TWI671536B - Electronic component correction unit and its application job sorter - Google Patents
Electronic component correction unit and its application job sorter Download PDFInfo
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- TWI671536B TWI671536B TW107130716A TW107130716A TWI671536B TW I671536 B TWI671536 B TW I671536B TW 107130716 A TW107130716 A TW 107130716A TW 107130716 A TW107130716 A TW 107130716A TW I671536 B TWI671536 B TW I671536B
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Abstract
一種電子元件校正單元,其係於載具上配置具驅動源及掣動具之驅動機構,該掣動具係設有第一、二導移部件,並承置第一校正具及第二校正具,該第一校正具係承置電子元件,並具有校正電子元件之第一校正部件,以及由第一導移部件帶動位移之第一承導部件,該第二校正具係設有相對第一校正部件且校正電子元件之第二校正部件,以及由第二導移部件帶動位移之第二承導部件,利用驅動機構之掣動具帶動第一校正具及第二校正具作相對位移而推移校正電子元件,達到精準校正電子元件之實用效益。 An electronic component correction unit is provided with a driving source and a driving mechanism of a detent on the carrier. The detent is provided with first and second guide members and receives a first correction tool and a second correction device. The first correcting tool is used for receiving electronic components, and has a first correcting member for correcting the electronic components, and a first guide member for displacement driven by the first guide moving member. The second correcting tool is provided with a relative first A correcting part and a second correcting part for correcting the electronic component, and a second guide part driven by the second guide moving part, and the first corrector and the second corrector are moved relative to each other by using the actuator of the driving mechanism The correction of electronic components is pushed to achieve the practical benefits of accurate electronic components correction.
Description
本發明係提供一種可精準校正電子元件之校正單元。 The invention provides a calibration unit capable of accurately calibrating electronic components.
在現今,電子元件日趨精密輕巧,自動化作業設備係以移料器將電子元件移載至各裝置之承置器,該承置器可為料盤、預溫盤或載台等,若電子元件偏移擺置於承置器內,當移料器將偏置之電子元件移入下一製程之測試座時,由於該偏置之電子元件的中心位置無法對位測試座之中心位置,不僅影響電子元件移入測試座之準確性,更將影響測試品質,故業者係於機台上設有一校正機構,用以校正電子元件之中心位置,以期提升移料器之取放料精準性。 At present, electronic components are becoming more sophisticated and lighter. Automated operating equipment uses electronic feeders to transfer electronic components to the holders of various devices. The holders can be trays, pre-warming trays, or carriers. The offset is placed in the holder. When the shifter moves the offset electronic component into the test stand of the next process, the center position of the offset electronic component cannot be aligned with the center position of the test stand, which not only affects The accuracy of the electronic components moving into the test stand will also affect the test quality. Therefore, the operator has a calibration mechanism on the machine to correct the center position of the electronic components, in order to improve the accuracy of the feeder.
請參閱第1圖,該校正機構係於一台板11上固設一呈L型之基準件12,並於基準件12之對角處設有一由壓缸13驅動位移之夾持件14,當移料器21將電子元件22移入基準件12與夾持件14之間,且置放於台板11上時,該壓缸13即驅動夾持件14相對基準件12作位移,令夾持件14推移電子元件22,使電子元件22之一角部靠抵於基準件12而定位,進而校正電子元件22之中心位置A,使電子元件22之中心位置A相對於移料器21之中心位置,再供移料器21取出已校正之電子元件22,並移載至下一製程之測試座(圖未示出)而執行測試作業;惟,由於不同型式之電子元件具有不同尺寸,當移料器21將另一批次大尺寸之電子元件23移入校正機構時,該夾持件14雖可推移電子元件23靠抵於基準件12而定位,但大尺寸之電子元件23的中心位置B已改變,當移料器2 1位移至預設取料位置時,移料器21之中心位置並無法對位於大尺寸電子元件23之中心位置B,導致移料器21取出偏置之電子元件23,進而降低校正使用效能。 Please refer to FIG. 1, the calibration mechanism is fixed on a plate 11 with an L-shaped reference piece 12, and a clamping piece 14 driven and displaced by a pressure cylinder 13 is provided at the diagonal of the reference piece 12. When the feeder 21 moves the electronic component 22 between the reference piece 12 and the holding piece 14 and is placed on the platen 11, the pressure cylinder 13 drives the holding piece 14 to move relative to the reference piece 12 to make the clip The holder 14 moves the electronic component 22 so that a corner of the electronic component 22 is positioned against the reference piece 12, and then the center position A of the electronic component 22 is corrected, so that the center position A of the electronic component 22 is relative to the center of the transfer device 21 Position, and then the feeder 21 takes out the calibrated electronic component 22 and transfers it to the test stand (not shown) of the next process to perform the test operation; however, because different types of electronic components have different sizes, when When the transfer device 21 moves another batch of large-sized electronic components 23 into the calibration mechanism, although the holding member 14 can move the electronic components 23 against the reference piece 12 for positioning, the center position of the large-sized electronic components 23 B has changed when feeder 2 1 When shifting to the preset picking position, the center position of the shifter 21 cannot be located at the center position B of the large-sized electronic component 23, which causes the shifter 21 to take out the offset electronic component 23, thereby reducing the calibration use efficiency.
本發明之目的一,係提供一種電子元件校正單元,其係於載具上配置具驅動源及掣動具之驅動機構,該掣動具係設有第一、二導移部件,並承置第一校正具及第二校正具,該第一校正具係承置電子元件,並具有校正電子元件之第一校正部件,以及由第一導移部件帶動位移之第一承導部件,該第二校正具係設有相對第一校正部件且校正電子元件之第二校正部件,以及由第二導移部件帶動位移之第二承導部件,利用驅動機構之掣動具帶動第一校正具及第二校正具作相對位移而推移校正電子元件,達到精準校正電子元件之實用效益。 An object of the present invention is to provide an electronic component correction unit, which is provided with a driving mechanism of a driving source and a trigger on the carrier. The trigger is provided with first and second guide components and is arranged. A first corrector and a second corrector, the first corrector is an electronic component, and has a first correcting component for correcting the electronic component; and a first guide component that is driven to move by the first guide component. The two correction tools are provided with a second correction member which is opposite to the first correction member and corrects the electronic components, and a second guide member which is driven to move by the second guide member. The first correction tool is driven by the detent of the driving mechanism and The second calibrator moves the calibration electronic component by relative displacement to achieve the practical benefit of accurate calibration of the electronic component.
本發明之目的二,係提供一種電子元件校正單元,其更包含檢知機構,該檢知機構係於該第一校正具設有至少一相通第一校正部件之第一通槽,以及於該第二校正具設有至少一相通第二校正部件之第二通槽,另於載具上設置至少一感測器,藉以利用第一、二校正具之第一、二通槽形成的檢知通道,而供感測器檢知第一校正具上是否殘留電子元件,以有效避免疊料或壓損電子元件,達到提升使用效能之實用效益。 The second object of the present invention is to provide an electronic component correction unit, which further includes a detection mechanism. The detection mechanism is provided with at least a first through groove communicating with the first correction component on the first calibration tool, and the first calibration groove The second calibration tool is provided with at least a second through groove communicating with the second calibration component, and at least one sensor is provided on the carrier, so as to use the detection formed by the first and second through grooves of the first and second calibration tools. Channel, and for the sensor to detect whether there are any remaining electronic components on the first calibrator, so as to effectively avoid material stacking or pressure damage to the electronic components and achieve practical benefits of improving the use efficiency.
本發明之目的三,係提供一種應用電子元件校正單元之作業分類機,其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置、校正單元及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待作業電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已作業電子元件之收料承置器,該作業裝置係配置於機台上,並設有至少一對電子元件執行預設作業之作業器,該輸送裝置係配置於機台上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之校正單元,以校正電子元件,該中央控制裝置係用以控制及整合各裝置作 動,以執行自動化作業,達到提升作業效能之實用效益。 A third object of the present invention is to provide a job classification machine using an electronic component correction unit, which includes a machine, a feeding device, a receiving device, a working device, a conveying device, a correction unit, and a central control device. The receiving device is arranged on the machine platform and is provided with at least one feeding supporter for containing the electronic components to be operated. The receiving device is arranged on the machine table and is provided with at least one receiving device for receiving the operated electronic components. The operating device is arranged on the machine and is provided with at least one pair of electronic components to perform preset operations. The conveying device is arranged on the machine and is provided with at least one transfer device for transferring electronic components. And at least one calibration unit of the present invention is provided to calibrate the electronic components. The central control device is used to control and integrate each device as To implement automated operations to achieve practical benefits of improving operational efficiency.
〔習知〕 [Learning]
11‧‧‧台板 11‧‧‧ countertop
12‧‧‧基準件 12‧‧‧ benchmark
13‧‧‧壓缸 13‧‧‧Press Cylinder
14‧‧‧夾持件 14‧‧‧Clamp
21‧‧‧移料器 21‧‧‧Feeder
22、23‧‧‧電子元件 22, 23‧‧‧Electronic components
A、B‧‧‧中心位置 A, B‧‧‧ Center
〔本發明〕 〔this invention〕
30‧‧‧校正單元 30‧‧‧correction unit
31‧‧‧載具 31‧‧‧ Vehicle
311‧‧‧載板 311‧‧‧ Carrier
312‧‧‧第一架體 312‧‧‧First frame
313‧‧‧第二架體 313‧‧‧Second frame
314‧‧‧第三架體 314‧‧‧ Third Frame
3141‧‧‧容置空間 3141‧‧‧accommodation space
3142‧‧‧第二滑軌 3142‧‧‧Second slide
3143‧‧‧第三滑軌 3143‧‧‧Third slide
3144‧‧‧第三通槽 3144‧‧‧Third channel
315‧‧‧第一滑軌 315‧‧‧The first slide
32‧‧‧驅動機構 32‧‧‧Drive mechanism
321‧‧‧馬達 321‧‧‧Motor
3221‧‧‧螺桿 3221‧‧‧Screw
3222‧‧‧螺座 3222‧‧‧Screw
323‧‧‧掣動具 323‧‧‧Trigger
3231‧‧‧第一導移部件 3231‧‧‧The first guide part
3232‧‧‧第二導移部件 3232‧‧‧Second guide moving part
324‧‧‧第一滑座 324‧‧‧First Slide
33‧‧‧第一校正具 33‧‧‧First Calibration Tool
331‧‧‧第一塊體 331‧‧‧First block
332‧‧‧第二塊體 332‧‧‧Second block
3321‧‧‧承置部 3321‧‧‧Accommodation Department
333、333A‧‧‧第三塊體 333, 333A‧‧‧Third block
3331、3331A‧‧‧第一校正部件 3331, 3331A‧‧‧First Calibration Unit
3332、3332A‧‧‧第一通槽 3332, 3332A‧‧‧First through slot
334‧‧‧第一承導部件 334‧‧‧First Guide Component
335‧‧‧第二滑座 335‧‧‧Second Slide
L‧‧‧中心軸線 L‧‧‧ center axis
34‧‧‧第二校正具 34‧‧‧Second Calibration Tool
341‧‧‧第四塊體 341‧‧‧ Fourth block
342‧‧‧第五塊體 342‧‧‧Fifth block
343、343A‧‧‧第六塊體 343, 343A‧‧‧ Sixth block
3431、3431A‧‧‧第二校正部件 3431, 3431A‧‧‧Second Calibration Unit
3432、3432A‧‧‧第二通槽 3432, 3432A‧‧‧Second through slot
344‧‧‧第二承導部件 344‧‧‧Second guide component
345‧‧‧第三滑座 345‧‧‧third slide
35‧‧‧檢知機構 35‧‧‧ Inspection Agency
351‧‧‧投光元件 351‧‧‧light-emitting element
352‧‧‧接光元件 352‧‧‧Light receiving element
40‧‧‧移料器 40‧‧‧Feeder
P‧‧‧中心位置 P‧‧‧Center Position
41、42‧‧‧電子元件 41, 42‧‧‧ electronic components
C、D‧‧‧中心位置 C, D‧‧‧ center position
50‧‧‧機台 50‧‧‧machine
60‧‧‧供料裝置 60‧‧‧Feeding device
61‧‧‧供料承置器 61‧‧‧feeder
70‧‧‧收料裝置 70‧‧‧ Receiving device
71‧‧‧收料承置器 71‧‧‧Receiving container
80‧‧‧作業裝置 80‧‧‧Working device
81‧‧‧電路板 81‧‧‧Circuit Board
82‧‧‧測試座 82‧‧‧Test Block
90‧‧‧輸送裝置 90‧‧‧ Conveying device
91‧‧‧第一移料器 91‧‧‧The first feeder
92‧‧‧第一入料載台 92‧‧‧First loading stage
93‧‧‧第二入料載台 93‧‧‧Second loading stage
94‧‧‧第二移料器 94‧‧‧second feeder
95‧‧‧第三移料器 95‧‧‧ third feeder
96‧‧‧第一出料載台 96‧‧‧First discharge stage
97‧‧‧第二出料載台 97‧‧‧Second discharge stage
98‧‧‧第四移料器 98‧‧‧The fourth feeder
第1圖:習知電子元件校正機構之使用示意圖。 Figure 1: Schematic diagram of the use of the conventional electronic component correction mechanism.
第2圖:本發明電子元件校正單元之外觀圖。 FIG. 2 is an external view of an electronic component correction unit of the present invention.
第3圖:本發明電子元件校正單元之零件分解圖。 Fig. 3: Exploded view of parts of the electronic component correction unit of the present invention.
第4圖:本發明電子元件校正單元之俯視圖。 FIG. 4 is a top view of the electronic component correction unit of the present invention.
第5圖:係校正小尺寸電子元件之使用示意圖(一)。 Figure 5: Schematic diagram of the use of small electronic components (1).
第6圖:係校正小尺寸電子元件之使用示意圖(二)。 Figure 6: A schematic diagram of the use of the calibration of small electronic components (2).
第7圖:係校正小尺寸電子元件之使用示意圖(三)。 Fig. 7 is a schematic diagram of the use of the calibration of small-sized electronic components (3).
第8圖:係校正小尺寸電子元件之使用示意圖(四)。 Figure 8: Schematic diagram of the use of small electronic components (4).
第9圖:係校正大尺寸電子元件之使用示意圖(一)。 Figure 9: Schematic diagram of the use of calibration of large-sized electronic components (1).
第10圖:係校正大尺寸電子元件之使用示意圖(二)。 Figure 10: Schematic diagram of the use of large-scale electronic components (2).
第11圖:係校正大尺寸電子元件之使用示意圖(三)。 Fig. 11 is a schematic diagram of the use of the correction of large-sized electronic components (3).
第12圖:係校正單元應用於作業分類機之示意圖。 FIG. 12 is a schematic diagram of a correction unit applied to a job sorter.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱第2、3、4圖,本發明電子元件校正單元30包含載具31、驅動機構32、第一校正具33、第二校正具34及檢知機構35;該載具31係為固定式配置而固設於機台(圖未示出)上,或為活動式配置而由至少一動力源(圖未示出)驅動作至少一方向位移,於本實施例中,該載具31係設有一固設於機台之載板311,並於載板311上設置第一架體312及第二架體313,一跨置固設於第一架體312及第二架體313上之第三架體314,該第三架體314係設有中空之容置空間3141;該驅動機構32係裝配於載具31上,並設有驅動源及由該驅動源驅動位移之掣動具,更進一步,該驅動源可為壓缸、線性馬達或包含馬達及傳動組,於本實施例中,該驅 動源包含馬達321,以及由該馬達321驅動且為螺桿螺座組之傳動組,該馬達321係水平斜向配置,該螺桿螺座組之螺桿3221係連結馬達321,並以螺座3222連結掣動具323,以帶動掣動具323作水平斜向位移,該掣動具323係設有第一導移部件3231及第二導移部件3232,更進一步,第一導移部件3231及第二導移部件3232係為導槽或導桿,於本實施例中,該第一導移部件3231及第二導移部件3232均為導槽,該驅動機構32另於掣動具323與載具31之間設有至少一第一滑軌組,於本實施例中,係於載具31之載板311上固設有呈斜向配置之第一滑軌315,並於掣動具323之底面裝配有可滑置於第一滑軌315上之第一滑座324;該第一校正具33係位於驅動機構32之掣動具323上,並設有至少一承置電子元件之承置部,以及設有至少一校正電子元件之第一校正部件,更進一步,該第一校正具33係為一體成型,或包含複數個塊體,於本實施例中,該第一校正具33係設有第一塊體331、第二塊體332及複數個第三塊體333,該第一塊體331上係裝配一具有承置部3321之第二塊體332,其承置部3321係承置電子元件,並供裝配複數個具第一校正部件3331之第三塊體333,該第一校正部件3331係為一角部,用以校正電子元件,又該第一校正具33係設有至少一與掣動具323之第一導移部件3231相互配合之第一承導部件334,於本實施例中,係於第一塊體331之底面設置一為導桿之第一承導部件334,並令第一承導部件334插置且位移於掣動具323之第一導移部件3231,另於第一校正具33與載具31之第三架體314間係設有至少一第二滑軌組,於本實施例中,係於載具31之第三架體314固設呈斜向配置之第二滑軌3142,並於第一校正具33之第一塊體331上裝配有滑置於第二滑軌3142上之第二滑座335;該第二校正具34係位於驅動機構32之掣動具323上,並設有至 少一相對第一校正部件3331且校正電子元件之第二校正部件,更進一步,該第二校正具34係為一體成型,或包含複數個塊體,於本實施例中,該第二校正具34係設有第四塊體341、第五塊體342及複數個第六塊體343,該第四塊體341上係裝配第五塊體342,該第五塊體342係裝配複數個具第二校正部件3431之第六塊體343,該第二校正部件3431係為一角部,用以校正電子元件,又該第二校正具34係設有至少一與掣動具323之第二導移部件3232相互配合之第二承導部件344,於本實施例中,係於第四塊體341之底面設置一為導桿之第二承導部件344,並令第二承導部件344插置且位移於掣動具323之第二導移部件3232,另於第二校正具34與載具31之第三架體314間係設有至少一第三滑軌組,於本實施例中,係於載具31之第三架體314固設有呈斜向配置之第三滑軌3143,並於第二校正具34之第四塊體341上裝配有滑置於第二滑軌3143上之第三滑座345;該檢知機構35係於載具31設有至少一感測器,並於第一校正具33及第二校正具34分別開設有相對應之第一通槽及第二通槽,以供感測器檢知第一校正具33上是否殘留電子元件,於本實施例中,該感測器係於載具31之第一架體312裝配一投光元件351,並於第二架體313裝配一接光元件352,另於第一校正具33之各第三塊體333開設有相通第一校正部件3331之第一通槽3332,以及於第二校正具34之各第六塊體343開設有相通第二校正部件3431之第二通槽3432,以及於載具31之第三架體314開設有第三通槽3144,使得第一通槽3332、第二通槽3432及第三通槽3144形成一檢知通道,以供檢知第一校正具33上是否殘留電子元件。 In order for your reviewing committee to further understand the present invention, a preferred embodiment will be given in conjunction with the drawings, which will be described in detail as follows: Please refer to FIGS. 2, 3, and 4. The electronic component correction unit 30 of the present invention includes a carrier. 31. Driving mechanism 32, first calibration tool 33, second calibration tool 34, and detection mechanism 35; the carrier 31 is fixedly arranged on a machine (not shown), or is movable It is configured to be driven by at least one power source (not shown in the figure) for displacement in at least one direction. In this embodiment, the carrier 31 is provided with a carrier plate 311 fixed on the machine platform, and is disposed on the carrier plate 311. The first frame body 312 and the second frame body 313 are a third frame body 314 which is fixed on the first frame body 312 and the second frame body 313 across the third frame body. The third frame body 314 is provided with a hollow space. Space 3141; The driving mechanism 32 is assembled on the carrier 31, and is provided with a driving source and a driving device for driving displacement by the driving source. Furthermore, the driving source may be a cylinder, a linear motor, or a motor and a transmission. Group, in this embodiment, the driver The driving source includes a motor 321 and a transmission group driven by the motor 321 and being a screw and screw seat group. The motor 321 is arranged horizontally and obliquely. The screw 3221 of the screw and screw seat group is connected to the motor 321 and is connected to the screw seat 3222. The detent 323 drives the detent 323 to perform horizontal oblique displacement. The detent 323 is provided with a first guide member 3231 and a second guide member 3232. Furthermore, the first guide member 3231 and the third guide member The two guide moving members 3232 are guide grooves or guide rods. In this embodiment, the first guide moving member 3231 and the second guide moving member 3232 are both guide grooves. The driving mechanism 32 is further connected to the stopper 323 and the load. At least one first slide rail group is provided between the tools 31. In this embodiment, the first slide rail 315 arranged in an oblique direction is fixed on the carrier plate 311 of the carrier 31, and the stopper 323 is The bottom surface is equipped with a first slide base 324 which can be slid on the first slide rail 315; the first corrector 33 is located on the detent 323 of the driving mechanism 32, and is provided with at least one bearing for receiving electronic components. And a first correction component provided with at least one correction electronic component. Furthermore, the first correction tool 33 is integrated Or includes a plurality of blocks. In this embodiment, the first corrector 33 is provided with a first block 331, a second block 332, and a plurality of third blocks 333. The first block 331 is provided on the first corrector 33. A second block 332 is provided with a receiving portion 3321. The receiving portion 3321 is used for receiving electronic components and is used for assembling a plurality of third blocks 333 with a first correction member 3331. The first correction member 3331 It is a corner for correcting electronic components, and the first corrector 33 is provided with at least a first guide member 334 which cooperates with the first guide member 3231 of the detent 323. In this embodiment, A first guide member 334 is provided on the bottom surface of the first block 331 as a guide rod, and the first guide member 334 is inserted and displaced to the first guide member 3231 of the stopper 323. At least one second slide rail set is provided between the first correction tool 33 and the third frame 314 of the carrier 31. In this embodiment, the third frame 314 of the carrier 31 is fixedly arranged in an oblique direction. A second slide rail 3142, and a second slide 335 slid on the second slide rail 3142 is mounted on the first block 331 of the first corrector 33; the second correction Latching system 34 is located in the drive mechanism 32 movable with the 323, and provided to One is less than the first correction part 3331 and the second correction part for correcting the electronic components. Furthermore, the second correction tool 34 is integrally formed or includes a plurality of blocks. In this embodiment, the second correction tool 34 34 is provided with a fourth block 341, a fifth block 342, and a plurality of sixth blocks 343. The fourth block 341 is equipped with a fifth block 342, and the fifth block 342 is equipped with a plurality of tools. The sixth block 343 of the second correction member 3431. The second correction member 3431 is a corner portion for correcting the electronic components. The second correction member 34 is provided with at least one second guide and the stopper 323. A second guide member 344 that cooperates with the moving member 3232 in this embodiment. In this embodiment, a second guide member 344 as a guide rod is provided on the bottom surface of the fourth block 341, and the second guide member 344 is inserted. It is placed and displaced on the second guide member 3232 of the detent 323, and at least one third slide group is arranged between the second correction tool 34 and the third frame 314 of the carrier 31. In this embodiment, The third frame 314 attached to the carrier 31 is fixed with a third slide rail 3143 arranged in an oblique direction, and the fourth The body 341 is equipped with a third sliding seat 345 slidably placed on the second slide rail 3143; the detection mechanism 35 is provided with at least one sensor on the carrier 31, and is calibrated on the first calibration tool 33 and the second calibration A corresponding first through slot and a second through slot are respectively provided in the tool 34 for the sensor to detect whether there are any remaining electronic components on the first calibration tool 33. In this embodiment, the sensor is attached to a carrier The first frame body 312 of 31 is equipped with a light projection element 351, and the second frame body 313 is equipped with a light receiving element 352. In addition, the first correcting member 3331 is connected to each of the third blocks 333 of the first corrector 33. A first through groove 3332 and a second through groove 3332 communicating with the second correction member 3431 in each of the sixth blocks 343 of the second correction tool 34 and a third frame 314 provided with a third correction member 34 in the carrier 31 The three through grooves 3144 enable the first through groove 3332, the second through groove 3332, and the third through groove 3144 to form a detection channel for detecting whether there is an electronic component remaining on the first corrector 33.
請參閱第5圖,於執行校正電子元件作業前,該校正單元30係以檢知機構35之投光元件351經第一校正具3 3之第一通槽3332及第二校正具34之第二通槽3432及載具31之第三通槽3144所形成的檢知通道投射光線,當接光元件352經由檢知通道接收到光線時,即代表第一校正具33之承置部3321上並無殘留電子元件,進而有效避免疊料或壓損電子元件,反之,若無接收到光線,則代表第一校正具33之承置部3321上殘留電子元件或驅動源異常,工作人員即需排除異常。 Please refer to FIG. 5, before performing the operation of calibrating the electronic components, the calibration unit 30 uses the light-emitting element 351 of the detection mechanism 35 to pass the first calibration tool 3. The detection channel formed by the first through groove 3332 of 3, the second through groove 3432 of the second correction tool 34, and the third through groove 3144 of the carrier 31 projects light, and when the light receiving element 352 receives the light through the detection channel At this time, there is no residual electronic component on the receiving portion 3321 of the first corrector 33, which effectively avoids stacking or pressure damage to the electronic component. On the contrary, if no light is received, it means that the first corrector 33 is accepted. The electronic components or the driving source on the part 3321 are abnormal, and the worker needs to eliminate the abnormality.
請參閱第6圖,於檢知作業完畢,該校正單元30之驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,使第一校正具33之承置部3321提供一較大之入料空間,以供移料器40作Z方向位移順利將偏置之電子元件41移入第一校正具33之承置部3321。 Please refer to FIG. 6. After the detection operation is completed, the driving mechanism 32 of the correction unit 30 is driven by the motor 321 through the screw 3221 and the screw seat 3222 to move the detent 323, and the detent 323 is moved by the first guide. The parts 3231 and the second guide moving part 3232 guide the displacement of the first guide member 334 pushing the first corrector 33 and the second guide member 344 of the second corrector 34 to drive the first corrector 33 and the first The two correction tools 34 are respectively displaced outward, so that the receiving portion 3321 of the first correction tool 33 provides a larger feeding space for the Z-position displacement of the shifter 40 to smoothly move the offset electronic component 41 into the first The receiving portion 3321 of the corrector 33.
請參閱第7圖,接著該驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323反向位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向內位移,由於電子元件41係置放於第一校正具33之承置部3321,該第一校正具33係會帶動電子元件41朝向第二校正具34作相對位移,同時,該第二校正具34之第二校正部件3431會頂推電子元件41位移,令電子元件41靠置於第一校正具33之第一校正部件3331,使得第一校正具33之第一校正部件3331及第二校正具34之第二校正部件3431校正電子元件41,由於驅動機構32係以掣動具323之第一導移部件3231及第二導移部件 3232同步作動導引第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,而可使第一校正具33及第二校正具34具有相同之位移行程,以令第一校正具33之第一校正部件3331及第二校正具34之第二校正部件3431夾持推移電子元件41之中心位置C對位於第一校正具33之承置部3321的中心軸線L,進而校正電子元件41之中心位置C。 Please refer to FIG. 7. Then, the driving mechanism 32 is driven by the motor 321 via the screw 3221 and the screw seat 3222 to move the detent 323 in the reverse direction. The detent 323 is moved by the first guide member 3231 and the second guide. The component 3232 guides the displacement of the first guide member 334 pushing the first corrector 33 and the second guide member 344 of the second corrector 34 to drive the first corrector 33 and the second corrector 34 inward, respectively. Displacement, since the electronic component 41 is placed on the receiving portion 3321 of the first corrector 33, the first corrector 33 will drive the electronic component 41 to relatively move toward the second corrector 34, and at the same time, the second corrector The second correction component 3431 of 34 will push the electronic component 41 to move, so that the electronic component 41 rests on the first correction component 3331 of the first correction device 33, so that the first correction component 3331 and the second correction of the first correction device 33 The second correction part 3431 of the tool 34 corrects the electronic component 41, because the driving mechanism 32 is used to actuate the first guide member 3231 and the second guide member of the tool 323. The 3232 synchronous operation guides the displacement of the first guide member 334 of the first correction tool 33 and the second guide member 344 of the second correction tool 34, so that the first correction tool 33 and the second correction tool 34 have the same displacement. The stroke is such that the first correcting member 3331 of the first correcting tool 33 and the second correcting member 3431 of the second correcting tool 34 clamp and move the center position C of the electronic component 41 to the receiving portion 3321 of the first correcting tool 33. The center axis L corrects the center position C of the electronic component 41.
請參閱第8圖,於完成校正作業後,該校正單元30之驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於第一校正具33之承置部3321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件41之中心位置C,該移料器40即可作Z方向向下位移而精準取出電子元件41,以利準確將電子元件41移入至下一作業器(如測試座,圖未示出)。 Please refer to FIG. 8. After the calibration operation is completed, the driving mechanism 32 of the calibration unit 30 is driven by the motor 321 through the screw 3221 and the screw seat 3222 to move the detent 323, and the detent 323 is moved by the first guide. The parts 3231 and the second guide moving part 3232 guide the displacement of the first guide member 334 pushing the first corrector 33 and the second guide member 344 of the second corrector 34 to drive the first corrector 33 and the first The two correction tools 34 are respectively displaced outward. When the shifter 40 is moved to the preset picking position, since the center position P of the shifter 40 has been preset to the central axis of the receiving portion 3321 located at the first correction tool 33 L, so that the center position P of the shifter 40 can be positioned at the center position C of the electronic component 41, and the shifter 40 can be moved downward in the Z direction to accurately take out the electronic component 41, so as to accurately and accurately move the electronic component 41 Move to the next manipulator (such as a test stand, not shown).
請參閱第9圖,欲校正大尺寸之電子元件42時,該校正單元30可更換第一校正具33之第三塊體,而於第二塊體332上換裝不同尺寸之複數個具有第一校正部件3331A及第一通槽3332A的第三塊體333A,以及更換第二校正具34之第六塊體,而於第五塊體342上換裝不同尺寸之複數個具有第二校正部件3431A及第二通槽3432A的第六塊體343A;該驅動機構32之馬達321係經由螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承 導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,使第一校正具33及第二校正具34之間提供一較大之入料空間,該移料器40即可帶動偏置之電子元件42作Z方向向下位移置放於第一校正具33之承置部3321。 Please refer to FIG. 9. When the large-sized electronic component 42 is to be corrected, the correction unit 30 may replace the third block of the first correction tool 33, and the second block 332 may be replaced with a plurality of different-sized ones having a first block. A correction member 3331A, a third block 333A of the first through groove 3332A, and a sixth block in which the second correction tool 34 is replaced, and a fifth block 342 is replaced with a plurality of second correction members of different sizes. 3431A and the sixth block 343A of the second through groove 3432A; the motor 321 of the driving mechanism 32 drives the detent 323 to move through the screw 3221 and the screw seat 3222, and the detent 323 is the first guide member 3231 And the second guide moving member 3232 respectively guide the first guide member 334 of the first corrector 33 and the second guide member of the second corrector 34 The guide member 344 is displaced to drive the first corrector 33 and the second corrector 34 to move outward respectively, so that a larger feeding space is provided between the first corrector 33 and the second corrector 34. The feeder 40 can drive the offset electronic component 42 to be displaced downward in the Z direction and placed on the receiving portion 3321 of the first corrector 33.
請參閱第10圖,接著該驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323反向位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向內位移,該第一校正具33係會帶動電子元件42朝向第二校正具34作相對位移,同時,該第二校正具34之第二校正部件3431A會頂推電子元件42位移,令電子元件42靠置於第一校正具33之第一校正部件3331A,使得第一校正具33之第一校正部件3331A及第二校正具34之第二校正部件3431A夾持推移電子元件42之中心位置D對位於第一校正具33之承置部3321的中心軸線L,進而校正電子元件42之中心位置D。 Please refer to FIG. 10, and then the driving mechanism 32 is driven by the motor 321 through the screw 3221 and the screw seat 3222 to reverse the displacement of the detent 323, and the detent 323 uses the first guide member 3231 and the second guide to move The component 3232 guides the displacement of the first guide member 334 pushing the first corrector 33 and the second guide member 344 of the second corrector 34 to drive the first corrector 33 and the second corrector 34 inward, respectively. Displacement, the first corrector 33 will drive the electronic component 42 toward the second corrector 34 for relative displacement, and at the same time, the second correcting member 3431A of the second corrector 34 will push the electronic component 42 to move, so that the electronic component 42 will be displaced. The first correction member 3331A placed on the first correction tool 33 makes the first correction member 3331A of the first correction tool 33 and the second correction member 3431A of the second correction tool 34 clamp and move the center position D pair of the electronic component 42. The central axis L of the receiving portion 3321 of the first corrector 33 is used to correct the central position D of the electronic component 42.
請參閱第11圖,於完成校正作業後,該驅動機構32之馬達321經由螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於第一校正具33之承置部3321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件42之中心位置D,該移料器40即可作Z方向向下位移而精準取出電子元件42,以利準確將電子元件42移入至下一作業器(如測試座,圖未示出)。 Please refer to FIG. 11. After the calibration operation is completed, the motor 321 of the driving mechanism 32 drives the detent 323 to move through the screw 3221 and the screw seat 3222. The detent 323 uses the first guide member 3231 and the second The guide member 3232 guides the displacement of the first guide member 334 pushing the first corrector 33 and the second guide member 344 of the second corrector 34 to drive the first corrector 33 and the second corrector 34, respectively. Outward displacement, when the shifter 40 is moved to the preset picking position, since the center position P of the shifter 40 is preset to the central axis L of the receiving portion 3321 of the first corrector 33, The center position P of the device 40 can be positioned at the center position D of the electronic component 42. The feeder 40 can move downward in the Z direction to accurately take out the electronic component 42 in order to accurately move the electronic component 42 to the next operation. (Such as a test stand, not shown).
請參閱第2、3、4、12圖,係本發明校正單元 30應用於電子元件作業分類機之示意圖,該作業分類機係於機台50上配置有供料裝置60、收料裝置70、作業裝置80、輸送裝置90及中央控制裝置(圖未示出);該供料裝置60係裝配於機台50,並設有至少一為供料盤之供料承置器61,用以容納至少一待作業之電子元件;該收料裝置70係裝配於機台50,並設有至少一為收料盤之收料承置器71,用以容納至少一已作業之電子元件;該作業裝置80係裝配於機台50,並設有至少一作業器,以對電子元件執行預設作業,於本實施例中,該作業器係為測試器,該測試器係設有電性連接之電路板81及測試座82,並以測試座82承置及測試電子元件;該輸送裝置90係裝配於機台50上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之校正單元30,以校正電子元件,於本實施例中,該輸送裝置90係設有第一移料器91,以於供料裝置60之供料承置器61取出待測之電子元件,並移載至第一入料載台92及第二入料載台93,第一入料載台92及第二入料載台93將待測之電子元件載送至測試裝置80之側方,該輸送裝置90係以第二移料器94及第三移料器95於第一入料載台92及第二入料載台93取出待測之電子元件,並分別移入二校正單元30而校正電子元件,再以第二移料器94及第三移料器95將二校正單元30內已校正之電子元件移載至作業裝置80之測試座82而執行測試作業,以及將測試座82之已測電子元件移載至第一出料載台96及第二出料載台97,第一出料載台96及第二出料載台97載出已測之電子元件,該輸送裝置90係以第四移料器98於第一出料載台96及第二出料載台97上取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置70之收料承置器71處而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to Figures 2, 3, 4, and 12 for the calibration unit of the present invention. 30 is a schematic diagram of an electronic component job classification machine, which is configured on a machine 50 with a feeding device 60, a receiving device 70, a working device 80, a conveying device 90, and a central control device (not shown in the figure) The feeding device 60 is assembled on the machine table 50 and is provided with at least one feeding holder 61 which is a feeding tray for receiving at least one electronic component to be operated. The receiving device 70 is assembled on the machine The receiving device 71 is provided with at least one receiving device 71 which is a receiving tray for accommodating at least one operated electronic component. The operation device 80 is assembled on the machine table 50 and is provided with at least one operation device. The preset operation is performed on electronic components. In this embodiment, the operation device is a tester, and the tester is provided with an electrically connected circuit board 81 and a test base 82, and the test base 82 is used for testing. Electronic components; the conveying device 90 is assembled on the machine 50, and is provided with at least one transfer device for transferring electronic components, and at least one calibration unit 30 of the present invention is provided to calibrate the electronic components. In this embodiment, The conveying device 90 is provided with a first feeder 91 for feeding. The feeding holder 61 of the device 60 takes out the electronic components to be tested and transfers them to the first feeding stage 92 and the second feeding stage 93, the first feeding stage 92 and the second feeding stage 93 The electronic components to be tested are carried to the side of the testing device 80, and the conveying device 90 uses the second feeder 94 and the third feeder 95 on the first loading platform 92 and the second loading platform. The stage 93 takes out the electronic components to be tested, and moves them into the second calibration unit 30 to calibrate the electronic components, and then uses the second transfer device 94 and the third transfer device 95 to transfer the calibrated electronic components in the second calibration unit 30 to The test base 82 of the operating device 80 performs test operations, and the measured electronic components of the test base 82 are transferred to the first discharge stage 96 and the second discharge stage 97, the first discharge stage 96 and the first The second discharge stage 97 carries the measured electronic components. The conveying device 90 uses a fourth transfer device 98 to take out the measured electronic components from the first discharge stage 96 and the second discharge stage 97. According to the test results, the measured electronic components are transported to the receiving receiver 71 of the receiving device 70 to be classified for collection; the central control device is used to control and Integrate the actions of various devices to perform automated operations to achieve practical benefits of improving operation efficiency.
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