ATE14932T1 - Spektrometrie-vorrichtung. - Google Patents

Spektrometrie-vorrichtung.

Info

Publication number
ATE14932T1
ATE14932T1 AT83400003T AT83400003T ATE14932T1 AT E14932 T1 ATE14932 T1 AT E14932T1 AT 83400003 T AT83400003 T AT 83400003T AT 83400003 T AT83400003 T AT 83400003T AT E14932 T1 ATE14932 T1 AT E14932T1
Authority
AT
Austria
Prior art keywords
bundle
grating
polychromatic light
monochromatic
visible
Prior art date
Application number
AT83400003T
Other languages
English (en)
Inventor
Alain Thevenon
Original Assignee
Instruments Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Instruments Sa filed Critical Instruments Sa
Application granted granted Critical
Publication of ATE14932T1 publication Critical patent/ATE14932T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/20Rowland circle spectrometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Polarising Elements (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
AT83400003T 1982-01-04 1983-01-03 Spektrometrie-vorrichtung. ATE14932T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8200018A FR2519427A1 (fr) 1982-01-04 1982-01-04 Dispositif de spectrometrie
EP83400003A EP0083573B1 (de) 1982-01-04 1983-01-03 Spektrometrie-Vorrichtung

Publications (1)

Publication Number Publication Date
ATE14932T1 true ATE14932T1 (de) 1985-08-15

Family

ID=9269694

Family Applications (1)

Application Number Title Priority Date Filing Date
AT83400003T ATE14932T1 (de) 1982-01-04 1983-01-03 Spektrometrie-vorrichtung.

Country Status (6)

Country Link
US (1) US4571074A (de)
EP (1) EP0083573B1 (de)
JP (1) JPS58120135A (de)
AT (1) ATE14932T1 (de)
DE (1) DE3360528D1 (de)
FR (1) FR2519427A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19861479B4 (de) * 1998-11-21 2016-02-25 Spectro Analytical Instruments Gmbh Simultanes Doppelgitter-Spektrometer mit Halbleiterzeilensensoren oder Photoelektronenvervielfachern

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR900005331B1 (ko) * 1987-05-30 1990-07-27 주식회사 금성사 무기질원소 농도측정장치
US4820048A (en) * 1987-11-19 1989-04-11 The Perkin-Elmer Corporation Detector for a spectrometer
JPH0619079Y2 (ja) * 1988-04-28 1994-05-18 オリンパス光学工業株式会社 自動分析装置における分光装置
US4925305A (en) * 1988-12-01 1990-05-15 Erickson Ronald R Method for the preservation of wheat and device useful therefore
FI90592C (fi) * 1989-02-16 1994-02-25 Anadis Instr Sa IR-spektrometrinen analysointimenetelmä sekä IR-spektrometri
US5070246A (en) * 1989-09-22 1991-12-03 Ada Technologies, Inc. Spectrometer for measuring the concentration of components in a fluid stream and method for using same
US5272345A (en) * 1989-09-22 1993-12-21 Ada Technologies, Inc. Calibration method and apparatus for measuring the concentration of components in a fluid
US5373359A (en) * 1992-09-18 1994-12-13 J. A. Woollam Co. Ellipsometer
US5504582A (en) * 1992-09-18 1996-04-02 J. A. Woollam Co. Inc. System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
US5521706A (en) * 1992-09-18 1996-05-28 J. A. Woollam Co. Inc. System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
EP0711993A4 (de) * 1993-07-26 1997-09-10 Kawasaki Steel Co Vorrichtung und verfahren zur spektralen analyse einer emission
DE19635046A1 (de) * 1996-08-29 1998-03-05 Nis Ingenieurgesellschaft Mbh Spektralanalytische Vorrichtung und Verfahren zur Bestimmung von Elementzusammensetzungen und -konzentrationen
DE19853754B4 (de) 1998-11-21 2009-06-10 Spectro Analytical Instruments Gmbh Simultanes Doppelgitter-Spektrometer mit Halbleiterzeilensensoren oder Photoelektronenvervielfachern
AU2001252085A1 (en) * 2000-06-27 2002-01-08 Alberta Research Council Inc. Multiple pathlength spectrophotometer
KR20020013061A (ko) * 2000-08-10 2002-02-20 조기환 다중 슬릿을 이용한 분광 측정 방법과 이를 이용한 다중채널 분광기
DE10137428A1 (de) * 2001-07-27 2003-02-20 Karlsruhe Forschzent Vorrichtung zur Messung eines Spektrums
US9612155B2 (en) 2004-03-20 2017-04-04 Electronic Photonic Ic Inc. (Epic Inc.) Curved grating spectrometer and wavelength multiplexer or demultiplexer with very high wavelength resolution
US8462338B1 (en) * 2004-03-20 2013-06-11 Seng-Tiong Ho Curved grating spectrometer and wavelength multiplexer or demultiplexer with very high wavelength resolution
DE102007027008A1 (de) * 2007-06-08 2008-12-11 Spectro Analytical Instruments Gmbh & Co. Kg Spektrometer mit Festkörpersensoren und Sekundärelektronenvervielfachern
DE102007027010B4 (de) * 2007-06-08 2023-02-16 Spectro Analytical Instruments Gmbh Spektrometeroptik mit nicht-sphärischen Spiegeln
JP5335729B2 (ja) 2010-04-01 2013-11-06 浜松ホトニクス株式会社 分光モジュール
JP5325829B2 (ja) * 2010-04-01 2013-10-23 浜松ホトニクス株式会社 分光モジュール
JP5567887B2 (ja) * 2010-04-23 2014-08-06 オリンパス株式会社 分光装置
RU2476834C1 (ru) * 2011-07-05 2013-02-27 Федеральное государственное унитарное предприятие "Научно-производственная корпорация "Государственный оптический институт им. С.И. Вавилова" Дифракционный полихроматор
WO2014117258A1 (en) * 2013-02-01 2014-08-07 Tornado Medical Systems Inc. Multi backend ultra-broadband dispersive spectrometer
CN107148561B (zh) 2014-09-10 2019-01-11 电子光子集成电路股份有限公司 具有极高波长分辨率的曲线光栅光谱仪和波长复用器或解复用器
CN106896058A (zh) * 2015-12-18 2017-06-27 无锡市金义博仪器科技有限公司 一种多基体分析装置
CN106018315B (zh) * 2016-05-17 2018-09-11 天津大学 一种基于罗兰光栅的发动机排放气体分析仪
CA3096129A1 (en) 2018-04-25 2019-10-31 National Research Council Of Canada High resolution and high throughput spectrometer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3472595A (en) * 1965-06-15 1969-10-14 Shimadzu Corp Diffraction grating spectrophotometer
US3523734A (en) * 1967-12-18 1970-08-11 Fisher Scientific Co Diffraction grating spectrometer wherein the grating has first and second groups of grooves
FR2334947A1 (fr) * 1975-12-10 1977-07-08 Instruments Sa Spectographe a champ plan pour un domaine spectral etendu utilisant un reseau holographique concave
US4250465A (en) * 1978-08-29 1981-02-10 Grumman Aerospace Corporation Radiation beam deflection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19861479B4 (de) * 1998-11-21 2016-02-25 Spectro Analytical Instruments Gmbh Simultanes Doppelgitter-Spektrometer mit Halbleiterzeilensensoren oder Photoelektronenvervielfachern

Also Published As

Publication number Publication date
DE3360528D1 (en) 1985-09-19
JPH0339572B2 (de) 1991-06-14
EP0083573B1 (de) 1985-08-14
US4571074A (en) 1986-02-18
FR2519427B1 (de) 1984-04-06
FR2519427A1 (fr) 1983-07-08
JPS58120135A (ja) 1983-07-16
EP0083573A1 (de) 1983-07-13

Similar Documents

Publication Publication Date Title
FR2519427B1 (de)
US3885879A (en) Dual beam spectrophotometer utilizing a spectral wedge and bifurcated fiber optic bundle
US6774368B2 (en) Dispersive near-infrared spectrometer with automatic wavelength calibration
US5128549A (en) Stray radiation compensation
EP0174722B1 (de) Fluorimeter
US5908789A (en) Analysis of gas mixtures with an infrared method
US6643016B2 (en) Multiple pathlength spectrophotometer
KR930013777A (ko) 공간 광 변조기 분광기 및 광 분석 방법
EP0756169A3 (de) Spektralmessgerät und automatisches Analysenmessgerät
US20050236563A1 (en) Dispersive near-infrared spectrometer with automatic wavelength calibration
KR20110127122A (ko) 시료분석장치
ES2070883T3 (es) Procedimiento y medios de analisis espectrometrico infrarrojo.
JPH07128144A (ja) 分光測定装置
JPH0619079Y2 (ja) 自動分析装置における分光装置
JPS5760231A (en) Multi-wavelength spectrometer
US3247758A (en) Dual monochromator system
FR2519426B1 (fr) Dispositif optique pour un spectrometre d'emission
JPH0219897B2 (de)
JPS63250534A (ja) 分光測光器
JPS6459018A (en) Method and measuring instrument for long time resolution total reflection spectrum analyzing
GB2113833A (en) Gas analysis apparatus and method of operation
KR960006627Y1 (ko) 중첩 다격자 스펙트로그래프
JPS5929804B2 (ja) 分光器
JPH06109539A (ja) 光測定装置
JPH0415408B2 (de)

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee