WO2006008691A1 - Method and apparatus for generating radially and/or azimuthally polarized light beams. - Google Patents
Method and apparatus for generating radially and/or azimuthally polarized light beams. Download PDFInfo
- Publication number
- WO2006008691A1 WO2006008691A1 PCT/IB2005/052284 IB2005052284W WO2006008691A1 WO 2006008691 A1 WO2006008691 A1 WO 2006008691A1 IB 2005052284 W IB2005052284 W IB 2005052284W WO 2006008691 A1 WO2006008691 A1 WO 2006008691A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light beam
- generating
- birefringent material
- converging
- mode
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 16
- 230000003287 optical effect Effects 0.000 claims abstract description 52
- 239000000463 material Substances 0.000 claims abstract description 26
- 230000000903 blocking effect Effects 0.000 claims description 4
- 238000000386 microscopy Methods 0.000 abstract 1
- 230000010287 polarization Effects 0.000 description 27
- 210000001747 pupil Anatomy 0.000 description 9
- 239000010453 quartz Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 4
- 239000011149 active material Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229920000106 Liquid crystal polymer Polymers 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004624 confocal microscopy Methods 0.000 description 1
- 230000021615 conjugation Effects 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70566—Polarisation control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/08—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of polarising materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S359/00—Optical: systems and elements
- Y10S359/90—Methods
Definitions
- the present invention relates to a method and an apparatus for generating radially and/or azimuthally polarized light beams. Particularly, the present invention relates to a method and an apparatus for generating a light beam having a relatively narrow focal spot on the basis of the mentioned polarization of the light beam.
- the polarization is taken to be uniform across the pupil of the system, and either linear or circular.
- a non-uniform polarization state alters the distribution of light close to the focal point.
- a beam with a radially oriented linear polarization across the pupil is reported to result in a relatively narrow focal spot (cf. R. Dorn, S. Quabis, and G. Leuchs, Sharper focus for a radially polarized light beam, Physical Review Letters, Volume 91, 233901, 2003).
- apodization the polarization state across the focal spot is substantially linear and oriented along the optical axis of the system.
- An object of the present invention is to provide a light beam with a desired linear polarization across the pupil with simple means, and particularly with a radially oriented linear polarization across the pupil.
- a method of generating a polarized light beam to be projected onto an object plane comprising the steps of: generat-ing a converging or diverging light beam; and projecting the converging or diverging light beam through a member comprising a uniaxial birefringent material, the uniaxial birefrin-gent material having a symmetry axis essentially parallel to the optical axis of the light beam, and the member being placed at a distance from the object plane.
- Birefringent materials have a refractive index that depends on the polarization state of light. For example, when the polarization is along the symmetry axis of the uniaxially birefringent material, the refractive index is ne, and when the polarization is perpendicular to the symmetry axis, the refractive index is no, where no and ne are called the ordinary and extraordinary refractive index, respectively.
- the polarized state perpendicular to the plane spanned by the propagation direction and the symmetry axis is referred to as the ordinary mode and has a refractive index no;
- the polarization state in the plane spanned by the propagation direction and the symmetry axis is referred to as the extraordinary mode and has a refractive index depending on the
- light that traveled through the uniaxial birefringent material comprises an extraordinary mode and an ordinary mode, the modes having different focal points, and a spatial filter is provided for substantially blocking one of these modes.
- a plan-parallel slab is used as the object comprising a uniaxially birefringent material, both the extraordi ⁇ nary and the ordinary modes are generated by passing through the object. In the case that only one of these modes is to be used for optical data processing, it is advantageous, to filter out the other mode, thereby reducing the background in the resulting image.
- the ordinary mode is blocked by the spatial filter, thereby generating a radially polarized beam that passed the filter. Focusing of such a radially polarized beam results in a relatively narrow focal spot.
- the extraordinary mode is blocked by the spatial filter, thereby generating an azimuthally polarized beam that passed the filter
- the method further comprises the step of: placing a ⁇ /2 rotator into the azimuthally polarized beam, thereby generating a radially polarized beam that passed the ⁇ /2 rotator.
- a radially polarized beam is obtained, leading to the mentioned advantages as to focusing.
- an apodizer is placed into a radially polarized beam.
- An apodizer blocks the central part of the pupil. Thereby, a polarization state across the focal spot is obtained that is substantially linear and oriented along the optical axis of the system.
- a further embodiment of the method according to the invention comprises the steps of: providing a member comprising a uniaxial birefringent material having a thickness d that varies with the angle of incidence ⁇ i according to
- the mem-ber is designed as a birefringent layer with a symmetry axis substantially parallel to the optical axis, irradiated by a converging or diverging beam of circularly polarized light, which introduces a retardation of a quarter wave length between the azimuthally polarized and the radially polarized component of the beam.
- the thickness of the birefringent layer varies as a function of the angle as described above.
- the birefringent layer creates a linear polarization profile having an angle of 45 degrees with the radial direction for all rays in the converging or diverging cone of light.
- a rotator that rotates the polariza-tion over 45 degrees, e.g. a slab of an optically active material, such as quartz, a radially polarized or azimuthally polarized beam is created.
- the solution discussed here has the advantage that no light is lost for the optical data processing.
- an appa-ratus for generating a polarized light beam to be projected onto an object plane comprising: means for generating a converging or diverging light beam; a member comprising a uniaxial birefringent material located in the converging or diverging light beam, the uniaxial bire ⁇ fringent material having a symmetry axis essentially parallel to the optical axis of the con ⁇ verging or diverging light beam, the member being further located at a distance from the object plane.
- a member comprising a uniaxial birefringent material adapted to be placed into a converging or diverging light beam, the member having a thickness d that varies with the angle of inci ⁇ dence ⁇ i according to
- ⁇ is the wavelength of the light
- no is the refractive index for the ordinary mode
- ne is the refractive index for the extraordinary mode
- the present invention further relates to an optical device comprising an apparatus according to the present invention..
- Figure 1 shows an optical setup for defining basic terms to be used for explaining the present invention
- FIGS. 2a and 2b show cross sections through light beams in which radial and azimuthal polarizations are indicated, respectively;
- Figure 3 shows an optical setup for illustrating the present invention
- Figure 4 shows a further optical setup for illustrating the present invention
- - Figure 5 shows an apparatus according to the present invention
- Figure 6 shows an optical member according to one embodiment of the present invention
- Figure 7 shows an optical setup for illustrating the present invention.
- Figure 8 shows a flow chart illustrating a method according to the present invention.
- Figure 1 shows an optical setup for defining basic terms to be used for explaining the present invention.
- a light beam 10 travels parallel to an optical axis 12 and is incident on a lens 14 with a pupil plane 16.
- the converging beam of light is focused onto a layer 20, for example the data layer of an optical disk.
- Figures 2a and 2b show cross sections through light beams in which radial and azimuthal polarizations are indicated, respectively.
- Figure 2a shows a radially polarized beam
- Figure 2b shows an azimuthally polarized beam
- Figure 3 shows an optical setup for illustrating the present invention.
- a light beam 10 travels parallel to an optical axis 12 and is incident on a first lens 14 of a telescope.
- the lens 14 generates a converging light beam 18 which passes through a uniaxial birefringent slab 22 having a symmetry axis parallel to the optical axis 12. This results into a splitting of the converging light beam 18 into the extraordinary light beam 24 and the ordinary light beam 26.
- the extraordinary light beam 24 has a first focal point 28, and the ordinary light beam 26 has a second focal point 30.
- a spatial filter 32 blocks the ordinary mode, and a second lens 34 of the telescope generates a parallel light beam 36.
- the spatial filter is realized as a pinhole.
- This parallel light beam 36 is an essentially radially polarized light beam.
- Figure 4 shows a further optical setup for illustrating the present invention.
- the optical setup according to Figure 4 largely corresponds to the optical setup shown in Figure 3.
- the spatial filter according to Figure 4 is realized as a small obscuration 38 at the focus of the ordinary light beam 26.
- the central part, i.e. the rays close to the optical axis 12, of the extraordinary mode is blocked.
- the obscuration 38 also functions as an apodizer.
- Figures 3 and 4 show embodiments in which the ordinary mode is blocked by the spatial filters 32 and 38, respectively.
- the roles of the ordinary mode and the extraordinary mode are changed, i.e. the extraordinary mode is blocked and the ordinary mode passes the spatial filter.
- the beam directly after the telescope is azimuthally polarized. It is possible to transform this azimuthally polarized beam into a radially polarized beam by a uniform ⁇ /2 polarization rotator that is placed in the parallel beam directly after the telescope.
- a polarization rotator plate is for example a uniform slab of optically active material such as quartz of the thickness needed to produce the ⁇ /2 rotation.
- Figure 5 shows an apparatus according to the present invention.
- the telescope used in the arrangement according to Figure 5 corresponds to the telescope shown in Figure 3.
- the parallel beam that leave the lens 34 is either radially or azimuthally polarized.
- a ⁇ /2 rotator 40 is placed into the parallel beam 36, thereby producing a radially polarized beam.
- This radially polarized beam is focused onto an object plane 46 by an objective lens 44.
- an apodizer 48 is placed in front of the objective lens 44.
- the focus spot 50 thus produced results from a radially polarized beam and has a substantially linear polarization parallel to the optical axis 12.
- the birefringent slab is placed into the con ⁇ verging beam directly after the objective lens of the high NA imaging system (optical disc read-out system, scanning microscope, etc.). Now the object is illuminated by both spots. The extraordinary spot is focused onto the data layer/relevant depth slice so that the ordinary spot is defocused. This causes a small, relatively uniform background in the resulting image, which is not so harmful for the extraction of data or the formation of a sharp image.
- the high NA imaging system optical disc read-out system, scanning microscope, etc.
- the reflection due to the ordinary spot can be eliminated by means of a telescope with spatial filter placed in the detection branch of the optical disk readout sys ⁇ tem/scanning microscope, in much the same way as described according to the embodiments of the Figures 3, 4 and 5.
- Figure 6 shows an optical member according to one embodiment of the present invention.
- Figure 7 shows an optical setup for illustrating the present invention.
- a plan-parallel slab of birefringent material is used.
- a part of the light is lost.
- a birefringent layer 52 with a symmetry axis substantially parallel to the optical axis is used that has a thickness varying with the angle of incidence Oi.
- the optical axis 12 and the converging light beam 18 are also shown in Figure 6.
- the thickness of the birefringent layer varies as a function of the angle of incidence according to
- ⁇ is the wavelength of the light
- Xi 0 is the refractive index for the ordinary mode
- n e is the refractive index for the extraordinary mode.
- FIG. 7 the setup with the birefringent layer 52, a lens 54, and a ⁇ /4 rotator 56 is shown. If circularly polarized light is used for irradiating the birefringent layer 52, as shown in the top of Figure 7, a linear polarization profile is created, as shown in the middle of
- the linear polarization makes an angle of 45 degrees with the radial direction for all rays in the con- verging (or diverging) cone of light.
- a rotator that rotates the polarization over 45 degrees (for example a slab of an optical active material such as quartz)
- a radially polarized or azimuthally polarized beam is created.
- a radially polarized beam is shown in the bottom of Figure 7 .
- the advantage of this solution is the fact that no light is lost.
- this setup can also be realized by a solid immersion lens. Since the lens surface is perpendicular to the incoming rays, both the birefringent layer 52 and the rotator 56 can be "deposited" onto the spherical surface of the lens 54.
- the birefringent material used according to the present invention can be a crystal-line medium such as quartz or MgF 2 or a liquid crystalline medium.
- the liquid crystalline medium is preferably a liquid crystalline polymer.
- the spatial filtering with an obscuration is preferred rather than the spatial filtering with a pinhole.
- Figure 8 shows a flow chart illustrating a method according to the present invention to be performed on the basis of e.g. the embodiment shown in Figure 5. According to the embodiment described in Figure 8, a converging light beam is generated (SOl).
- the light beam is projected through a member comprising a uniaxial birefringent material having a symmetry axis essentially parallel to the optical axis of the light beam (S02).
- a member comprising a uniaxial birefringent material having a symmetry axis essentially parallel to the optical axis of the light beam (S02).
- an extraordinary and an ordinary mode is generated.
- the ordinary mode is blocked.
- the extraordinary mode is used for optical purposes, for example for data read-out or confocal microscopy.
- the embodiments of the present invention can be different from the examples shown in the drawings and described above.
- the birefringent material can also be placed into a diverging beam. In this case, the rest of the optical setup has to be adapted accordingly.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Polarising Elements (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/572,008 US7715100B2 (en) | 2004-07-16 | 2005-07-11 | Method and apparatus for generating radically and/or azimuthally polarized light beams |
JP2007520949A JP2008506982A (en) | 2004-07-16 | 2005-07-11 | Method and apparatus for generating a radially and / or azimuthally polarized light beam |
EP05759900A EP1771754A1 (en) | 2004-07-16 | 2005-07-11 | Method and apparatus for generating radially and/or azimuthally polarized light beams. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04300446.4 | 2004-07-16 | ||
EP04300446 | 2004-07-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006008691A1 true WO2006008691A1 (en) | 2006-01-26 |
Family
ID=35355328
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2005/052284 WO2006008691A1 (en) | 2004-07-16 | 2005-07-11 | Method and apparatus for generating radially and/or azimuthally polarized light beams. |
Country Status (7)
Country | Link |
---|---|
US (1) | US7715100B2 (en) |
EP (1) | EP1771754A1 (en) |
JP (1) | JP2008506982A (en) |
KR (1) | KR20070046114A (en) |
CN (1) | CN100445781C (en) |
TW (1) | TW200608056A (en) |
WO (1) | WO2006008691A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8339578B2 (en) | 2004-01-27 | 2012-12-25 | Nikon Corporation | Optical system, exposure system, and exposure method |
CN110082924A (en) * | 2018-12-19 | 2019-08-02 | 浙江理工大学 | A kind of circularly polarized light generating means of the vector beam based on radial polarisation variation |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080186466A1 (en) * | 2005-04-12 | 2008-08-07 | Sirat Gabriel Y | Element for defocusing tm mode for lithography |
US8441639B2 (en) * | 2009-09-03 | 2013-05-14 | Kla-Tencor Corp. | Metrology systems and methods |
US10153838B1 (en) * | 2016-12-28 | 2018-12-11 | Facebook, Inc. | Quad tracker with birefringent optics |
US11346769B2 (en) | 2020-02-20 | 2022-05-31 | Onto Innovation Inc. | Fast generalized multi-wavelength ellipsometer |
US11346768B1 (en) | 2020-12-02 | 2022-05-31 | Onto Innovation Inc. | Vortex polarimeter |
USD989966S1 (en) * | 2021-03-08 | 2023-06-20 | Aleksandr Tarashchansky | Vision therapy device |
Citations (3)
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US20020176166A1 (en) * | 2001-05-22 | 2002-11-28 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Polarizer and microlithography projection system with a polarizer |
US20030234981A1 (en) * | 2001-06-01 | 2003-12-25 | Optical Research Associates | Correction of birefringence in cubic crystalline optical systems |
US20040036971A1 (en) * | 2002-08-22 | 2004-02-26 | Mcguire James P. | Methods for reducing polarization aberration in optical systems |
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US5150234A (en) * | 1988-08-08 | 1992-09-22 | Olympus Optical Co., Ltd. | Imaging apparatus having electrooptic devices comprising a variable focal length lens |
DE59104430D1 (en) * | 1990-03-15 | 1995-03-09 | Werner Fiala | USE OF A MULTIFOCAL DOUBLE BREAKING LENS WITH ADAPTED DOUBLE BREAKAGE. |
NL9100379A (en) | 1991-03-01 | 1992-10-01 | Philips Nv | SIGMA DELTA MODULATOR. |
CN1039745C (en) * | 1992-12-25 | 1998-09-09 | 中国科学院长春光学精密机械研究所 | Real-time one-step double-wavelength holographic interference detection device |
JPH06317764A (en) * | 1993-04-27 | 1994-11-15 | Olympus Optical Co Ltd | Optical low-pass filter |
US6108131A (en) * | 1998-05-14 | 2000-08-22 | Moxtek | Polarizer apparatus for producing a generally polarized beam of light |
JPH11337874A (en) * | 1998-05-27 | 1999-12-10 | Fujitsu Ltd | Light polarizing and synthesizing device and display device using the device |
WO2001048520A1 (en) * | 1999-12-29 | 2001-07-05 | Metrologic Instruments, Inc. | Illumination apparatus with polarizing elements for beam shaping |
US6693711B1 (en) * | 2000-05-15 | 2004-02-17 | Regents Of The University Of Minnesota | Ellipsometer using radial symmetry |
JP2001349872A (en) * | 2000-06-06 | 2001-12-21 | Shimadzu Corp | Magnetic sensor |
-
2005
- 2005-07-11 CN CNB2005800240150A patent/CN100445781C/en not_active Expired - Fee Related
- 2005-07-11 JP JP2007520949A patent/JP2008506982A/en not_active Withdrawn
- 2005-07-11 WO PCT/IB2005/052284 patent/WO2006008691A1/en active Application Filing
- 2005-07-11 US US11/572,008 patent/US7715100B2/en not_active Expired - Fee Related
- 2005-07-11 EP EP05759900A patent/EP1771754A1/en not_active Withdrawn
- 2005-07-11 KR KR1020077003423A patent/KR20070046114A/en not_active Application Discontinuation
- 2005-07-13 TW TW094123747A patent/TW200608056A/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020176166A1 (en) * | 2001-05-22 | 2002-11-28 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Polarizer and microlithography projection system with a polarizer |
US20030234981A1 (en) * | 2001-06-01 | 2003-12-25 | Optical Research Associates | Correction of birefringence in cubic crystalline optical systems |
US20040036971A1 (en) * | 2002-08-22 | 2004-02-26 | Mcguire James P. | Methods for reducing polarization aberration in optical systems |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8339578B2 (en) | 2004-01-27 | 2012-12-25 | Nikon Corporation | Optical system, exposure system, and exposure method |
US8351021B2 (en) | 2004-01-27 | 2013-01-08 | Nikon Corporation | Optical system, exposure system, and exposure method |
US8436983B2 (en) * | 2004-01-27 | 2013-05-07 | Nikon Corporation | Optical system, exposure system, and exposure method |
CN110082924A (en) * | 2018-12-19 | 2019-08-02 | 浙江理工大学 | A kind of circularly polarized light generating means of the vector beam based on radial polarisation variation |
CN110082924B (en) * | 2018-12-19 | 2021-06-29 | 浙江理工大学 | Circular polarized light generating device of vector light beam based on radial polarization change |
Also Published As
Publication number | Publication date |
---|---|
US7715100B2 (en) | 2010-05-11 |
EP1771754A1 (en) | 2007-04-11 |
TW200608056A (en) | 2006-03-01 |
CN1985197A (en) | 2007-06-20 |
US20090040610A1 (en) | 2009-02-12 |
JP2008506982A (en) | 2008-03-06 |
CN100445781C (en) | 2008-12-24 |
KR20070046114A (en) | 2007-05-02 |
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