ATE427550T1 - Integritatssteuerung fur in einem nichtfluchtigen speicher gespeicherte daten - Google Patents
Integritatssteuerung fur in einem nichtfluchtigen speicher gespeicherte datenInfo
- Publication number
- ATE427550T1 ATE427550T1 AT04744341T AT04744341T ATE427550T1 AT E427550 T1 ATE427550 T1 AT E427550T1 AT 04744341 T AT04744341 T AT 04744341T AT 04744341 T AT04744341 T AT 04744341T AT E427550 T1 ATE427550 T1 AT E427550T1
- Authority
- AT
- Austria
- Prior art keywords
- memory
- storage cells
- volatile storage
- bit
- volatile memory
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1695—Protection circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Read Only Memory (AREA)
- Storage Device Security (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03101645 | 2003-06-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE427550T1 true ATE427550T1 (de) | 2009-04-15 |
Family
ID=33495628
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT04744341T ATE427550T1 (de) | 2003-06-05 | 2004-05-26 | Integritatssteuerung fur in einem nichtfluchtigen speicher gespeicherte daten |
Country Status (7)
Country | Link |
---|---|
US (1) | US7529987B2 (de) |
EP (1) | EP1634299B1 (de) |
JP (1) | JP2006526833A (de) |
CN (1) | CN1799104B (de) |
AT (1) | ATE427550T1 (de) |
DE (1) | DE602004020339D1 (de) |
WO (1) | WO2004109704A1 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1520252B1 (de) * | 2002-06-28 | 2009-12-02 | Nxp B.V. | Datenträger mit erkennungsmitteln zum erkennen einer durchgeführten veränderung einer in speichermitteln gespeicherten information |
FR2887050B1 (fr) * | 2005-06-14 | 2007-10-05 | Viaccess Sa | Procede et systeme de securisation d'une transaction dans un reseau de telecommunication |
US8327192B2 (en) * | 2006-02-06 | 2012-12-04 | Intel Corporation | Method for memory integrity |
US7529969B1 (en) * | 2006-08-24 | 2009-05-05 | Micron Technology, Inc. | Memory device internal parameter reliability |
CN101201773B (zh) * | 2006-12-15 | 2011-06-15 | 英业达股份有限公司 | 储存装置的数据保护方法 |
US8127203B2 (en) * | 2007-09-17 | 2012-02-28 | Infineon Technologies Ag | Method, data processing apparatus and wireless device |
US8782326B2 (en) * | 2009-04-01 | 2014-07-15 | Seiko Epson Corporation | Memory device and system including a memory device electronically connectable to a host circuit |
EP2282296A1 (de) * | 2009-07-31 | 2011-02-09 | Robert Bosch GmbH | Signalerfassungsvorrichtung |
GB2487530A (en) * | 2011-01-19 | 2012-08-01 | Nds Ltd | Detection of illegal memory readout by using permanently programmed cells |
US8751906B2 (en) * | 2011-06-13 | 2014-06-10 | Marvell World Trade Ltd. | Systems and methods for operating on a storage device using a life-cycle dependent coding scheme |
CN102608622B (zh) * | 2012-03-08 | 2013-07-10 | 东南大学 | 一种全球定位***导航数据的完整性存储方法 |
CN103116566A (zh) * | 2013-01-17 | 2013-05-22 | 东南大学 | 一种利用邮件收发箱实现双核之间通信的装置 |
KR102168096B1 (ko) | 2013-03-15 | 2020-10-20 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 그것의 데이터 쓰기 방법 |
KR101489091B1 (ko) | 2013-09-30 | 2015-02-04 | (주) 아이씨티케이 | 반도체 공정을 이용한 식별키 생성 장치 및 방법 |
GB2526261B (en) * | 2014-04-28 | 2017-08-02 | Gelliner Ltd | Encoded cells and cell arrays |
CN107548183A (zh) * | 2016-06-23 | 2018-01-05 | 上海北京大学微电子研究院 | 基于无线通信的led驱动调光芯片 |
US10559374B2 (en) * | 2017-02-20 | 2020-02-11 | Piecemakers Technology, Inc. | Circuit topology of memory chips with embedded function test pattern generation module connected to normal access port physical layer |
US10243583B2 (en) | 2017-06-16 | 2019-03-26 | Western Digital Technologies, Inc. | CPU error remediation during erasure code encoding |
US10431301B2 (en) | 2017-12-22 | 2019-10-01 | Micron Technology, Inc. | Auto-referenced memory cell read techniques |
US10566052B2 (en) * | 2017-12-22 | 2020-02-18 | Micron Technology, Inc. | Auto-referenced memory cell read techniques |
CN109979519B (zh) | 2017-12-27 | 2021-03-16 | 华邦电子股份有限公司 | 存储器完整性的检验方法、非易失性存储器以及电子装置 |
TWI650637B (zh) * | 2017-12-27 | 2019-02-11 | 華邦電子股份有限公司 | 記憶體完整性的檢驗方法、非揮發性記憶體以及電子裝置 |
CN114203250B (zh) * | 2021-12-14 | 2022-06-24 | 北京得瑞领新科技有限公司 | 固态存储器的数据存储方法、数据读取方法及固态存储器 |
CN117744075A (zh) * | 2023-12-25 | 2024-03-22 | 国创芯科技(江苏)有限公司 | 一种芯片测试模式防护电路及防护方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5533034A (en) * | 1992-06-26 | 1996-07-02 | Matsushita Electric Industrial Co., Ltd. | High speed data transfer device having improved efficiency |
US5606662A (en) | 1995-03-24 | 1997-02-25 | Advanced Micro Devices, Inc. | Auto DRAM parity enable/disable mechanism |
EP0862762B1 (de) * | 1996-08-16 | 2002-10-09 | Tokyo Electron Device Limited | Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur |
JP3268732B2 (ja) | 1996-10-21 | 2002-03-25 | 株式会社東芝 | 不揮発性半導体メモリ |
JPH10198608A (ja) * | 1997-01-08 | 1998-07-31 | Mitsubishi Electric Corp | メモリカード |
US6185718B1 (en) | 1998-02-27 | 2001-02-06 | International Business Machines Corporation | Memory card design with parity and ECC for non-parity and non-ECC systems |
US20020029365A1 (en) * | 1998-12-17 | 2002-03-07 | Yoshimichi Sato | Information processing apparatus |
US6872993B1 (en) | 1999-05-25 | 2005-03-29 | Micron Technology, Inc. | Thin film memory device having local and external magnetic shielding |
EP1297533B1 (de) | 2000-06-23 | 2008-08-27 | Nxp B.V. | Magnetischer speicher |
JP4726290B2 (ja) * | 2000-10-17 | 2011-07-20 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
US6611455B2 (en) * | 2001-04-20 | 2003-08-26 | Canon Kabushiki Kaisha | Magnetic memory |
JP4059473B2 (ja) * | 2001-08-09 | 2008-03-12 | 株式会社ルネサステクノロジ | メモリカード及びメモリコントローラ |
JP3866567B2 (ja) * | 2001-12-13 | 2007-01-10 | 株式会社東芝 | 半導体記憶装置及びその製造方法 |
US20030131277A1 (en) * | 2002-01-09 | 2003-07-10 | Taylor Richard D. | Soft error recovery in microprocessor cache memories |
JP3821066B2 (ja) * | 2002-07-04 | 2006-09-13 | 日本電気株式会社 | 磁気ランダムアクセスメモリ |
US20040059985A1 (en) * | 2002-09-25 | 2004-03-25 | Sharp Guy Bl | Method and apparatus for tracking address of memory errors |
US7206891B2 (en) * | 2002-09-26 | 2007-04-17 | Lsi Logic Corporation | Multi-port memory controller having independent ECC encoders |
-
2004
- 2004-05-26 CN CN2004800153711A patent/CN1799104B/zh not_active Expired - Fee Related
- 2004-05-26 EP EP04744341A patent/EP1634299B1/de not_active Expired - Lifetime
- 2004-05-26 DE DE602004020339T patent/DE602004020339D1/de not_active Expired - Lifetime
- 2004-05-26 JP JP2006508454A patent/JP2006526833A/ja not_active Withdrawn
- 2004-05-26 US US10/559,174 patent/US7529987B2/en active Active
- 2004-05-26 AT AT04744341T patent/ATE427550T1/de not_active IP Right Cessation
- 2004-05-26 WO PCT/IB2004/050774 patent/WO2004109704A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2004109704A1 (en) | 2004-12-16 |
EP1634299A1 (de) | 2006-03-15 |
CN1799104B (zh) | 2011-07-13 |
DE602004020339D1 (de) | 2009-05-14 |
CN1799104A (zh) | 2006-07-05 |
US20060155882A1 (en) | 2006-07-13 |
EP1634299B1 (de) | 2009-04-01 |
US7529987B2 (en) | 2009-05-05 |
JP2006526833A (ja) | 2006-11-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |