ATE464534T1 - Verfahren und vorrichtung zur höhenabtastenden interferometrie mit phasendifferenz-analyse - Google Patents
Verfahren und vorrichtung zur höhenabtastenden interferometrie mit phasendifferenz-analyseInfo
- Publication number
- ATE464534T1 ATE464534T1 AT01988481T AT01988481T ATE464534T1 AT E464534 T1 ATE464534 T1 AT E464534T1 AT 01988481 T AT01988481 T AT 01988481T AT 01988481 T AT01988481 T AT 01988481T AT E464534 T1 ATE464534 T1 AT E464534T1
- Authority
- AT
- Austria
- Prior art keywords
- height
- profile
- scanning interferometry
- phase difference
- difference analysis
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US24544300P | 2000-11-02 | 2000-11-02 | |
PCT/US2001/051152 WO2002040938A2 (en) | 2000-11-02 | 2001-11-02 | Height scanning interferometry method and apparatus including phase gap analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE464534T1 true ATE464534T1 (de) | 2010-04-15 |
Family
ID=22926671
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT01988481T ATE464534T1 (de) | 2000-11-02 | 2001-11-02 | Verfahren und vorrichtung zur höhenabtastenden interferometrie mit phasendifferenz-analyse |
Country Status (7)
Country | Link |
---|---|
US (1) | US6775006B2 (de) |
EP (1) | EP1332332B1 (de) |
JP (1) | JP4279550B2 (de) |
AT (1) | ATE464534T1 (de) |
AU (1) | AU2002241784A1 (de) |
DE (1) | DE60141848D1 (de) |
WO (1) | WO2002040938A2 (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2817030B1 (fr) * | 2000-11-17 | 2003-03-28 | Centre Nat Rech Scient | Procede et dispositif d'imagerie microscopique interferentielle d'un objet a haute cadence |
JP3852561B2 (ja) * | 2001-03-21 | 2006-11-29 | 三菱電機株式会社 | 画像表示装置および画像表示方法 |
US20030020902A1 (en) * | 2001-07-18 | 2003-01-30 | Yonathan Japha | Method for inspection of optical elements |
US7557929B2 (en) | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
US7365858B2 (en) * | 2001-12-18 | 2008-04-29 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
WO2003093759A2 (en) * | 2002-05-02 | 2003-11-13 | Zygo Corporation | Phase gap analysis for scanning interferometry |
US7869057B2 (en) | 2002-09-09 | 2011-01-11 | Zygo Corporation | Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis |
US7139081B2 (en) * | 2002-09-09 | 2006-11-21 | Zygo Corporation | Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |
US7271918B2 (en) * | 2003-03-06 | 2007-09-18 | Zygo Corporation | Profiling complex surface structures using scanning interferometry |
JP2006519993A (ja) | 2003-03-06 | 2006-08-31 | ザイゴ コーポレーション | 走査干渉分光を用いた複雑な表面構造のプロファイリング |
US7324214B2 (en) | 2003-03-06 | 2008-01-29 | Zygo Corporation | Interferometer and method for measuring characteristics of optically unresolved surface features |
US7106454B2 (en) | 2003-03-06 | 2006-09-12 | Zygo Corporation | Profiling complex surface structures using scanning interferometry |
DE10328412B4 (de) * | 2003-06-19 | 2005-11-17 | Medizinisches Laserzentrum Lübeck GmbH | Verfahren zur interferometrischen Bestimmmung optischer Ebenenabstände mit Subnanometer-Genauigkeit |
TWI331211B (en) | 2003-09-15 | 2010-10-01 | Zygo Corp | Optical system,method of analyzing a measured object, and system for determining a spatial property of a measured object |
TWI335417B (en) | 2003-10-27 | 2011-01-01 | Zygo Corp | Method and apparatus for thin film measurement |
US7884947B2 (en) | 2005-01-20 | 2011-02-08 | Zygo Corporation | Interferometry for determining characteristics of an object surface, with spatially coherent illumination |
WO2006078718A1 (en) | 2005-01-20 | 2006-07-27 | Zygo Corporation | Interferometer for determining characteristics of an object surface |
GB0502677D0 (en) * | 2005-02-09 | 2005-03-16 | Taylor Hobson Ltd | Apparatus for and a method of determining a surface characteristic |
WO2006125131A2 (en) * | 2005-05-19 | 2006-11-23 | Zygo Corporation | Analyzing low-coherence interferometry signals for thin film structures |
US7595891B2 (en) * | 2005-07-09 | 2009-09-29 | Kla-Tencor Corporation | Measurement of the top surface of an object with/without transparent thin films in white light interferometry |
US7636168B2 (en) | 2005-10-11 | 2009-12-22 | Zygo Corporation | Interferometry method and system including spectral decomposition |
WO2008011510A2 (en) | 2006-07-21 | 2008-01-24 | Zygo Corporation | Compensation of systematic effects in low coherence interferometry |
JP5502491B2 (ja) | 2006-12-22 | 2014-05-28 | ザイゴ コーポレーション | 表面特徴の特性測定のための装置および方法 |
US7889355B2 (en) | 2007-01-31 | 2011-02-15 | Zygo Corporation | Interferometry for lateral metrology |
US8072611B2 (en) | 2007-10-12 | 2011-12-06 | Zygo Corporation | Interferometric analysis of under-resolved features |
WO2009064670A2 (en) | 2007-11-13 | 2009-05-22 | Zygo Corporation | Interferometer utilizing polarization scanning |
EP2232195B1 (de) | 2007-12-14 | 2015-03-18 | Zygo Corporation | Analyse der oberflächenstruktur unter verwendung von rasterinterferometrie |
US8662962B2 (en) * | 2008-06-30 | 2014-03-04 | 3M Innovative Properties Company | Sandpaper with non-slip coating layer and method of using |
US8120781B2 (en) | 2008-11-26 | 2012-02-21 | Zygo Corporation | Interferometric systems and methods featuring spectral analysis of unevenly sampled data |
EP2314982B1 (de) | 2009-10-20 | 2020-12-02 | Mitutoyo Corporation | Verfahren und Vorrichtung zur Bestimmung der Höhe einer Reihe räumlicher Positionen auf einer Probe, die ein Profil einer Oberfläche mithilfe der Weißlicht-Interferometrie definieren |
JP5493152B2 (ja) * | 2010-08-06 | 2014-05-14 | 株式会社ミツトヨ | 形状測定装置 |
US8780334B1 (en) * | 2011-12-14 | 2014-07-15 | Zygo Corporation | Topographical profiling with coherence scanning interferometry |
US9020293B2 (en) | 2012-02-07 | 2015-04-28 | National Cheung Kung University | Integration of filters and phase unwrapping algorithms for removing noise in image reconstruction |
EP2662661A1 (de) * | 2012-05-07 | 2013-11-13 | Leica Geosystems AG | Messgerät mit einem Interferometer und einem ein dichtes Linienspektrum definierenden Absorptionsmedium |
LU92173B1 (en) * | 2013-03-20 | 2014-09-22 | Iee Sarl | Distance determination method |
KR101613829B1 (ko) * | 2014-05-08 | 2016-04-20 | 조춘식 | 미분 모아레를 이용한 3차원 형상 측정방법 및 장치 |
US9632038B2 (en) * | 2014-08-20 | 2017-04-25 | Kla-Tencor Corporation | Hybrid phase unwrapping systems and methods for patterned wafer measurement |
US11513080B2 (en) * | 2016-09-09 | 2022-11-29 | Hamilton Sundstrand Corporation | Inspection systems for additive manufacturing systems |
CN108007397A (zh) * | 2018-01-09 | 2018-05-08 | 常州华达科捷光电仪器有限公司 | 一种激光测准*** |
US10996335B2 (en) * | 2018-05-09 | 2021-05-04 | Microsoft Technology Licensing, Llc | Phase wrapping determination for time-of-flight camera |
CN116057348A (zh) * | 2020-04-10 | 2023-05-02 | 纽约州立大学研究基金会 | 用于3d图像扫描的***和方法 |
CN115943286B (zh) * | 2020-07-30 | 2024-02-20 | 科磊股份有限公司 | 用于扫描计量工具的自适应对焦*** |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5402234A (en) * | 1992-08-31 | 1995-03-28 | Zygo Corporation | Method and apparatus for the rapid acquisition of data in coherence scanning interferometry |
US5398113A (en) * | 1993-02-08 | 1995-03-14 | Zygo Corporation | Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
US5438413A (en) * | 1993-03-03 | 1995-08-01 | Kla Instruments Corporation | Process for measuring overlay misregistration during semiconductor wafer fabrication |
US5471303A (en) * | 1994-04-29 | 1995-11-28 | Wyko Corporation | Combination of white-light scanning and phase-shifting interferometry for surface profile measurements |
US5987189A (en) * | 1996-12-20 | 1999-11-16 | Wyko Corporation | Method of combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite map |
US5784164A (en) * | 1997-03-20 | 1998-07-21 | Zygo Corporation | Method and apparatus for automatically and simultaneously determining best focus and orientation of objects to be measured by broad-band interferometric means |
US5953124A (en) * | 1998-01-19 | 1999-09-14 | Zygo Corporation | Interferometric methods and systems using low coherence illumination |
US6195168B1 (en) * | 1999-07-22 | 2001-02-27 | Zygo Corporation | Infrared scanning interferometry apparatus and method |
US6597460B2 (en) * | 2000-05-19 | 2003-07-22 | Zygo Corporation | Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum |
US6493093B2 (en) * | 2001-04-12 | 2002-12-10 | Veeco Instruments Inc. | Bat-wing attenuation in white-light interferometry |
-
2001
- 2001-11-02 AU AU2002241784A patent/AU2002241784A1/en not_active Abandoned
- 2001-11-02 WO PCT/US2001/051152 patent/WO2002040938A2/en active Application Filing
- 2001-11-02 DE DE60141848T patent/DE60141848D1/de not_active Expired - Lifetime
- 2001-11-02 AT AT01988481T patent/ATE464534T1/de not_active IP Right Cessation
- 2001-11-02 US US10/053,106 patent/US6775006B2/en not_active Expired - Lifetime
- 2001-11-02 EP EP01988481A patent/EP1332332B1/de not_active Expired - Lifetime
- 2001-11-02 JP JP2002542821A patent/JP4279550B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6775006B2 (en) | 2004-08-10 |
AU2002241784A1 (en) | 2002-05-27 |
DE60141848D1 (de) | 2010-05-27 |
US20020135775A1 (en) | 2002-09-26 |
JP2004514125A (ja) | 2004-05-13 |
JP4279550B2 (ja) | 2009-06-17 |
EP1332332B1 (de) | 2010-04-14 |
WO2002040938A2 (en) | 2002-05-23 |
EP1332332A2 (de) | 2003-08-06 |
WO2002040938A3 (en) | 2002-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |