ATE245835T1 - Fehlerkorrekturschaltung und verfahren in einer speichereinrichtung - Google Patents
Fehlerkorrekturschaltung und verfahren in einer speichereinrichtungInfo
- Publication number
- ATE245835T1 ATE245835T1 AT00935982T AT00935982T ATE245835T1 AT E245835 T1 ATE245835 T1 AT E245835T1 AT 00935982 T AT00935982 T AT 00935982T AT 00935982 T AT00935982 T AT 00935982T AT E245835 T1 ATE245835 T1 AT E245835T1
- Authority
- AT
- Austria
- Prior art keywords
- error correction
- correction circuit
- memory device
- error
- detect
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
- G11B20/10—Digital recording or reproducing
- G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Signal Processing (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
- Error Detection And Correction (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/314,574 US6584594B1 (en) | 1999-05-18 | 1999-05-18 | Data pre-reading and error correction circuit for a memory device |
US09/314,575 US6438726B1 (en) | 1999-05-18 | 1999-05-18 | Method of dual use of non-volatile memory for error correction |
US09/314,576 US6360347B1 (en) | 1999-05-18 | 1999-05-18 | Error correction method for a memory device |
PCT/US2000/013385 WO2000070459A1 (en) | 1999-05-18 | 2000-05-16 | Error correction circuit and method for a memory device |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE245835T1 true ATE245835T1 (de) | 2003-08-15 |
Family
ID=27405731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT00935982T ATE245835T1 (de) | 1999-05-18 | 2000-05-16 | Fehlerkorrekturschaltung und verfahren in einer speichereinrichtung |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1192544B1 (de) |
JP (1) | JP2002544622A (de) |
KR (1) | KR20020007414A (de) |
AT (1) | ATE245835T1 (de) |
DE (1) | DE60004057D1 (de) |
TW (1) | TW479223B (de) |
WO (1) | WO2000070459A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100634414B1 (ko) | 2004-09-06 | 2006-10-16 | 삼성전자주식회사 | 에러 검출용 패러티 발생기를 구비한 낸드 플래시 메모리 장치 및 그것의 에러 검출 방법 |
CN101558394B (zh) * | 2006-09-06 | 2013-06-19 | 极速决件有限公司 | 用来保护内容的方法、***和介质 |
US8135935B2 (en) * | 2007-03-20 | 2012-03-13 | Advanced Micro Devices, Inc. | ECC implementation in non-ECC components |
JP2012155541A (ja) | 2011-01-26 | 2012-08-16 | Toshiba Corp | データ記憶装置、メモリ制御装置及びメモリ制御方法 |
EP2608036A1 (de) | 2011-12-22 | 2013-06-26 | Thomson Licensing | Verfahren und System zum Verwalten der Fehlererkennung und -korrektur |
KR101361238B1 (ko) * | 2012-06-05 | 2014-02-25 | 한국과학기술원 | 간섭 채널 환경에서의 오류 정정 방법 및 회로, 이를 이용한 플래시 메모리 장치 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2830308B2 (ja) * | 1990-02-26 | 1998-12-02 | 日本電気株式会社 | 情報処理装置 |
JP3272903B2 (ja) * | 1995-03-16 | 2002-04-08 | 株式会社東芝 | 誤り訂正検出回路と半導体記憶装置 |
-
2000
- 2000-05-16 AT AT00935982T patent/ATE245835T1/de not_active IP Right Cessation
- 2000-05-16 KR KR1020017014657A patent/KR20020007414A/ko not_active Application Discontinuation
- 2000-05-16 JP JP2000618835A patent/JP2002544622A/ja not_active Withdrawn
- 2000-05-16 EP EP00935982A patent/EP1192544B1/de not_active Expired - Lifetime
- 2000-05-16 DE DE60004057T patent/DE60004057D1/de not_active Expired - Lifetime
- 2000-05-16 WO PCT/US2000/013385 patent/WO2000070459A1/en active IP Right Grant
- 2000-05-18 TW TW089109515A patent/TW479223B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2002544622A (ja) | 2002-12-24 |
WO2000070459A1 (en) | 2000-11-23 |
DE60004057D1 (de) | 2003-08-28 |
TW479223B (en) | 2002-03-11 |
EP1192544B1 (de) | 2003-07-23 |
KR20020007414A (ko) | 2002-01-26 |
EP1192544A1 (de) | 2002-04-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |