ATE407430T1 - Optische vorrichtung zur messung von modulierten lichtsignalen - Google Patents

Optische vorrichtung zur messung von modulierten lichtsignalen

Info

Publication number
ATE407430T1
ATE407430T1 AT05021500T AT05021500T ATE407430T1 AT E407430 T1 ATE407430 T1 AT E407430T1 AT 05021500 T AT05021500 T AT 05021500T AT 05021500 T AT05021500 T AT 05021500T AT E407430 T1 ATE407430 T1 AT E407430T1
Authority
AT
Austria
Prior art keywords
signal light
light path
interferometer
probe
detector
Prior art date
Application number
AT05021500T
Other languages
English (en)
Inventor
Nenad Ocelic
Rainer Hillenbrand
Original Assignee
Max Planck Gesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft filed Critical Max Planck Gesellschaft
Application granted granted Critical
Publication of ATE407430T1 publication Critical patent/ATE407430T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/005Reproducing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1387Means for guiding the beam from the source to the record carrier or from the record carrier to the detector using the near-field effect

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biophysics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
AT05021500T 2005-09-30 2005-09-30 Optische vorrichtung zur messung von modulierten lichtsignalen ATE407430T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05021500A EP1770714B1 (de) 2005-09-30 2005-09-30 Optische Vorrichtung zur Messung von modulierten Lichtsignalen

Publications (1)

Publication Number Publication Date
ATE407430T1 true ATE407430T1 (de) 2008-09-15

Family

ID=35311504

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05021500T ATE407430T1 (de) 2005-09-30 2005-09-30 Optische vorrichtung zur messung von modulierten lichtsignalen

Country Status (6)

Country Link
US (1) US7738115B2 (de)
EP (1) EP1770714B1 (de)
AT (1) ATE407430T1 (de)
DE (1) DE602005009540D1 (de)
ES (1) ES2313179T3 (de)
WO (1) WO2007039210A1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8705040B2 (en) * 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
US10955327B2 (en) * 2004-03-06 2021-03-23 Michael Trainer Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light
US7933025B2 (en) * 2006-12-18 2011-04-26 Zygo Corporation Sinusoidal phase shifting interferometry
JP5183989B2 (ja) * 2007-07-19 2013-04-17 株式会社ミツトヨ 形状測定装置
FR2922307B1 (fr) * 2007-10-10 2017-03-24 Centre Nat Rech Scient Procede et dispositif de caracterisation d'elements microscopiques
US8564961B2 (en) 2007-11-30 2013-10-22 Apple Inc. Methods and apparatus for providing holes through portions of a housing of an electronic device
CN101620357B (zh) * 2008-07-02 2012-06-13 昂纳信息技术(深圳)有限公司 一种光信号解调器和解调方法
US8004750B1 (en) * 2008-09-07 2011-08-23 Optoplex Corporation Multiple-FSR DPSK demodulator
US20140223612A1 (en) * 2013-02-05 2014-08-07 Asylum Corporation Modular Atomic Force Microscope
US10908084B2 (en) * 2008-10-14 2021-02-02 Timothy M. Ragan Devices and methods for direct-sampling analog time-resolved detection
US7948637B2 (en) * 2009-03-20 2011-05-24 Zygo Corporation Error compensation in phase shifting interferometry
US20110043814A1 (en) * 2009-08-24 2011-02-24 Raytheon Company Ultra stable short pulse remote sensor
KR101691560B1 (ko) * 2009-11-24 2017-01-10 삼성디스플레이 주식회사 표시기판 및 이의 제조방법
DE102010013829A1 (de) * 2010-03-26 2011-09-29 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zur Erfassung von Probenlicht
EP2678695A2 (de) 2011-02-23 2014-01-01 RHK Technology Inc. Integriertes mikroskop sowie zugehörige verfahren und vorrichtungen
EP2613159A1 (de) 2012-01-05 2013-07-10 Neaspec GmbH Messverfahren eines Nahfeldsignals
US8665434B2 (en) 2012-06-04 2014-03-04 Empire Technology Development Llc Integrated Raman spectroscopy detector
US8646110B1 (en) * 2012-11-27 2014-02-04 Xiaoji Xu Method to obtain absorption spectra from near-field infrared scattering using homodyne detection
US9658247B2 (en) 2013-03-15 2017-05-23 Anasys Instruments Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
US9778282B2 (en) * 2013-03-15 2017-10-03 Anasys Instruments Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
CN107860944B (zh) * 2013-03-15 2019-04-30 布鲁克纳米股份有限公司 使用归一化近场光谱对样品的化学纳米识别
FR3010555B1 (fr) * 2013-09-11 2019-12-20 Universite De Technologie De Troyes Procede electronique d'extraction de l'amplitude et de la phase d'un signal dans une detection synchrone et son application dans des montages interferometriques.
EP3108262B1 (de) * 2014-02-19 2019-04-03 Bruker Nano, Inc. Feldabbildung und fokuspunktsverfolgung für s-snom
EP3067701A1 (de) 2015-03-13 2016-09-14 Asociación-centro De Investigación Cooperativa En Nanociencias - CIC Nanogune Optisches Nahfeldmikroskop zur Erfassung von Spektren
CA2979031C (en) 2015-04-13 2021-04-13 Halliburton Energy Services, Inc. Modulating downhole reflector
US10228389B2 (en) * 2015-12-02 2019-03-12 Bruker Nano, Inc. Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
WO2017095427A1 (en) * 2015-12-03 2017-06-08 Halliburton Energy Services, Inc. Downhole telemetry using adaptive feedback
US10241131B2 (en) * 2016-08-28 2019-03-26 Bruker Nano, Inc. Method and apparatus for chemical and optical imaging with a broadband source
EP3404424A1 (de) * 2017-05-15 2018-11-21 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Rastersondenmikroskopiesystem und verfahren zur abbildung von nanostrukturen auf der oberfläche einer probe
EP3743732A4 (de) 2018-01-22 2021-09-15 Lehigh University System und verfahren für eine optische rasternahfeldmikroskopie mit non-tapping-modus
US11391834B2 (en) * 2018-02-28 2022-07-19 Illusense, Inc. Method and device for interferometric range measurements
KR20210013577A (ko) 2018-05-18 2021-02-04 더 리젠츠 오브 더 유니버시티 오브 미시건 주파수 변조 간섭계를 위한 경로 변동 모니터링
US11493323B2 (en) * 2019-01-03 2022-11-08 The Board Of Trustees Of The University Of Illinois Infrared-optical hybrid imaging technology for all-digital histopathology
JP6834116B2 (ja) * 2020-02-26 2021-02-24 株式会社東京精密 距離測定装置及び距離測定方法
CN111693133B (zh) * 2020-06-24 2022-04-15 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) 光纤水听器光程差测试装置、方法、计算机设备
EP3940393A1 (de) 2020-07-17 2022-01-19 attocube systems AG Verfahren zur referenzierung einer nahfeldmessung mit drift- und fluktuationskorrektur
CN114184276A (zh) * 2021-11-05 2022-03-15 深圳华迈兴微医疗科技有限公司 一种基于光纤的多通道采光方法及装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2704601B2 (ja) * 1993-04-12 1998-01-26 セイコーインスツルメンツ株式会社 走査型近視野原子間力顕微鏡、及びその顕微鏡に使用されるプローブ、及びそのプローブの製造方法
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
WO1996003641A1 (en) * 1994-07-28 1996-02-08 Kley Victor B Scanning probe microscope assembly
US6339217B1 (en) * 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
US5565987A (en) * 1995-03-23 1996-10-15 Anvik Corporation Fabry-Perot probe profilometer having feedback loop to maintain resonance
US5623339A (en) * 1995-08-04 1997-04-22 International Business Machines Corporation Interferometric measuring method based on multi-pole sensing
US5939709A (en) * 1997-06-19 1999-08-17 Ghislain; Lucien P. Scanning probe optical microscope using a solid immersion lens
DE10035134B4 (de) * 2000-07-19 2006-06-01 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zur optischen Nahfeldmikroskopie
US6667809B2 (en) * 2000-07-27 2003-12-23 Zetetic Institute Scanning interferometric near-field confocal microscopy with background amplitude reduction and compensation
US6643012B2 (en) * 2001-02-23 2003-11-04 National University Of Singapore Apertureless near-field scanning raman microscopy using reflection scattering geometry
JP4076792B2 (ja) * 2001-06-19 2008-04-16 独立行政法人科学技術振興機構 カンチレバーアレイ、その製造方法及びその装置
US6718821B1 (en) * 2001-11-07 2004-04-13 Sandia Corporation Laser interferometry force-feedback sensor for an interfacial force microscope
US6650420B2 (en) * 2002-02-27 2003-11-18 The United States Of America As Represented By The Secretary Of The Navy Nanoscale vibrometric measurement apparatus and method
DE10228123B4 (de) * 2002-06-24 2011-09-15 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtungen zur Erfassung von optischen Nahfeldwechselwirkungssignalen
JP3958206B2 (ja) * 2002-12-27 2007-08-15 独立行政法人科学技術振興機構 マルチカンチレバーの振動周波数の計測方法及び装置
US6985223B2 (en) * 2003-03-07 2006-01-10 Purdue Research Foundation Raman imaging and sensing apparatus employing nanoantennas
JP2008051556A (ja) * 2006-08-22 2008-03-06 Sii Nanotechnology Inc 光学式変位検出機構及びそれを用いた表面情報計測装置
JP5122775B2 (ja) * 2006-08-23 2013-01-16 株式会社ミツトヨ 測定装置
US8156568B2 (en) * 2007-04-27 2012-04-10 Picocal, Inc. Hybrid contact mode scanning cantilever system
US8402819B2 (en) * 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
JP5183989B2 (ja) * 2007-07-19 2013-04-17 株式会社ミツトヨ 形状測定装置

Also Published As

Publication number Publication date
WO2007039210A1 (en) 2007-04-12
ES2313179T3 (es) 2009-03-01
EP1770714B1 (de) 2008-09-03
DE602005009540D1 (de) 2008-10-16
US20080285041A1 (en) 2008-11-20
US7738115B2 (en) 2010-06-15
EP1770714A1 (de) 2007-04-04

Similar Documents

Publication Publication Date Title
ATE407430T1 (de) Optische vorrichtung zur messung von modulierten lichtsignalen
CN105136175B (zh) 一种基于自混频技术的相位敏感光时域反射***
CN109141490B (zh) 一种扰动波形和位置同时测量的光纤传感装置和解调方法
WO2009064670A3 (en) Interferometer utilizing polarization scanning
JP6241283B2 (ja) レーダ装置および距離速度測定方法
DE602005027852D1 (de) Optischer phasenschieber auf basis einer gemusterten drehscheibe für optische spektralbereichskohärenztomografie
CN101893562B (zh) 基于数字式微滴进样通道的高灵敏度集成光波导传感器件
ATE464004T1 (de) Optischer blutflussmesser unter verwendung von selbstmisch-dopplereffekt
WO2007056772A3 (en) Modulation cancellation method in laser spectroscopy
CN104330104A (zh) 一种干涉型传感器臂长差的测量装置
WO2013188914A1 (en) Sensitive rapid response optical sensor and method
EP1136811A4 (de) Verfahren und vorrichtung zur messung der inneren eigenschaften eines streuenden absorbers
CN110411334B (zh) 一种改进的相位载波pgc解调方法及***
US8630551B2 (en) Method and system for characterizing an optical device
CN111751845B (zh) 用于气体检测的激光雷达频率锁定装置及方法
WO2003060422A3 (de) Interferometrische optische anordnung
WO2002010705A3 (en) Electromagnetic and optical analyzer
DE50307538D1 (de) Faseroptischer stromsensor mit mehreren sensorköpfen
ATE456022T1 (de) Verfahren zur interferenzmessung und vorrichtung zur interferenzmessung
CA2743694C (en) Method and device for spatially resolved measuring of a physical variable
US7688451B2 (en) Heterodyne interferometer having an optical modulator
JP4213877B2 (ja) マッハツェンダ干渉計光センサ
WO2006125162A3 (en) Surface and subsurface detection sensor
DE60239083D1 (de) Apparat und verfahren zur messung der chromatischen dispersion bei variablen wellenlängen
RU2120617C1 (ru) Оптический влагомер

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties