TWI496111B - Bent pin inspection method - Google Patents
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- TWI496111B TWI496111B TW102121768A TW102121768A TWI496111B TW I496111 B TWI496111 B TW I496111B TW 102121768 A TW102121768 A TW 102121768A TW 102121768 A TW102121768 A TW 102121768A TW I496111 B TWI496111 B TW I496111B
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Description
本發明是有關於一種針腳彎曲檢測方法,特別是有關於一種應用於中央處理器(Central Processing Unit,CPU)之插槽的針腳彎曲檢測方法。The present invention relates to a method for detecting a bending of a stitch, and more particularly to a method for detecting a bending of a stitch applied to a slot of a Central Processing Unit (CPU).
現行主流的中央處理器(Central Processing Unit,CPU)的插槽可區分為1366/1567/2011針腳等。由於這些插槽的針腳數量非常多,因此經常會出現針腳偏移、異物入侵、針腳毀損等情況出現。目前在檢測插槽的針腳所採用的方式,是利用人工目視方式進行檢查,但此方式並不可靠,常常會造成後續中央處理器測試時容易出現品質問題。The slots of the current mainstream Central Processing Unit (CPU) can be divided into 1366/1567/2011 pins. Since the number of pins in these slots is very large, pin shifting, foreign matter intrusion, and stitch damage often occur. At present, the method used to detect the pins of the slot is to use manual visual inspection, but this method is not reliable and often causes quality problems in subsequent CPU tests.
一般來說,針腳與針腳之間的間距約為40 mils(約1.016 mm)左右。而在針腳常出現的角度歪斜或陰影、下壓或上翹等多種不良情況之中,有些偏移僅4~5 mils,以上述人工目視方式難以驗出。In general, the spacing between the pins and the pins is about 40 mils (about 1.016 mm). Among the various adverse conditions such as skewing or shadowing, pressing or upturning, which are often seen in stitches, some offsets are only 4 to 5 mils, which is difficult to detect by the above-mentioned manual visual method.
再者,單一插槽少則包含一千多個針腳,多則包含兩千多個針腳,若以述人工目視方式進行檢查,不僅時間緩慢,並且容易出現誤判為通過檢測的不良品。Furthermore, a single slot contains less than a thousand pins, and more than two thousand pins. If the inspection is performed by manual visual inspection, not only is the time slow, but also a defective product that is misjudged as passing the detection is prone to occur.
另外,目前雖有習知自動光學檢測(AOI)設備可用以檢測插槽,但其成本費用相當高(超過百萬元)。在檢測過程中,習知自動光學檢測設備必須在檢測完一個插槽之後,才能再移動到另一個插槽進行檢測,造成待測的插槽數量越多,其所需的檢測時間就越長的問題。不僅如此,習知自動光學檢測設備所需的治具空間較大。In addition, although conventional automatic optical inspection (AOI) equipment is currently available to detect slots, the cost is quite high (more than one million dollars). During the detection process, the conventional automatic optical inspection device must detect another slot before moving to another slot for detection. The more the number of slots to be tested, the longer the detection time required. The problem. Moreover, the fixtures required for conventional automatic optical inspection equipment have a large space.
本發明提供一種針腳彎曲檢測方法,其係應用至插槽。插槽包含複數個針腳。針腳彎曲檢測方法包含:產生關於插槽之二值化影像,其中二值化影像具有針腳矩陣圖案;基於針腳矩陣圖案的輪廓特徵產生複數個參考線;基於參考線於二值化影像上計算複數組參考點,其中複數組參考點分別對應針腳;判斷每一組參考點的灰階值是否為255;以及若否,則判定插槽為嚴重不合格。The present invention provides a method of detecting a stitch bend which is applied to a slot. The slot contains a plurality of pins. The pin bending detection method includes: generating a binarized image about a slot, wherein the binarized image has a stitch matrix pattern; generating a plurality of reference lines based on a contour feature of the stitch matrix pattern; and calculating a complex number on the binarized image based on the reference line The reference point of the group, wherein the reference points of the complex array respectively correspond to the stitches; whether the grayscale value of each set of reference points is 255; and if not, the slot is determined to be seriously unqualified.
於本發明之一實施例中,上述產生關於插槽之二值化影像的步驟包含:拍攝插槽之彩色影像;轉換彩色影像為灰階影像;以及轉換灰階影像為二值化影像。In an embodiment of the invention, the step of generating a binarized image about the slot includes: capturing a color image of the slot; converting the color image to a grayscale image; and converting the grayscale image to a binarized image.
於本發明之一實施例中,上述轉換灰階影像為二值化影像的步驟包含:劃分灰階影像為複數個影像區塊;定義複數個灰階臨界(threshold)值分別對應影像區塊;以及使影像區塊分別根據灰階臨界值進行二值化,進而獲得二值化影像。In an embodiment of the present invention, the step of converting the grayscale image into a binarized image comprises: dividing the grayscale image into a plurality of image blocks; and defining a plurality of grayscale threshold values corresponding to the image blocks; And binarizing the image block according to the grayscale threshold value, thereby obtaining a binarized image.
於本發明之一實施例中,上述的灰階臨界值的範圍 為130~150。In an embodiment of the invention, the range of the gray scale threshold is It is 130~150.
於本發明之一實施例中,上述基於針腳矩陣圖案的輪廓特徵產生複數個參考線的步驟包含:基於參考線旋轉二值化影像,致使針腳矩陣圖案轉正。In an embodiment of the invention, the step of generating a plurality of reference lines based on the contour features of the stitch matrix pattern comprises: rotating the binarized image based on the reference line, causing the stitch matrix pattern to be positive.
於本發明之一實施例中,上述的每一針腳包含針尖以及針體。每一組參考點包含第一參考點以及複數個第二參考點。第一參考點與對應之針腳的針尖對應,並且第二參考點與對應之針腳的針體對應。In an embodiment of the invention, each of the stitches described above includes a needle tip and a needle body. Each set of reference points includes a first reference point and a plurality of second reference points. The first reference point corresponds to the needle tip of the corresponding stitch, and the second reference point corresponds to the needle body of the corresponding stitch.
於本發明之一實施例中,上述若判斷每一組參考點的灰階值是否為255的步驟的判斷結果為是,則針腳彎曲檢測方法還包含:分別基於第一參考點擷取複數個畫素矩陣,其中每一畫素矩陣具有針尖圖案;判斷每一畫素矩陣中之針尖圖案與任一相鄰之畫素矩陣中之針尖圖案的形狀相似度是否大於預定比值;以及若否,則判定插槽為輕微不合格。In an embodiment of the present invention, if the determining result of the step of determining whether the grayscale value of each set of reference points is 255 is yes, the method for detecting the stitching of the stitching further comprises: capturing a plurality of the plurality of reference points based on the first reference point respectively a pixel matrix, wherein each pixel matrix has a tip pattern; determining whether a shape similarity between a tip pattern in each pixel matrix and a tip pattern in any adjacent pixel matrix is greater than a predetermined ratio; and if not, Then it is determined that the slot is slightly unqualified.
於本發明之一實施例中,上述的預定比值為70%~80%。In an embodiment of the invention, the predetermined ratio is 70% to 80%.
於本發明之一實施例中,上述的每一第一參考點位於對應之畫素矩陣的中心。In an embodiment of the invention, each of the first reference points is located at a center of a corresponding pixel matrix.
於本發明之一實施例中,上述的針腳矩陣圖案的輪廓特徵為針腳矩陣圖案的邊界。In an embodiment of the invention, the contour feature of the stitch matrix pattern is a boundary of the stitch matrix pattern.
綜上所述,本發明所提供的針腳彎曲檢測方法首先係對插槽進行影像拍攝以及影像處理,進而獲得插槽的二值化影像。接著,針腳彎曲檢測方法係在二值化影像上計 算出正常針腳位置所對應的參考點。最後,針腳彎曲檢測方法再判斷參考點的灰階值是否為255(亦即,白色),若否,則代表參考點所對應的針腳發生偏移現象。藉此,本發明的針腳彎曲檢測方法可檢測出人工目視難以觀察到的小幅度偏移現象(例如,角度歪斜或陰影、下壓或上翹等),進而減少誤判缺失的發生。並且,本發明的針腳彎曲檢測方法可採用全自動光學辨識技術,進而大幅減少檢測時間。再者,本發明的針腳彎曲檢測方法僅須成本低廉的光學治具結合程式應用,可取代習知自動光學檢測設備動輒百萬元以上的建置費用。In summary, the method for detecting the stitch bending provided by the present invention first performs image capturing and image processing on the slot, thereby obtaining a binarized image of the slot. Next, the stitch bending detection method is performed on the binarized image. Calculate the reference point corresponding to the normal stitch position. Finally, the stitch bending detection method determines whether the grayscale value of the reference point is 255 (ie, white), and if not, it represents that the stitch corresponding to the reference point is offset. Thereby, the stitch bending detecting method of the present invention can detect a small amplitude shift phenomenon (for example, angle skew or shadow, depression or upturn, etc.) which is difficult to observe by manual visual observation, thereby reducing the occurrence of misjudgment loss. Moreover, the stitch bending detecting method of the present invention can adopt a fully automatic optical identification technology, thereby greatly reducing the detection time. Furthermore, the method for detecting the stitch bending of the present invention requires only a low-cost optical jig combination program, and can replace the cost of the construction of the conventional automatic optical detecting device by more than one million yuan.
1‧‧‧二值化影像1‧‧‧ binarized imagery
10‧‧‧畫素矩陣10‧‧‧ pixel matrix
2‧‧‧針腳矩陣圖案2‧‧‧ Pin matrix pattern
20‧‧‧針腳圖案20‧‧‧ stitch pattern
200‧‧‧針尖圖案200‧‧‧ pinpoint pattern
202‧‧‧針體圖案202‧‧‧ needle pattern
22‧‧‧間隔部位22‧‧‧Interval
3‧‧‧參考線3‧‧‧ reference line
30‧‧‧第一參考點30‧‧‧First reference point
32‧‧‧第二參考點32‧‧‧second reference point
S100~S122‧‧‧流程步驟S100~S122‧‧‧ Process steps
第1圖為繪示本發明一實施方式之針腳彎曲檢測方法的流程圖。FIG. 1 is a flow chart showing a method of detecting a stitch bending according to an embodiment of the present invention.
第2圖為繪示第1圖中之針腳彎曲檢測方法的細部流程圖。Fig. 2 is a detailed flow chart showing the method of detecting the stitch bending in Fig. 1.
第3圖為繪示插槽之二值化影像的示意圖。Figure 3 is a schematic diagram showing the binarized image of the slot.
第4圖為繪示第3圖中之二值化影像的另一示意圖,其中參考線以白色線條表示。Figure 4 is another schematic diagram showing the binarized image in Figure 3, wherein the reference lines are indicated by white lines.
第5圖為繪示第3圖中之二值化影像的局部放大圖。Fig. 5 is a partially enlarged view showing the binarized image in Fig. 3.
第6A圖為繪示畫素矩陣的示意圖。Figure 6A is a schematic diagram showing a pixel matrix.
第6B圖為繪示另一相鄰畫素矩陣的示意圖。FIG. 6B is a schematic diagram showing another adjacent pixel matrix.
以下將以圖式揭露本發明之複數個實施例,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本發明。也就是說,在本發明部分實施例中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。The embodiments of the present invention are disclosed in the following drawings, and for the purpose of illustration However, it should be understood that these practical details are not intended to limit the invention. That is, in some embodiments of the invention, these practical details are not necessary. In addition, some of the conventional structures and elements are shown in the drawings in a simplified schematic manner in order to simplify the drawings.
請參照第1圖、第2圖以及第3圖。第1圖為繪示本發明一實施方式之針腳彎曲檢測方法的流程圖。第2圖為繪示第1圖中之針腳彎曲檢測方法的細部流程圖。第3圖為繪示插槽之二值化影像1的示意圖。Please refer to Figure 1, Figure 2 and Figure 3. FIG. 1 is a flow chart showing a method of detecting a stitch bending according to an embodiment of the present invention. Fig. 2 is a detailed flow chart showing the method of detecting the stitch bending in Fig. 1. FIG. 3 is a schematic diagram showing the binarized image 1 of the slot.
如第1圖、第2圖與第3圖所示,於本實施方式中,針腳彎曲檢測方法包含步驟S100至步驟S104。As shown in FIG. 1, FIG. 2, and FIG. 3, in the present embodiment, the stitch bending detecting method includes steps S100 to S104.
步驟S100:拍攝插槽之彩色影像。Step S100: Shoot a color image of the slot.
步驟S102:轉換彩色影像為灰階影像。Step S102: Convert the color image into a grayscale image.
步驟S104:轉換灰階影像為二值化影像1。Step S104: Convert the grayscale image into the binarized image 1.
藉此,即可產生關於插槽之二值化影像1(如第3圖所示)。其中,二值化影像1具有針腳矩陣圖案(array pattern)2。針腳矩陣圖案2係由複數個針腳圖案20所構成。針腳矩陣圖案2的灰階值為255(亦即,白色),而針腳矩陣圖案2以外的區域的灰階值為0(亦即,黑色)。Thereby, a binarized image 1 of the slot can be generated (as shown in FIG. 3). Among them, the binarized image 1 has a stitch pattern 2 . The stitch matrix pattern 2 is composed of a plurality of stitch patterns 20. The gray matrix value of the stitch matrix pattern 2 is 255 (that is, white), and the grayscale value of the region other than the stitch matrix pattern 2 is 0 (that is, black).
於產生上述二值化影像1的實際過程中,可採用高解析度顯微鏡(例如,解析度為1280x1024 pixel),並開發專用治具、圖形應用介面及演算法來實施上述目的。專用 治具可包含光罩以及自動調光設備以自動調整光源,使得光源能沿著插槽的針腳方向順向打光,進而獲得品質較佳的彩色影像。In the actual process of generating the above-described binarized image 1, a high-resolution microscope (for example, a resolution of 1280×1024 pixels) can be used, and a special jig, a graphic application interface, and an algorithm are developed to achieve the above object. dedicated The fixture can include a reticle and an auto-dimming device to automatically adjust the light source so that the light source can be strobed along the stitching direction of the slot to obtain a better quality color image.
然而,現實中所拍攝的彩色影像往往會受限於環境因素(例如,光源數量、光源架設位置、插槽種類、針腳形狀等),造成彩色影像上各區域的明暗分佈不均。若在上述灰階影像轉換成二值化影像1時,僅單純以固定的灰階臨界(threshold)值進行影像的二值化處理,則可能會造成二值化影像1上的針腳矩陣圖案2各區域大小不一,並造成後續發生誤判情事。However, the color images captured in reality are often limited by environmental factors (for example, the number of light sources, the position of the light source, the type of slots, the shape of the stitches, etc.), resulting in uneven distribution of light and dark in various areas of the color image. If the grayscale image is converted into the binarized image 1, the binarization processing of the image is performed only by the fixed grayscale threshold value, and the stitch matrix pattern 2 on the binarized image 1 may be caused. The sizes of the regions vary and cause subsequent misjudgments.
因此,為了解決上述問題,於本實施方式中,針腳彎曲檢測方法的步驟S104包含步驟S104a至步驟S104c,如第2圖所示。Therefore, in order to solve the above problem, in the present embodiment, the step S104 of the stitch bending detecting method includes steps S104a to S104c as shown in FIG.
步驟S104a:劃分灰階影像為複數個影像區塊。Step S104a: dividing the grayscale image into a plurality of image blocks.
步驟S104b:定義複數個灰階臨界值分別對應影像區塊。Step S104b: Defining a plurality of grayscale threshold values respectively corresponding to image blocks.
步驟S104c:使影像區塊分別根據灰階臨界值進行二值化,進而獲得二值化影像1。Step S104c: Binarize the image blocks according to the grayscale threshold values, and obtain the binarized image 1.
由此可知,根據本發明之針腳彎曲檢測方法,可使灰階影像中比較暗的影像區塊中以比較低的灰階臨界值進行二值化處理,並使灰階影像中比較亮的影像區塊中以比較高的灰階臨界值進行二值化處理。藉此,在上述灰階影像轉換成二值化影像1時,即可避免發生二值化影像1上的針腳矩陣圖案2各區域大小不一的問題,並造成後續發 生誤判情事。Therefore, according to the stitch bending detection method of the present invention, the darker image block in the grayscale image can be binarized with a relatively low grayscale threshold value, and the relatively bright image in the grayscale image can be made. The block is binarized with a relatively high grayscale threshold. Therefore, when the grayscale image is converted into the binarized image 1, the problem that the size of each region of the stitch matrix pattern 2 on the binarized image 1 is different can be avoided, and the subsequent issue is caused. Misunderstandings.
於實際應用中,上述的灰階臨界值的範圍為130~150,但本發明並不以此為限。In practical applications, the gray scale threshold value ranges from 130 to 150, but the invention is not limited thereto.
請參照第4圖,其為繪示第3圖中之二值化影像1的另一示意圖,其中參考線3以白色線條表示。Please refer to FIG. 4 , which is another schematic diagram of the binarized image 1 in FIG. 3 , wherein the reference line 3 is represented by a white line.
如第1圖與第4圖所示,於本實施方式中,針腳彎曲檢測方法還包含步驟S106以及步驟S108。As shown in FIGS. 1 and 4, in the present embodiment, the stitch bending detecting method further includes steps S106 and S108.
步驟S106:基於針腳矩陣圖案2的輪廓特徵產生複數個參考線3。Step S106: generating a plurality of reference lines 3 based on the contour features of the stitch matrix pattern 2.
步驟S108:基於參考線3旋轉二值化影像1,致使針腳矩陣圖案2轉正。Step S108: Rotating the binarized image 1 based on the reference line 3 causes the stitch matrix pattern 2 to be rotated.
於本實施方式中,針腳矩陣圖案2的輪廓特徵為針腳矩陣圖案2的邊界,因此參考線3係位於針腳矩陣圖案2的邊界處,如第4圖所示。In the present embodiment, the outline feature of the stitch matrix pattern 2 is the boundary of the stitch matrix pattern 2, and therefore the reference line 3 is located at the boundary of the stitch matrix pattern 2 as shown in FIG.
然而,本發明並不以此為限。另一實施方式中,針腳矩陣圖案2具有明顯的兩間隔(gap)部位22,並且針腳矩陣圖案2的輪廓特徵為針腳矩陣圖案2中的間隔部位22。而間隔部位22的位置與幾何形狀,皆因不同插槽種類而有差異。However, the invention is not limited thereto. In another embodiment, the stitch matrix pattern 2 has distinct two gap portions 22, and the contour features of the stitch matrix pattern 2 are the spacing portions 22 in the stitch matrix pattern 2. The position and geometry of the spacing portion 22 vary depending on the type of slot.
請參照第5圖,其為繪示第3圖中之二值化影像1的局部放大圖。Please refer to FIG. 5 , which is a partial enlarged view of the binarized image 1 in FIG. 3 .
如第1圖與第5圖所示,於本實施方式中,針腳彎曲檢測方法還包含步驟S110至步驟S114。As shown in FIGS. 1 and 5, in the present embodiment, the stitch bending detecting method further includes steps S110 to S114.
步驟S110:基於參考線3於針腳矩陣圖案2上計 算複數組參考點。Step S110: Based on the reference line 3 on the stitch matrix pattern 2 Compute the array reference point.
步驟S112:判斷每一組參考點的灰階值是否為255。Step S112: Determine whether the grayscale value of each group of reference points is 255.
於本實施方式中,每一針腳包含針尖以及針體。因此,每一針腳圖案20皆包含針尖圖案200以及針體圖案202(如第5圖所示)。上述的每一組參考點包含第一參考點30以及複數個第二參考點32。第一參考點30與對應之針腳的針尖對應,並且第二參考點32與對應之針腳的針體對應。於實際應用中,第一參考點30與第二參考點32的位置可藉由參考線3之間的間距與插槽的標準規格尺寸來推算而得。若針腳並未發生歪斜的問題,則每一第一參考點30會位於對應的針尖圖案200上,且每一第二參考點32會位於對應的針體圖案202上。In the present embodiment, each stitch includes a needle tip and a needle body. Therefore, each of the stitch patterns 20 includes the tip pattern 200 and the needle pattern 202 (as shown in FIG. 5). Each set of reference points described above includes a first reference point 30 and a plurality of second reference points 32. The first reference point 30 corresponds to the needle tip of the corresponding stitch, and the second reference point 32 corresponds to the needle body of the corresponding stitch. In practical applications, the positions of the first reference point 30 and the second reference point 32 can be derived by the spacing between the reference lines 3 and the standard size of the slot. If the stitching problem does not occur, each first reference point 30 will be located on the corresponding tip pattern 200, and each second reference point 32 will be located on the corresponding needle pattern 202.
於本實施方式中,每一針體所對應之第二參考點32的數量為8,但本發明並不以此為限。In the present embodiment, the number of the second reference points 32 corresponding to each of the needles is 8, but the invention is not limited thereto.
若步驟S112的判斷結果為否,則根據本發明之針腳彎曲檢測方法執行步驟S114:判定插槽為嚴重不合格。If the result of the determination in the step S112 is NO, the stitch bending detecting method according to the present invention executes the step S114 of determining that the slot is a serious failure.
換言之,若步驟S112的判斷結果為否,則代表有某些第一參考點30並未位於對應之針尖圖案200上,或有某些第二參考點32並未位於對應之針體圖案202上,因此針腳的歪斜狀況即可被檢測出。並且,當有第一參考點30並未位於對應之針尖圖案200上,或有第二參考點32並未位於對應之針體圖案202上的狀況發生時,往往針腳的歪斜狀況較為嚴重,因此判定插槽為嚴重不合格。In other words, if the result of the determination in step S112 is negative, it means that some of the first reference points 30 are not located on the corresponding tip pattern 200, or some of the second reference points 32 are not located on the corresponding needle pattern 202. Therefore, the skew condition of the stitch can be detected. Moreover, when the first reference point 30 is not located on the corresponding tip pattern 200, or the second reference point 32 is not located on the corresponding needle pattern 202, the skew of the stitch is often serious, so The slot is determined to be seriously unqualified.
相對地,若步驟S112的判斷結果為是,則代表每一第一參考點30皆位於對應之針尖圖案200上,並且每一第二參考點32皆位於對應之針體圖案202上。換句話說,可以得出插槽的針腳並未出現嚴重歪斜情況的結論。On the other hand, if the result of the determination in step S112 is YES, each of the first reference points 30 is located on the corresponding tip pattern 200, and each of the second reference points 32 is located on the corresponding needle pattern 202. In other words, it can be concluded that the pins of the slot do not appear to be severely skewed.
請參照第6A圖以及第6B圖。第6A圖為繪示畫素矩陣10的示意圖。第6B圖為繪示另一相鄰畫素矩陣10的示意圖。Please refer to Figure 6A and Figure 6B. FIG. 6A is a schematic diagram showing the pixel matrix 10. FIG. 6B is a schematic diagram showing another adjacent pixel matrix 10.
如第1圖、第6A圖與第6B圖所示,於本實施方式中,若判斷每一組參考點的灰階值是否為255的步驟(亦即,步驟S112)的判斷結果為是,則針腳彎曲檢測方法還包含步驟S116至步驟S122。As shown in FIG. 1 , FIG. 6A and FIG. 6B , in the present embodiment, if the grayscale value of each set of reference points is 255 (ie, step S112), the determination result is yes. Then, the stitch bending detecting method further includes steps S116 to S122.
步驟S116:分別基於第一參考點30擷取複數個畫素矩陣10。Step S116: The plurality of pixel matrices 10 are retrieved based on the first reference point 30, respectively.
於本實施方式中,由於每一針尖圖案200相對於對應之第一餐考點的位置不盡相同,因此本實施方式係以每一第一參考點30位於對應之畫素矩陣10的中心的方式,作為擷取每一畫素矩陣10的依據。In this embodiment, since the position of each of the tip patterns 200 is different from the position of the corresponding first test site, the present embodiment is such that each first reference point 30 is located at the center of the corresponding pixel matrix 10. As the basis for capturing each pixel matrix 10.
步驟S118:判斷每一畫素矩陣10中之針尖圖案200與任一相鄰之畫素矩陣10中之針尖圖案200的形狀相似度是否大於預定比值。Step S118: It is judged whether the shape similarity between the tip pattern 200 in each pixel matrix 10 and the tip pattern 200 in any adjacent pixel matrix 10 is greater than a predetermined ratio.
於本實施方式中,每一畫素矩陣10所包含的畫素的數量為2500(亦即,50x50),但本發明並不以此為限,可依據所需而彈性地改變。In the present embodiment, the number of pixels included in each pixel matrix 10 is 2500 (that is, 50×50), but the present invention is not limited thereto and can be elastically changed as needed.
一般來說,除了位於針腳矩陣圖案2邊界處的針尖 圖案200之外,每一針尖圖案200皆會有四個相鄰之針尖圖案200(亦即,上下左右四個針尖圖案200)。In general, except for the tip of the needle at the boundary of the stitch matrix pattern 2 In addition to the pattern 200, each of the tip patterns 200 will have four adjacent tip patterns 200 (i.e., up, down, left, and right four tip patterns 200).
若步驟S118的判斷結果為否,則根據本發明之針腳彎曲檢測方法執行步驟S120:判定插槽為輕微不合格。If the result of the determination in the step S118 is NO, the stitch bending detecting method according to the present invention executes the step S120 of determining that the slot is slightly unacceptable.
換言之,若步驟S118的判斷結果為否,則代表雖然插槽的所有針腳並未發生嚴重歪斜狀況,但卻有某些針腳具有人工目視難以檢測出的輕微歪斜狀況,因此可判定插槽為輕微不合格。In other words, if the result of the determination in the step S118 is negative, it means that although all the stitches of the slot do not have a serious skew condition, some of the stitches have a slight skew condition which is difficult to detect by manual visual observation, so that the slot can be determined to be slight. Not qualified.
若步驟S118的判斷結果為是,則根據本發明之針腳彎曲檢測方法執行步驟S122:判定插槽為合格。If the result of the determination in step S118 is YES, step S122 is performed in accordance with the stitch bending detecting method of the present invention: it is determined that the slot is acceptable.
相對地,若步驟S118的判斷結果為是,則代表不僅插槽的所有針腳並未發生嚴重歪斜狀況,並且每一針腳連輕微歪斜的狀況也不存在,因此可判定插槽為合格。On the other hand, if the result of the determination in the step S118 is YES, it means that not only the serious skewing condition of all the stitches of the slot does not occur, but also the condition that each stitch is slightly skewed, so that the slot can be judged to be acceptable.
於本實施方式中,用以判斷針尖圖案200之形狀相似度的預定比值為70%~80%,但本發明並不以此為限。In the present embodiment, the predetermined ratio for determining the shape similarity of the needle tip pattern 200 is 70% to 80%, but the invention is not limited thereto.
由以上對於本發明之具體實施例之詳述,可以明顯地看出,本發明所提供的針腳彎曲檢測方法首先係對插槽進行影像拍攝以及影像處理,進而獲得插槽的二值化影像。接著,針腳彎曲檢測方法係在二值化影像上計算出正常針腳位置所對應的參考點。最後,針腳彎曲檢測方法再判斷參考點的灰階值是否為255(亦即,白色),若否,則代表參考點所對應的針腳發生偏移現象。藉此,本發明的針腳彎曲檢測方法可檢測出人工目視難以觀察到的小幅度偏移現象(例如,角度歪斜或陰影、下壓或上翹等),進而減少 誤判缺失的發生。並且,本發明的針腳彎曲檢測方法可採用全自動光學辨識技術,進而大幅減少檢測時間。再者,本發明的針腳彎曲檢測方法僅須成本低廉的光學治具結合程式應用,可取代習知自動光學檢測設備動輒百萬元以上的建置費用。From the above detailed description of the specific embodiments of the present invention, it can be clearly seen that the stitch bending detection method provided by the present invention first performs image capturing and image processing on the slot, thereby obtaining a binarized image of the slot. Next, the stitch bending detection method calculates a reference point corresponding to the position of the normal stitch on the binarized image. Finally, the stitch bending detection method determines whether the grayscale value of the reference point is 255 (ie, white), and if not, it represents that the stitch corresponding to the reference point is offset. Thereby, the stitch bending detecting method of the present invention can detect a small amplitude shift phenomenon (for example, angle skew or shadow, depression or upturn, etc.) which is difficult to observe by manual visual observation, thereby reducing The occurrence of a misjudgment is missing. Moreover, the stitch bending detecting method of the present invention can adopt a fully automatic optical identification technology, thereby greatly reducing the detection time. Furthermore, the method for detecting the stitch bending of the present invention requires only a low-cost optical jig combination program, and can replace the cost of the construction of the conventional automatic optical detecting device by more than one million yuan.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and the present invention can be modified and retouched without departing from the spirit and scope of the present invention. The scope is subject to the definition of the scope of the patent application attached.
S100~S122‧‧‧流程步驟S100~S122‧‧‧ Process steps
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