ATE521898T1 - A DIGITAL SYSTEM AND METHOD FOR TESTING ANALOG AND DIGITAL/ANALOG CIRCUITS OR SYSTEMS - Google Patents

A DIGITAL SYSTEM AND METHOD FOR TESTING ANALOG AND DIGITAL/ANALOG CIRCUITS OR SYSTEMS

Info

Publication number
ATE521898T1
ATE521898T1 AT03760088T AT03760088T ATE521898T1 AT E521898 T1 ATE521898 T1 AT E521898T1 AT 03760088 T AT03760088 T AT 03760088T AT 03760088 T AT03760088 T AT 03760088T AT E521898 T1 ATE521898 T1 AT E521898T1
Authority
AT
Austria
Prior art keywords
digital
analog
input signal
testing
merit
Prior art date
Application number
AT03760088T
Other languages
German (de)
Inventor
David Hamilton
Brian Stimpson
Mahmoud Ali Mousa Bekheit
Original Assignee
Ateeda Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ateeda Ltd filed Critical Ateeda Ltd
Application granted granted Critical
Publication of ATE521898T1 publication Critical patent/ATE521898T1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.
AT03760088T 2002-06-17 2003-06-17 A DIGITAL SYSTEM AND METHOD FOR TESTING ANALOG AND DIGITAL/ANALOG CIRCUITS OR SYSTEMS ATE521898T1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0213882.4A GB0213882D0 (en) 2002-06-17 2002-06-17 A digital system & method for testing analogue & mixed-signal circuits or systems
PCT/GB2003/002599 WO2003107019A2 (en) 2002-06-17 2003-06-17 A digital system and method for testing analogue and mixed-signal circuits or systems

Publications (1)

Publication Number Publication Date
ATE521898T1 true ATE521898T1 (en) 2011-09-15

Family

ID=9938726

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03760088T ATE521898T1 (en) 2002-06-17 2003-06-17 A DIGITAL SYSTEM AND METHOD FOR TESTING ANALOG AND DIGITAL/ANALOG CIRCUITS OR SYSTEMS

Country Status (7)

Country Link
US (1) US7174491B2 (en)
EP (1) EP1514125B1 (en)
JP (1) JP2005530161A (en)
AT (1) ATE521898T1 (en)
AU (1) AU2003250369A1 (en)
GB (1) GB0213882D0 (en)
WO (1) WO2003107019A2 (en)

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EP1382975B1 (en) * 2002-07-19 2008-01-02 Qimonda AG Method of generating a test pattern for the simulation and/or test of the layout of an integrated circuit
US7823128B2 (en) * 2004-04-19 2010-10-26 Verigy (Singapore) Pte. Ltd. Apparatus, system and/or method for combining multiple tests to a single test in a multiple independent port test environment
US20050278160A1 (en) * 2004-06-14 2005-12-15 Donnelly James M Reduction of settling time in dynamic simulations
US7747405B2 (en) 2006-03-24 2010-06-29 Ics Triplex Technology Ltd. Line frequency synchronization
US7476891B2 (en) 2006-03-24 2009-01-13 Ics Triplex Technology, Ltd. Fault detection method and apparatus
US7729098B2 (en) 2006-03-24 2010-06-01 Ics Triplex Technology Limited Overload protection method
US7613974B2 (en) 2006-03-24 2009-11-03 Ics Triplex Technology Limited Fault detection method and apparatus
US7504975B2 (en) 2006-03-24 2009-03-17 Ics Triplex Technology Limited Method and apparatus for output current control
US8166362B2 (en) 2006-03-24 2012-04-24 Rockwell Automation Limited Fault detection method and apparatus for analog to digital converter circuits
US7688560B2 (en) 2006-03-24 2010-03-30 Ics Triplex Technology Limited Overload protection method
EP1837992B1 (en) * 2006-03-24 2011-02-23 ICS Triplex Technology Limited Digital output module overload protection
US9459316B2 (en) 2011-09-06 2016-10-04 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for testing a semiconductor device
CN103064009B (en) * 2012-12-28 2015-03-11 辽宁大学 Artificial circuit fault diagnosis method based on wavelet analysis and limited gauss mixed model expectation maximization (EM) method
FI126901B (en) * 2014-09-12 2017-07-31 Enics Ag Method and system for testing an electronic unit
CN105223495A (en) * 2015-10-20 2016-01-06 国家电网公司 A kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system
CN110088462A (en) 2016-12-22 2019-08-02 维斯塔斯风力***集团公司 Electric fault detection in wind turbine generator control system
CN112444737B (en) * 2020-09-21 2021-10-22 电子科技大学 Method for determining fault parameter range of analog circuit
CN112684282B (en) * 2020-11-12 2022-07-19 国网河北省电力有限公司电力科学研究院 Power distribution network single-phase earth fault identification method and device and terminal equipment
CN113051862B (en) * 2021-04-19 2022-07-26 电子科技大学 Digital-analog hybrid circuit test vector set optimization method based on genetic algorithm
CN115085194B (en) * 2022-07-20 2022-12-23 南方电网科学研究院有限责任公司 Power system stability control strategy generation method, system, device and storage medium
CN117970039B (en) * 2024-04-01 2024-06-04 山东大学 Distribution line fault moment detection method

Family Cites Families (8)

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US5694356A (en) 1994-11-02 1997-12-02 Invoice Technology, Inc. High resolution analog storage EPROM and flash EPROM
US5646521A (en) 1995-08-01 1997-07-08 Schlumberger Technologies, Inc. Analog channel for mixed-signal-VLSI tester
US5745409A (en) 1995-09-28 1998-04-28 Invox Technology Non-volatile memory with analog and digital interface and storage
US5793778A (en) * 1997-04-11 1998-08-11 National Semiconductor Corporation Method and apparatus for testing analog and digital circuitry within a larger circuit
CA2206738A1 (en) * 1997-06-02 1998-12-02 Naim Ben Hamida Fault modeling and simulation for mixed-signal circuits and systems
US6467058B1 (en) * 1999-01-20 2002-10-15 Nec Usa, Inc. Segmented compaction with pruning and critical fault elimination
US20020188904A1 (en) * 2001-06-11 2002-12-12 International Business Machines Corporation Efficiency of fault simulation by logic backtracking
US6898746B2 (en) * 2001-06-19 2005-05-24 Intel Corporation Method of and apparatus for testing a serial differential/mixed signal device

Also Published As

Publication number Publication date
GB0213882D0 (en) 2002-07-31
US7174491B2 (en) 2007-02-06
AU2003250369A1 (en) 2003-12-31
JP2005530161A (en) 2005-10-06
EP1514125B1 (en) 2011-08-24
AU2003250369A8 (en) 2003-12-31
WO2003107019A3 (en) 2004-07-01
WO2003107019A2 (en) 2003-12-24
EP1514125A2 (en) 2005-03-16
US20060242498A1 (en) 2006-10-26

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