ATE440291T1 - Verfahren zum erzeugen von hdl- beschreibungsdateien digitaler systeme und erhaltene systeme - Google Patents

Verfahren zum erzeugen von hdl- beschreibungsdateien digitaler systeme und erhaltene systeme

Info

Publication number
ATE440291T1
ATE440291T1 AT05717613T AT05717613T ATE440291T1 AT E440291 T1 ATE440291 T1 AT E440291T1 AT 05717613 T AT05717613 T AT 05717613T AT 05717613 T AT05717613 T AT 05717613T AT E440291 T1 ATE440291 T1 AT E440291T1
Authority
AT
Austria
Prior art keywords
systems
electronic system
hdl
files
preserved
Prior art date
Application number
AT05717613T
Other languages
English (en)
Inventor
Chouki Aktouf
Original Assignee
Inst Nat Polytech Grenoble
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR0401479A external-priority patent/FR2866434A1/fr
Application filed by Inst Nat Polytech Grenoble filed Critical Inst Nat Polytech Grenoble
Application granted granted Critical
Publication of ATE440291T1 publication Critical patent/ATE440291T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/333—Design for testability [DFT], e.g. scan chain or built-in self-test [BIST]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Devices For Executing Special Programs (AREA)
  • Moving Of Heads (AREA)
  • Communication Control (AREA)
  • Paper (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
AT05717613T 2004-02-13 2005-02-11 Verfahren zum erzeugen von hdl- beschreibungsdateien digitaler systeme und erhaltene systeme ATE440291T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0401479A FR2866434A1 (fr) 2004-02-13 2004-02-13 Procede d'elaboration automatique de fichiers de description hdl de systeme electectronique digital integre et systeme digital electronique integre obtenu
FR0409181A FR2866435B1 (fr) 2004-02-13 2004-08-30 Procede d'elaboration automatique de fichiers de description hdl de systeme electronique digital integre et systeme digital elecronique integre obtenu
PCT/FR2005/000323 WO2005083454A1 (fr) 2004-02-13 2005-02-11 Procede d'elaboration de fichiers de description hdl de systemes digitaux et systemes obtenus

Publications (1)

Publication Number Publication Date
ATE440291T1 true ATE440291T1 (de) 2009-09-15

Family

ID=34809853

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05717613T ATE440291T1 (de) 2004-02-13 2005-02-11 Verfahren zum erzeugen von hdl- beschreibungsdateien digitaler systeme und erhaltene systeme

Country Status (7)

Country Link
US (1) US8010918B2 (de)
EP (1) EP1716425B1 (de)
JP (1) JP4654203B2 (de)
AT (1) ATE440291T1 (de)
DE (1) DE602005016079D1 (de)
FR (1) FR2866435B1 (de)
WO (1) WO2005083454A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7600168B2 (en) * 2005-12-26 2009-10-06 Prolific Technology Inc. Apparatus with programmable scan chains for multiple chip modules and method for programming the same
US20120131316A1 (en) * 2010-04-12 2012-05-24 Mitola Iii Joseph Method and apparatus for improved secure computing and communications
US9753750B2 (en) 2012-08-30 2017-09-05 Entit Software Llc Global feature library useable with continuous delivery
US9081932B2 (en) * 2013-02-01 2015-07-14 Qualcomm Incorporated System and method to design and test a yield sensitive circuit
US10474441B1 (en) * 2013-02-06 2019-11-12 Altera Corporation Method and apparatus for performing automatic data compression algorithm selection during high-level compilation
US9383411B2 (en) 2013-06-26 2016-07-05 International Business Machines Corporation Three-dimensional processing system having at least one layer with circuitry dedicated to scan testing and system state checkpointing of other system layers
US9389876B2 (en) 2013-10-24 2016-07-12 International Business Machines Corporation Three-dimensional processing system having independent calibration and statistical collection layer
US9928150B2 (en) * 2014-06-30 2018-03-27 The Board Of Trustees Of The Leland Stanford Junior University System and method for testing a logic-based processing device

Family Cites Families (22)

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Publication number Priority date Publication date Assignee Title
US5193092A (en) * 1990-12-20 1993-03-09 Vlsi Technology, Inc. Integrated parity-based testing for integrated circuits
JP2760212B2 (ja) * 1992-04-23 1998-05-28 日本電気株式会社 スキャンパス設計方式
JPH0652259A (ja) * 1992-08-04 1994-02-25 Nec Eng Ltd スキャン挿入方法
US5508937A (en) * 1993-04-16 1996-04-16 International Business Machines Corporation Incremental timing analysis
JP2957508B2 (ja) * 1996-03-06 1999-10-04 松下電器産業株式会社 Ｒｔｌにおける検査容易化設計方法
US5748647A (en) * 1996-10-31 1998-05-05 Nec Usa, Inc. Low cost testing method for register transfer level circuits
US6256770B1 (en) * 1997-10-17 2001-07-03 Lucent Technologies Inc. Register transfer level (RTL) based scan insertion for integrated circuit design processes
WO1999045667A1 (en) * 1998-03-03 1999-09-10 Rutgers University Method and apparatus for combined stuck-at fault and partial-scanned delay-fault built-in self test
US6256759B1 (en) * 1998-06-15 2001-07-03 Agere Systems Inc. Hybrid algorithm for test point selection for scan-based BIST
US6301688B1 (en) * 1998-11-24 2001-10-09 Agere Systems Optoelectronics Guardian Corp. Insertion of test points in RTL designs
CN1214529C (zh) * 1999-09-22 2005-08-10 西门子公司 具有至少两个时钟***的集成电路
JP2001237826A (ja) * 2000-02-23 2001-08-31 Nec Corp パラレルランダムパタン生成回路及びそれを用いたスクランブル回路並びにデスクランブル回路
US6795951B2 (en) * 2001-02-09 2004-09-21 International Business Machines Corporation Method and system for fault-tolerant static timing analysis
US6957403B2 (en) * 2001-03-30 2005-10-18 Syntest Technologies, Inc. Computer-aided design system to automate scan synthesis at register-transfer level
US6714807B2 (en) * 2001-06-29 2004-03-30 Ge Medical Systems Global Technology Co., Llc Magnetic resonance imaging system
AUPR868201A0 (en) * 2001-11-05 2001-11-29 Thorlock International Limited Q-factor switching method and apparatus for detecting nuclear quadrupole and nuclear magnetic resonance signals
US7234092B2 (en) * 2002-06-11 2007-06-19 On-Chip Technologies, Inc. Variable clocked scan test circuitry and method
US6785875B2 (en) * 2002-08-15 2004-08-31 Fulcrum Microsystems, Inc. Methods and apparatus for facilitating physical synthesis of an integrated circuit design
US7131081B2 (en) * 2003-02-14 2006-10-31 Nec Laboratories America, Inc. Scalable scan-path test point insertion technique
JP4711801B2 (ja) * 2005-10-28 2011-06-29 ルネサスエレクトロニクス株式会社 回路設計システム及び回路設計プログラム
US7640476B2 (en) * 2006-09-22 2009-12-29 Sun Microsystems Inc. Method and system for automated path delay test vector generation from functional tests
US20080092093A1 (en) * 2006-10-12 2008-04-17 Nec Laboratories America, Inc. Register Transfer Level (RTL) Test Point Insertion Method to Reduce Delay Test Volume

Also Published As

Publication number Publication date
JP2007522574A (ja) 2007-08-09
US8010918B2 (en) 2011-08-30
EP1716425A1 (de) 2006-11-02
FR2866435A1 (fr) 2005-08-19
DE602005016079D1 (de) 2009-10-01
WO2005083454A1 (fr) 2005-09-09
EP1716425B1 (de) 2009-08-19
JP4654203B2 (ja) 2011-03-16
FR2866435B1 (fr) 2008-04-04
US20080295045A1 (en) 2008-11-27

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