AU2001234994A1 - Method and system for automatically generating reference height data for use in a three-dimensional inspection system - Google Patents

Method and system for automatically generating reference height data for use in a three-dimensional inspection system

Info

Publication number
AU2001234994A1
AU2001234994A1 AU2001234994A AU3499401A AU2001234994A1 AU 2001234994 A1 AU2001234994 A1 AU 2001234994A1 AU 2001234994 A AU2001234994 A AU 2001234994A AU 3499401 A AU3499401 A AU 3499401A AU 2001234994 A1 AU2001234994 A1 AU 2001234994A1
Authority
AU
Australia
Prior art keywords
automatically generating
height data
reference height
generating reference
dimensional inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001234994A
Inventor
Robert W. Kelley
Donald K. Rohrer
Donald J. Svetkoff
John J. Weisgerber
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GSI Lumonics Inc Canada
Original Assignee
GSI Lumonics Inc Canada
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GSI Lumonics Inc Canada filed Critical GSI Lumonics Inc Canada
Publication of AU2001234994A1 publication Critical patent/AU2001234994A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU2001234994A 2000-02-17 2001-02-08 Method and system for automatically generating reference height data for use in a three-dimensional inspection system Abandoned AU2001234994A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/506,144 US6496270B1 (en) 2000-02-17 2000-02-17 Method and system for automatically generating reference height data for use in a three-dimensional inspection system
US09506144 2000-02-17
PCT/US2001/004398 WO2001061275A1 (en) 2000-02-17 2001-02-08 Method and system for automatically generating reference height data for use in a three-dimensional inspection system

Publications (1)

Publication Number Publication Date
AU2001234994A1 true AU2001234994A1 (en) 2001-08-27

Family

ID=24013372

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001234994A Abandoned AU2001234994A1 (en) 2000-02-17 2001-02-08 Method and system for automatically generating reference height data for use in a three-dimensional inspection system

Country Status (3)

Country Link
US (1) US6496270B1 (en)
AU (1) AU2001234994A1 (en)
WO (1) WO2001061275A1 (en)

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US7545512B2 (en) 2006-01-26 2009-06-09 Koh Young Technology Inc. Method for automated measurement of three-dimensional shape of circuit boards
US20080082949A1 (en) * 2006-10-01 2008-04-03 Dell Products L.P. Method, Apparatus and Media for Updating CAD Data with Printed Circuit Board Stencil Data
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CN101803049B (en) * 2007-09-20 2012-02-08 皇家飞利浦电子股份有限公司 Led package, lamp using LED package and method for manufacturing the led package
FI121151B (en) * 2007-11-22 2010-07-30 Valtion Teknillinen Method and apparatus for determining the topography and optical properties of a moving surface
US9013711B2 (en) * 2008-04-01 2015-04-21 Perceptron, Inc. Contour sensor incorporating MEMS mirrors
US20100226114A1 (en) * 2009-03-03 2010-09-09 David Fishbaine Illumination and imaging system
JP5772062B2 (en) 2011-02-25 2015-09-02 オムロン株式会社 Three-dimensional shape measuring apparatus and three-dimensional shape measuring method
CN103561905A (en) * 2011-06-08 2014-02-05 村田机械株式会社 Workpiece-processing system
US9513230B2 (en) 2012-12-14 2016-12-06 Kla-Tencor Corporation Apparatus and method for optical inspection, magnetic field and height mapping
FR3004571B1 (en) * 2013-04-11 2015-04-10 Vit METHOD OF CORRECTING A THREE-DIMENSIONAL IMAGE OF AN ELECTRONIC CIRCUIT
US10201120B2 (en) * 2013-10-17 2019-02-05 Yamaha Hatsudoki Kabushiki Kaisha Component mounting apparatus
CN104765822B (en) * 2015-04-08 2018-09-25 上海望友信息科技有限公司 Electronic device three-dimensional database system and its application
TWI582629B (en) * 2016-08-19 2017-05-11 和碩聯合科技股份有限公司 Interference detection method and detecting device using the same
CN114353676B (en) * 2021-12-07 2024-03-19 江苏华创微***有限公司 Automatic measurement device for height of mounted chip and test method thereof
CN115854892B (en) * 2022-12-05 2024-02-02 上海赫立智能机器有限公司 Zero plane correction method for PCB detection

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Also Published As

Publication number Publication date
WO2001061275A1 (en) 2001-08-23
US6496270B1 (en) 2002-12-17

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