AU1088401A - Deposition of transition metal carbides - Google Patents

Deposition of transition metal carbides

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Publication number
AU1088401A
AU1088401A AU10884/01A AU1088401A AU1088401A AU 1088401 A AU1088401 A AU 1088401A AU 10884/01 A AU10884/01 A AU 10884/01A AU 1088401 A AU1088401 A AU 1088401A AU 1088401 A AU1088401 A AU 1088401A
Authority
AU
Australia
Prior art keywords
deposition
transition metal
metal carbides
carbides
transition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU10884/01A
Inventor
Kai-Erik Elers
Suvi P. Haukka
Sari Johanna Kaipio
Ville Antero Saanila
Pekka Juha Soininen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASM Microchemistry Oy
Original Assignee
ASM America Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FI992233A external-priority patent/FI118158B/en
Priority claimed from FI992234A external-priority patent/FI117944B/en
Priority claimed from FI992235A external-priority patent/FI117943B/en
Priority claimed from FI20000564A external-priority patent/FI119941B/en
Application filed by ASM America Inc filed Critical ASM America Inc
Publication of AU1088401A publication Critical patent/AU1088401A/en
Abandoned legal-status Critical Current

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    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/38Nitrides
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AU10884/01A 1999-10-15 2000-10-16 Deposition of transition metal carbides Abandoned AU1088401A (en)

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Application Number Priority Date Filing Date Title
US15979999P 1999-10-15 1999-10-15
FI19992234 1999-10-15
FI992233A FI118158B (en) 1999-10-15 1999-10-15 Process for modifying the starting chemical in an ALD process
FI19992233 1999-10-15
FI992234A FI117944B (en) 1999-10-15 1999-10-15 A method for growing transition metal nitride thin films
FI19992235 1999-10-15
FI992235A FI117943B (en) 1999-10-15 1999-10-15 Deposition of metal carbide film on substrate, e.g. integrated circuit, involves atomic layer deposition
US60159799 1999-10-15
US17694800P 2000-01-18 2000-01-18
US60176948 2000-01-18
FI20000564A FI119941B (en) 1999-10-15 2000-03-10 A process for preparing nanolaminates
FI20000564 2000-03-10
PCT/US2000/028537 WO2001029280A1 (en) 1999-10-15 2000-10-16 Deposition of transition metal carbides

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Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI119941B (en) 1999-10-15 2009-05-15 Asm Int A process for preparing nanolaminates
EP1221178A1 (en) 1999-10-15 2002-07-10 ASM America, Inc. Method for depositing nanolaminate thin films on sensitive surfaces
FI20000099A0 (en) 2000-01-18 2000-01-18 Asm Microchemistry Ltd A method for growing thin metal films
US6319766B1 (en) 2000-02-22 2001-11-20 Applied Materials, Inc. Method of tantalum nitride deposition by tantalum oxide densification
US7419903B2 (en) 2000-03-07 2008-09-02 Asm International N.V. Thin films
US6620723B1 (en) 2000-06-27 2003-09-16 Applied Materials, Inc. Formation of boride barrier layers using chemisorption techniques
FI20001694A0 (en) 2000-07-20 2000-07-20 Asm Microchemistry Oy A method for growing a thin film on a substrate
EP1772534A3 (en) 2000-09-28 2007-04-25 The President and Fellows of Harvard College Tungsten-containing and hafnium-containing precursors for vapor deposition
US6765178B2 (en) 2000-12-29 2004-07-20 Applied Materials, Inc. Chamber for uniform substrate heating
US6825447B2 (en) 2000-12-29 2004-11-30 Applied Materials, Inc. Apparatus and method for uniform substrate heating and contaminate collection
US6811814B2 (en) 2001-01-16 2004-11-02 Applied Materials, Inc. Method for growing thin films by catalytic enhancement
US6951804B2 (en) 2001-02-02 2005-10-04 Applied Materials, Inc. Formation of a tantalum-nitride layer
US6878206B2 (en) 2001-07-16 2005-04-12 Applied Materials, Inc. Lid assembly for a processing system to facilitate sequential deposition techniques
US6660126B2 (en) 2001-03-02 2003-12-09 Applied Materials, Inc. Lid assembly for a processing system to facilitate sequential deposition techniques
US9139906B2 (en) 2001-03-06 2015-09-22 Asm America, Inc. Doping with ALD technology
US6734020B2 (en) 2001-03-07 2004-05-11 Applied Materials, Inc. Valve control system for atomic layer deposition chamber
FI109770B (en) 2001-03-16 2002-10-15 Asm Microchemistry Oy Growing transition metal nitride thin films by using compound having hydrocarbon, amino or silyl group bound to nitrogen as nitrogen source material
US6828218B2 (en) 2001-05-31 2004-12-07 Samsung Electronics Co., Ltd. Method of forming a thin film using atomic layer deposition
TW581822B (en) 2001-07-16 2004-04-01 Applied Materials Inc Formation of composite tungsten films
US9051641B2 (en) 2001-07-25 2015-06-09 Applied Materials, Inc. Cobalt deposition on barrier surfaces
DE10136400B4 (en) * 2001-07-26 2006-01-05 Infineon Technologies Ag Method for producing a metal carbide layer and method for producing a trench capacitor
KR101013231B1 (en) 2001-09-14 2011-02-10 에이에스엠 인터내셔널 엔.브이. Metal nitride deposition by ald with reduction pulse
TW589684B (en) 2001-10-10 2004-06-01 Applied Materials Inc Method for depositing refractory metal layers employing sequential deposition techniques
US6916398B2 (en) 2001-10-26 2005-07-12 Applied Materials, Inc. Gas delivery apparatus and method for atomic layer deposition
US6729824B2 (en) 2001-12-14 2004-05-04 Applied Materials, Inc. Dual robot processing system
US6939801B2 (en) 2001-12-21 2005-09-06 Applied Materials, Inc. Selective deposition of a barrier layer on a dielectric material
US6809026B2 (en) 2001-12-21 2004-10-26 Applied Materials, Inc. Selective deposition of a barrier layer on a metal film
US6620670B2 (en) 2002-01-18 2003-09-16 Applied Materials, Inc. Process conditions and precursors for atomic layer deposition (ALD) of AL2O3
US6827978B2 (en) 2002-02-11 2004-12-07 Applied Materials, Inc. Deposition of tungsten films
US6833161B2 (en) 2002-02-26 2004-12-21 Applied Materials, Inc. Cyclical deposition of tungsten nitride for metal oxide gate electrode
US6720027B2 (en) 2002-04-08 2004-04-13 Applied Materials, Inc. Cyclical deposition of a variable content titanium silicon nitride layer
US7150789B2 (en) * 2002-07-29 2006-12-19 Micron Technology, Inc. Atomic layer deposition methods
US6753271B2 (en) 2002-08-15 2004-06-22 Micron Technology, Inc. Atomic layer deposition methods
US6890596B2 (en) 2002-08-15 2005-05-10 Micron Technology, Inc. Deposition methods
US6673701B1 (en) 2002-08-27 2004-01-06 Micron Technology, Inc. Atomic layer deposition methods
KR100487639B1 (en) * 2002-12-11 2005-05-03 주식회사 하이닉스반도체 Method for forming metal line of semiconductor device
US6753248B1 (en) 2003-01-27 2004-06-22 Applied Materials, Inc. Post metal barrier/adhesion film
US7198820B2 (en) 2003-02-06 2007-04-03 Planar Systems, Inc. Deposition of carbon- and transition metal-containing thin films
US7202166B2 (en) 2003-08-04 2007-04-10 Asm America, Inc. Surface preparation prior to deposition on germanium
US7030430B2 (en) 2003-08-15 2006-04-18 Intel Corporation Transition metal alloys for use as a gate electrode and devices incorporating these alloys
US7405143B2 (en) 2004-03-25 2008-07-29 Asm International N.V. Method for fabricating a seed layer
US8323754B2 (en) 2004-05-21 2012-12-04 Applied Materials, Inc. Stabilization of high-k dielectric materials
US8119210B2 (en) 2004-05-21 2012-02-21 Applied Materials, Inc. Formation of a silicon oxynitride layer on a high-k dielectric material
KR100594626B1 (en) * 2004-09-02 2006-07-07 한양대학교 산학협력단 Method for forming nitride layer using atomic layer deposition
JP2008532271A (en) 2005-02-22 2008-08-14 エーエスエム アメリカ インコーポレイテッド Surface plasma pretreatment for atomic layer deposition
JP5109299B2 (en) * 2005-07-07 2012-12-26 東京エレクトロン株式会社 Deposition method
US8993055B2 (en) 2005-10-27 2015-03-31 Asm International N.V. Enhanced thin film deposition
TWI329135B (en) 2005-11-04 2010-08-21 Applied Materials Inc Apparatus and process for plasma-enhanced atomic layer deposition
KR101427142B1 (en) 2006-10-05 2014-08-07 에이에스엠 아메리카, 인코포레이티드 ALD of metal silicate films
US8268409B2 (en) 2006-10-25 2012-09-18 Asm America, Inc. Plasma-enhanced deposition of metal carbide films
US7638170B2 (en) 2007-06-21 2009-12-29 Asm International N.V. Low resistivity metal carbonitride thin film deposition by atomic layer deposition
US8017182B2 (en) 2007-06-21 2011-09-13 Asm International N.V. Method for depositing thin films by mixed pulsed CVD and ALD
JP5551681B2 (en) 2008-04-16 2014-07-16 エーエスエム アメリカ インコーポレイテッド Atomic layer deposition of metal carbide films using aluminum hydrocarbon compounds
US7666474B2 (en) 2008-05-07 2010-02-23 Asm America, Inc. Plasma-enhanced pulsed deposition of metal carbide films
US20100062149A1 (en) 2008-09-08 2010-03-11 Applied Materials, Inc. Method for tuning a deposition rate during an atomic layer deposition process
US10513772B2 (en) 2009-10-20 2019-12-24 Asm International N.V. Process for passivating dielectric films
JP6022228B2 (en) 2011-09-14 2016-11-09 株式会社日立国際電気 Semiconductor device manufacturing method, substrate processing method, substrate processing apparatus, and program
US9412602B2 (en) 2013-03-13 2016-08-09 Asm Ip Holding B.V. Deposition of smooth metal nitride films
US8846550B1 (en) 2013-03-14 2014-09-30 Asm Ip Holding B.V. Silane or borane treatment of metal thin films
US8841182B1 (en) 2013-03-14 2014-09-23 Asm Ip Holding B.V. Silane and borane treatments for titanium carbide films
US9394609B2 (en) 2014-02-13 2016-07-19 Asm Ip Holding B.V. Atomic layer deposition of aluminum fluoride thin films
US10643925B2 (en) 2014-04-17 2020-05-05 Asm Ip Holding B.V. Fluorine-containing conductive films
KR102216575B1 (en) 2014-10-23 2021-02-18 에이에스엠 아이피 홀딩 비.브이. Titanium aluminum and tantalum aluminum thin films
US9941425B2 (en) 2015-10-16 2018-04-10 Asm Ip Holdings B.V. Photoactive devices and materials
US9786491B2 (en) 2015-11-12 2017-10-10 Asm Ip Holding B.V. Formation of SiOCN thin films
US9786492B2 (en) 2015-11-12 2017-10-10 Asm Ip Holding B.V. Formation of SiOCN thin films
KR102378021B1 (en) 2016-05-06 2022-03-23 에이에스엠 아이피 홀딩 비.브이. Formation of SiOC thin films
US10847529B2 (en) 2017-04-13 2020-11-24 Asm Ip Holding B.V. Substrate processing method and device manufactured by the same
US10504901B2 (en) 2017-04-26 2019-12-10 Asm Ip Holding B.V. Substrate processing method and device manufactured using the same
CN114875388A (en) 2017-05-05 2022-08-09 Asm Ip 控股有限公司 Plasma enhanced deposition method for controlled formation of oxygen-containing films
US10991573B2 (en) 2017-12-04 2021-04-27 Asm Ip Holding B.V. Uniform deposition of SiOC on dielectric and metal surfaces
CN112626491B (en) * 2020-12-14 2022-02-01 江南大学 Nano FeCxMethod for producing a material

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2822536B2 (en) * 1990-02-14 1998-11-11 住友電気工業株式会社 Method for forming cubic boron nitride thin film
WO1996018756A1 (en) * 1994-12-16 1996-06-20 Nkt Research Center A/S A PA-CVD PROCESS FOR DEPOSITION OF A SOLID METAL-CONTAINING FILM ONTO A SUBSTRATE CONTAINING AT LEAST 50 % of Fe or WC
US5672054A (en) * 1995-12-07 1997-09-30 Carrier Corporation Rotary compressor with reduced lubrication sensitivity
US5916365A (en) * 1996-08-16 1999-06-29 Sherman; Arthur Sequential chemical vapor deposition

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