | Electronic test head positioner for test systems |
US4705447A (en) * | 1983-08-11 | 1987-11-10 | Intest Corporation | Electronic test head positioner for test systems |
US5149029A (en) * | 1982-08-25 | 1992-09-22 | Intest Corporation | Electronic test head positioner for test systems |
US4973015A (en) * | 1987-09-17 | 1990-11-27 | Schlumberger Technologies, Inc. | Manipulator apparatus for test head support and orientation |
US4893074A (en) | 1988-05-13 | 1990-01-09 | Intest Corporation | Electronic device testing system |
US5059089A (en) * | 1988-10-17 | 1991-10-22 | Kocaoglan Harutyun A | Infinitely adjustable travel lead screw and multi-cylinder driven movement unit |
US5030869A (en) | 1990-07-25 | 1991-07-09 | Intest Corporation | Device testing system with cable pivot |
US5241870A (en) * | 1991-07-22 | 1993-09-07 | Intest Corporation | Test head manipulator |
US5352946A (en) * | 1993-02-04 | 1994-10-04 | Megamation Incorporated | Linear motor suspension system |
US5600258A (en) * | 1993-09-15 | 1997-02-04 | Intest Corporation | Method and apparatus for automated docking of a test head to a device handler |
US5506512A (en) * | 1993-11-25 | 1996-04-09 | Tokyo Electron Limited | Transfer apparatus having an elevator and prober using the same |
KR960019641A (en) * | 1994-11-24 | 1996-06-17 | 오우라 히로시 | Semiconductor test equipment equipped with a test head connection device |
JP3869465B2 (en) | 1995-02-23 | 2007-01-17 | テラダイン・インコーポレーテッド | Manipulator for test head of automatic test equipment |
US5603677A (en) * | 1995-03-28 | 1997-02-18 | Sollo; Robert E. | Weight assisted rehabilitation system |
US5608334A (en) | 1995-04-20 | 1997-03-04 | Intest Corporation | Device testing system with cable pivot and method of installation |
JPH08324913A (en) * | 1995-06-06 | 1996-12-10 | Hitachi Ltd | Elevator device |
US5606262A (en) * | 1995-06-07 | 1997-02-25 | Teradyne, Inc. | Manipulator for automatic test equipment test head |
JP3266509B2 (en) * | 1996-05-09 | 2002-03-18 | 東京エレクトロン株式会社 | Heavy object turning device and inspection device |
US6023173A (en) * | 1997-04-30 | 2000-02-08 | Credence Systems Corporation | Manipulator with expanded range of motion |
US5949002A (en) | 1997-11-12 | 1999-09-07 | Teradyne, Inc. | Manipulator for automatic test equipment with active compliance |
US6271658B1 (en) * | 1998-10-19 | 2001-08-07 | St Assembly Test Services Pte, Ltd. | Universal Docking System |
US6009670A (en) * | 1999-02-01 | 2000-01-04 | Howard; Glenn | Gate operator for vertical gate movement |
US6837125B1 (en) * | 1999-07-14 | 2005-01-04 | Teradyne, Inc. | Automatic test manipulator with support internal to test head |
US6396257B1 (en) * | 2000-04-26 | 2002-05-28 | Credence Systems Corporation | Test head manipulator for semiconductor tester with manual assist for vertical test head movement |
US6640610B2 (en) * | 2001-03-30 | 2003-11-04 | Analog Devices, Inc. | Automatic integrated mechanical and electrical angular motion detector test system |
-
2001
- 2001-02-28 MY MYPI20071058A patent/MY144519A/en unknown
- 2001-02-28 MY MYPI20010914A patent/MY138984A/en unknown
- 2001-03-01 TW TW090104703A patent/TWI222911B/en not_active IP Right Cessation
- 2001-03-01 DE DE60117003T patent/DE60117003T2/en not_active Expired - Lifetime
- 2001-03-01 CN CNB018059481A patent/CN100495040C/en not_active Expired - Fee Related
- 2001-03-01 DE DE60144498T patent/DE60144498D1/en not_active Expired - Lifetime
- 2001-03-01 AT AT01914580T patent/ATE317128T1/en not_active IP Right Cessation
- 2001-03-01 US US10/204,069 patent/US7554321B2/en not_active Expired - Fee Related
- 2001-03-01 AU AU2001239949A patent/AU2001239949A1/en not_active Abandoned
- 2001-03-01 KR KR1020027011523A patent/KR20020082862A/en active IP Right Grant
- 2001-03-01 EP EP01914580A patent/EP1259829B1/en not_active Expired - Lifetime
- 2001-03-01 EP EP06001973A patent/EP1650573B1/en not_active Expired - Lifetime
- 2001-03-01 JP JP2001563272A patent/JP2003525433A/en active Pending
- 2001-03-01 WO PCT/US2001/006456 patent/WO2001064389A2/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
ATE317128T1 (en) | 2006-02-15 |
EP1650573B1 (en) | 2011-04-20 |
CN100495040C (en) | 2009-06-03 |
TWI222911B (en) | 2004-11-01 |
EP1259829A2 (en) | 2002-11-27 |
CN1408065A (en) | 2003-04-02 |
DE60117003D1 (en) | 2006-04-13 |
KR20020082862A (en) | 2002-10-31 |
US7554321B2 (en) | 2009-06-30 |
EP1650573A2 (en) | 2006-04-26 |
US20040051517A1 (en) | 2004-03-18 |
WO2001064389A3 (en) | 2002-09-06 |
EP1259829B1 (en) | 2006-02-01 |
WO2001064389A2 (en) | 2001-09-07 |
DE60144498D1 (en) | 2011-06-01 |
DE60117003T2 (en) | 2006-11-30 |
JP2003525433A (en) | 2003-08-26 |
MY138984A (en) | 2009-08-28 |
EP1650573A3 (en) | 2006-07-19 |
MY144519A (en) | 2011-09-30 |
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