ATE511096T1 - METHOD FOR PRODUCING A CAPTIBLE WIRED TEST DEVICE - Google Patents
METHOD FOR PRODUCING A CAPTIBLE WIRED TEST DEVICEInfo
- Publication number
- ATE511096T1 ATE511096T1 AT03253864T AT03253864T ATE511096T1 AT E511096 T1 ATE511096 T1 AT E511096T1 AT 03253864 T AT03253864 T AT 03253864T AT 03253864 T AT03253864 T AT 03253864T AT E511096 T1 ATE511096 T1 AT E511096T1
- Authority
- AT
- Austria
- Prior art keywords
- locations
- fixture
- plate
- hole
- wired
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49126—Assembling bases
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
- Y10T29/49151—Assembling terminal to base by deforming or shaping
- Y10T29/49153—Assembling terminal to base by deforming or shaping with shaping or forcing terminal into base aperture
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
- Y10T29/49162—Manufacturing circuit on or in base by using wire as conductive path
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/532—Conductor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/532—Conductor
- Y10T29/53209—Terminal or connector
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/532—Conductor
- Y10T29/53209—Terminal or connector
- Y10T29/53213—Assembled to wire-type conductor
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Multi-Conductor Connections (AREA)
- Installation Of Indoor Wiring (AREA)
Abstract
A method for wiring a test fixture comprised of two parallel fixture plates wherein the wires are wired randomly from locations on one plate to locations on a second plate using a system of software algorithms and positioning apparatus to control the motion of one plate relative to the other to allow the wires to be passed directly through the hole locations to be wired together, while previously woven locations are allowed to slide in the hole in the fixture plate to allow reaching subsequent hole pair locations. After the fixture is wired, a termination is added to the wire end emerging from the hole in the fixture plates. The resultant assembly consists of contacts on one outer surface electrically connected to contacts on a second outer surface with all of the wiring sandwiched between the two fixture plates. <IMAGE>
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US39109702P | 2002-06-24 | 2002-06-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE511096T1 true ATE511096T1 (en) | 2011-06-15 |
Family
ID=29718065
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT03253864T ATE511096T1 (en) | 2002-06-24 | 2003-06-18 | METHOD FOR PRODUCING A CAPTIBLE WIRED TEST DEVICE |
Country Status (8)
Country | Link |
---|---|
US (3) | US7059046B2 (en) |
EP (1) | EP1376141B1 (en) |
JP (1) | JP4098676B2 (en) |
CN (1) | CN1320369C (en) |
AT (1) | ATE511096T1 (en) |
MY (1) | MY134274A (en) |
SG (1) | SG102716A1 (en) |
TW (1) | TWI223098B (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7059046B2 (en) * | 2002-06-24 | 2006-06-13 | Delaware Capital Formation, Inc. | Method for producing a captive wired test fixture and fixture therefor |
US8181906B2 (en) * | 2009-04-02 | 2012-05-22 | Raytheon Company | Method and apparatus for ram deceleration in a launch system |
US8648616B2 (en) * | 2009-12-22 | 2014-02-11 | Ltx-Credence Corporation | Loaded printed circuit board test fixture and method for manufacturing the same |
TWI426366B (en) * | 2011-01-17 | 2014-02-11 | Hon Hai Prec Ind Co Ltd | System and method for automatically searching and optimum arranging test points |
US9658252B2 (en) * | 2011-02-21 | 2017-05-23 | United Microelectronics Corp. | Probe insertion auxiliary and method of probe insertion |
US9182425B2 (en) | 2012-05-21 | 2015-11-10 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Probe supporting and aligning apparatus |
CN102768293B (en) * | 2012-07-24 | 2015-03-25 | 上海交通大学 | Measuring clamp for organic electroluminescent devices |
CN107564829B (en) * | 2017-08-24 | 2020-09-04 | 北京智芯微电子科技有限公司 | Method for measuring internal signal of TSV (through silicon via) packaged chip |
CN110429401A (en) * | 2019-08-07 | 2019-11-08 | 广东电网有限责任公司 | A kind of adjustable wire clamp |
CN111286846B (en) * | 2020-04-15 | 2021-04-16 | 扬州市郭氏精密机械制造有限公司 | Yarn clip for weaving |
Family Cites Families (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2493671A1 (en) | 1980-10-30 | 1982-05-07 | Everett Charles Inc | CONTACTS SHIFT, TEST APPARATUS WITH CONTACTS SHIFT, AND METHOD FOR MANUFACTURING CONTACTS SHIFT |
US4353536A (en) * | 1981-02-04 | 1982-10-12 | Peter Mazzotta | Miter clamp |
US4423376A (en) * | 1981-03-20 | 1983-12-27 | International Business Machines Corporation | Contact probe assembly having rotatable contacting probe elements |
US4788496A (en) * | 1982-11-05 | 1988-11-29 | Martin Maelzer | Adapter for a printed circuit board testing device |
US4535536A (en) * | 1983-11-03 | 1985-08-20 | Augat Inc. | Method of assembling adaptor for automatic testing equipment |
US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
US4622514A (en) * | 1984-06-15 | 1986-11-11 | Ibm | Multiple mode buckling beam probe assembly |
DE3678825D1 (en) * | 1985-11-01 | 1991-05-23 | Hewlett Packard Co | BRACKET FOR PCB TEST. |
DE3539720A1 (en) * | 1985-11-08 | 1987-05-14 | Martin Maelzer | ADAPTER FOR A PCB TEST DEVICE |
EP0285799B1 (en) * | 1987-03-31 | 1993-07-28 | Siemens Aktiengesellschaft | Device for the functional electric testing of wiring arrays, in particular of circuit boards |
US4935696A (en) * | 1987-04-16 | 1990-06-19 | Teradyne, Inc. | Test pin assembly for circuit board tester |
US4963822A (en) * | 1988-06-01 | 1990-10-16 | Manfred Prokopp | Method of testing circuit boards and the like |
US4904935A (en) * | 1988-11-14 | 1990-02-27 | Eaton Corporation | Electrical circuit board text fixture having movable platens |
US4977370A (en) * | 1988-12-06 | 1990-12-11 | Genrad, Inc. | Apparatus and method for circuit board testing |
US5399982A (en) * | 1989-11-13 | 1995-03-21 | Mania Gmbh & Co. | Printed circuit board testing device with foil adapter |
JPH0675415B2 (en) * | 1991-03-15 | 1994-09-21 | 山一電機株式会社 | Leadless type IC package connector |
DE4337500A1 (en) | 1993-11-03 | 1995-05-04 | Test Plus Electronic Gmbh | Two-part adapter device |
US5442299A (en) * | 1994-01-06 | 1995-08-15 | International Business Machines Corporation | Printed circuit board test fixture and method |
US5493230A (en) * | 1994-02-25 | 1996-02-20 | Everett Charles Technologies, Inc. | Retention of test probes in translator fixtures |
US5729146A (en) * | 1995-09-21 | 1998-03-17 | Everett Charles Technologies, Inc. | Quick stacking translator fixture |
IT1282689B1 (en) * | 1996-02-26 | 1998-03-31 | Circuit Line Spa | DEVICE FOR CONVERSION OF THE GRID OF TEST POINTS OF A MACHINE FOR THE ELECTRICAL TEST OF UNASSEMBLED PRINTED CIRCUITS |
US5818248A (en) * | 1996-07-29 | 1998-10-06 | Delaware Capital Formation, Inc | Loaded board test fixture with integral translator fixture for testing closely spaced test sites |
US5804984A (en) * | 1996-08-02 | 1998-09-08 | International Business Machines Corporation | Electronic component test apparatus with rotational probe |
JPH09281139A (en) * | 1996-09-13 | 1997-10-31 | Furukawa Electric Co Ltd:The | Manufacture of prober |
US6407565B1 (en) * | 1996-10-29 | 2002-06-18 | Agilent Technologies, Inc. | Loaded-board, guided-probe test fixture |
US5773988A (en) * | 1996-10-29 | 1998-06-30 | Hewlett-Packard Company | Standard- and limited-access hybrid test fixture |
US5945836A (en) * | 1996-10-29 | 1999-08-31 | Hewlett-Packard Company | Loaded-board, guided-probe test fixture |
US6222377B1 (en) * | 1998-01-13 | 2001-04-24 | Masatoshi Kato | Circuit board probe device |
US6024579A (en) * | 1998-05-29 | 2000-02-15 | The Whitaker Corporation | Electrical connector having buckling beam contacts |
US6208158B1 (en) * | 1998-06-03 | 2001-03-27 | Schein Research, Inc. | Zero static force assembly for wireless test fixtures |
DE19907727A1 (en) * | 1999-02-23 | 2000-08-24 | Test Plus Electronic Gmbh | Test adapter for contacting assembled printed circuit boards |
US6414504B2 (en) * | 1999-05-20 | 2002-07-02 | Delaware Capital Formation, Inc. | Coaxial tilt pin fixture for testing high frequency circuit boards |
JP3619069B2 (en) * | 1999-08-09 | 2005-02-09 | ユニチカ株式会社 | Fly ash recycling process |
FR2815127B1 (en) * | 2000-10-05 | 2002-12-20 | Andre Sabatier | ELECTRIC CONNECTOR WITH MULTIPLE CONTACTS |
US6559664B2 (en) * | 2001-08-13 | 2003-05-06 | Desimone Peter | Probe plate assembly for a circuit board test fixture |
US6878530B2 (en) * | 2002-02-07 | 2005-04-12 | Panomics, Inc. | Methods for detecting polymorphisms in nucleic acids |
US7059046B2 (en) * | 2002-06-24 | 2006-06-13 | Delaware Capital Formation, Inc. | Method for producing a captive wired test fixture and fixture therefor |
-
2003
- 2003-06-05 US US10/454,930 patent/US7059046B2/en not_active Expired - Fee Related
- 2003-06-17 SG SG200303783A patent/SG102716A1/en unknown
- 2003-06-18 EP EP03253864A patent/EP1376141B1/en not_active Expired - Lifetime
- 2003-06-18 AT AT03253864T patent/ATE511096T1/en not_active IP Right Cessation
- 2003-06-23 TW TW092116954A patent/TWI223098B/en not_active IP Right Cessation
- 2003-06-23 MY MYPI20032339A patent/MY134274A/en unknown
- 2003-06-24 CN CNB03148705XA patent/CN1320369C/en not_active Expired - Fee Related
- 2003-06-24 JP JP2003179972A patent/JP4098676B2/en not_active Expired - Fee Related
-
2006
- 2006-02-28 US US11/365,300 patent/US20060143909A1/en not_active Abandoned
- 2006-03-09 US US11/373,595 patent/US7424775B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1320369C (en) | 2007-06-06 |
EP1376141A1 (en) | 2004-01-02 |
SG102716A1 (en) | 2004-03-26 |
MY134274A (en) | 2007-11-30 |
US20060151444A1 (en) | 2006-07-13 |
US7424775B2 (en) | 2008-09-16 |
US20030234640A1 (en) | 2003-12-25 |
TWI223098B (en) | 2004-11-01 |
CN1472540A (en) | 2004-02-04 |
JP4098676B2 (en) | 2008-06-11 |
US7059046B2 (en) | 2006-06-13 |
JP2004029024A (en) | 2004-01-29 |
US20060143909A1 (en) | 2006-07-06 |
TW200401900A (en) | 2004-02-01 |
EP1376141B1 (en) | 2011-05-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |