WO2005119372A1 - Developer for a photopolymer protective layer - Google Patents
Developer for a photopolymer protective layer Download PDFInfo
- Publication number
- WO2005119372A1 WO2005119372A1 PCT/US2005/018990 US2005018990W WO2005119372A1 WO 2005119372 A1 WO2005119372 A1 WO 2005119372A1 US 2005018990 W US2005018990 W US 2005018990W WO 2005119372 A1 WO2005119372 A1 WO 2005119372A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- lower alkyl
- composition
- surfactant
- alkyl
- hydrogen
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0035—Multiple processes, e.g. applying a further resist layer on an already in a previously step, processed pattern or textured surface
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/322—Aqueous alkaline compositions
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0047—Photosensitive materials characterised by additives for obtaining a metallic or ceramic pattern, e.g. by firing
Definitions
- the present invention relates to a composition and a process for its use.
- the composition is a developer that may be applied to a protective layer in the fabrication of electronic devices prepared from thick film pastes.
- the present invention relates to a composition, and a process for its use with a protective layer in fabricating electronic devices.
- the composition is used as a developer.
- a substrate is coated with a conducting layer that is subsequently coated with a thick film paste.
- the thick film paste may contain materials such as glass frits, conductors, photo-imageable polymers and, usually, a solvent.
- a photo-imageable protective layer may be used to isolate a photo-imageable thick film deposit from other elements of these electronic devices such as conductive layers used as electrodes.
- the addition of a small amount of surfactant to the developer improves the developing time and cleanness of the developed image.
- the present invention is particularly useful for developing a protective layer prepared from a photoresist material containing a high level of carboxylic acid.
- One embodiment of the present invention is a composition that includes 0.1 to 10 percent by weight surfactant, and a developing solution selected from the group consisting of a carbonate solution, a sodium hydroxide solution, a potassium hydroxide solution and a tetramethylammonium hydroxide solution.
- Another embodiment of the present invention is a process for dissolving coating material in a coating by exposing the coating to the composition described above.
- the coating may be in the form of a protective layer prepared from a photoresist material .
- the photoresist material may further be prepared from a polymer that includes at least 50 mole percent monomers having a structure selected from the group consisting of:
- Ri is hydrogen or lower alkyl
- R 2 is a lower alkyl
- R 3 is hydrogen or a lower alkyl
- a lower alkyl includes alkyl groups having 1 to 6 linear or cyclic carbon atoms
- Ri is hydrogen or lower alkyl
- R 2 is a lower alkyl
- R 3 and R 4 are independently hydrogen or a lower alkyl
- a lower alkyl includes alkyl groups having 1 to 6 carbon atoms, and the joining of Ri and R 2 , or R x and either R 3 or R 4 , or R 2 and either R 3 or R 4 to form a 5-, 6- or 7-membered ring; and ( C )
- R x is hydrogen or lower alkyl
- R 2 is a lower alkyl
- R 3 and R 4 are independently hydrogen or a lower alkyl
- a lower alkyl includes alkyl groups having 1 to 6 carbon atoms, and the joining of Ri and R 2 , or R x and either R 3 or R 4 , or R 2 and either R 3 or R 4 to form a 5-, 6- or 7-membered ring.
- the present invention provides a composition and a process for its use that is suitable for developing a protective layer, such as a protective layer prepared from a photoresist material containing high levels of carboxylic acid.
- a protective layer such as a protective layer prepared from a photoresist material containing high levels of carboxylic acid.
- photoresist materials can be used in protective layers in connection with the fabrication of electronic devices where thick film paste printing technology is also used.
- Suitable developers for this type of fabrication of electronic devices typically include carbonate solutions, such as a sodium carbonate solution, a sodium hydroxide solution, a potassium hydroxide solution or a tetramethylammonium hydroxide solution.
- carbonate solutions such as a sodium carbonate solution, a sodium hydroxide solution, a potassium hydroxide solution or a tetramethylammonium hydroxide solution.
- a small amount of surfactant in the developer improves the developing time and cleanness of the developed image .
- Novalac-type phenolic formaldehyde polymeric materials are typically used as photoresist materials in a protective layer in the process of fabricating electronic devices from photo-imageable thick film pastes, such as Fodel ® silver paste (from DuPont, Wilmington DE) .
- the role of such a protective layer is to maintain spacing between the thick film deposit and other substrate structures to prevent contamination of the bottom substrate with the thick film paste. As mentioned above, in some cases, contamination of the bottom substrate may lead to short circuits.
- the protective layer is eventually removed by dissolution along with unimaged thick film material. However, these protective layers are frequently found to be damaged during the process of applying the paste materials on the top of the protective layer.
- the cause of the damage is either the dissolution of the protective layer by solvent vapors generated during the paste drying process, or plastic deformation of the photoresist material due to plastization by these vapors.
- Butyl carbitol, butyl carbitol acetate, dibutyl carbitol, dibutyl phthalate, texanol and terpineol are examples of the solvents currently used in thick film paste formulation.
- a suitable, and often preferred, photoresist material includes a polymer in which at least 50 mole percent of the monomers in the polymer comprise a structure selected from the group consisting of: (a)
- Ri is hydrogen or lower alkyl
- R 2 is a lower alkyl
- R 3 is hydrogen or a lower alkyl
- a lower alkyl includes alkyl groups having 1 to 6 linear or cyclic carbon atoms
- R x is hydrogen or lower alkyl
- R 3 and R 4 are independently hydrogen or a lower alkyl
- a lower alkyl includes alkyl groups having 1 to 6 carbon atoms, and the joining of Rx and R 2 , or R x and either R 3 or R 4 , or R 2 and either R 3 or R to form a 5-, 6- or 7-membered ring;
- R x is hydrogen or lower alkyl
- R 2 is a lower alkyl
- R 3 and R 4 are independently hydrogen or a lower alkyl
- a lower alkyl includes alkyl groups having 1 to 6 carbon atoms, and the joining of Ri and R 2 , or R x and either R 3 or R 4 , or R 2 and either R 3 or R 4 to form a 5-, 6- or 7-membered ring.
- the photoresist material typically also includes a photo-acid initiator and/or photo-acid generator.
- the photo-initiator may be selected from conventional photo acid generators, such as aromatic sulfonium phosphofluoride or antimony fluoride, or aromatic iodonium salt with similar anions.
- suitable photo-acid generators are described in a paper by J.V. Crivello, "The Chemistry of Photoacid Generating Compounds" in Polymeric Materials Science and Engineering, Vol. 61, American Chemical Society Meeting, Miami FL, Sect. 11-15, 1989, pp. 62-66 and references therein.
- the selected photo acid generator should not undergo decomposition or dissolution during the development stage.
- Suitable nonionic photoacid generators include those such as PI-105 (Midori Kagaku Co., Tokyo, Japan), or high molecular weight photo acid generators such as Cyracure UVI 6976 (Dow Chemical, Midland MI), or CD-1012 (Aldrich Chemical, Milwaukee I) .
- a 0.5 to 5 micron thick coating of a photoresist material is applied to a substrate to serve as a protective layer.
- the photoresist material is prepared from polymers with pendant labile acid groups and photoactive reagents.
- Such a coating could be obtained by spin-coating or table-coating using a blade in an appropriate organic solvent .
- the preferred organic solvents for applying the coating are propylene glycol 1-monomethyl ether 2- acetate (PGMEA) or cyclohexanone .
- PMEA propylene glycol 1-monomethyl ether 2- acetate
- the solvent is removed by heating the substrate to between about 70 to 100°C for typically about 1 to 3 minutes on a hot plate.
- the coating is then ready to be patterned by UV photo-irradiation through a mask.
- UV irradiation followed by heat treatment will cleave acid labile pendant group to convert the ester to the acid.
- Suitable photosensitizers may include isopropylthioxanthone (ITX), 2 , 4-diethyl-9H- thioxanthen-9-one (DETX) , benzophenone .
- the UV irradiation dose is 50 to 3000 mJ/square centimeters.
- Post exposure baking is then performed, the conditions for which are typically about 120 to 140°C for about 1 to 3 minutes.
- This treatment results in the exposed area of the protective layer being soluble in an aqueous base developing solvent .
- Suitable basic developing solvents may include a carbonate solution or a low concentration sodium or potassium hydroxide solution.
- a commercial aqueous base developer such as AZ 300 from Clariant Corporation (AZ Electronic Materials, Somerville NJ) , can be used.
- the protective layer serves as a patterned template . As the remaining areas of the protective layer are still soluble in organic solvents, however, the compatibility of those areas with the thick film paste is limited.
- the protective layer can be converted to a film containing a high level of polycarboxylic acid, which is insoluble in the common organic solvents employed in thick film pastes, by exposure to UV light and subsequent heat treatment.
- the UV irradiation dose is typically about 50 to 3000 mJ/square centimeters.
- Post exposure baking conditions are typically about 120 to 140 °C for 1 to 3 minutes.
- a thick film paste is then deposited on the protective layer.
- a preferred thick film paste is a negatively-imageable thick film paste that may be developed by an aqueous base, such as Fodel ® silver paste (from DuPont, Wilmington DE) .
- the thick film paste may also include carbon nanotubes for field emission display applications.
- the thick film paste is applied on the top of the converted protective layer by such methods as screen printing so that the paste fills the vacancies in the patterned template generated in the protective layer by photo development. Subsequently, the thick film paste is photo-irradiated through a transparent substrate such as glass . The paste located in the patterned template where the protective layer is removed by photo imaging would be imaged preferentially.
- the paste As the paste is negatively developed upon irradiation, the paste becomes insoluble to developing solvents.
- these thick film pastes are developed by gentle spray of an aqueous base solution.
- the unimaged paste is washed out within a length of time that is referred to as the time-to-clear (TTC) .
- TTC time-to-clear
- the spray will last about 1.5 to about 3.0 times the TTC.
- a suitable developer for use in this process is typically a carbonate solution, such as a sodium carbonate solution, a sodium hydroxide solution, a potassium hydroxide solution or a tetramethylammonium hydroxide solution.
- a carbonate solution such as a sodium carbonate solution, a sodium hydroxide solution, a potassium hydroxide solution or a tetramethylammonium hydroxide solution.
- Addition of a small amount of surfactant in the developer improves the developing time and cleanness of the developed image.
- the surfactant is present in an amount of about 0.1 to 10 percent by weight surfactant in the weight of the total composition.
- a surfactant is a molecule composed of groups of opposing solubility tendencies, i.e. one or more groups have an affinity for the phase in which the molecule or ion is dissolved, and one or more groups are antipathic to that medium.
- Surfactants are classified according to the charge on the surface- active moiety. In anionic surfactants, this moiety carries a negative charge; in a cationic surfactant, the charge is positive; in a nonionic surfactant, there is no charge on the molecule and the solubilizing effect may be supplied, for example, by hydroxyl groups or a long chain of ethylene oxide groups; and in an amphoteric surfactant, the solubilizing effect is provided by both positive and negative charges in the molecule.
- Hydrophilic, solubilizing groups for anionic surfactants include carboxylates, sulfonates, sulfates (including sulfated alcohols and sulfated alkyl phenols) , phosphates (including phosphate esters) , N- acylsarcosinates, and acylated protein hydrolysates . Cationics are solubilized by amine and ammonium groups.
- nonionic surfactants include a carboxylic acid ester, an anhydrosorbitol ester, a glycol ester of a fatty acid, an alkyl polyglycoside, a carboxylic amide, and a fatty acid glucamide. A mixture of these surfactants is also effective.
- anionic surfactants include sodium dialkyl sulfosuccinate, sodium alkyl diphenyl ether disulfonate, sodium alkyl diphenyl ether disulfonate, a potassium salt of polyoxyethylene alkyl ether phosphate, sodium alkane sulfonate, or a derivative of any of the foregoing containing 2,2',2"- nitrilotris (ethanol) as a counter cation.
- Nonionic surfactants are very useful in chemical blends and mixtures because of their electrical neutrality. These surfactants offer a high degree of flexibility for preparation and structure. This is achieved by careful control of the size and ratio of the hydrophilic group verses hydrophobic group during polymerization. Recently in addition to commonly known ethoxylates, nonionic surfactants such as glycerol esters, amine oxides, acetylenic alcohol derivatives, silicones, fluorocompounds, and carbohydrate derivatives have also been found useful .
- a typical example of an ethoxylate surfactant is DOWFAX (Dow Chemical, Midland MI) , which is produced by polymerizing ethylene oxide (EO) , propylene oxide (PO) , and/or butylene oxide (BO) in the same molecule. The ratio and order of oxide addition, together with the choice of initiator, control the chemical and physical properties.
- Another well-known type of nonionic surfactant is poly (oxy-1, 2-ethanediyl) -alpha undecyl omega (Tomah Product Inc.).
- Micro-90 a mildly alkaline, aqueous solution (International Products Corp., Burlington NJ) , is particularly effective for this invention. Addition of a small amount of Micro-90 solution to various concentrations of sodium carbonate is effective in developing a polymeric protective layer that is made up of at least 50-mole percent of monomers with carboxylic groups.
- the solution is cast on a glass plate and allowed to air dry for 10 minutes.
- the film is then dried for 2 min at 70 °C on a hot plate.
- the film is exposed to about a 2.25 J/cm 2 broad band UV light using a 20 micron photomask, then heat treated on a hot plate at 120 °C for 2 min.
- the imaged part is developed by spraying, for the time as shown in Table 1, a developing solution containing the carbonate and Micro 90 components as also shown in Table 1.
- the film is then washed with deionized water for 1 min., then dried on a hot plate at 90°C for 30 sec.
- the remaining film is flood exposed about a 1.5 J/cm 2 UV light then heat-treated at 120 °C for 2 mins .
- the remaining film could be washed out with the same developer as shown in Table 1.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007515469A JP2008500588A (en) | 2004-05-27 | 2005-05-27 | Photopolymer protective layer developer |
EP05756482A EP1756673A1 (en) | 2004-05-27 | 2005-05-27 | Developer for a photopolymer protective layer |
KR1020067027211A KR20070034519A (en) | 2004-05-27 | 2005-05-27 | Developer for photosensitive polymer protective layer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US57500704P | 2004-05-27 | 2004-05-27 | |
US60/575,007 | 2004-05-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005119372A1 true WO2005119372A1 (en) | 2005-12-15 |
Family
ID=35045018
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2005/018990 WO2005119372A1 (en) | 2004-05-27 | 2005-05-27 | Developer for a photopolymer protective layer |
Country Status (6)
Country | Link |
---|---|
US (2) | US20050282094A1 (en) |
EP (1) | EP1756673A1 (en) |
JP (1) | JP2008500588A (en) |
KR (1) | KR20070034519A (en) |
CN (1) | CN1973247A (en) |
WO (1) | WO2005119372A1 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7374859B2 (en) * | 2002-11-15 | 2008-05-20 | E.I. Du Pont De Nemours And Company | Protective layers compatible with thick film pastes |
US20040170925A1 (en) * | 2002-12-06 | 2004-09-02 | Roach David Herbert | Positive imageable thick film compositions |
US7402373B2 (en) * | 2004-02-05 | 2008-07-22 | E.I. Du Pont De Nemours And Company | UV radiation blocking protective layers compatible with thick film pastes |
CN101750910B (en) * | 2008-12-18 | 2012-11-21 | 京东方科技集团股份有限公司 | Developer solution component |
JP5783142B2 (en) * | 2011-07-25 | 2015-09-24 | 信越化学工業株式会社 | Chemically amplified positive resist material and pattern forming method |
JP6027633B2 (en) * | 2015-01-13 | 2016-11-16 | 日本写真印刷株式会社 | Method for manufacturing touch input sensor and photosensitive conductive film |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4833067A (en) * | 1985-08-06 | 1989-05-23 | Tokyo Ohka Kogyo Co., Ltd. | Developing solution for positive-working photoresist comprising tmah and non-ionic surfactant |
US5756267A (en) * | 1990-05-29 | 1998-05-26 | Fuji Photo Film Co., Ltd. | Developing solution for negative type photosensitive resin compositions |
US20020058207A1 (en) * | 1998-01-16 | 2002-05-16 | Toshiyuki Urano | Method for forming a positive image |
US20020106589A1 (en) * | 1999-05-04 | 2002-08-08 | Kevin Rodney | Acetylenic diol ethylene oxide/propylene oxide adducts and their use in photoresist developers |
EP1231074A2 (en) * | 2001-02-07 | 2002-08-14 | Fuji Photo Film Co., Ltd. | Presensitized plate useful for making lithographic printing plate and method for making lithographic printing plate therefrom |
WO2003042762A1 (en) * | 2001-11-13 | 2003-05-22 | Samsung Electronics Co., Ltd. | Chemical rinse composition |
WO2003052518A1 (en) * | 2001-12-14 | 2003-06-26 | Rhom And Haas Electronic Materials, L.L.C. | Developing solution for photoresist |
US20040018453A1 (en) * | 2002-04-12 | 2004-01-29 | Shipley Company, L.L.C. | Photoresist processing aid and method |
WO2005001578A2 (en) * | 2003-06-27 | 2005-01-06 | Tokyo Ohka Kogyo Co., Ltd. | Developer composition for resists and method for formation of resist pattern |
EP1521123A1 (en) * | 2003-10-02 | 2005-04-06 | Agfa-Gevaert | Alkaline Developer for radiation sensitive compositions |
EP1553455A2 (en) * | 2003-12-19 | 2005-07-13 | Fuji Photo Film Co., Ltd. | Method for forming images |
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US336543A (en) * | 1886-02-23 | Spring for vehicles | ||
US4939070A (en) * | 1986-07-28 | 1990-07-03 | Brunsvold William R | Thermally stable photoresists with high sensitivity |
US5120633A (en) * | 1990-04-10 | 1992-06-09 | E. I. Du Pont De Nemours And Company | Resist material for use in thick film resists |
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JP3707856B2 (en) * | 1996-03-07 | 2005-10-19 | 富士通株式会社 | Method for forming resist pattern |
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JP2003195518A (en) * | 2001-12-14 | 2003-07-09 | Shipley Co Llc | Photoresist developer |
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-
2005
- 2005-05-27 CN CNA2005800168660A patent/CN1973247A/en active Pending
- 2005-05-27 US US11/139,458 patent/US20050282094A1/en not_active Abandoned
- 2005-05-27 WO PCT/US2005/018990 patent/WO2005119372A1/en active Application Filing
- 2005-05-27 KR KR1020067027211A patent/KR20070034519A/en not_active Application Discontinuation
- 2005-05-27 EP EP05756482A patent/EP1756673A1/en not_active Withdrawn
- 2005-05-27 JP JP2007515469A patent/JP2008500588A/en active Pending
-
2007
- 2007-05-14 US US11/803,451 patent/US20100261116A1/en not_active Abandoned
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Publication number | Priority date | Publication date | Assignee | Title |
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US4833067A (en) * | 1985-08-06 | 1989-05-23 | Tokyo Ohka Kogyo Co., Ltd. | Developing solution for positive-working photoresist comprising tmah and non-ionic surfactant |
US5756267A (en) * | 1990-05-29 | 1998-05-26 | Fuji Photo Film Co., Ltd. | Developing solution for negative type photosensitive resin compositions |
US20020058207A1 (en) * | 1998-01-16 | 2002-05-16 | Toshiyuki Urano | Method for forming a positive image |
US20020106589A1 (en) * | 1999-05-04 | 2002-08-08 | Kevin Rodney | Acetylenic diol ethylene oxide/propylene oxide adducts and their use in photoresist developers |
EP1231074A2 (en) * | 2001-02-07 | 2002-08-14 | Fuji Photo Film Co., Ltd. | Presensitized plate useful for making lithographic printing plate and method for making lithographic printing plate therefrom |
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US20050130082A1 (en) * | 2001-12-14 | 2005-06-16 | Takashi Kanda | Developing solution for photoresist |
US20040018453A1 (en) * | 2002-04-12 | 2004-01-29 | Shipley Company, L.L.C. | Photoresist processing aid and method |
WO2005001578A2 (en) * | 2003-06-27 | 2005-01-06 | Tokyo Ohka Kogyo Co., Ltd. | Developer composition for resists and method for formation of resist pattern |
EP1521123A1 (en) * | 2003-10-02 | 2005-04-06 | Agfa-Gevaert | Alkaline Developer for radiation sensitive compositions |
EP1553455A2 (en) * | 2003-12-19 | 2005-07-13 | Fuji Photo Film Co., Ltd. | Method for forming images |
Also Published As
Publication number | Publication date |
---|---|
US20100261116A1 (en) | 2010-10-14 |
JP2008500588A (en) | 2008-01-10 |
KR20070034519A (en) | 2007-03-28 |
EP1756673A1 (en) | 2007-02-28 |
CN1973247A (en) | 2007-05-30 |
US20050282094A1 (en) | 2005-12-22 |
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