WO2005085832A3 - Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien - Google Patents
Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien Download PDFInfo
- Publication number
- WO2005085832A3 WO2005085832A3 PCT/EP2005/001888 EP2005001888W WO2005085832A3 WO 2005085832 A3 WO2005085832 A3 WO 2005085832A3 EP 2005001888 W EP2005001888 W EP 2005001888W WO 2005085832 A3 WO2005085832 A3 WO 2005085832A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- deep
- electrically conductive
- conductive materials
- detecting defects
- destructive manner
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9006—Details, e.g. in the structure or functioning of sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE502005011332T DE502005011332D1 (de) | 2004-03-08 | 2005-02-23 | Vorrichtung zur zerstörungsfreien erfassung von tiefen-defekten in elektrisch leitenden materialien |
US10/592,295 US7495433B2 (en) | 2004-03-08 | 2005-02-23 | Device for detecting defects in electrically conductive materials in a nondestructive manner |
EP05743195A EP1723409B1 (de) | 2004-03-08 | 2005-02-23 | Vorrichtung zur zerstörungsfreien erfassung von tiefen-defekten in elektrisch leitenden materialien |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04005462A EP1574850A1 (de) | 2004-03-08 | 2004-03-08 | Vorrichtung zur zerstörungsfreien Erfassung von tiefen Defekten in elektrisch leitenden Materialien |
EP04005462.9 | 2004-03-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005085832A2 WO2005085832A2 (de) | 2005-09-15 |
WO2005085832A3 true WO2005085832A3 (de) | 2007-03-29 |
Family
ID=34814261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2005/001888 WO2005085832A2 (de) | 2004-03-08 | 2005-02-23 | Vorrichtung zur zerstörungsfreien erfassung von tiefen und oberflächennahen defekten in elektrisch leitenden materialien |
Country Status (4)
Country | Link |
---|---|
US (1) | US7495433B2 (de) |
EP (2) | EP1574850A1 (de) |
DE (1) | DE502005011332D1 (de) |
WO (1) | WO2005085832A2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2084524B1 (de) * | 2006-11-01 | 2016-11-30 | Industry-academic Cooperation Foundation, Chosun University | Magnetsensorvorrichtung zum nachweis von defekten |
WO2009119529A1 (en) * | 2008-03-27 | 2009-10-01 | Honda Motor Co., Ltd. | Nondestructive testing system for steel workpiece |
DE102009022136A1 (de) * | 2009-05-20 | 2010-11-25 | Prüftechnik Dieter Busch AG | Vorrichtung und Verfahren für induktive Messungen |
ES2465999T3 (es) | 2011-09-29 | 2014-06-09 | Abb Technology Ag | Método y dispositivo para la detección de fisuras en un material metálico |
US20140002069A1 (en) * | 2012-06-27 | 2014-01-02 | Kenneth Stoddard | Eddy current probe |
WO2015171885A1 (en) * | 2014-05-07 | 2015-11-12 | Office Of Technology Transfer, National Institutes Of Health | Negative resistance preamplifier for inductively coupled local mri coils |
US10073058B2 (en) * | 2015-02-11 | 2018-09-11 | Structural Integrity Associates | Dynamic pulsed eddy current probe |
US10895555B2 (en) | 2015-03-30 | 2021-01-19 | Structural Integrity Associates, Inc. | System for in-line inspection using a dynamic pulsed eddy current probe and method thereof |
KR101736000B1 (ko) * | 2016-02-26 | 2017-05-15 | 엘에스산전 주식회사 | 전력 계통의 고장 검출 장치 |
US10240909B2 (en) * | 2016-10-17 | 2019-03-26 | The Boeing Company | Three-dimensional gap measurement systems and methods |
US10203363B2 (en) * | 2016-12-14 | 2019-02-12 | General Electric Company | DC leakage current detector and method of operation thereof for leakage current detection in DC power circuits |
CN115236145B (zh) * | 2022-09-21 | 2022-12-09 | 中国石油大学(华东) | 一种评估玻璃纤维增强材料基体固化状态的装置和方法 |
Citations (7)
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---|---|---|---|---|
US4924293A (en) * | 1985-05-24 | 1990-05-08 | Hitachi, Ltd. | Semiconductor integrated circuit device |
US5243547A (en) * | 1992-04-01 | 1993-09-07 | Motorola, Inc. | Limiting parasitic signal coupling between conductors |
US5842986A (en) * | 1995-08-16 | 1998-12-01 | Proton Sciences Corp. | Ferromagnetic foreign body screening method and apparatus |
US6031273A (en) * | 1996-05-02 | 2000-02-29 | Integrated Magnetoelectronics | All-metal, giant magnetoresistive, solid-state component |
DE19945944A1 (de) * | 1999-09-24 | 2001-05-31 | Siemens Ag | Verfahren zur zerstörungsfreien Detektion und Bestimmung von Defekten in elektrisch leitendem Material mit Anwendung eines Wirbelstrom-Prüfverfahrens |
US20020060565A1 (en) * | 1999-10-13 | 2002-05-23 | Nve Corporation | Magnetizable bead detector |
US6452384B1 (en) * | 1997-11-04 | 2002-09-17 | Siemens Aktiengesellschaft | Scanning head for eddy-current testing, method for processing a scanning head for an eddy-current test method |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US601273A (en) * | 1898-03-29 | Weighing-scale | ||
JPS5514145A (en) * | 1978-07-17 | 1980-01-31 | Nippon Kokan Kk <Nkk> | Weld seam center determining method |
US4594549A (en) * | 1984-05-11 | 1986-06-10 | United Technologies Corporation | Uniform field generating eddy current testing processing method and apparatus |
US5491409A (en) * | 1992-11-09 | 1996-02-13 | The Babcock & Wilcox Company | Multiple yoke eddy current technique for detection of surface defects on metal components covered with marine growth |
DE4318716A1 (de) | 1993-06-07 | 1994-12-08 | Smt & Hybrid Gmbh | Magnetfeldsensor in Form einer Brückenschaltung |
JP3623366B2 (ja) * | 1998-07-17 | 2005-02-23 | アルプス電気株式会社 | 巨大磁気抵抗効果素子を備えた磁界センサおよびその製造方法と製造装置 |
US6504363B1 (en) * | 2000-03-07 | 2003-01-07 | Teodor Dogaru | Sensor for eddy current testing and method of use thereof |
US6911826B2 (en) * | 2001-06-12 | 2005-06-28 | General Electric Company | Pulsed eddy current sensor probes and inspection methods |
-
2004
- 2004-03-08 EP EP04005462A patent/EP1574850A1/de not_active Withdrawn
-
2005
- 2005-02-23 US US10/592,295 patent/US7495433B2/en not_active Expired - Fee Related
- 2005-02-23 EP EP05743195A patent/EP1723409B1/de not_active Not-in-force
- 2005-02-23 DE DE502005011332T patent/DE502005011332D1/de active Active
- 2005-02-23 WO PCT/EP2005/001888 patent/WO2005085832A2/de not_active Application Discontinuation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4924293A (en) * | 1985-05-24 | 1990-05-08 | Hitachi, Ltd. | Semiconductor integrated circuit device |
US5243547A (en) * | 1992-04-01 | 1993-09-07 | Motorola, Inc. | Limiting parasitic signal coupling between conductors |
US5842986A (en) * | 1995-08-16 | 1998-12-01 | Proton Sciences Corp. | Ferromagnetic foreign body screening method and apparatus |
US6031273A (en) * | 1996-05-02 | 2000-02-29 | Integrated Magnetoelectronics | All-metal, giant magnetoresistive, solid-state component |
US6452384B1 (en) * | 1997-11-04 | 2002-09-17 | Siemens Aktiengesellschaft | Scanning head for eddy-current testing, method for processing a scanning head for an eddy-current test method |
DE19945944A1 (de) * | 1999-09-24 | 2001-05-31 | Siemens Ag | Verfahren zur zerstörungsfreien Detektion und Bestimmung von Defekten in elektrisch leitendem Material mit Anwendung eines Wirbelstrom-Prüfverfahrens |
US20020060565A1 (en) * | 1999-10-13 | 2002-05-23 | Nve Corporation | Magnetizable bead detector |
Non-Patent Citations (3)
Title |
---|
"Introduction to NVE GMR Sensors", NVE CORPORATION, 15 November 2002 (2002-11-15), XP002329240, Retrieved from the Internet <URL:http://www.megatron.fr/composants/pdf/pdfgmr/Sensor_Catalog_111402-Introduction_to_GMR_Sensors1.pdf> [retrieved on 20050524] * |
INDECK R S ET AL: "A MAGNETORESISTIVE GRADIOMETER", IEEE TRANSACTIONS ON MAGNETICS, IEEE INC. NEW YORK, US, vol. 24, no. 6, 1 November 1988 (1988-11-01), pages 2617 - 2619, XP000031789, ISSN: 0018-9464 * |
TREUTLER C P O: "Magnetic sensors for automotive applications", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 91, no. 1-2, 5 June 2001 (2001-06-05), pages 2 - 6, XP004239165, ISSN: 0924-4247 * |
Also Published As
Publication number | Publication date |
---|---|
EP1723409B1 (de) | 2011-05-04 |
US7495433B2 (en) | 2009-02-24 |
DE502005011332D1 (de) | 2011-06-16 |
EP1574850A1 (de) | 2005-09-14 |
WO2005085832A2 (de) | 2005-09-15 |
US20070200563A1 (en) | 2007-08-30 |
EP1723409A2 (de) | 2006-11-22 |
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