TW351691B - Method for polishing thin plate and apparatus for polishing - Google Patents

Method for polishing thin plate and apparatus for polishing

Info

Publication number
TW351691B
TW351691B TW086117297A TW86117297A TW351691B TW 351691 B TW351691 B TW 351691B TW 086117297 A TW086117297 A TW 086117297A TW 86117297 A TW86117297 A TW 86117297A TW 351691 B TW351691 B TW 351691B
Authority
TW
Taiwan
Prior art keywords
polishing
thin plate
plate
rotating
polish
Prior art date
Application number
TW086117297A
Other languages
English (en)
Inventor
Koichi Tanaka
Toshihiro Tsuchiya
Foji Morita
Tsutomu Takaku
Original Assignee
Shinetsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Handotai Co Ltd filed Critical Shinetsu Handotai Co Ltd
Application granted granted Critical
Publication of TW351691B publication Critical patent/TW351691B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002—Preparing wafers
    • H01L21/02005—Preparing bulk and homogeneous wafers
    • H01L21/02008—Multistep processes
    • H01L21/0201—Specific process step
    • H01L21/02024—Mirror polishing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
TW086117297A 1996-11-27 1997-11-19 Method for polishing thin plate and apparatus for polishing TW351691B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31663496A JPH10156710A (ja) 1996-11-27 1996-11-27 薄板の研磨方法および研磨装置

Publications (1)

Publication Number Publication Date
TW351691B true TW351691B (en) 1999-02-01

Family

ID=18079231

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086117297A TW351691B (en) 1996-11-27 1997-11-19 Method for polishing thin plate and apparatus for polishing

Country Status (5)

Country Link
US (1) US5934981A (zh)
EP (1) EP0845329B1 (zh)
JP (1) JPH10156710A (zh)
DE (1) DE69711818T2 (zh)
TW (1) TW351691B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4236292B2 (ja) * 1997-03-06 2009-03-11 日本碍子株式会社 ウエハー吸着装置およびその製造方法
JP3618220B2 (ja) * 1998-03-30 2005-02-09 信越半導体株式会社 薄板の研磨方法および薄板保持プレート
WO2000025981A1 (fr) * 1998-10-30 2000-05-11 Shin-Etsu Handotai Co., Ltd. Plan non poli de maintien/travail et son procede de fabrication ; technique et dispositif de polissage
JP3772954B2 (ja) * 1999-10-15 2006-05-10 株式会社村田製作所 チップ状部品の取扱方法
DE10009656B4 (de) * 2000-02-24 2005-12-08 Siltronic Ag Verfahren zur Herstellung einer Halbleiterscheibe
DE10012840C2 (de) * 2000-03-16 2001-08-02 Wacker Siltronic Halbleitermat Verfahren zur Herstellung einer Vielzahl von polierten Halbleiterscheiben
JP6088919B2 (ja) * 2013-06-28 2017-03-01 株式会社東芝 半導体装置の製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4010583A (en) * 1974-05-28 1977-03-08 Engelhard Minerals & Chemicals Corporation Fixed-super-abrasive tool and method of manufacture thereof
JP2632738B2 (ja) * 1990-04-27 1997-07-23 信越半導体 株式会社 パッキングパッド、および半導体ウェーハの研磨方法
US5140782A (en) * 1990-10-29 1992-08-25 Honore Mecteau Tool and method for forming a lens
US5380387A (en) * 1992-10-13 1995-01-10 Loctite Corporation Lens blocking/deblocking method
JPH06320414A (ja) * 1993-05-11 1994-11-22 Hitachi Ltd 研磨プレートおよびそれを用いた研磨装置
JP3042293B2 (ja) * 1994-02-18 2000-05-15 信越半導体株式会社 ウエーハのポリッシング装置
JPH07297195A (ja) * 1994-04-27 1995-11-10 Speedfam Co Ltd 半導体装置の平坦化方法及び平坦化装置
JP2719113B2 (ja) * 1994-05-24 1998-02-25 信越半導体株式会社 単結晶シリコンウェーハの歪付け方法
US5664990A (en) * 1996-07-29 1997-09-09 Integrated Process Equipment Corp. Slurry recycling in CMP apparatus

Also Published As

Publication number Publication date
DE69711818T2 (de) 2002-09-12
EP0845329A2 (en) 1998-06-03
EP0845329A3 (en) 1998-12-16
US5934981A (en) 1999-08-10
DE69711818D1 (de) 2002-05-16
JPH10156710A (ja) 1998-06-16
EP0845329B1 (en) 2002-04-10

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