TW270995B - Memory cell - Google Patents

Memory cell

Info

Publication number
TW270995B
TW270995B TW084107637A TW84107637A TW270995B TW 270995 B TW270995 B TW 270995B TW 084107637 A TW084107637 A TW 084107637A TW 84107637 A TW84107637 A TW 84107637A TW 270995 B TW270995 B TW 270995B
Authority
TW
Taiwan
Prior art keywords
conducting layers
memory cell
conducting
layers
application means
Prior art date
Application number
TW084107637A
Other languages
English (en)
Inventor
Yasunao Katayama
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of TW270995B publication Critical patent/TW270995B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/36—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using diodes, e.g. as threshold elements, i.e. diodes assuming a stable ON-stage when driven above their threshold (S- or N-characteristic)
    • G11C11/38—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using diodes, e.g. as threshold elements, i.e. diodes assuming a stable ON-stage when driven above their threshold (S- or N-characteristic) using tunnel diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
TW084107637A 1995-02-22 1995-07-24 Memory cell TW270995B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7033998A JP2986057B2 (ja) 1995-02-22 1995-02-22 メモリセル

Publications (1)

Publication Number Publication Date
TW270995B true TW270995B (en) 1996-02-21

Family

ID=12402137

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084107637A TW270995B (en) 1995-02-22 1995-07-24 Memory cell

Country Status (8)

Country Link
US (1) US5625589A (zh)
EP (1) EP0729156B1 (zh)
JP (1) JP2986057B2 (zh)
KR (1) KR0184629B1 (zh)
AT (1) ATE211295T1 (zh)
DE (1) DE69618044T2 (zh)
ES (1) ES2167515T3 (zh)
TW (1) TW270995B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0797182A1 (en) * 1996-03-19 1997-09-24 Hitachi, Ltd. Active matrix LCD with data holding circuit in each pixel
US7534710B2 (en) * 2005-12-22 2009-05-19 International Business Machines Corporation Coupled quantum well devices (CQWD) containing two or more direct selective contacts and methods of making same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0225698B1 (en) * 1985-10-12 1990-08-01 Fujitsu Limited Logic circuitry
JP2588590B2 (ja) * 1988-07-20 1997-03-05 富士通株式会社 半導体記憶装置
US5251170A (en) * 1991-11-04 1993-10-05 Nonvolatile Electronics, Incorporated Offset magnetoresistive memory structures
JPH05190922A (ja) * 1992-01-09 1993-07-30 Hitachi Ltd 量子メモリ装置
US5420819A (en) * 1992-09-24 1995-05-30 Nonvolatile Electronics, Incorporated Method for sensing data in a magnetoresistive memory using large fractions of memory cell films for data storage
US5390145A (en) * 1993-04-15 1995-02-14 Fujitsu Limited Resonance tunnel diode memory

Also Published As

Publication number Publication date
EP0729156A2 (en) 1996-08-28
KR960032764A (ko) 1996-09-17
EP0729156A3 (en) 1999-07-28
ATE211295T1 (de) 2002-01-15
US5625589A (en) 1997-04-29
EP0729156B1 (en) 2001-12-19
DE69618044T2 (de) 2002-08-29
ES2167515T3 (es) 2002-05-16
JP2986057B2 (ja) 1999-12-06
JPH08250672A (ja) 1996-09-27
DE69618044D1 (de) 2002-01-31
KR0184629B1 (ko) 1999-03-20

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