AU1088401A - Deposition of transition metal carbides - Google Patents
Deposition of transition metal carbidesInfo
- Publication number
- AU1088401A AU1088401A AU10884/01A AU1088401A AU1088401A AU 1088401 A AU1088401 A AU 1088401A AU 10884/01 A AU10884/01 A AU 10884/01A AU 1088401 A AU1088401 A AU 1088401A AU 1088401 A AU1088401 A AU 1088401A
- Authority
- AU
- Australia
- Prior art keywords
- deposition
- transition metal
- metal carbides
- carbides
- transition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 230000008021 deposition Effects 0.000 title 1
- 229910052723 transition metal Inorganic materials 0.000 title 1
- -1 transition metal carbides Chemical class 0.000 title 1
Classifications
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- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/38—Nitrides
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/08—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal halides
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/32—Carbides
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45536—Use of plasma, radiation or electromagnetic fields
- C23C16/45542—Plasma being used non-continuously during the ALD reactions
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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Applications Claiming Priority (13)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15979999P | 1999-10-15 | 1999-10-15 | |
FI19992234 | 1999-10-15 | ||
FI992233A FI118158B (en) | 1999-10-15 | 1999-10-15 | Process for modifying the starting chemical in an ALD process |
FI19992233 | 1999-10-15 | ||
FI992234A FI117944B (en) | 1999-10-15 | 1999-10-15 | A method for growing transition metal nitride thin films |
FI19992235 | 1999-10-15 | ||
FI992235A FI117943B (en) | 1999-10-15 | 1999-10-15 | Deposition of metal carbide film on substrate, e.g. integrated circuit, involves atomic layer deposition |
US60159799 | 1999-10-15 | ||
US17694800P | 2000-01-18 | 2000-01-18 | |
US60176948 | 2000-01-18 | ||
FI20000564A FI119941B (en) | 1999-10-15 | 2000-03-10 | A process for preparing nanolaminates |
FI20000564 | 2000-03-10 | ||
PCT/US2000/028537 WO2001029280A1 (en) | 1999-10-15 | 2000-10-16 | Deposition of transition metal carbides |
Publications (1)
Publication Number | Publication Date |
---|---|
AU1088401A true AU1088401A (en) | 2001-04-30 |
Family
ID=27545968
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU10884/01A Abandoned AU1088401A (en) | 1999-10-15 | 2000-10-16 | Deposition of transition metal carbides |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100737901B1 (en) |
AU (1) | AU1088401A (en) |
WO (1) | WO2001029280A1 (en) |
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JP5551681B2 (en) | 2008-04-16 | 2014-07-16 | エーエスエム アメリカ インコーポレイテッド | Atomic layer deposition of metal carbide films using aluminum hydrocarbon compounds |
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JP6022228B2 (en) | 2011-09-14 | 2016-11-09 | 株式会社日立国際電気 | Semiconductor device manufacturing method, substrate processing method, substrate processing apparatus, and program |
US9412602B2 (en) | 2013-03-13 | 2016-08-09 | Asm Ip Holding B.V. | Deposition of smooth metal nitride films |
US8846550B1 (en) | 2013-03-14 | 2014-09-30 | Asm Ip Holding B.V. | Silane or borane treatment of metal thin films |
US8841182B1 (en) | 2013-03-14 | 2014-09-23 | Asm Ip Holding B.V. | Silane and borane treatments for titanium carbide films |
US9394609B2 (en) | 2014-02-13 | 2016-07-19 | Asm Ip Holding B.V. | Atomic layer deposition of aluminum fluoride thin films |
US10643925B2 (en) | 2014-04-17 | 2020-05-05 | Asm Ip Holding B.V. | Fluorine-containing conductive films |
KR102216575B1 (en) | 2014-10-23 | 2021-02-18 | 에이에스엠 아이피 홀딩 비.브이. | Titanium aluminum and tantalum aluminum thin films |
US9941425B2 (en) | 2015-10-16 | 2018-04-10 | Asm Ip Holdings B.V. | Photoactive devices and materials |
US9786491B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
US9786492B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
KR102378021B1 (en) | 2016-05-06 | 2022-03-23 | 에이에스엠 아이피 홀딩 비.브이. | Formation of SiOC thin films |
US10847529B2 (en) | 2017-04-13 | 2020-11-24 | Asm Ip Holding B.V. | Substrate processing method and device manufactured by the same |
US10504901B2 (en) | 2017-04-26 | 2019-12-10 | Asm Ip Holding B.V. | Substrate processing method and device manufactured using the same |
CN114875388A (en) | 2017-05-05 | 2022-08-09 | Asm Ip 控股有限公司 | Plasma enhanced deposition method for controlled formation of oxygen-containing films |
US10991573B2 (en) | 2017-12-04 | 2021-04-27 | Asm Ip Holding B.V. | Uniform deposition of SiOC on dielectric and metal surfaces |
CN112626491B (en) * | 2020-12-14 | 2022-02-01 | 江南大学 | Nano FeCxMethod for producing a material |
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JP2822536B2 (en) * | 1990-02-14 | 1998-11-11 | 住友電気工業株式会社 | Method for forming cubic boron nitride thin film |
WO1996018756A1 (en) * | 1994-12-16 | 1996-06-20 | Nkt Research Center A/S | A PA-CVD PROCESS FOR DEPOSITION OF A SOLID METAL-CONTAINING FILM ONTO A SUBSTRATE CONTAINING AT LEAST 50 % of Fe or WC |
US5672054A (en) * | 1995-12-07 | 1997-09-30 | Carrier Corporation | Rotary compressor with reduced lubrication sensitivity |
US5916365A (en) * | 1996-08-16 | 1999-06-29 | Sherman; Arthur | Sequential chemical vapor deposition |
-
2000
- 2000-10-16 AU AU10884/01A patent/AU1088401A/en not_active Abandoned
- 2000-10-16 KR KR1020027004824A patent/KR100737901B1/en active IP Right Grant
- 2000-10-16 WO PCT/US2000/028537 patent/WO2001029280A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
KR20020063165A (en) | 2002-08-01 |
KR100737901B1 (en) | 2007-07-10 |
WO2001029280A1 (en) | 2001-04-26 |
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