WO1987000663A1 - Coin testing apparatus - Google Patents

Coin testing apparatus Download PDF

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Publication number
WO1987000663A1
WO1987000663A1 PCT/US1985/001327 US8501327W WO8700663A1 WO 1987000663 A1 WO1987000663 A1 WO 1987000663A1 US 8501327 W US8501327 W US 8501327W WO 8700663 A1 WO8700663 A1 WO 8700663A1
Authority
WO
WIPO (PCT)
Prior art keywords
coin
signal
track
light
timer
Prior art date
Application number
PCT/US1985/001327
Other languages
French (fr)
Inventor
Lester Gregory, Jr.
Original Assignee
Patent Research Development Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US06/478,842 priority Critical patent/US4546868A/en
Application filed by Patent Research Development Corporation filed Critical Patent Research Development Corporation
Priority to EP19850903631 priority patent/EP0229055A1/en
Priority to PCT/US1985/001327 priority patent/WO1987000663A1/en
Publication of WO1987000663A1 publication Critical patent/WO1987000663A1/en

Links

Classifications

    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07FCOIN-FREED OR LIKE APPARATUS
    • G07F1/00Coin inlet arrangements; Coins specially adapted to operate coin-freed mechanisms
    • G07F1/04Coin chutes
    • G07F1/041Coin chutes with means, other than for testing currency, for dealing with inserted foreign matter, e.g. "stuffing", "stringing" or "salting"
    • G07F1/042Coin chutes with means, other than for testing currency, for dealing with inserted foreign matter, e.g. "stuffing", "stringing" or "salting" the foreign matter being a long flexible member attached to a coin
    • G07F1/044Automatic detection of the flexible member
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/005Testing the surface pattern, e.g. relief
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/02Testing the dimensions, e.g. thickness, diameter; Testing the deformation
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07FCOIN-FREED OR LIKE APPARATUS
    • G07F1/00Coin inlet arrangements; Coins specially adapted to operate coin-freed mechanisms
    • G07F1/04Coin chutes
    • G07F1/041Coin chutes with means, other than for testing currency, for dealing with inserted foreign matter, e.g. "stuffing", "stringing" or "salting"
    • G07F1/042Coin chutes with means, other than for testing currency, for dealing with inserted foreign matter, e.g. "stuffing", "stringing" or "salting" the foreign matter being a long flexible member attached to a coin
    • G07F1/043Cutting or trapping of the flexible member or the attached coin

Definitions

  • a coin testing apparatus which has a ramp disposed to receive coins supplied to the apparatus and the coins are constrained to roll down the ramp.
  • a first optical means is positioned in predetermined spaced relationship with the ramp to detect the diameter and thickness of a coin rolling therepast.
  • the first optical means includes light emitting means and light sensitive means on opposite sides of the path of the coin, with the light sensitive means mounted in an opening which is positioned such that a coin of proper thickness and diameter will completely cover and block the opening to light passing thereinto from the light emitting means.
  • the light emitting means is disposed in an opening positioned angularly relative to the light sensitive means, so that light can only pass from the light emitting means to the light sensi ⁇ tive means when a coin is of insufficient thickness and diameter to completely block the opening to the light sensitive means.
  • This arrangement enables high intensity lights to be used, thus rendering the apparatus less susceptible to external environmental conditions.
  • a first signal of predetermined timed duration is produced by a first timer circuit.
  • a second optical means is positioned adjacent the first optical means to sense the reflectiveity from the side of the coin and is operable to produce a second signal when the proper reflectiveity is detected.
  • the first signal is supplied to a plurality of latches to reset or enable them, and the second signal is supplied to the latches to set them and provide an output signal which turns on an electromagnet and a solenoid. Coins having magnetic material therein are detained by the electromagnet until the timed duration expires, at which time the magnetic coins are rejected.
  • the solenoid operates a movable ramp segment, urging it from an at-rest position for rejecting coins to an energized position for conveying an acceptable coin past a "vend" device to a collection box.
  • the output signal from one of the latches is supplied to a NAND gate which, in turn, provides a reset signal to a second timer circuit.
  • the second timer circuit is also connected with a third optical means disposed in the path of a coin leaving the ramp. So long as the proper reset signal is supplied to the second timer circuit, the apparatus remains operative and block ⁇ age of the third optical means by a coin moving therepast has no effect. However, if a coin is dropped into the apparatus and an effort is made to draw it back up through the apparatus, blockage of the third optical means will be out of sequence and the second timer circuit will disable or reset the first timer circuit for a predetermine period of time during which a "vend" cannot be obtained.
  • the output or reset signal from the NAND gate is supplied, via a second NAND gate, to another latch to reset the latch.
  • a fourth optical means is positioned to sense a coin progressing through the apparatus from the reject gate or movable ramp segment, and only acceptable coins are detected by the fourth optical means.
  • This fourth optical means is connected to provide a set signal to the last mentioned latch, providing an output to turn on a "vend” mechanism.
  • the time duration set by the first timer circuit is very short, being on the order of about five milli ⁇ seconds. Thus, all of the tests have to be successfully completed within this time in order to obtain a "vend”.
  • the third optical means and second timer circuit effectively prevent "stringing" or withdrawal of coins from the apparatus in an effort to fraudulently obtain a "vend", and a detent or goove is associated with the ramp to receive the string attached to a coin and trap the coin, preventing its withdrawal.
  • FIG. 1 is somewhate schematic perspective view of a portion of the panel of a machine with which the coin testing device is associated, showing the coin testing device in dashed lines;
  • Fig. 2 is a front perspective view of the coin testing device of the invention, showing the front panel thereof in dot-and-dash lines for sake of clarity;
  • Fig. 3 is an end view in elevation of the coin testing device of the invention.
  • Fig. 4 is a greatly enlarged, fragmentary section- al view taken along line 4-4 in figure 2;
  • Fig. 5 is a greatly enlarged, fragmentary section ⁇ al view taken along line 5-5 in figure 2, showing the reject gate in deenergized, at-rest , reject position;
  • Fig. 6 is a view similar to figure 5, showing the reject gate in an energized, accept postion;
  • Fig. 7 is a greatly enlarged, fragmentary section ⁇ al view taken along line 7-7 in figure 6;
  • Fig. 8 is a schematic diagram of a circuit used in the device of the invention.
  • the coin testing apparatus receives and tests a coin C inserted through slot 11 in the front panel 12 of the machine with which the testing apparatus is associated.
  • the coin testing apparatus 10 comprises a body of plate 13 having a rectangularly shaped lower portion 14 and a smaller rectangularly shaped upper portion 15.
  • the upper portion or plate is angularly inclined to the vertica at an angle of about 45 so that a coin fed into the app ⁇ aratus remains in contiguous, sliding contact with the plate 15.
  • a track or rail 16 is supported at the bottom edge of upper plate 15, and as seen best in figure 4, has an inclined upper surface 17.
  • a coin fed through slot 11 drops onto the rail and rolls along the inclined upper surface 17 while resting in sliding contact with the upper plate 15.
  • the rail 16 is inclined to the horizontal whereby the coin rolls downwardly with a suitable speed, and the inclined upper surface 17 of the rail supports a coin in predetermined elevated position, depending upon the thick ⁇ ness of the coin.
  • a first optical device is mounted on the upper plate 15 and comprises an LED 18 supported in a mounting bracket 19 secured to the top of the upper plate 15, and a phototransistor 20 supported on the upper plate 15.
  • the phototransistor 20 is supported in an opening 21 aimed across the path of a coin rolling down the track.
  • the LED is supported in an inclined open- ing 22 aimed downwardly toward the opening 21.
  • a coin C of the proper diameter and thickness will just block the opening 21, preventing light from the LED from striking the phototransistor 20.
  • a second optical device immediately follows the first optical device, and comprises an LED 23 and photo ⁇ transistor 24 mounted in openings 25 and 26, respective ⁇ ly, in the top plate 15 and aimed angularly toward one another.
  • An electromagnet 27 is disposed to one side of the path of the coin rolling down the track 16 and is spaced adjacent the end of the track 16 to detain a coin having magnetic properties and prevent its further advancement through the apparatus.
  • the electromagnet is energized in response to sensing of an acceptable coin by the first and second optical devices.
  • a movable gate or rail 28 is mounted beneath the end of track 16 and magnet 27 and is positioned across the opening into a reject slot or channel defined between a pair of deflectors 29 and 30 on the bottom plate 14.
  • the gate is- moved into position blocking entrance into the reject channel and bridging the space between the deflectors when the first and second optical devices sense an acceptable coin (see figures 2 and 6) . If the coin is unacceptable, the gate reamins in its retracted position as shown in figure 5, and the coin falls into the reject channel.
  • a third optical device comprising an LED 31 and phototransistor 32 is positioned above the gate 28 in the path of a coin rolling along the movable gate.
  • a fourth optical device comprising a LED 33 and phototransistor 34 is positioned in the path of a coin which has traversed the gate. Interruption of this light results in a vend signal.
  • a coin interrupting light to phototransistor 20 causes the phototransistor to go low, and this low signal is applied to pin 2 of 555 timer 35, turning the timer on for a period of time determined by the R-C circuit or timing network 36.
  • the duration of time the 555 timer is on could be on the order of 250 milli ⁇ seconds.
  • the output of 555 timer 35 goes high and is applied to the reset pins of latches L, , L « and L in a 4044 IC, enabling them to be set by the proper signal.
  • the photo ⁇ transistor -24 receives reflected light from LED 23 and provides a high signal to transistor 37, which inverts the signal and supplies a low signal to the latches L,, Lm and L 3 , setting them.
  • Setting of the latches causes their outputs to go high, turning on electromagnet 27 and detaining all coins having magnetic content until the timed duration of the signal from 555 timer 35 expires.
  • the output from latch L 3 is applied to transistor 38, which inverts the signal and turns on or energizes a solenoid 39, extending the gate 28 and bridging the space between deflectors 29 and 30 to support the coin after it leaves the track 16.
  • transistor 38 which inverts the signal and turns on or energizes a solenoid 39, extending the gate 28 and bridging the space between deflectors 29 and 30 to support the coin after it leaves the track 16.
  • the high output from latch L 2 is applied to one input of one quarter of a QUAD NAND 4011 IC, causing its output to go low. This low output is applied to the reset pin of a second 555 timer 41 and to a second quarter 42 of the 4011 IC, causing its output to go high.
  • the high output from the second quarter 42 of 4011 IC is applied to latch L. reset.
  • latch L. reset When an acceptable coin moves past LED 33 and phototransistor 34, blocking light from LED 33 to phototransistor 34, the output from the phototransistor 34 goes low, setting the latch L. and providing an output to a transistor 43 which turns on or energizes vend relay 44.
  • the coin In moving across the gate 28 the coin also passes between LED 31 and phototransistor 32, causing the output of phototransistor 32 to go low.
  • This low signal is applied to the set pin of 555 timer 41, but since the reset pin. is low (signal from NAND gate 40), there is no output from the 555 timer 41 and the output from the third quarter 45 of the 4011 IC stays high. Therefore, the 555 timer 35 continues to provide its output signal for the timed duration originally set.
  • timer 41 is turned on and the output from timer 41 is applied through NAND gate 45 to reset pin of timer 35, resetting it for a predetermined time during which a vend cannot be obtained
  • Another instance which would cause timer 41 to reset timer 35 is when a coin is caused to move back past phototransis ⁇ tor 32, as for example, by means of a string attached to the coin. Because of the timing of the timer 35, this could only occur after the timing sequence of timer 35 had expired. Thus, the low signal from phototransistor 32 would set timer 41 and cause timer 35 to be reset, since there would not be any low signal applied to the reset pin of timer 41.
  • a notch 46 is formed at the lower end of rail 16 (see figures 2 and 7) to trap the string (not shown) whenever someone attempts to obtain a fraudulent vend by the technique of "stringing".

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)

Abstract

The coin testing apparatus includes a first optical device (18, 20) positioned in predetermined spaced relationship with a ramp (16) along which the coin is constrained to roll after it is fed through an infeed slot (11). The first optical device detects a first parameter and produces a first signal of predetermined timed duration. A second optical device (23, 24) is positioned adjacent one side of the track or ramp (16) to measure the reflectivity of the coin and produce an output signal for a coin having the proper first and second parameters. The output signal energizes a device (27) which detains coins having an improper third parameter until expiration of the timed duration of the first signal. A reject mechanism (28) is operative to reject improper coins. A third optical device (31, 32) is positioned in the path of coins leaving the ramp (16) and is connected with a reset (32, 35, 41) to disable the apparatus for a predetermined time when an attempt is made to withdraw a coin back through the apparatus in a reverse direction past the third optical device. A coin detecting device (33, 34) is positioned in the path of a coin passing all of the tests to produce a ''vend'' signal.

Description

Coin Testing Apparatus
Technical Field:
This invention relates to apparatus for dis¬ criminating between acceptable and unacceptable coins. More particularly, the invention is used to test coins fed to vending machines of various types, such as coin- operated laundries, electronic games and dispensing machines for food and the like. The invention repre¬ sents an improvement over earlier U.S. Patent Numbers 3,978,962 and 4,089,400.
Background Art:
The use of coin-operated and controlled devices is widespread, and includes such diverse mechanisms as electronic games, coin-operated laundries, pay telephones, toll stations, good vending machines and the like. Since such devices are typically left unattended, they are particularly susceptible to vandalism and abuse. Operators of such machines lose large sums of revenue due to fraudulent use of bogus coins, tokens and the technique of "stringing", which entails the use of a string attached to a coin of proper value which is inserted into the apparatus by the user and then withdrawn after all of the tests are passed, thereby obtaining a free vend.
Various efforts have been made in the prior art to defeat such fraudulent use of the vending machines, including means for detecting and measuring selected parameters of a coin supplied to the apparatus. Examples of some such devices are disclosed in the aforementioned patents 3,978,962 and 4,089,400 and the patents cited therein.
Most of these devices are relatively complex and expensive, and are, themselves, subject to abuse. For instance, the majority of coin testing devices presently in use rely upon mechanical testing means for testing the physical size and metal content of the coins. Experience has shown that these devices can be defeated or rendered inoperable by introducing foreign material into the mechanism or by applying a sharp blow to it. Many of the devices can be "fooled" by dropping a coin of proper value into the machine, but then withdrawing the coin by means of a string attached to it after all of the tests have been passed.
Disclosure of the Invention:
In accordance with the present invention, a coin testing apparatus is provided which has a ramp disposed to receive coins supplied to the apparatus and the coins are constrained to roll down the ramp. A first optical means is positioned in predetermined spaced relationship with the ramp to detect the diameter and thickness of a coin rolling therepast. The first optical means includes light emitting means and light sensitive means on opposite sides of the path of the coin, with the light sensitive means mounted in an opening which is positioned such that a coin of proper thickness and diameter will completely cover and block the opening to light passing thereinto from the light emitting means. The light emitting means is disposed in an opening positioned angularly relative to the light sensitive means, so that light can only pass from the light emitting means to the light sensi¬ tive means when a coin is of insufficient thickness and diameter to completely block the opening to the light sensitive means. This arrangement enables high intensity lights to be used, thus rendering the apparatus less susceptible to external environmental conditions. When a coin of proper diameter and thickness is detected, a first signal of predetermined timed duration is produced by a first timer circuit. A second optical means is positioned adjacent the first optical means to sense the reflectiveity from the side of the coin and is operable to produce a second signal when the proper reflectiveity is detected. The first signal is supplied to a plurality of latches to reset or enable them, and the second signal is supplied to the latches to set them and provide an output signal which turns on an electromagnet and a solenoid. Coins having magnetic material therein are detained by the electromagnet until the timed duration expires, at which time the magnetic coins are rejected.
The solenoid operates a movable ramp segment, urging it from an at-rest position for rejecting coins to an energized position for conveying an acceptable coin past a "vend" device to a collection box.
The output signal from one of the latches is supplied to a NAND gate which, in turn, provides a reset signal to a second timer circuit. The second timer circuit is also connected with a third optical means disposed in the path of a coin leaving the ramp. So long as the proper reset signal is supplied to the second timer circuit, the apparatus remains operative and block¬ age of the third optical means by a coin moving therepast has no effect. However, if a coin is dropped into the apparatus and an effort is made to draw it back up through the apparatus, blockage of the third optical means will be out of sequence and the second timer circuit will disable or reset the first timer circuit for a predetermine period of time during which a "vend" cannot be obtained. The output or reset signal from the NAND gate is supplied, via a second NAND gate, to another latch to reset the latch.
A fourth optical means is positioned to sense a coin progressing through the apparatus from the reject gate or movable ramp segment, and only acceptable coins are detected by the fourth optical means. This fourth optical means is connected to provide a set signal to the last mentioned latch, providing an output to turn on a "vend" mechanism. The time duration set by the first timer circuit is very short, being on the order of about five milli¬ seconds. Thus, all of the tests have to be successfully completed within this time in order to obtain a "vend". The third optical means and second timer circuit effectively prevent "stringing" or withdrawal of coins from the apparatus in an effort to fraudulently obtain a "vend", and a detent or goove is associated with the ramp to receive the string attached to a coin and trap the coin, preventing its withdrawal.
Brief Description of the Drawings:
Details of the invention will be described in connection with the accompanying drawings, in which like reference characters designate like parts throughout the several views, and wherein: Fig. 1 is somewhate schematic perspective view of a portion of the panel of a machine with which the coin testing device is associated, showing the coin testing device in dashed lines;
Fig. 2 is a front perspective view of the coin testing device of the invention, showing the front panel thereof in dot-and-dash lines for sake of clarity;
Fig. 3 is an end view in elevation of the coin testing device of the invention;
Fig. 4 is a greatly enlarged, fragmentary section- al view taken along line 4-4 in figure 2;
Fig. 5 is a greatly enlarged, fragmentary section¬ al view taken along line 5-5 in figure 2, showing the reject gate in deenergized, at-rest , reject position; Fig. 6 is a view similar to figure 5, showing the reject gate in an energized, accept postion; Fig. 7 is a greatly enlarged, fragmentary section¬ al view taken along line 7-7 in figure 6; and
Fig. 8 is a schematic diagram of a circuit used in the device of the invention.
Best Mode for Carrying Out the Invention:
More specifically referring to the drawings, the coin testing apparatus, indicated generally at 10, receives and tests a coin C inserted through slot 11 in the front panel 12 of the machine with which the testing apparatus is associated.
The coin testing apparatus 10 comprises a body of plate 13 having a rectangularly shaped lower portion 14 and a smaller rectangularly shaped upper portion 15. The upper portion or plate is angularly inclined to the vertica at an angle of about 45 so that a coin fed into the app¬ aratus remains in contiguous, sliding contact with the plate 15. A track or rail 16 is supported at the bottom edge of upper plate 15, and as seen best in figure 4, has an inclined upper surface 17. A coin fed through slot 11 drops onto the rail and rolls along the inclined upper surface 17 while resting in sliding contact with the upper plate 15.
The rail 16 is inclined to the horizontal whereby the coin rolls downwardly with a suitable speed, and the inclined upper surface 17 of the rail supports a coin in predetermined elevated position, depending upon the thick¬ ness of the coin.
A first optical device is mounted on the upper plate 15 and comprises an LED 18 supported in a mounting bracket 19 secured to the top of the upper plate 15, and a phototransistor 20 supported on the upper plate 15. As seen best in figure 4, the phototransistor 20 is supported in an opening 21 aimed across the path of a coin rolling down the track. The LED is supported in an inclined open- ing 22 aimed downwardly toward the opening 21. Thus, a coin C of the proper diameter and thickness will just block the opening 21, preventing light from the LED from striking the phototransistor 20. Due to the angular relationship of the openings 21 and 22, the coin must completely cover the opening 21 or else light from the LED will impinge on the phototransistor. This enables relatively bright light to be used, reducing the possi¬ bility of erroneous readings caused by environmental conditions. Also, the sensitivity of the apparatus is significantly increased.
Coins of excessive diameter and thickness will generally be excluded by the feed slot in the front panel of the machine.
A second optical device immediately follows the first optical device, and comprises an LED 23 and photo¬ transistor 24 mounted in openings 25 and 26, respective¬ ly, in the top plate 15 and aimed angularly toward one another. Thus, when a coin rolls down the track, light from the LED will be reflected off the side of the coin onto the phototransistor if the coin has the proper reflectivity.
An electromagnet 27 is disposed to one side of the path of the coin rolling down the track 16 and is spaced adjacent the end of the track 16 to detain a coin having magnetic properties and prevent its further advancement through the apparatus. The electromagnet is energized in response to sensing of an acceptable coin by the first and second optical devices.
A movable gate or rail 28 is mounted beneath the end of track 16 and magnet 27 and is positioned across the opening into a reject slot or channel defined between a pair of deflectors 29 and 30 on the bottom plate 14. The gate is- moved into position blocking entrance into the reject channel and bridging the space between the deflectors when the first and second optical devices sense an acceptable coin (see figures 2 and 6) . If the coin is unacceptable, the gate reamins in its retracted position as shown in figure 5, and the coin falls into the reject channel. A third optical device comprising an LED 31 and phototransistor 32 is positioned above the gate 28 in the path of a coin rolling along the movable gate. If the coin is acceptable and all of the preceding tests have been successfully passed, interruption of this light by the coin has no effect on the operation of the apparatus However, if an effort is made to withdraw the coin back out of the apparatus and the coin interrupts this light, a signal is produced which disables the vending machine for a predetermined time. A fourth optical device comprising a LED 33 and phototransistor 34 is positioned in the path of a coin which has traversed the gate. Interruption of this light results in a vend signal.
The ciruitry associated with the lights, photo- transistors, gate and electromagnet is illustrated in figure 8. A coin interrupting light to phototransistor 20 causes the phototransistor to go low, and this low signal is applied to pin 2 of 555 timer 35, turning the timer on for a period of time determined by the R-C circuit or timing network 36. For example, the duration of time the 555 timer is on could be on the order of 250 milli¬ seconds.
The output of 555 timer 35 goes high and is applied to the reset pins of latches L, , L« and L in a 4044 IC, enabling them to be set by the proper signal.
When the coin passes LED 23 and phototransistor 24, if the coin has the proper reflectivity the photo¬ transistor -24 receives reflected light from LED 23 and provides a high signal to transistor 37, which inverts the signal and supplies a low signal to the latches L,, Lm and L3, setting them.
Setting of the latches causes their outputs to go high, turning on electromagnet 27 and detaining all coins having magnetic content until the timed duration of the signal from 555 timer 35 expires. The output from latch L3 is applied to transistor 38, which inverts the signal and turns on or energizes a solenoid 39, extending the gate 28 and bridging the space between deflectors 29 and 30 to support the coin after it leaves the track 16. Thus, magnetic coins will be held by the electromagnet until the solenoid is deenergized upon expiration of the time set by timer 35, and the gate is retracted, permitting bogus or unacceptable coins to fall into the reject channel. Coins which are non-magnetic will not be detained by the electromagnet and will continue to roll across the gate 28.
The high output from latch L2 is applied to one input of one quarter of a QUAD NAND 4011 IC, causing its output to go low. This low output is applied to the reset pin of a second 555 timer 41 and to a second quarter 42 of the 4011 IC, causing its output to go high.
The high output from the second quarter 42 of 4011 IC is applied to latch L. reset. Thus, when an acceptable coin moves past LED 33 and phototransistor 34, blocking light from LED 33 to phototransistor 34, the output from the phototransistor 34 goes low, setting the latch L. and providing an output to a transistor 43 which turns on or energizes vend relay 44.
In moving across the gate 28 the coin also passes between LED 31 and phototransistor 32, causing the output of phototransistor 32 to go low. This low signal is applied to the set pin of 555 timer 41, but since the reset pin. is low (signal from NAND gate 40), there is no output from the 555 timer 41 and the output from the third quarter 45 of the 4011 IC stays high. Therefore, the 555 timer 35 continues to provide its output signal for the timed duration originally set.
However, if latch L2 has not been set (resulting, for example, from a coin of improper reflectivity) , and the phototransistor 32 is blocked, the timer 41 is turned on and the output from timer 41 is applied through NAND gate 45 to reset pin of timer 35, resetting it for a predetermined time during which a vend cannot be obtained Another instance which would cause timer 41 to reset timer 35 is when a coin is caused to move back past phototransis¬ tor 32, as for example, by means of a string attached to the coin. Because of the timing of the timer 35, this could only occur after the timing sequence of timer 35 had expired. Thus, the low signal from phototransistor 32 would set timer 41 and cause timer 35 to be reset, since there would not be any low signal applied to the reset pin of timer 41.
A notch 46 is formed at the lower end of rail 16 (see figures 2 and 7) to trap the string (not shown) whenever someone attempts to obtain a fraudulent vend by the technique of "stringing".
While the coin testing apparatus has been shown and described in detail, this invention is not to be considered as being limited to the exact form disclosed, and changes in detail and construction may be made therein within the scope of the invention, without departing from the spirit thereof.

Claims

Claims
1. A coin testing apparatus for discriminating between acceptable and unacceptable coins and the like, and for providing a vend signal in response to sensing of an acceptable coin, comprising: an inclined track down which coins fed to the apparatus are constrained to roll from an inlet end thereof to an outlet end; a plurality of light emitting means and light sensitive means arranged in predetermined spaced re- lationship to the track to sense a plurality of parameters of the coin as the coin rolls along the track; first timer means connected with the light sensi¬ tive means to be turned on for a predetermined time duration in response to the sensing of a first parameter of the coin, said time duration being calulated to approxi¬ mate the time it would take a valid coin to roll unimpeded down the inclined track and past all of the light emitting means and the light sensitive means; magnet means positioned adjacent the track in a location to attract and detain until expiration of the time duration any coin having magnetic material therein; reject means adjacent the outlet end of the track and operative in response to sensing of an improper parameter to reject coins having the improper parameter; said light emitting means and associated light sensitive means including a light and phototransistor located adjacent the outlet end of the track in a loca¬ tion such that the light to the light sensitive means is blocked upon passage of a coin therebetween, producing a signal; second timer means connected to receive said signal, said second timer means being unaffected by pass¬ age of an acceptable coin between said light and photo- transistor, but being turned on for a predetermined time upon passage of an unacceptable coin or upon withdrawal of a coin therepast; and said second timer means being connected to reset the first timer means and inhibit a vend for said prede¬ termined time when it is turned on.
2. A coin testing apparatus as claimed in claim
1, wherein: the track includes a notch positioned to entrap a string attached to a coin supplied to the apparatus, to prevent withdrawal of the coin.
3. A coin testing apparatus as claimed in claim
2, wherein: a first light emitting means and associated light sensitive means are located in predetermined spaced re- lation to the track on opposite sides of the path of a coin rolling down the track such that a coin of acceptable diameter and thickness blocks the light to the light sensitive means, producing a first signal, said first signal being applied to the first timer means to turn it on, producing an output signal of predetermined time duration; a second light emitting means and associated light sensitive means are located on one side of the track and are aimed to sense the reflectivity from the side of the coin, producing a second signal; circuit means responsive to the output from the first timer means and to the second signal and operative to reset a latch means; and a third light emitting means and associated light sensitive means located to sense the presence of a coin which has passed all of the tests and to produce a third signal in response thereto, said third signal being applied to set the latch and obtain an output operative to turn on a vend device.
PCT/US1985/001327 1983-03-25 1985-07-15 Coin testing apparatus WO1987000663A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US06/478,842 US4546868A (en) 1983-03-25 1983-03-25 Coin testing apparatus
EP19850903631 EP0229055A1 (en) 1985-07-15 1985-07-15 Coin testing apparatus
PCT/US1985/001327 WO1987000663A1 (en) 1985-07-15 1985-07-15 Coin testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1985/001327 WO1987000663A1 (en) 1985-07-15 1985-07-15 Coin testing apparatus

Publications (1)

Publication Number Publication Date
WO1987000663A1 true WO1987000663A1 (en) 1987-01-29

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Application Number Title Priority Date Filing Date
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Country Status (2)

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EP (1) EP0229055A1 (en)
WO (1) WO1987000663A1 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2212313A (en) * 1987-11-13 1989-07-19 Coin & Micro Systems Limited Identifying articles
GB2227347A (en) * 1989-01-19 1990-07-25 Idx Inc Token validation device
EP0628930A1 (en) * 1993-06-07 1994-12-14 National Rejectors Inc. GmbH Coin tester with means preventing stringing
DE19529259A1 (en) * 1995-08-09 1997-02-13 Nat Rejectors Gmbh Coin mechanism
DE19549407A1 (en) * 1995-08-09 1997-02-13 Nat Rejectors Gmbh Coin testing system for coin operated machines
AT404761B (en) * 1994-03-14 1999-02-25 Leonhart Xaver Coin tester for slot machines and the like
CN112783012A (en) * 2019-11-08 2021-05-11 青岛海尔洗衣机有限公司 Coin detection method and system for coin device and clothes treatment equipment

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4089400A (en) * 1976-01-23 1978-05-16 Gregory Jr Lester Coin testing device
US4243133A (en) * 1979-03-08 1981-01-06 Bally Manufacturing Corporation Anti-stringing device for a coin detecting device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4089400A (en) * 1976-01-23 1978-05-16 Gregory Jr Lester Coin testing device
US4243133A (en) * 1979-03-08 1981-01-06 Bally Manufacturing Corporation Anti-stringing device for a coin detecting device

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2212313B (en) * 1987-11-13 1991-10-30 Coin & Micro Systems Limited Article identification
GB2212313A (en) * 1987-11-13 1989-07-19 Coin & Micro Systems Limited Identifying articles
GB2227347A (en) * 1989-01-19 1990-07-25 Idx Inc Token validation device
AU619639B2 (en) * 1989-01-19 1992-01-30 Idx, Inc. A token having a predetermined optical characteristic, and a token validation device for use therewith
GB2227347B (en) * 1989-01-19 1993-05-12 Idx Inc A token
EP0628930A1 (en) * 1993-06-07 1994-12-14 National Rejectors Inc. GmbH Coin tester with means preventing stringing
AT404761B (en) * 1994-03-14 1999-02-25 Leonhart Xaver Coin tester for slot machines and the like
DE19529259A1 (en) * 1995-08-09 1997-02-13 Nat Rejectors Gmbh Coin mechanism
DE19549407A1 (en) * 1995-08-09 1997-02-13 Nat Rejectors Gmbh Coin testing system for coin operated machines
DE19549407C2 (en) * 1995-08-09 1999-09-23 Nat Rejectors Gmbh Coin mechanism
DE19529259C2 (en) * 1995-08-09 2001-09-20 Nat Rejectors Gmbh Coin mechanism
CN112783012A (en) * 2019-11-08 2021-05-11 青岛海尔洗衣机有限公司 Coin detection method and system for coin device and clothes treatment equipment
CN112783012B (en) * 2019-11-08 2023-11-07 青岛海尔洗衣机有限公司 Coin detection method and system for coin device and clothes treatment equipment

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