TWI422797B - By means of image processing of the collector wire wear and offset measurement device - Google Patents

By means of image processing of the collector wire wear and offset measurement device Download PDF

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Publication number
TWI422797B
TWI422797B TW98139572A TW98139572A TWI422797B TW I422797 B TWI422797 B TW I422797B TW 98139572 A TW98139572 A TW 98139572A TW 98139572 A TW98139572 A TW 98139572A TW I422797 B TWI422797 B TW I422797B
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wire
line sensor
image
collecting
wear
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TW98139572A
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Chinese (zh)
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TW201022624A (en
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Yusuke Watabe
Makoto Niwakawa
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Meidensha Electric Mfg Co Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B60VEHICLES IN GENERAL
    • B60MPOWER SUPPLY LINES, AND DEVICES ALONG RAILS, FOR ELECTRICALLY- PROPELLED VEHICLES
    • B60M1/00Power supply lines for contact with collector on vehicle
    • B60M1/12Trolley lines; Accessories therefor
    • B60M1/28Manufacturing or repairing trolley lines
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

藉由影像處理之集電線之磨耗及偏移測定裝置Wear and offset measuring device for collecting wires by image processing

本發明係關於藉由影像處理之集電線之磨耗及偏移測定裝置。The present invention relates to an abrasion and offset measuring device for a collecting wire processed by an image.

進行對電氣化鐵路車輛供給電力之設備之集電線的維護管理時,作為特別重要之項目之一,可舉例有集電線之高度、偏移、磨耗之測定。In the maintenance management of the electric power line of the equipment for supplying electric power to the electric railway vehicle, as one of the particularly important items, the measurement of the height, the offset, and the wear of the electric wire can be exemplified.

先前,作為測定集電線之磨耗之裝置,公知有藉由影像處理算出集電線之磨耗面之寬度,再將其值使用從外部輸入之集電線之高度資料或集電線之尺寸等各種參數而換算成實際之磨耗量者(例如,參照專利文獻1)。再者,亦有在測定集電線之磨耗之裝置中,具備由藉由影像處理所求出之集電線整體之寬度、與既知之集電線之尺寸,而算出其集電線之架設之高度的機構者(例如,參照專利文獻2)。In the prior art, it is known that the width of the wear surface of the collecting wire is calculated by image processing, and the value is converted using various parameters such as the height data of the collecting wire input from the outside or the size of the collecting wire. The actual wear amount is (for example, refer to Patent Document 1). Further, in the apparatus for measuring the wear of the collecting electric wire, there is provided a mechanism for calculating the height of the collecting wire by the width of the entire collecting wire obtained by the image processing and the size of the known collecting wire. (For example, refer to Patent Document 2).

[專利文獻1]日本特開2007-271445號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2007-271445

[專利文獻2]日本特開2008-089523號公報[Patent Document 2] Japanese Patent Laid-Open Publication No. 2008-089523

然而,上述之專利文獻1、專利文獻2所記載者雖可求得集電線之磨耗量或集電線之高度,但不具備測定集電線之偏移量之機構,因此,為測定集電線之磨耗量或高度且亦測定集電線之偏移量,必須使用其他裝置測定集電線之偏移量,如此會有裝置花費之成本增加之問題,或測定所需要之作業繁雜之問題。However, in the above-described Patent Document 1 and Patent Document 2, although the wear amount of the collecting wire or the height of the collecting wire can be obtained, the mechanism for measuring the offset amount of the collecting wire is not provided, and therefore, the wear of the collecting wire is measured. The amount or height and the offset of the collecting wire are also determined, and it is necessary to measure the offset of the collecting wire by using other means, which may cause an increase in the cost of the device, or a problem of measuring the complicated work required.

因此,本發明之目的係提供一種可用一個裝置測定集電線之磨耗量及偏移量的集電線之磨耗測定裝置。SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide an abrasion measuring device for a collecting wire which can measure the amount of wear and offset of a collecting wire by one device.

用以解決上述問題之第1發明之藉由影像處理之集電線的磨耗及偏移測定裝置,其特徵為包含:線感測器影像製作機構,其係製作將藉由使掃描線方向垂直且水平於車輛之行駛方向之線感測器所拍攝的影像按時間序列排列而成之線感測器影像者;二值化處理機構,其係對上述線感測器影像進行二值化處理,而製作強調所拍攝之集電線之磨耗部分的二值化線感測器影像者;邊緣檢測機構,其係對於上述二值化線感測器影像檢測上述磨耗部分之兩側之邊緣者;集電線重心位置檢測機構,其係從上述磨耗部分之兩側之邊緣的位置檢測上述集電線之重心位置者;集電線偏移量計算機構,其係由上述集電線之重心位置之變化量檢測上述集電線之實際的偏移量者;及集電線磨耗量計算機構,其係構成為可由上述磨耗部分之兩側之邊緣的位置檢測上述集電線之磨耗量者。An apparatus for manufacturing an abrasion and offset of a collecting wire by image processing according to a first aspect of the present invention, characterized in that it comprises a line sensor image producing mechanism which is formed by causing a scanning line direction to be vertical and a line sensor image obtained by aligning images captured by a line sensor in a direction of travel of the vehicle in time series; a binarization processing mechanism for binarizing the line sensor image, And producing a binarized line sensor image that emphasizes the worn portion of the collected wire; the edge detecting mechanism detects the edge of both sides of the worn portion for the binarized line sensor image; a wire center-of-gravity position detecting mechanism for detecting a position of a center of gravity of the current collecting wire from a position of an edge of both sides of the wear portion; and a collecting wire offset amount calculating means for detecting the amount of change in a gravity center position of the current collecting wire The actual offset of the collecting wire; and the collecting wire wear amount calculating mechanism configured to detect the wear of the collecting wire by the position of the edge of both sides of the wear portion Quantity.

第2發明之藉由影像處理之集電線之磨耗及偏移測定裝置,其係如第1發明之藉由影像處理之集電線之磨耗及偏移測定裝置,其中上述二值化處理機構係藉由根據上述線感測器影像之狀態自動決定臨限值之判斷分析二值化處理,而對上述線感測器影像進行二值化處理,且製作上述二值化線感測器影像。According to a second aspect of the invention, there is provided an apparatus for processing an abrasion and offset of a collecting wire by image processing according to the first aspect of the invention, wherein the binarizing processing means is The binarization processing is performed by judging and analyzing the threshold value according to the state of the line sensor image, and the line sensor image is binarized, and the binarized line sensor image is created.

第3發明之藉由影像處理之集電線之磨耗及偏移測定裝置係如第1或第2發明之藉由影像處理之集電線之磨耗及偏移測定裝置,其中包含雜訊去除機構,其係去除上述二值化線感測器影像上之雜訊者。According to a third aspect of the invention, there is provided an apparatus for processing an abrasion and offset of a collecting wire by image processing according to the first or second aspect of the present invention, comprising: a noise removing mechanism; The noise of the above-mentioned binarized line sensor image is removed.

第4發明之藉由影像處理之集電線之磨耗及偏移測定裝置係如第1發明之藉由影像處理之集電線之磨耗及偏移測定裝置,其中集電線磨耗量計算機構係構成為至少與藉由上述集電線偏移量計算機構之處理並行,而可由上述磨耗部分之兩側之邊緣的位置檢測上述集電線之磨耗量。According to a fourth aspect of the invention, there is provided an apparatus for processing an abrasion and offset of a collecting wire by image processing according to the first aspect of the invention, wherein the collecting wire wear amount calculating means is configured to be at least In parallel with the processing by the above-described collecting wire offset calculating means, the amount of wear of the above-mentioned collecting wires can be detected from the positions of the edges of both sides of the above-mentioned wearing portion.

根據上述第1發明之藉由影像處理之集電線之磨耗及偏移測定裝置,可用一個裝置算出集電線之磨耗測定與集電線之偏移量,因此可維持裝置所花費之成本,且提高便利性。According to the above-described first aspect of the invention, the wear and offset measuring device for the collecting wire by the image processing can calculate the wear amount of the collecting wire and the offset amount of the collecting wire by one device, thereby maintaining the cost of the device and improving the convenience. Sex.

又,根據第2發明之藉由影像處理之集電線之磨耗及偏移測定裝置,可於藉由二值化處理機構對線感測器影像進行二值化處理時,將所需之臨限值根據集電線之變位或來自集電線之反射光之強度的不同而自動設定,因此可提高集電線之磨耗部分之抽出處理的精度。Further, according to the wear and offset measuring device for the collecting wire by image processing according to the second aspect of the invention, when the line sensor image is binarized by the binarization processing means, the required threshold is used. The value is automatically set according to the displacement of the collecting wire or the intensity of the reflected light from the collecting wire, so that the precision of the drawing process of the worn portion of the collecting wire can be improved.

又,根據第3發明之藉由影像處理之集電線之磨耗及偏移測定裝置,可藉由去除二值化線感測器影像上之雜訊,更加提高集電線之磨耗部分之抽出處理的精度。Further, according to the third aspect of the invention, the wear and offset measuring device for the collecting wire by the image processing can further improve the extraction processing of the worn portion of the collecting wire by removing the noise on the image of the binarized line sensor. Precision.

根據上述第4發明之藉由影像處理之集電線之磨耗及偏移測定裝置,有可同時算出集電線之磨耗測定與集電線之偏移量的優點。According to the fourth aspect of the invention, the wear and offset measuring device for the collecting wire by the image processing has the advantage that the amount of wear of the collecting wire and the offset amount of the collecting wire can be simultaneously calculated.

以下,茲參照圖式詳細說明本發明之藉由影像處理之磨耗及偏移測定裝置。Hereinafter, the wear and offset measuring apparatus by image processing of the present invention will be described in detail with reference to the drawings.

[實施例][Examples]

以下用圖1至圖8說明本發明之藉由影像處理之磨耗及偏移測定裝置之一實施例。圖1係顯示本實施例之藉由影像處理之磨耗及偏移測定裝置之設置例的說明圖,圖2係顯示本實施例之藉由影像處理之磨耗測定裝置之構成的方塊圖,圖3係顯示本實施例之磨耗測定之流程的流程圖,圖4係顯示線感測器影像之一例的說明圖,圖5係顯示二值化線感測器影像之例的說明圖,圖6係顯示從二值化線感測器影像抽出集電線之磨耗部分之邊緣的例的說明圖,圖7係顯示由圖6所示之邊緣求出重心位置之例的說明圖,圖8係顯示實際之集電線之位置與線感測器影像上之集電線之位置的關係的說明圖。An embodiment of the apparatus for attrition and offset measurement by image processing of the present invention will be described below with reference to Figs. 1 is an explanatory view showing an arrangement example of an abrasion and displacement measuring device by image processing according to the present embodiment, and FIG. 2 is a block diagram showing the configuration of an abrasion measuring device by image processing of the present embodiment, FIG. A flow chart showing the flow of the abrasion measurement of the present embodiment, FIG. 4 is an explanatory view showing an example of a line sensor image, and FIG. 5 is an explanatory view showing an example of a binarized line sensor image, and FIG. An explanatory diagram showing an example of extracting the edge of the worn portion of the collecting wire from the binarized line sensor image, and FIG. 7 is an explanatory view showing an example of obtaining the position of the center of gravity from the edge shown in FIG. 6, and FIG. 8 shows the actual An explanatory diagram of the relationship between the position of the collecting wire and the position of the collecting wire on the line sensor image.

如圖1所示,本實施例之藉由影像處理之磨耗及偏移測定裝置係包含:設置於車輛1之頂部上之線感測器2及照明裝置3、與設置於車輛1之內部之測量用電腦4及記錄裝置5。As shown in FIG. 1 , the image processing and wear and loss measuring apparatus of the present embodiment includes: a line sensor 2 and a lighting device 3 disposed on the top of the vehicle 1 and an interior of the vehicle 1 The measuring computer 4 and the recording device 5 are used.

線感測器2係設置為其視野朝向鉛直上方,且其掃描線之方向係垂直且水平於車輛1之行駛方向。藉此,線感測器2係在掃描線與集電線6交叉之狀態下對集電線6予以拍攝。該線感測器2之輸出係輸出於測量用電腦4。The line sensor 2 is disposed such that its field of view faces vertically upward, and the direction of its scanning line is vertical and horizontal to the traveling direction of the vehicle 1. Thereby, the line sensor 2 photographs the collecting wire 6 in a state where the scanning line and the collecting wire 6 are crossed. The output of the line sensor 2 is output to the measuring computer 4.

照明裝置3係使用如通常之白色照明等。該照明裝置3係設置於線感測器2之附近,且至少照明藉由集電線6之線感測器2所拍攝之部分。The lighting device 3 is used as usual white lighting or the like. The illuminating device 3 is disposed in the vicinity of the line sensor 2 and at least illuminates a portion captured by the line sensor 2 of the collecting wire 6.

測量用電腦4係根據由線感測器2輸入之影像信號(亮度信號)來求出集電線6之磨耗量及偏移量。The measuring computer 4 obtains the amount of wear and the amount of shift of the collecting wire 6 based on the image signal (luminance signal) input from the line sensor 2.

更詳言之為如圖2所示,本實施例之測量用電腦4係包含:作為線感測器影像製作機構之線感測器影像製作部4a;作為二值化處理機構之判斷分析二值化處理部4b;作為雜訊去除機構之雜訊去除處理部4c;作為邊緣檢測機構之集電線磨耗部分邊緣檢測部4d;作為集電線重心位置檢測機構之集電線重心位置檢測部4e;作為集電線偏移量計算機構之集電線偏移實座標轉換計算部4f;及作為集電線磨耗計算機構之集電線磨耗部分寬度計算部4g等。More specifically, as shown in FIG. 2, the measuring computer 4 of the present embodiment includes: a line sensor image creating unit 4a as a line sensor image producing unit; and a judgment analysis 2 as a binarization processing unit. The value processing unit 4b; the noise removal processing unit 4c as the noise removing means; the wire abrasion portion edge detecting portion 4d as the edge detecting means; and the collecting wire center-of-gravity position detecting portion 4e as the center-of-gravity center-of-gravity position detecting means; The integrated electric wire offset real coordinate conversion calculation unit 4f of the electric wire offset calculation means, and the electric wire wear portion width calculation unit 4g as the electric wire wear calculation means.

線感測器影像製作部4a係將由線感測器2輸入之影像信號製作按時間序列排列之線感測器影像(平面之影像)。判斷分析二值化處理部4b係對於線感測器影像製作部4a所製作之線感測器影像進行之後詳述之判斷分析二值化處理。The line sensor image creating unit 4a creates line sensor images (planar images) arranged in time series from the image signals input from the line sensor 2. The judgment analysis binarization processing unit 4b performs a judgment analysis binarization process which will be described in detail later on the line sensor image created by the line sensor image creation unit 4a.

雜訊去除處理部4c係對於判斷分析二值化處理部4b所製作之二值化線感測器影像,去除其因集電線之磨耗部分(以下稱為集電線磨耗部分)之傷痕或背景部分之狀態而含有之細小點狀的雜訊等。集電線磨耗部分邊緣檢測部4d係對於藉由雜訊去除處理部4c將雜訊去除之二值化線感測器影像,就某線例如從左探索之情形下,進行將由黑變白之點作為左側之邊緣點而檢測,其後將由白變黑之點作為右側之邊緣點而檢測之處理。該處理係由影像之上至下於各線進行。The noise removal processing unit 4c determines the damage of the binarized line sensor image produced by the analysis binarization processing unit 4b, and removes the flaw or background portion of the worn portion of the collecting wire (hereinafter referred to as the wire wearing portion). The small noise of the state contained in the state. The wire-worn portion edge detecting portion 4d is a binarized line sensor image in which noise is removed by the noise removing processing unit 4c, and a black line is turned white when a line is searched for, for example, from the left. The detection is performed as the edge point on the left side, and then the point from white to black is detected as the edge point on the right side. This processing is performed from top to bottom of the image.

集電線重心位置檢測部4e係對於藉由集電線磨耗部分邊緣檢測部4d所檢測之左右之邊緣點,將各線左右之邊緣點之中心位置作為集電線6之重心位置進行檢測。集電線偏移實座標轉換計算部4f係對於集電線重心位置檢測部4e所檢測之集電線6的重心位置,將其變化換算成實際之集電線之偏移量。The center-of-gravity center-of-gravity position detecting unit 4e detects the center point of the left and right edge points of each line as the center-of-gravity position of the collecting line 6 with respect to the left and right edge points detected by the collecting wire abrasion portion edge detecting unit 4d. The collected electric wire offset real coordinate conversion calculation unit 4f converts the change in the position of the center of gravity of the electric current line 6 detected by the electric wire gravity center position detecting unit 4e into the actual electric power line offset amount.

集電線磨耗部分寬度計算部4g係由集電線磨耗部分邊緣檢測部4d所檢測之左右之邊緣點,算出線感測器影像上之該左右之邊緣點間的寬,再將其換算成實際之集電線6之磨耗量。The wire-worn portion width calculating unit 4g is a left-right edge point detected by the wire-worn portion edge detecting unit 4d, and calculates the width between the left and right edge points on the line sensor image, and converts it into a real one. The amount of wear of the wire 6 is collected.

以下,用圖3至圖6說明本實施例之測量用電腦4之處理。Hereinafter, the processing of the measuring computer 4 of the present embodiment will be described with reference to Figs. 3 to 6 .

如圖3所示,本實施例之測量用電腦4,首先係於線感測器影像製作部4a藉由將由線感測器2輸入之影像信號按時間序列排列,而進行製作如圖4所示之線感測器影像8之處理(步驟P1)。As shown in FIG. 3, the measuring computer 4 of the present embodiment is first formed in the line sensor image creating unit 4a by arranging the image signals input by the line sensor 2 in time series, as shown in FIG. The processing of the line sensor image 8 is shown (step P1).

如圖4所示,線感測器影像8係包含集電線6(磨耗部分6a及未磨耗之部分6b、6c),且包含背景部分A(如空白等)。該線感測器影像8除了藉由記憶體7a而保存於記錄裝置5以外,又與參數一同透過記憶體7b被傳送於判斷分析二值化處理部4b。As shown in FIG. 4, the line sensor image 8 includes a collecting wire 6 (abrading portion 6a and unworn portions 6b, 6c) and includes a background portion A (such as a blank or the like). The line sensor image 8 is stored in addition to the recording device 5 by the memory 7a, and is transmitted to the judgment analysis binarization processing unit 4b via the memory 7b together with the parameters.

繼步驟P1之處理之後,係於判斷分析二值化處理部4b對線感測器影像8進行判斷分析二值化處理,製作如圖5所示之二值化線感測器影像9(步驟P2)。即,集電線磨耗部分6a係集電線6與集電弓1a(參照圖1)接觸而削除之部分,其與集電線6之未磨耗之部分6b、6c相比,有強烈光澤。因此,對於線感測器影像8用判斷分析二值化處理法,進行將集電線磨耗部分6a、集電線6之未磨耗部分6b、6c及背景部分A分開之處理。After the processing of step P1, the determination analysis binarization processing unit 4b performs a judgment analysis binarization process on the line sensor image 8, and creates a binarized line sensor image 9 as shown in FIG. 5 (step P2). That is, the collecting wire abrasion portion 6a is a portion which is removed by contact with the pantograph 1a (see Fig. 1), and which has a strong gloss as compared with the unworn portions 6b, 6c of the collecting wire 6. Therefore, the line sensor image 8 is subjected to a process of separating the unworn portions 6b and 6c of the collecting wire 6a and the collecting wire 6 by the judgment analysis binarization processing method.

此處,判斷分析二值化處理法係進行二值化處理時,根據影像之狀態而自動設定臨限值之方法。具體而言,其係對於各線感測器影像8之柱狀圖「以某程度之範圍之亮度值而集合之像素數的塊(以下稱為級)」,將其二值化時,以使背景與圖案區域相關之級內分散與級間分散之分散比為最大的方式,而設定臨限值的方法。藉由進行如此之處理,於任何影像皆可設定比較良好的臨限值。於判斷分析二值化處理部4b根據如此設定之臨限值,製作集電線磨耗部分6a為白色、背景部分B為黑色之二值化線感測器影像9。Here, when the judgment analysis binarization processing method performs the binarization processing, the method of automatically setting the threshold value according to the state of the image is used. Specifically, for the histogram of each line sensor image 8 "a block (hereinafter referred to as a level) of the number of pixels collected by a certain range of luminance values", it is binarized so that The method of setting the threshold value is the method in which the dispersion ratio between the background and the pattern region is the largest and the dispersion ratio between the stages is the largest. By doing this, a better threshold can be set for any image. In the judgment analysis binarization processing unit 4b, based on the threshold value thus set, the binarized line sensor image 9 in which the collecting wire abrasion portion 6a is white and the background portion B is black is produced.

藉由用上述判斷分析二值化處理法,可對應集電線6之變位或來自集電線6之反射光之強度的不同。藉此,較之將臨限值作為固定值而設定之情形,可防止根據拍攝時之環境有集電線磨耗部分6a以外強調‧抽出,或磨耗部分6a本身未抽出的問題發生。By analyzing the binarization processing method by the above judgment, it is possible to correspond to the difference in the intensity of the reflected light of the collecting wire 6 or the reflected light from the collecting wire 6. Thereby, compared with the case where the threshold value is set as a fixed value, it is possible to prevent the problem that the wire-worn portion 6a is emphasized and extracted in accordance with the environment at the time of shooting, or the wear portion 6a itself is not extracted.

藉由判斷分析二值化處理部4b製作之二值化線感測器影像9,經由記憶體7b被傳送於雜訊去除處理部4c。The binarized line sensor image 9 created by the analysis binarization processing unit 4b is transmitted to the noise removal processing unit 4c via the memory 7b.

繼步驟P2之處理之後,於雜訊去除處理部4c進行將二值化線感測器影像9上之雜訊去除之處理(步驟P3)。即,由線感測器影像8藉由二值化處理而製作二值化線感測器影像9之情形,如此狀態下有時會有集電線磨耗部分6a之傷痕、或根據背景部分A之狀態有細小點狀之雜訊包含於二值化線感測器影像9之背景部分B。因此,進行二值化處理之膨脹、收縮處理而進行如上述之雜訊之去除。After the processing of step P2, the noise removal processing unit 4c performs a process of removing the noise on the binarized line sensor image 9 (step P3). That is, the binarized line sensor image 9 is produced by the binarization processing of the line sensor image 8, and in this state, there may be a scar of the wire wearing portion 6a or according to the background portion A. The noise with a small dot shape is included in the background portion B of the binarized line sensor image 9. Therefore, the expansion and contraction processing of the binarization processing is performed to remove the noise as described above.

藉由雜訊去除處理部4c將雜訊去除之二值化線感測器影像9,係經由記憶體7b與參數一同傳送於集電線磨耗部分邊緣檢測部4d。The binarized line sensor image 9 from which the noise is removed by the noise removal processing unit 4c is transmitted to the collecting wire abrasion portion edge detecting portion 4d together with the parameter via the memory 7b.

繼步驟P3之處理之後,於集電線磨耗部分邊緣檢測部4d進行檢測集電線6之磨耗部6a之邊緣的處理(步驟P4)。即,係將去除雜訊或既存構造物之二值化線感測器影像9上用白色表示之集電線磨耗部分6a的兩側端,如圖6所示作為邊緣部6d、6e進行檢測。After the process of the step P3, the edge of the wire-wearing portion edge detecting portion 4d performs the process of detecting the edge of the worn portion 6a of the collecting wire 6 (step P4). That is, both side ends of the wire worn portion 6a indicated by white on the binarized line sensor image 9 from which the noise or the existing structure is removed are detected as the edge portions 6d, 6e as shown in Fig. 6.

更詳言之為,就二值化線感測器影像9之橫方向之線,如從左向右探索之情形,係將由背景部分B之黑色變為磨耗部分6a之白色之點作為構成磨耗部分6a之左側之邊緣部6d之邊緣點。且,係將由磨耗部分6a之白色變為背景部分B之黑色之點作為構成磨耗部分6a之右側之邊緣部6e之邊緣點。該處理係由二值化線感測器影像9之上向下於各線進行。藉此檢測一幅二值化線感測器影像9之磨耗部分6a的邊緣部6d、6e。More specifically, as for the line in the horizontal direction of the binarized line sensor image 9, as in the case of searching from left to right, the black of the background portion B is changed to the white point of the worn portion 6a as a wear. The edge point of the edge portion 6d on the left side of the portion 6a. Further, the black point from the white portion of the wear portion 6a to the background portion B is defined as the edge point of the edge portion 6e constituting the right side of the wear portion 6a. This processing is performed by the binarized line sensor image 9 down to the lines. Thereby, the edge portions 6d, 6e of the worn portion 6a of the binarized line sensor image 9 are detected.

藉由集電線磨耗部分邊緣檢測部4d檢測出之邊緣部6d、6e之資料係一方面作為邊緣資料而經由記憶體7b被傳送至集電線重心位置檢測部4e,且另一方面與參數及集電線高度資料一同被傳送至集電線磨耗部分寬度計算部4g。另,集電線高度資料可藉由如專利文獻1所揭示之由外部輸入,或使用專利文獻2所揭示之方法而求出等既知之手法取得。The data of the edge portions 6d, 6e detected by the wire-worn portion edge detecting portion 4d is transmitted as the edge data to the collecting wire center-of-gravity position detecting portion 4e via the memory 7b, and on the other hand, parameters and sets. The wire height data is transmitted to the collecting wire abrasion portion width calculating portion 4g. In addition, the wire height data can be obtained by externally inputting as disclosed in Patent Document 1, or by using the method disclosed in Patent Document 2 to obtain a known method.

繼步驟P4之後,於集電線重心位置檢測部4e進行算出集電線6之重心位置之處理(步驟P5)。即,集電線6之磨耗面可視為相對於車輛1之頂部上方水平磨減,或集電線6之磨耗面可視為相對於剖面為圓形之物從一方向平削其表面之狀態,而利用集電線6之軸線與其磨耗面之寬方向之中心其水平方向之位置一致之點,而於步驟P4中,將逐線檢測出之集電線磨耗部分6a之兩側之邊緣部6d、6e的中心6f的位置,作為二值化線感測器影像9上的集電線6之重心之座標進行檢測。After the step P4, the collection line center-of-gravity position detecting unit 4e performs a process of calculating the position of the center of gravity of the collecting wire 6 (step P5). That is, the wear surface of the collecting wire 6 can be regarded as being horizontally worn off with respect to the top of the vehicle 1, or the wear surface of the collecting wire 6 can be regarded as a state in which the surface of the collecting wire 6 is flattened from one direction with respect to the object having a circular cross section. The axis of the collecting wire 6 coincides with the position of the center of the width direction of the wear surface thereof in the horizontal direction, and in step P4, the center of the edge portions 6d, 6e on both sides of the wire wearing portion 6a is detected line by line. The position of 6f is detected as the coordinate of the center of gravity of the collecting wire 6 on the binarized line sensor image 9.

藉由集電線重心位置檢測部4e檢測出之影像上之重心座標資料,係經由記憶體7b與參數一同傳送至集電線偏移實座標轉換計算部4f。The barycentric coordinate data on the image detected by the collecting wire center-of-gravity position detecting unit 4e is transmitted to the collecting wire offset real coordinate conversion calculating unit 4f together with the parameter via the memory 7b.

繼步驟P5之後,於集電線偏移實座標轉換計算部4f,就藉由集電線重心位置檢測部4e所求得之邊緣部6d、6e之中心6f之位置,算出其變位,而進行用以將其轉換為實座標之計算(步驟P6)。即,在步驟P5檢測出之座標資料為二值化線感測器影像9上之位置,其單位以像素(pixel)表示。將其換算成實際之集電線6之偏移量D[mm]。After the step P5, the position of the center line 6f of the edge portions 6d and 6e obtained by the center-of-gravity center-of-gravity position detecting unit 4e is calculated by the current line offset real coordinate conversion calculation unit 4f, and is used for the displacement. It is calculated by converting it into a real coordinate (step P6). That is, the coordinate data detected in step P5 is the position on the binarized line sensor image 9, and the unit is expressed in pixels. This is converted into the offset D [mm] of the actual collecting wire 6.

轉換為實座標之實際之集電線6的偏移量D[mm]如圖8所示,若將步驟P5所檢測之邊緣部6d、6e之中心6f之感測器面11上的座標設為d[pixel],將感測器面11之長度(感測器長)設為s[mm],將軌道13(參照圖1)至線感測器2之感測器面11的距離設為hs [mm],將透鏡之焦點距離設為f[mm],將線感測器2之感測器數設為p[pixel],及將軌道13至集電線6之實際之高度設為h[mm],則可根據以下(1)式求出。The offset D [mm] of the actual collecting wire 6 converted into a real coordinate is as shown in Fig. 8, and the coordinates on the sensor face 11 of the center 6f of the edge portions 6d, 6e detected in the step P5 are set as d[pixel], the length of the sensor face 11 (sensor length) is set to s [mm], and the distance from the track 13 (refer to FIG. 1) to the sensor face 11 of the line sensor 2 is set to h s [mm], set the focal length of the lens to f[mm], set the number of sensors of the line sensor 2 to p[pixel], and set the actual height of the track 13 to the set line 6 to h[mm] can be obtained from the following formula (1).

[數1][Number 1]

於集電線偏移實座標轉換計算部4f所算出之集電線之實際的偏移量係作為集電線實座標偏移資料而經由記憶體7b被傳送於記憶裝置5。另,圖8中,符號10係表示線感測器2之視野與集電線6之磨耗面為同一平面交叉之部分的實座標面,W係表示集電線磨耗部分6a之實際之寬,w係表示二值化線感測器影像9上所表現之集電線磨耗部分6a的寬。The actual offset amount of the current line calculated by the integrated wire offset real coordinate conversion calculation unit 4f is transmitted to the memory device 5 via the memory 7b as the current line solid coordinate offset data. In addition, in FIG. 8, reference numeral 10 denotes a solid coordinate surface in which the field of view of the line sensor 2 and the wear surface of the collecting wire 6 intersect at the same plane, and W denotes the actual width of the wire wearing portion 6a, and the w system The width of the wire wearing portion 6a represented on the binarized line sensor image 9 is indicated.

又,本實施例係並行步驟P5、步驟P6之處理,且繼步驟P4之處理後,由集電線磨耗部分寬度計算部4g進行求出集電線磨耗部分6a之實際之寬W[mm]的處理(步驟P7)。Further, in the present embodiment, the processing of the step P5 and the step P6 is performed in parallel, and after the processing of the step P4, the processing of the actual width W [mm] of the collecting wire worn portion 6a is performed by the collecting wire abrasion portion width calculating portion 4g. (Step P7).

即,集電線磨耗部分寬度計算部4g首先係用由二值化線感測器影像9檢測之集電線磨耗部分6a之兩側的邊緣資料,將線感測器2之一個掃描線上之邊緣部6d、6e間的距離作為集電線磨耗部分6a之影像上的寬w[pixel]求出。其後,經由記憶體7b輸入之從軌道13至集電線6之實際高度h[mm]、線感測器2之透鏡之焦點距離f[mm]、線感測器2之感測器長s[mm]、及感測器像素數計算出對於1像素(pixel)之實際尺寸[mm]之程度的影像解析度[mm/pixel],再進行集電線磨耗部分6a之二值化線感測器影像9上之寬與影像解析度之乘算,求出集電線磨耗部分6a之實際之寬W[mm]。That is, the collecting wire abrasion portion width calculating portion 4g first uses the edge data on both sides of the collecting wire abrasion portion 6a detected by the binarized line sensor image 9, and the edge portion of one scanning line of the line sensor 2 is used. The distance between 6d and 6e is obtained as the width w [pixel] on the image of the wire abrasion portion 6a. Thereafter, the actual height h [mm] from the track 13 to the collecting wire 6 input via the memory 7b, the focal length f [mm] of the lens of the line sensor 2, and the sensor length s of the line sensor 2 [mm], and the number of pixels of the sensor, the image resolution [mm/pixel] for the actual size [mm] of 1 pixel (pixel) is calculated, and the binarized line sensing of the wire wearing portion 6a is performed. The multiplication of the width of the image 9 and the resolution of the image is obtained, and the actual width W [mm] of the wire wearing portion 6a is obtained.

於集電線磨耗部分寬度計算部4g所算出之集電線磨耗部分6a之實際的寬W係作為集電線磨耗部分寬度資料經由記憶體7b而傳送於記憶裝置5。The actual width W of the collecting wire worn portion 6a calculated by the collecting wire abrasion portion width calculating portion 4g is transmitted to the memory device 5 as the collecting wire wear portion width data via the memory 7b.

藉由進行如此處理,本實施例之測量用電腦4可同時測定集電線6之偏移量D[mm]、與集電線6之磨耗寬W[mm]。By performing such processing, the measuring computer 4 of the present embodiment can simultaneously measure the offset D [mm] of the collecting wire 6 and the wear width W [mm] of the collecting wire 6.

記錄裝置5除了將由測量用電腦4輸入之線感測器影像8作為輸入影像予以保存之外,亦保存二值化線感測器影像9、各種參數、集電線磨耗部分邊緣檢測部4d所檢測之邊緣資料、集電線重心位置檢測部4e所檢測之影像上之集電線6的重心座標資料、集電線偏移實座標轉換計算部4f所算出之集電線實座標偏移資料、及集電線磨耗部分寬度計算部4g所算出之集電線磨耗部分寬度資料等。The recording device 5 stores the line sensor image 8 input from the measuring computer 4 as an input image, and also stores the binarized line sensor image 9, various parameters, and the wire-worn portion edge detecting portion 4d. The edge data, the gravity center coordinate data of the current collecting wire 6 on the image detected by the wire center-of-gravity position detecting unit 4e, the current wire coordinate offset data calculated by the current wire offset real coordinate conversion calculating unit 4f, and the wire abrasion amount The wire width portion width data and the like calculated by the partial width calculating unit 4g.

根據上述本實施例之藉由影像處理之集電線之磨耗及偏移測定裝置,可用一個測量用電腦4檢測集電線6之偏移量D[mm]與集電線6之磨耗寬W[mm],因此可維持測定所花費之成本,且提高便利性。According to the wear and offset measuring device for the collecting wire by image processing according to the above embodiment, the measuring device 4 can detect the offset D [mm] of the collecting wire 6 and the wear width W [mm] of the collecting wire 6. Therefore, the cost of the measurement can be maintained, and the convenience is improved.

另,本發明之藉由影像處理之集電線之磨耗及偏移測定裝置,並非限定於上述實施例,亦可在不脫離本發明之主旨之範圍內進行各種更改。例如,上述實施例係顯示同時算出集電線6之偏移量D[mm]與磨耗寬W[mm]之例,但本發明之集電線之磨耗及偏移測定裝置不限於此。例如亦可先算出集電線之偏移量,其後再算出集電線之磨耗寬,反之,又可先算出集電線之磨耗寬,其後再算出集電線之偏移量。甚至又可根據目的而僅算出集電線之偏移量、或集電線之磨耗寬。Further, the apparatus for consuming and arranging the wire of the present invention by the image processing is not limited to the above-described embodiment, and various modifications can be made without departing from the spirit and scope of the invention. For example, the above embodiment shows an example in which the offset D [mm] and the wear width W [mm] of the collecting wire 6 are simultaneously calculated, but the wear and offset measuring device of the collecting wire of the present invention is not limited thereto. For example, the offset of the collecting wire may be calculated first, and then the total wear of the collecting wire may be calculated. Conversely, the wear of the collecting wire may be calculated first, and then the offset of the collecting wire may be calculated. It is even possible to calculate only the offset of the collecting wire or the wear of the collecting wire according to the purpose.

本發明係較宜適用於藉由影像處理之集電線磨耗測定裝置。The present invention is preferably applicable to a wire abrasion measuring device by image processing.

1...車輛1. . . vehicle

2...線感測器2. . . Line sensor

3...照明裝置3. . . Lighting device

4...測量用電腦4. . . Measuring computer

4a...線感測器影像製作部4a. . . Line sensor image production department

4b...判斷分析二值化處理部4b. . . Judging analysis binarization processing unit

4c...雜訊去除處理部4c. . . Noise removal processing unit

4d...集電線磨耗部分邊緣檢測部4d. . . Wire wear part edge detection part

4e...集電線重心位置檢測部4e. . . Set wire center position detection unit

4f...集電線偏移實座標轉換計算部4f. . . Set wire offset real coordinate conversion calculation unit

4g...集電線磨耗部分寬度計算部4g. . . Set wire wear part width calculation section

5...記錄裝置5. . . Recording device

6...集電線6. . . Set of wires

6a...集電線之磨耗部分6a. . . Wear part of the wire

6b...集電線之未磨耗之部分6b. . . Collecting the unworn part of the wire

6c...集電線之未磨耗之部分6c. . . Collecting the unworn part of the wire

6d...邊緣部6d. . . Edge

6e...邊緣部6e. . . Edge

6f...邊緣部6d、6e之中心6f. . . Center of edge portions 6d, 6e

7a...記憶體7a. . . Memory

7b...記憶體7b. . . Memory

8...線感測器影像8. . . Line sensor image

9...二值化線感測器影像9. . . Binarized line sensor image

11...感測器面11. . . Sensor face

13...軌道13. . . track

A...背景部分(白色)A. . . Background part (white)

B...背景部分(黑色)B. . . Background part (black)

圖1係顯示本發明之實施例之藉由影像處理之集電線磨耗測定裝置的設置例的說明圖;圖2係顯示本發明之實施例之測量用電腦之構成的方塊圖;圖3係顯示本發明之實施例之磨耗測定之流程的流程圖;圖4係顯示本發明之實施例之線感測器影像之一例的說明圖;圖5係顯示將圖4所示之線感測器影像予以二值化處理之二值化線感測器影像之一例的說明圖;圖6係顯示在圖5所示之二值化線感測器影像中抽出集電線之邊緣部之例的說明圖;1 is an explanatory view showing an arrangement example of a wire abrasion measuring device by image processing according to an embodiment of the present invention; FIG. 2 is a block diagram showing a configuration of a measuring computer according to an embodiment of the present invention; FIG. 4 is an explanatory diagram showing an example of a line sensor image according to an embodiment of the present invention; FIG. 5 is a view showing a line sensor image shown in FIG. An explanatory diagram of an example of a binarized line sensor image to be binarized; and FIG. 6 is an explanatory view showing an example of extracting an edge portion of a collecting wire in the binarized line sensor image shown in FIG. ;

圖7係顯示由圖6所示之邊緣部求出之重心之例的說明圖;及7 is an explanatory view showing an example of a center of gravity obtained from an edge portion shown in FIG. 6;

圖8係顯示實際之集電線之位置與線感測器影像上之集電線之位置的關係的說明圖。Fig. 8 is an explanatory view showing the relationship between the position of the actual collecting wire and the position of the collecting wire on the line sensor image.

1...車輛1. . . vehicle

2...線感測器2. . . Line sensor

3...照明裝置3. . . Lighting device

4...測量用電腦4. . . Measuring computer

5...記錄裝置5. . . Recording device

6...集電線6. . . Set of wires

13...軌道13. . . track

Claims (3)

一種藉由影像處理之集電線(trolley wire)之磨耗及偏移測定裝置,其特徵為包含:線感測器影像製作機構,其係製作將藉由使掃描線方向垂直且水平於車輛之行駛方向之線感測器所拍攝的影像按時間序列排列而成之線感測器影像者;二值化處理機構,其係對上述線感測器影像進行二值化處理,而製作強調所拍攝之集電線之磨耗部分的二值化線感測器影像者;邊緣檢測機構,其係對上述二值化線感測器影像檢測上述磨耗部分之兩側之邊緣者;集電線重心位置檢測機構,其係從上述磨耗部分之兩側之邊緣的位置檢測上述集電線之重心位置者;集電線偏移量計算機構,其係在由上述集電線重心位置檢測機構檢測出之上述集電線之重心位置之上述線感測器之感測面上之座標設為d[pixel]、上述線感測器之感測面之感測器長設為s[mm]、從軌道至上述線感測器之感測面之距離設為hs [mm]、透鏡之焦點距離設為f[mm]、上述線感測器之感測器數設為p[pixel]、上述軌道至上述集電線之實際之高度設為h[mm]時,可藉由以下(1)式檢測上述集電線之實際的偏移量D者,D=(h-hs -f)‧s‧d/(p‧f)…(1);及集電線磨耗量計算機構,其係構成為至少與藉由上述集電線偏移量計算機構之處理並行地,將由上述高度 h[mm]、上述焦點距離f[mm]、上述感測器長s[mm]及上述感測器數p[pixel]所計算的對於1像素(PIXEL)之實際尺寸[mm]之程度即影像解析度[mm/pixel]與藉由上述邊緣檢測機構檢測出之邊緣間之距離即上述集電線磨耗部分之影像上之寬w[pixel]進行乘算,藉此可檢測上述集電線之磨耗量者。A wear and offset measuring device for a wire processed by image processing, comprising: a line sensor image producing mechanism, which is manufactured by making a scanning line direction perpendicular and horizontally traveling on a vehicle a line sensor image obtained by aligning the image of the line sensor in time series; a binarization processing mechanism, which performs binarization processing on the line sensor image, and produces an emphasis shot a binarized line sensor imager of the wear portion of the wire; an edge detecting mechanism for detecting the edge of both sides of the wear portion of the binarized line sensor image; and a wire center position detecting mechanism And detecting a position of a center of gravity of the current collecting wire from a position of an edge of both sides of the wear portion; and a collecting wire offset calculating mechanism that is determined by a center of gravity of the current collecting wire detected by the collecting wire center-of-gravity position detecting mechanism The coordinate of the sensing surface of the line sensor is set to d[pixel], the sensor length of the sensing surface of the line sensor is set to s[mm], and the track is connected to the line sensor. Sensing The distance is set to h s [mm], the focal distance of the lens is set to f [mm], the number of sensors set to the wire sensor p [pixel], to the actual height of the track of the wire to the collector When h[mm], the actual offset amount D of the above-mentioned current collecting wire can be detected by the following formula (1), D = (hh s - f) ‧ s ‧ d / (p ‧ f) (1); And a collecting wire wear amount calculating mechanism configured to be at least the height h [mm], the focal length f [mm], and the sensor length in parallel with the processing by the current wire offset calculating means s[mm] and the above-mentioned sensor number p[pixel] calculated for the actual size [mm] of 1 pixel (PIXEL), that is, image resolution [mm/pixel] and detected by the edge detecting mechanism The distance between the edges, that is, the width w [pixel] on the image of the wear portion of the above-mentioned collecting wire, is multiplied, whereby the amount of wear of the above-mentioned collecting wires can be detected. 如請求項1之藉由影像處理之集電線之磨耗及偏移測定裝置,其中上述二值化處理機構係藉由根據上述線感測器影像之狀態自動決定臨限值之判斷分析二值化處理,而對上述線感測器影像進行二值化處理,且製作上述二值化線感測器影像。 The apparatus for processing an abrasion and offset of a collecting wire by image processing according to claim 1, wherein the binarization processing mechanism performs binarization by automatically determining a threshold value according to a state of the line sensor image. Processing, the above-mentioned line sensor image is binarized, and the above-mentioned binarized line sensor image is produced. 如請求項1或請求項2之藉由影像處理之集電線之磨耗及偏移測定裝置,其中包含雜訊去除機構,其係去除上述二值化線感測器影像上之雜訊者。The apparatus for abrading and offsetting of a wire for image processing according to claim 1 or claim 2, comprising a noise removing mechanism for removing noise on the image of the binarized line sensor.
TW98139572A 2008-11-27 2009-11-20 By means of image processing of the collector wire wear and offset measurement device TWI422797B (en)

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Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI417205B (en) * 2010-12-09 2013-12-01 China Steel Corp Collector brush copper wear detection system
JP5811637B2 (en) * 2011-06-30 2015-11-11 株式会社明電舎 Trolley wire wear measuring device by image processing
JP5861318B2 (en) * 2011-08-26 2016-02-16 株式会社明電舎 Trolley wire data comparison device
JP6069701B2 (en) * 2013-02-19 2017-02-01 株式会社明電舎 Wear measuring apparatus and method
JP5534058B1 (en) 2013-02-19 2014-06-25 株式会社明電舎 Wear measuring apparatus and method
JP6852472B2 (en) * 2017-03-09 2021-03-31 株式会社明電舎 Sliding surface width detection device and method for trolley wire
JP6841096B2 (en) * 2017-03-09 2021-03-10 株式会社明電舎 Sliding surface width detection device and method for trolley wire
JP7310668B2 (en) * 2020-03-18 2023-07-19 株式会社明電舎 Trapezoidal overhead wire residual height measuring device and trapezoidal overhead wire residual height measuring method
CN113221058B (en) * 2021-06-08 2022-05-10 中国科学院软件研究所 Method for detecting and evaluating abrasion loss of outer edge of circular accessory

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006284535A (en) * 2005-04-05 2006-10-19 Meidensha Corp Position measuring device of trolley line
TW200708424A (en) * 2005-03-11 2007-03-01 Meidensha Electric Mfg Co Ltd Image-processing based trolley wire wear measurement apparatus
TW200810518A (en) * 2006-08-11 2008-02-16 Hon Hai Prec Ind Co Ltd System and method for boundary scan of an image
WO2008044389A1 (en) * 2006-10-05 2008-04-17 Meidensha Corporation Trolley wire wear measuring device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10044432A1 (en) * 2000-09-08 2002-04-04 Siemens Ag Device, method and use for the automatic detection of the wear of the contact wires of overhead lines for electrically powered vehicles
JP2005147878A (en) * 2003-11-17 2005-06-09 Tokyo Metro Co Ltd Method and apparatus for measuring amount of wear of trolley wire

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200708424A (en) * 2005-03-11 2007-03-01 Meidensha Electric Mfg Co Ltd Image-processing based trolley wire wear measurement apparatus
JP2006284535A (en) * 2005-04-05 2006-10-19 Meidensha Corp Position measuring device of trolley line
TW200810518A (en) * 2006-08-11 2008-02-16 Hon Hai Prec Ind Co Ltd System and method for boundary scan of an image
WO2008044389A1 (en) * 2006-10-05 2008-04-17 Meidensha Corporation Trolley wire wear measuring device

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