WO2005085832A3 - Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien - Google Patents

Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien Download PDF

Info

Publication number
WO2005085832A3
WO2005085832A3 PCT/EP2005/001888 EP2005001888W WO2005085832A3 WO 2005085832 A3 WO2005085832 A3 WO 2005085832A3 EP 2005001888 W EP2005001888 W EP 2005001888W WO 2005085832 A3 WO2005085832 A3 WO 2005085832A3
Authority
WO
WIPO (PCT)
Prior art keywords
deep
electrically conductive
conductive materials
detecting defects
destructive manner
Prior art date
Application number
PCT/EP2005/001888
Other languages
English (en)
French (fr)
Other versions
WO2005085832A2 (de
Inventor
Gabriel Daalmans
Martin Steck
Original Assignee
Siemens Ag
Gabriel Daalmans
Martin Steck
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag, Gabriel Daalmans, Martin Steck filed Critical Siemens Ag
Priority to DE502005011332T priority Critical patent/DE502005011332D1/de
Priority to US10/592,295 priority patent/US7495433B2/en
Priority to EP05743195A priority patent/EP1723409B1/de
Publication of WO2005085832A2 publication Critical patent/WO2005085832A2/de
Publication of WO2005085832A3 publication Critical patent/WO2005085832A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

Vorrichtung zur zerstörungsfreien Erfassung von tiefen und oberflächennahen Defekten in elektrisch leitenden Materialien mit einer Erregereinrichtung mit Induktionsspulen zur Erzeugung niederfrequenter Wirbelströme im Material und mit einer Empfangseinrichtung für die durch die Defekte veränderten Magnetfelder der Wirbelströme, wobei die Empfangseinrichtung Gradiometer-Magnetfeldsensoren (2-5) mit integrierter Brückenschaltung enthält.
PCT/EP2005/001888 2004-03-08 2005-02-23 Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien WO2005085832A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE502005011332T DE502005011332D1 (de) 2004-03-08 2005-02-23 Vorrichtung zur zerstörungsfreien erfassung von tiefen-defekten in elektrisch leitenden materialien
US10/592,295 US7495433B2 (en) 2004-03-08 2005-02-23 Device for detecting defects in electrically conductive materials in a nondestructive manner
EP05743195A EP1723409B1 (de) 2004-03-08 2005-02-23 Vorrichtung zur zerstörungsfreien erfassung von tiefen-defekten in elektrisch leitenden materialien

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04005462A EP1574850A1 (de) 2004-03-08 2004-03-08 Vorrichtung zur zerstörungsfreien Erfassung von tiefen Defekten in elektrisch leitenden Materialien
EP04005462.9 2004-03-08

Publications (2)

Publication Number Publication Date
WO2005085832A2 WO2005085832A2 (de) 2005-09-15
WO2005085832A3 true WO2005085832A3 (de) 2007-03-29

Family

ID=34814261

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2005/001888 WO2005085832A2 (de) 2004-03-08 2005-02-23 Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien

Country Status (4)

Country Link
US (1) US7495433B2 (de)
EP (2) EP1574850A1 (de)
DE (1) DE502005011332D1 (de)
WO (1) WO2005085832A2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2084524B1 (de) * 2006-11-01 2016-11-30 Industry-academic Cooperation Foundation, Chosun University Magnetsensorvorrichtung zum nachweis von defekten
WO2009119529A1 (en) * 2008-03-27 2009-10-01 Honda Motor Co., Ltd. Nondestructive testing system for steel workpiece
DE102009022136A1 (de) * 2009-05-20 2010-11-25 Prüftechnik Dieter Busch AG Vorrichtung und Verfahren für induktive Messungen
ES2465999T3 (es) 2011-09-29 2014-06-09 Abb Technology Ag Método y dispositivo para la detección de fisuras en un material metálico
US20140002069A1 (en) * 2012-06-27 2014-01-02 Kenneth Stoddard Eddy current probe
WO2015171885A1 (en) * 2014-05-07 2015-11-12 Office Of Technology Transfer, National Institutes Of Health Negative resistance preamplifier for inductively coupled local mri coils
US10073058B2 (en) * 2015-02-11 2018-09-11 Structural Integrity Associates Dynamic pulsed eddy current probe
US10895555B2 (en) 2015-03-30 2021-01-19 Structural Integrity Associates, Inc. System for in-line inspection using a dynamic pulsed eddy current probe and method thereof
KR101736000B1 (ko) * 2016-02-26 2017-05-15 엘에스산전 주식회사 전력 계통의 고장 검출 장치
US10240909B2 (en) * 2016-10-17 2019-03-26 The Boeing Company Three-dimensional gap measurement systems and methods
US10203363B2 (en) * 2016-12-14 2019-02-12 General Electric Company DC leakage current detector and method of operation thereof for leakage current detection in DC power circuits
CN115236145B (zh) * 2022-09-21 2022-12-09 中国石油大学(华东) 一种评估玻璃纤维增强材料基体固化状态的装置和方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4924293A (en) * 1985-05-24 1990-05-08 Hitachi, Ltd. Semiconductor integrated circuit device
US5243547A (en) * 1992-04-01 1993-09-07 Motorola, Inc. Limiting parasitic signal coupling between conductors
US5842986A (en) * 1995-08-16 1998-12-01 Proton Sciences Corp. Ferromagnetic foreign body screening method and apparatus
US6031273A (en) * 1996-05-02 2000-02-29 Integrated Magnetoelectronics All-metal, giant magnetoresistive, solid-state component
DE19945944A1 (de) * 1999-09-24 2001-05-31 Siemens Ag Verfahren zur zerstörungsfreien Detektion und Bestimmung von Defekten in elektrisch leitendem Material mit Anwendung eines Wirbelstrom-Prüfverfahrens
US20020060565A1 (en) * 1999-10-13 2002-05-23 Nve Corporation Magnetizable bead detector
US6452384B1 (en) * 1997-11-04 2002-09-17 Siemens Aktiengesellschaft Scanning head for eddy-current testing, method for processing a scanning head for an eddy-current test method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US601273A (en) * 1898-03-29 Weighing-scale
JPS5514145A (en) * 1978-07-17 1980-01-31 Nippon Kokan Kk <Nkk> Weld seam center determining method
US4594549A (en) * 1984-05-11 1986-06-10 United Technologies Corporation Uniform field generating eddy current testing processing method and apparatus
US5491409A (en) * 1992-11-09 1996-02-13 The Babcock & Wilcox Company Multiple yoke eddy current technique for detection of surface defects on metal components covered with marine growth
DE4318716A1 (de) 1993-06-07 1994-12-08 Smt & Hybrid Gmbh Magnetfeldsensor in Form einer Brückenschaltung
JP3623366B2 (ja) * 1998-07-17 2005-02-23 アルプス電気株式会社 巨大磁気抵抗効果素子を備えた磁界センサおよびその製造方法と製造装置
US6504363B1 (en) * 2000-03-07 2003-01-07 Teodor Dogaru Sensor for eddy current testing and method of use thereof
US6911826B2 (en) * 2001-06-12 2005-06-28 General Electric Company Pulsed eddy current sensor probes and inspection methods

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4924293A (en) * 1985-05-24 1990-05-08 Hitachi, Ltd. Semiconductor integrated circuit device
US5243547A (en) * 1992-04-01 1993-09-07 Motorola, Inc. Limiting parasitic signal coupling between conductors
US5842986A (en) * 1995-08-16 1998-12-01 Proton Sciences Corp. Ferromagnetic foreign body screening method and apparatus
US6031273A (en) * 1996-05-02 2000-02-29 Integrated Magnetoelectronics All-metal, giant magnetoresistive, solid-state component
US6452384B1 (en) * 1997-11-04 2002-09-17 Siemens Aktiengesellschaft Scanning head for eddy-current testing, method for processing a scanning head for an eddy-current test method
DE19945944A1 (de) * 1999-09-24 2001-05-31 Siemens Ag Verfahren zur zerstörungsfreien Detektion und Bestimmung von Defekten in elektrisch leitendem Material mit Anwendung eines Wirbelstrom-Prüfverfahrens
US20020060565A1 (en) * 1999-10-13 2002-05-23 Nve Corporation Magnetizable bead detector

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
"Introduction to NVE GMR Sensors", NVE CORPORATION, 15 November 2002 (2002-11-15), XP002329240, Retrieved from the Internet <URL:http://www.megatron.fr/composants/pdf/pdfgmr/Sensor_Catalog_111402-Introduction_to_GMR_Sensors1.pdf> [retrieved on 20050524] *
INDECK R S ET AL: "A MAGNETORESISTIVE GRADIOMETER", IEEE TRANSACTIONS ON MAGNETICS, IEEE INC. NEW YORK, US, vol. 24, no. 6, 1 November 1988 (1988-11-01), pages 2617 - 2619, XP000031789, ISSN: 0018-9464 *
TREUTLER C P O: "Magnetic sensors for automotive applications", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 91, no. 1-2, 5 June 2001 (2001-06-05), pages 2 - 6, XP004239165, ISSN: 0924-4247 *

Also Published As

Publication number Publication date
EP1723409B1 (de) 2011-05-04
US7495433B2 (en) 2009-02-24
DE502005011332D1 (de) 2011-06-16
EP1574850A1 (de) 2005-09-14
WO2005085832A2 (de) 2005-09-15
US20070200563A1 (en) 2007-08-30
EP1723409A2 (de) 2006-11-22

Similar Documents

Publication Publication Date Title
WO2005085832A3 (de) Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien
ATE422055T1 (de) Magnetfeldsensor
HK1077634A1 (en) Measurement probe and authentication device and method comprising the same
WO2003019981A3 (en) Electromagnetic piezoelectric acoustic sensor
WO2007088502A3 (en) Magnetic sensor device with reference unit
WO2004077044A8 (de) Verfahren und vorrichtung zum selektiven nachweis ferromagnetischer oder superparamagnetischer partikel
CA2863843A1 (en) Apparatus and method for measuring properties of a ferromagnetic material
ATE371236T1 (de) Münzunterscheidungsvorrichtung, in der frequenzen von wirbelströmen gemessen werden
US7843193B2 (en) System for testing magnetic sensitivity of Hall-effect switch
AU2001285910A1 (en) Detecting an anomaly in an object of electrically conductive material
JP4621880B2 (ja) 異物検知方法及び異物検知装置
AU2002334314A1 (en) Device for the measurement of glucose concentrations
UA94970C2 (ru) Индуктор вихревых токов для магнитографической дефектоскопии и сканер на его основе
JP2010127889A (ja) フラックスゲート型磁気センサ
JP2004301763A (ja) チェーン型コンベヤ対応金属探知装置
DK1488230T3 (da) Detektor for magnetisk permeabilitet med driftkompensation
US20190041361A1 (en) Device for pulsed eddy current testing of ferromagnetic structures covered with ferromagnetic protective jacket
WO2006130487A3 (en) Method and apparatus for eddy current compensation in a radio frequency probe
JP2009210399A (ja) 渦電流センサ
FR2910636B1 (fr) Capteur inductif de mesure de courant
CN103954682A (zh) 一种并联谐振电路电感检测非金属材料不连续性的方法
CN103954654A (zh) 一种串联谐振电路电感检测非金属材料不连续性的方法
Friedman et al. A finite element model of near-field scanning microwave microscopy
Tian et al. Eddy-current scratch inspection with high probe lift-off
EP1943477A1 (de) Einrichtung zur zerstörungsfreien untersuchung eines objekts

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SM SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DPEN Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed from 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2005743195

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 10592295

Country of ref document: US

Ref document number: 2007200563

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

WWW Wipo information: withdrawn in national office

Ref document number: DE

WWP Wipo information: published in national office

Ref document number: 2005743195

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 10592295

Country of ref document: US