AU2001234994A1 - Method and system for automatically generating reference height data for use in a three-dimensional inspection system - Google Patents
Method and system for automatically generating reference height data for use in a three-dimensional inspection systemInfo
- Publication number
- AU2001234994A1 AU2001234994A1 AU2001234994A AU3499401A AU2001234994A1 AU 2001234994 A1 AU2001234994 A1 AU 2001234994A1 AU 2001234994 A AU2001234994 A AU 2001234994A AU 3499401 A AU3499401 A AU 3499401A AU 2001234994 A1 AU2001234994 A1 AU 2001234994A1
- Authority
- AU
- Australia
- Prior art keywords
- automatically generating
- height data
- reference height
- generating reference
- dimensional inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/506,144 US6496270B1 (en) | 2000-02-17 | 2000-02-17 | Method and system for automatically generating reference height data for use in a three-dimensional inspection system |
US09506144 | 2000-02-17 | ||
PCT/US2001/004398 WO2001061275A1 (en) | 2000-02-17 | 2001-02-08 | Method and system for automatically generating reference height data for use in a three-dimensional inspection system |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001234994A1 true AU2001234994A1 (en) | 2001-08-27 |
Family
ID=24013372
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001234994A Abandoned AU2001234994A1 (en) | 2000-02-17 | 2001-02-08 | Method and system for automatically generating reference height data for use in a three-dimensional inspection system |
Country Status (3)
Country | Link |
---|---|
US (1) | US6496270B1 (en) |
AU (1) | AU2001234994A1 (en) |
WO (1) | WO2001061275A1 (en) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL133696A (en) * | 1999-12-23 | 2006-04-10 | Orbotech Ltd | Cam reference inspection of multi-color and contour images |
US20030024913A1 (en) * | 2002-04-15 | 2003-02-06 | Downes Joseph P. | Laser scanning method and system for marking articles such as printed circuit boards, integrated circuits and the like |
JP4502496B2 (en) * | 2000-11-16 | 2010-07-14 | 富士通株式会社 | Solder shape evaluation method for BGA mounting, solder shape evaluation apparatus for BGA mounting, and computer-readable recording medium storing a solder shape evaluation program for BGA mounting |
US6678062B2 (en) * | 2000-12-08 | 2004-01-13 | Cyberoptics Corporation | Automated system with improved height sensing |
JP3409117B2 (en) * | 2001-03-30 | 2003-05-26 | オムロン株式会社 | Optical reflective sensor |
JP2003058601A (en) * | 2001-08-14 | 2003-02-28 | Matsushita Electric Ind Co Ltd | Method and system for distributing teaching data for image processor |
US6920624B2 (en) * | 2002-01-17 | 2005-07-19 | Seagate Technology, Llc | Methodology of creating an object database from a Gerber file |
AU2003202121A1 (en) * | 2002-01-18 | 2003-07-30 | Mv Research Limited | A machine vision system |
US7119351B2 (en) * | 2002-05-17 | 2006-10-10 | Gsi Group Corporation | Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system |
US7505619B2 (en) * | 2002-09-27 | 2009-03-17 | Kla-Tencor Technologies Corporation | System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface |
US7158663B2 (en) * | 2003-04-22 | 2007-01-02 | Siemens Corporate Research, Inc. | Method for measuring confidence of ball grid array model in surface mounted devices |
US20050162651A1 (en) * | 2004-01-22 | 2005-07-28 | Seagate Technology Llc | Automatic optical inspection of components using a shadow projection threshold for a data storage device |
JP4746841B2 (en) * | 2004-01-23 | 2011-08-10 | ルネサスエレクトロニクス株式会社 | Manufacturing method of semiconductor integrated circuit device |
US20060086773A1 (en) * | 2004-10-27 | 2006-04-27 | Sanftleben Henry M | Technique for optical inspection system verification |
US7705268B2 (en) | 2004-11-11 | 2010-04-27 | Gsi Group Corporation | Method and system for laser soft marking |
WO2006066136A2 (en) * | 2004-12-19 | 2006-06-22 | Ade Corporation | System and method for inspecting a workpiece surface by analyzing scattered light in a back quartersphere region above the workpiece |
US9027218B2 (en) * | 2005-09-13 | 2015-05-12 | Gudmunn Slettemoen | Opto-mechanical postion finder |
US7545512B2 (en) | 2006-01-26 | 2009-06-09 | Koh Young Technology Inc. | Method for automated measurement of three-dimensional shape of circuit boards |
US20080082949A1 (en) * | 2006-10-01 | 2008-04-03 | Dell Products L.P. | Method, Apparatus and Media for Updating CAD Data with Printed Circuit Board Stencil Data |
WO2008124397A1 (en) | 2007-04-03 | 2008-10-16 | David Fishbaine | Inspection system and method |
CN101803049B (en) * | 2007-09-20 | 2012-02-08 | 皇家飞利浦电子股份有限公司 | Led package, lamp using LED package and method for manufacturing the led package |
FI121151B (en) * | 2007-11-22 | 2010-07-30 | Valtion Teknillinen | Method and apparatus for determining the topography and optical properties of a moving surface |
US9013711B2 (en) * | 2008-04-01 | 2015-04-21 | Perceptron, Inc. | Contour sensor incorporating MEMS mirrors |
US20100226114A1 (en) * | 2009-03-03 | 2010-09-09 | David Fishbaine | Illumination and imaging system |
JP5772062B2 (en) | 2011-02-25 | 2015-09-02 | オムロン株式会社 | Three-dimensional shape measuring apparatus and three-dimensional shape measuring method |
CN103561905A (en) * | 2011-06-08 | 2014-02-05 | 村田机械株式会社 | Workpiece-processing system |
US9513230B2 (en) | 2012-12-14 | 2016-12-06 | Kla-Tencor Corporation | Apparatus and method for optical inspection, magnetic field and height mapping |
FR3004571B1 (en) * | 2013-04-11 | 2015-04-10 | Vit | METHOD OF CORRECTING A THREE-DIMENSIONAL IMAGE OF AN ELECTRONIC CIRCUIT |
US10201120B2 (en) * | 2013-10-17 | 2019-02-05 | Yamaha Hatsudoki Kabushiki Kaisha | Component mounting apparatus |
CN104765822B (en) * | 2015-04-08 | 2018-09-25 | 上海望友信息科技有限公司 | Electronic device three-dimensional database system and its application |
TWI582629B (en) * | 2016-08-19 | 2017-05-11 | 和碩聯合科技股份有限公司 | Interference detection method and detecting device using the same |
CN114353676B (en) * | 2021-12-07 | 2024-03-19 | 江苏华创微***有限公司 | Automatic measurement device for height of mounted chip and test method thereof |
CN115854892B (en) * | 2022-12-05 | 2024-02-02 | 上海赫立智能机器有限公司 | Zero plane correction method for PCB detection |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4650333A (en) * | 1984-04-12 | 1987-03-17 | International Business Machines Corporation | System for measuring and detecting printed circuit wiring defects |
US4677302A (en) * | 1985-03-29 | 1987-06-30 | Siemens Corporate Research & Support, Inc. | Optical system for inspecting printed circuit boards wherein a ramp filter is disposed between reflected beam and photodetector |
US5088828A (en) | 1989-02-28 | 1992-02-18 | Siemens Aktiengesellschaft | Method and apparatus for three-dimensional testing of printed circuitboards |
US5200799A (en) * | 1989-09-12 | 1993-04-06 | Matsushita Electric Industrial Co., Ltd. | System for optically inspecting conditions of parts packaged on substrate |
JPH04106267A (en) | 1990-08-23 | 1992-04-08 | Okabe Co Ltd | Form device of column |
JP3113731B2 (en) * | 1991-05-17 | 2000-12-04 | キヤノン株式会社 | Component mounting inspection method, inspection device thereof, and substrate inspected by the inspection device |
EP0526080B1 (en) | 1991-07-22 | 1996-10-02 | Omron Corporation | Teaching method and system for mounted component inspection |
JP2711042B2 (en) | 1992-03-30 | 1998-02-10 | シャープ株式会社 | Cream solder printing condition inspection device |
JP3314406B2 (en) * | 1992-04-24 | 2002-08-12 | 松下電器産業株式会社 | How to measure the height of cream solder |
JP3148000B2 (en) * | 1992-06-29 | 2001-03-19 | 松下電器産業株式会社 | Solder printing inspection method |
JP2651093B2 (en) * | 1992-10-27 | 1997-09-10 | 松下電工株式会社 | Shape detection method and device |
US5465152A (en) | 1994-06-03 | 1995-11-07 | Robotic Vision Systems, Inc. | Method for coplanarity inspection of package or substrate warpage for ball grid arrays, column arrays, and similar structures |
JP3143038B2 (en) * | 1994-11-18 | 2001-03-07 | 株式会社日立製作所 | Automatic focusing method and apparatus, and three-dimensional shape detection method and apparatus |
JPH08152299A (en) | 1994-11-25 | 1996-06-11 | Yasuda Shiko Kk | Display firework |
JPH09329422A (en) * | 1996-06-12 | 1997-12-22 | Fujitsu Ltd | Height measuring method and device |
US5902353A (en) | 1996-09-23 | 1999-05-11 | Motorola, Inc. | Method, system, and article of manufacture for navigating to a resource in an electronic network |
US5760893A (en) * | 1996-12-24 | 1998-06-02 | Teradyne, Inc. | Method and apparatus for inspecting component placement and solder connection in printed circuit board manufacture |
US5862973A (en) | 1997-01-30 | 1999-01-26 | Teradyne, Inc. | Method for inspecting solder paste in printed circuit board manufacture |
KR100233621B1 (en) * | 1997-10-24 | 1999-12-01 | 조성욱 | Method of measuring non-contact 3-dimensional micro-image using optical window |
-
2000
- 2000-02-17 US US09/506,144 patent/US6496270B1/en not_active Expired - Fee Related
-
2001
- 2001-02-08 AU AU2001234994A patent/AU2001234994A1/en not_active Abandoned
- 2001-02-08 WO PCT/US2001/004398 patent/WO2001061275A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2001061275A1 (en) | 2001-08-23 |
US6496270B1 (en) | 2002-12-17 |
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