AU1876499A - Process for the measurement of three dimensional (3d) profiles by means of structured light projection - Google Patents
Process for the measurement of three dimensional (3d) profiles by means of structured light projectionInfo
- Publication number
- AU1876499A AU1876499A AU18764/99A AU1876499A AU1876499A AU 1876499 A AU1876499 A AU 1876499A AU 18764/99 A AU18764/99 A AU 18764/99A AU 1876499 A AU1876499 A AU 1876499A AU 1876499 A AU1876499 A AU 1876499A
- Authority
- AU
- Australia
- Prior art keywords
- profiles
- dimensional
- measurement
- structured light
- light projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT97MI002667A IT1296825B1 (en) | 1997-12-02 | 1997-12-02 | PROCEDURE FOR MEASURING THREE-DIMENSION PROFILES BY STRUCTURED LIGHT PROJECTION |
ITMI97A2667 | 1997-12-02 | ||
PCT/EP1998/007705 WO1999028704A1 (en) | 1997-12-02 | 1998-11-30 | Process for the measurement of three dimensional (3d) profiles by means of structured light projection |
Publications (1)
Publication Number | Publication Date |
---|---|
AU1876499A true AU1876499A (en) | 1999-06-16 |
Family
ID=11378301
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU18764/99A Abandoned AU1876499A (en) | 1997-12-02 | 1998-11-30 | Process for the measurement of three dimensional (3d) profiles by means of structured light projection |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1038157A1 (en) |
AU (1) | AU1876499A (en) |
IT (1) | IT1296825B1 (en) |
WO (1) | WO1999028704A1 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU6115700A (en) * | 1999-07-21 | 2001-02-13 | Benjamin A. Bard | Method and apparatus for performing calibration-based absolute shape measurementusing phase-shifting projected fringe profilometry |
US7625335B2 (en) | 2000-08-25 | 2009-12-01 | 3Shape Aps | Method and apparatus for three-dimensional optical scanning of interior surfaces |
US8032337B2 (en) | 2001-03-02 | 2011-10-04 | 3Shape A/S | Method for modeling customized earpieces |
US20070057946A1 (en) * | 2003-07-24 | 2007-03-15 | Dan Albeck | Method and system for the three-dimensional surface reconstruction of an object |
DE10345586B4 (en) | 2003-09-29 | 2007-03-15 | BIAS - Bremer Institut für angewandte Strahltechnik GmbH | Method and device for determining the structure of a surface |
CN1302257C (en) * | 2003-10-09 | 2007-02-28 | 四川大学 | Method for realizing Fourier transfrom contour by generating pi phase shift by two-colour grating template |
CN100464152C (en) * | 2007-06-08 | 2009-02-25 | 东南大学 | Self-correcting method for optical grating based on linear phase position |
JP4931728B2 (en) * | 2007-08-08 | 2012-05-16 | シーケーディ株式会社 | 3D measuring device and board inspection machine |
CN106091981B (en) * | 2016-05-27 | 2018-09-04 | 西安交通大学 | Region projection method for measuring optical three-dimensional contour for high dynamic range object |
JP6970551B2 (en) * | 2017-07-31 | 2021-11-24 | 株式会社キーエンス | Shape measuring device and shape measuring method |
CN111536904B (en) * | 2020-05-27 | 2022-04-15 | 深圳市华汉伟业科技有限公司 | Three-dimensional measurement method and system based on structural illumination and storage medium |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5557410A (en) * | 1994-05-26 | 1996-09-17 | Lockheed Missiles & Space Company, Inc. | Method of calibrating a three-dimensional optical measurement system |
GB9420638D0 (en) * | 1994-10-13 | 1994-11-30 | Moore John H | Three-dimensional digitiser |
DE19515949C2 (en) * | 1995-05-02 | 1999-02-04 | Continental Ag | Method and device for areal measurement and detection of the tread wear of a vehicle tire |
-
1997
- 1997-12-02 IT IT97MI002667A patent/IT1296825B1/en active IP Right Grant
-
1998
- 1998-11-30 WO PCT/EP1998/007705 patent/WO1999028704A1/en not_active Application Discontinuation
- 1998-11-30 AU AU18764/99A patent/AU1876499A/en not_active Abandoned
- 1998-11-30 EP EP98963529A patent/EP1038157A1/en not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
IT1296825B1 (en) | 1999-08-02 |
WO1999028704A1 (en) | 1999-06-10 |
EP1038157A1 (en) | 2000-09-27 |
ITMI972667A1 (en) | 1999-06-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |